varius-tc: a modular architecture- level model of...
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LTAI
VARIUS-TC: A Modular Architecture-Level Model of Parametric Variation
for Thin-Channel Switches
S. Karen Khatamifard, Michael Resch, Nam Sung Kim†, Ulya R. Karpuzcu
University of Minnesota †University of Illinois
{khata006, resc0059, ukarpuzc}@umn.edu [email protected]
10/5/2016
ICCD’16
• Manufacturing process becomes less controllable under aggressive scaling.
Motivation
2VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• Manufacturing process becomes less controllable under aggressive scaling.Deviation of device parameters from nominal becomes more likely.
Motivation
2VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• Manufacturing process becomes less controllable under aggressive scaling.Deviation of device parameters from nominal becomes more likely.
Performance and power of manufactured hardware become unpredictable.
Motivation
2VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• Manufacturing process becomes less controllable under aggressive scaling.Deviation of device parameters from nominal becomes more likely.
Performance and power of manufactured hardware become unpredictable.
We need system-level models of variation at early stages of the design.
Motivation
2VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• Manufacturing process becomes less controllable under aggressive scaling.Deviation of device parameters from nominal becomes more likely.
Performance and power of manufactured hardware become unpredictable.
We need system-level models of variation at early stages of the design.
• Contribution: VARIUS-TC
Motivation
2VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• Manufacturing process becomes less controllable under aggressive scaling.Deviation of device parameters from nominal becomes more likely.
Performance and power of manufactured hardware become unpredictable.
We need system-level models of variation at early stages of the design.
• Contribution: VARIUS-TCModeling process variation in emerging devices at architecture-level.
Motivation
2VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
Thin Channel (TC) devices
3VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
[K. Ahmed, and K. Schuegraf. "Transistor wars." IEEE Spectrum48.11 (2011): 50-66.].
ICCD’16
Thin Channel (TC) devices
3VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
[K. Ahmed, and K. Schuegraf. "Transistor wars." IEEE Spectrum48.11 (2011): 50-66.].
Traditional Planar CMOS
ICCD’16
Thin Channel (TC) devices
3VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
[K. Ahmed, and K. Schuegraf. "Transistor wars." IEEE Spectrum48.11 (2011): 50-66.].
Channel Thickness
Traditional Planar CMOS
ICCD’16
Thin Channel (TC) devices
3VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
[K. Ahmed, and K. Schuegraf. "Transistor wars." IEEE Spectrum48.11 (2011): 50-66.].
Channel Thickness
Traditional Planar CMOS SOI
ICCD’16
Thin Channel (TC) devices
3VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
[K. Ahmed, and K. Schuegraf. "Transistor wars." IEEE Spectrum48.11 (2011): 50-66.].
Channel Thickness
Traditional Planar CMOS SOI
ICCD’16
Thin Channel (TC) devices
3VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
[K. Ahmed, and K. Schuegraf. "Transistor wars." IEEE Spectrum48.11 (2011): 50-66.].
Channel Thickness
Traditional Planar CMOS SOI
ICCD’16
Thin Channel (TC) devices
3VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
[K. Ahmed, and K. Schuegraf. "Transistor wars." IEEE Spectrum48.11 (2011): 50-66.].
Channel Thickness
Traditional Planar CMOS SOI FinFET
ICCD’16
Thin Channel (TC) devices
3VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
[K. Ahmed, and K. Schuegraf. "Transistor wars." IEEE Spectrum48.11 (2011): 50-66.].
Channel Thickness
Traditional Planar CMOS SOI FinFET
ICCD’16
Thin Channel (TC) devices
3VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
[K. Ahmed, and K. Schuegraf. "Transistor wars." IEEE Spectrum48.11 (2011): 50-66.].
Channel Thickness
Traditional Planar CMOS SOI FinFET
ICCD’16
VARIUS-TC: Overview
4VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
VARIUS-TC: Overview
4VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
VARIUS-TC
ICCD’16
VARIUS-TC: Overview
4VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
VARIUS-TCLUT
DEVICE
MODULE
ICCD’16
VARIUS-TC: Overview
4VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
VARIUS-TCLUT
DEVICE
MODULE
CIRCUIT
MODULE
ICCD’16
VARIUS-TC: Overview
4VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
VARIUS-TCLUT
DEVICE
MODULE
CIRCUIT
MODULE
ARCHITECTURE
MODULE
1/f
1 / 𝐟𝐍𝐎𝐌
Path delay distribution
ICCD’16
VARIUS-TC: Overview
4VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
VARIUS-TCfloorplan
LUT
DEVICE
MODULE
CIRCUIT
MODULE
ARCHITECTURE
MODULE
1/f
1 / 𝐟𝐍𝐎𝐌
Path delay distribution
ICCD’16
VARIUS-TC: Overview
4VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
VARIUS-TCfloorplan
LUT
DEVICE
MODULE
CIRCUIT
MODULE
ARCHITECTURE
MODULE
1/f
1 / 𝐟𝐍𝐎𝐌
Path delay distribution
device parameters
ICCD’16
VARIUS-TC: Overview
4VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
VARIUS-TCfloorplan
LUT
DEVICE
MODULE
CIRCUIT
MODULE
ARCHITECTURE
MODULE
1/f
1 / 𝐟𝐍𝐎𝐌
Path delay distribution
device parameters
1/f
𝟏
𝐟𝐍𝐎𝐌
𝟏
𝐟𝐕𝐀𝐑
Path delay distribution
ICCD’16
VARIUS-TC: Overview
4VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
VARIUS-TCfloorplan
LUT
DEVICE
MODULE
CIRCUIT
MODULE
ARCHITECTURE
MODULE
1/f
1 / 𝐟𝐍𝐎𝐌
Path delay distribution
device parameters
1/f
𝟏
𝐟𝐍𝐎𝐌
𝟏
𝐟𝐕𝐀𝐑
Path delay distribution
# Memory Blocks
VMIN
ICCD’16
VARIUS-TC: Overview
4VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
VARIUS-TCfloorplan
LUT
DEVICE
MODULE
CIRCUIT
MODULE
ARCHITECTURE
MODULE
1/f
1 / 𝐟𝐍𝐎𝐌
Path delay distribution
device parameters
1/f
𝟏
𝐟𝐍𝐎𝐌
𝟏
𝐟𝐕𝐀𝐑
Path delay distribution
# Memory Blocks
VMIN
ICCD’16
Hierarchical Variation Modeling
5VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Systematic variation
ICCD’16
Hierarchical Variation Modeling
5VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Systematic variation
• Spatial correlation
ICCD’16
Hierarchical Variation Modeling
5VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Systematic variation
• Spