voltage switchable dielectric material offers novel ......the output of each nand gate drives an...
TRANSCRIPT
Voltage Switchable Dielectric Material Offers Novel Approach to
More Comprehensive ESD Protection
R. Fleming, D. Vasquez, M. Glickman, J. Wu, F. Razavi, P. Pande
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We are an ESD Solutions Company
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ESD represents a major failure mode during semiconductor assembly and during actual system use
Destroys chips and passive elements
Example: “Zapped” Bond Wire Example: “Zapped” Integrated Circuit
8kV ESD pulse (defined by International Standard, IEC)
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First major application is cell phones
Example: 0201 Resistor Pulsed with 8kV IEC Contact
Shocking Technologies 2013 APEC Conference
Shocking Corporate Overview
Founded July 2006
Production facility & Nanotech laboratory in Aug 2008- Sales Offices in US & Singapore
Industry Partners- Certified Manufacturers:
- PCB Electrical Test:
- Design Software:
University partners: Company has over 230 patents and applications on polymer,
applications and structures3 Shocking Technologies 2013 APEC Conference
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How Does VSD™ Material Work? Shocking’s Voltage Switchable Dielectric material allows for the creation of embedded ESD protection At operating voltages, VSDM is a standard dielectric At high voltages, VSDM turns into a conductor shunting dangerous ESD currents to the GND plane
L1
VSD™ Layer (All other dielectrics are standard materials)
Connector I/O
L2
L3
L4
PassiveActive
XStaticVSDM
Plated thru Via
Control Gap
GND Plane4 Shocking Technologies 2013 APEC Conference
XStatic incorporation into PCB/Substrate
Liquid Polymer
Polymer Coating on Foil
Sheet to Size Inventory & Distribution
Finished PCB/Flex
Warehousing/ Asia
Simple integration XStatic fits seamlessly into existing PCB/Flex ecosystemWe sell sheets of VSDM coated on copper foil to the PCB/Flex manufacturer
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2nd Sourcing in Certification
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XStatic: A Voltage Switchable Dielectric™ (VSD™) “ Polymer Diode”
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A Voltage Switchable Dielectric™ (VSD™) behaves like an insulator (dielectric) during normal circuit operation (low voltage) and becomes conductive under high voltage event (i.e. ESD discharge). Material is a polymer composite analog to a varistor (variable resistor).
During conduction, the resistance changes so as to maintain a constant clamp voltage. Vclamp = Von + IRon The material becomes an insulator (high resistance) again after the voltage drops
back below the threshold to normal operating levels. The clamp is bi-directional – working equally well with both positive and negative pulsed
events. The sub-nanosecond response time is fast enough to clamp ESD transients to a safe
level.
Insulator
Conductor
ESD Transient Voltage+100 V +200 V +300 V +30 KV
Clamp Voltage“Adjustable”
-100 V-200 V-300 V-30 KV
Clamp Voltage“Adjustable”
“Normal”Operation
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Xstatic™ Compared to other low capacitance DevicesVI Curve with Stepped TLP (100ns square wave pulse)
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Shocking’s VSDM turns on with a lower trigger than existing polymer surface Mount device and lower on state impedance than a Multi-layer varistor device
Vclamp = Von + IRon
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XStatic Response to 8kV IEC Waveform
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8kV IEC pulse into 500 Ω load
XStatic Response
XStatic activation within1ns
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Designing in XStatic
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Simulate
Modify schematic Layout
Input product schematic and run simulation. Identify
ESD vulnerable locations
Add XStatic switching structures to schematic in locations
recommended by simulation
Drop shapes into layout from Cadence/Mentor
Library
Step 1 Step 2 Step 3
No change to Design flow at OEM/ODM
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STUDIES ON MODEL SYSTEMShocking Technologies, Inc.
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Step 1: Protect Passive Components0201 Resistors Pulsed with 8kV IEC Contact
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Step 2: Protect ICModel System Level Test on Active IC
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System Level Test Boardw/ Embedded VSDM
555 Timer
Vc
Zapping Pads
Embedded VSD Structures
R1
R2
1K
1K
Simplified Design SchematicIEC ESD Test
NAND Gate
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Experimental Design
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Top view of the board (control) Bottom view of the board (control/VSD)
NAND Gate Chip
555 Timer
A QUAD NAND gate is selected for this experiment due to its simplicity which allows for easy functionality debugging
Each NAND gate has two inputs which are both tested (this will add up to 4×2 test pads).
All tests are based on direct Contact Discharge. The output of each NAND gate drives an LED. The 555 Timer output is also connected to an LED. The tests are carried at 2K, 4K, 6K, 8K, 10K, 12K, 15K,
20K, 25K and 30K volts using an HAEFELY IEC Gun.
Ground Pads
columns
Zapping Pads
columns
Timer LED
NAND gates LEDs
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Comparing Control and Embedded VSDM – Brand A NAND
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Con
trol
VS
D
Hard fail
Soft fail
OK
NM: Not Measured
Contact IEC Pre zap 2K 4K 6K 8K 10K 12K 15K 20K 25K 30KNAND1 BD1 OK OK OK SOFT HARD NM NM NM NM NM NM
BD2 OK OK OK OK HARD NM NM NM NM NM NMBD3 OK OK OK OK HARD NM NM NM NM NM NMBD4 OK OK OK OK HARD NM NM NM NM NM NM
NAND2 BD1 OK OK OK SOFT HARD NM NM NM NM NM NMBD2 OK OK OK OK HARD NM NM NM NM NM NMBD3 OK OK OK OK HARD NM NM NM NM NM NMBD4 OK OK OK OK HARD NM NM NM NM NM NM
NAND3 BD1 OK OK OK OK HARD NM NM NM NM NM NMBD2 OK OK OK OK HARD NM NM NM NM NM NMBD3 OK OK OK OK HARD NM NM NM NM NM NMBD4 OK OK OK OK HARD NM NM NM NM NM NM
NAND4 BD1 OK OK OK HARD NM NM NM NM NM NM NMBD2 OK OK OK SOFT HARD NM NM NM NM NM NMBD3 OK OK OK HARD NM NM NM NM NM NM NMBD4 OK OK OK OK HARD NM NM NM NM NM NM
Contact IEC Pre zap 2K 4K 6K 8K 10K 12K 15K 20K 25K 30KNAND1 BD1 OK OK OK OK OK OK OK OK OK HARD NM
BD2 OK OK OK OK OK OK OK OK OK HARD NMBD3 OK OK OK OK OK OK OK OK OK OK HARDBD4 OK OK OK OK OK OK OK OK OK OK OK
NAND2 BD1 OK OK OK OK OK OK OK OK OK HARD NMBD2 OK OK OK OK OK OK OK OK HARD NM NMBD3 OK OK OK OK OK OK OK OK OK HARD NMBD4 OK OK OK OK OK OK OK OK OK HARD NM
NAND3 BD1 OK OK OK OK OK OK OK HARD NM NM NMBD2 OK OK OK OK OK OK OK OK HARD NM NMBD3 OK OK OK OK OK OK OK OK HARD NM NMBD4 OK OK OK OK OK OK OK OK OK HARD NM
NAND4 BD1 OK OK OK OK OK OK OK OK HARD NM NMBD2 OK OK OK OK OK OK OK OK HARD NM NMBD3 OK OK OK OK OK OK OK OK HARD NM NMBD4 OK OK OK OK OK OK OK OK OK OK OK
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Comparing Control and Embedded VSDM – Brand B NAND
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Contact IEC Pre zap 2K 4K 6K 8K 10K 12K 15K 20K 25K 30K
NAND1 BD1 OK OK OK OK SOFT SOFT OK HARD NM NM NM
BD2 OK OK OK OK SOFT SOFT OK HARD NM NM NM
BD3 OK OK OK OK SOFT SOFT OK HARD NM NM NM
NAND2 BD1 OK OK OK OK SOFT OK OK HARD NM NM NM
BD2 OK OK OK OK OK SOFT OK HARD NM NM NM
BD3 OK OK OK OK SOFT OK OK HARD NM NM NM
NAND3 BD1 OK OK OK OK OK OK OK HARD NM NM NM
BD2 OK OK OK OK OK OK OK HARD NM NM NM
BD3 OK OK OK OK OK HARD NM NM NM NM NM
NAND4 BD1 OK OK OK OK SOFT OK OK HARD NM NM NM
BD2 OK OK OK OK SOFT OK OK HARD NM NM NM
BD3 OK OK OK OK SOFT HARD NM NM NM NM NM
Contact IEC Pre zap 2K 4K 6K 8K 10K 12K 15K 20K 25K 30K
NAND1 BD1 OK OK OK OK OK OK OK OK OK OK OK
BD2 OK OK OK OK OK OK OK OK OK OK HARD
BD3 OK OK OK OK OK OK OK OK OK HARD NM
NAND2 BD1 OK OK OK OK OK OK OK OK OK OK OK
BD2 OK OK OK OK OK OK OK OK OK OK HARD
BD3 OK OK OK OK OK OK OK OK OK OK OK
NAND3 BD1 OK OK OK OK OK OK OK OK OK HARD NM
BD2 OK OK OK OK OK OK OK OK OK OK OK
BD3 OK OK OK OK OK OK OK OK HARD NM NM
NAND4 BD1 OK OK OK OK OK OK OK OK OK OK HARD
BD2 OK OK OK OK OK OK OK OK OK HARD NM
BD3 OK OK OK OK OK OK OK OK HARD NM NM
Con
trol
VS
D
Hard fail
Soft fail
OK
NM: Not Measured
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Flex Demo Test Vehicle
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NAND IC inside
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Contact IEC Pre zap 2K 4K 6K 8K 10K 12K 15K 20K 25K 30K
NAND1 BD1 OK OK OK OK HARD NM NM NM NM NM NM
BD2 OK OK OK OK SOFT SOFT HARD HARD NM NM NM
BD3 OK OK OK OK OK OK SOFT HARD NM NM NM
NAND2 BD1 OK OK OK OK HARD NM NM NM NM NM NM
BD2 OK OK OK SOFT OK OK OK HARD NM NM NM
BD3 OK OK OK OK OK HARD NM NM NM NM NM
NAND3 BD1 OK OK OK SOFT HARD NM NM NM NM NM NM
BD2 OK OK OK OK SOFT OK OK HARD NM NM NM
BD3 OK OK OK OK OK HARD NM NM NM NM NM
NAND4 BD1 OK OK OK SOFT HARD NM NM NM NM NM NM
BD2 OK OK OK SOFT OK OK OK HARD NM NM NM
BD3 OK OK OK OK OK SOFT OK HARD NM NM NM
ESD Test Results – Control vs. VSDM
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Con
trol
VS
D
Hard fail
Soft fail
OK
NM: Not Measured
Contact IEC Pre zap 2K 4K 6K 8K 10K 12K 15K 20K 25K 30K
NAND1 BD1 OK OK OK OK OK OK OK OK OK OK OK
BD2 OK OK OK OK OK OK OK OK OK OK OK
NAND2 BD1 OK OK OK OK OK OK OK OK OK OK OK
BD2 OK OK OK OK OK OK OK OK OK OK OK
NAND3 BD1 OK OK OK OK OK OK OK OK OK OK OK
BD2 OK OK OK OK OK OK OK OK OK OK OK
NAND4 BD1 OK OK OK OK OK OK OK OK OK OK OK
BD2 OK OK OK OK OK OK OK OK OK OK OK
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ESD Protection of Capacitance Touch Panel– In Development
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-Partnered with Multek (New Vision Display) to incorporate VSDM in FlexFirst prototype was to demonstrate VSDM could protect Atmel Controller ICESD protection from touch panel and from main PCB (per customer request)
Capacitance Touch Panel controller is Protected with Embedded VSDM
Test with interface boardTo check functionality
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Capacitance Touch Display(powered off)
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pin Type Zap Location* Pre zap 2K 4K 6K 8K 10K 12K 15K 20K 25K 30KPin 1 VSDM Small Flex Tail OK OK OK OK OK OK OK OK OK OK FailedPin 2 VSDM Small Flex Tail OK OK OK OK OK OK OK OK OK OK FailedPin 3 VSDM Small Flex Tail OK OK OK OK OK OK OK OK OK OK FailedPin 4 VSDM Small Flex Tail OK OK OK OK OK OK OK OK OK OK FailedPin 5 VSDM Small Flex Tail OK OK OK OK OK OK OK OK OK OK FailedPin 6 VSDM Small Flex Tail OK OK OK OK OK OK OK OK OK OK FailedPin 7 VSDM Small Flex Tail OK OK OK OK OK OK OK OK OK OK FailedPin 8 VSDM Small Flex Tail OK OK OK OK OK OK OK OK OK OK FailedPin 1 Control Small Flex Tail OK OK OK OK OK FailedPin 2 Control Small Flex Tail OK OK OK OK OK FailedPin 3 Control Small Flex Tail OK OK OK OK OK FailedPin 4 Control Small Flex Tail OK OK OK OK OK FailedPin 5 Control Small Flex Tail OK OK OK OK OK FailedPin 6 Control Small Flex Tail OK OK OK OK OK FailedPin 7 Control Small Flex Tail OK OK OK OK OK FailedPin 8 Control Small Flex Tail OK OK OK OK OK Failed
*Test was run unpowered
ESD Pule = IEC Contact Discharge
Pulse contact to connector
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Capacitance Touch Display -Powered On (Very Preliminary data)
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ControlPoint Zapped Prezap 2K 4K 6K 8K 10K 12K 15K 20K 25K 30KTop Left OK OK OK OK OK OK OK OK NM NM NMTop Right OK OK OK OK OK OK OK OK NM NM NMClose to Flex OK OK OK NO* OK OK OK NO NM NM NMCenter OK OK OK OK OK OK OK NM NM NM NMLower Left OK OK OK OK OK OK OK NM NM NM NMLower Right OK OK OK OK OK OK OK NM NM NM NM
VSDMPoint Zapped Prezap 2K 4K 6K 8K 10K 12K 15K 20K 25K 30KTop Left OK OK OK OK OK OK OK OK OK** OK* OK**Top Right OK OK OK OK OK OK OK OK OK OK* OK*Close to Flex OK OK OK OK* OK OK* OK* OK** OK OK* OK**Center OK OK OK OK OK OK OK OK OK OK OK*Lower Left OK OK OK OK OK OK OK OK OK OK OK*Lower Right OK OK OK OK OK OK OK OK OK* OK NM
IEC Air Discharge
IEC Air Discharge
No protection in interface boardTest was run powered
Yellow = soft failures
Likely due to pulseGetting in to interfaceboard
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Rigid Flex Test Vehicle
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Cu 12 umVSDM 25 um
Acrylic Adhesive 25 um
PI 25 umCu 12 um
Flex Region Stack up
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Preliminary Reliability Test Results
Flex Testing- Bending Diameter, R=8.6mm (R=L/2 π)- Bending degree: ~90°- Multimeter is used to detect the continuity after bending test.- Conclusions:
- Flex board with Embedded VSDM can survive greater than 1000 cycles.- Traces on VSDM side of copper (ED) may fail easier than non-VSDM side
of copper (RA).- Better performance can likely be achieved using VSDM coated onto RA
copper
Solder Reflow Testing- Lead Free Solder Reflow Profile (260C peak, >10sec above 255C)- Passes >8 cycles
Electrical Testing- Switching and electrical properties are comparable to results expected
from rigid PCB
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Conclusions
Shocking Technologies embedded XStaticmaterial improves ESD performance- VSD™ can have significantly better performance
than discrete devices - Implemented globally for higher reliability- Protect active and passive components- Predictable ESD performance from system level
ESD modelingRigid PCB Product in production Flex Application Commercialization 2013
- Improved ESD performance demonstrated on Touch panel display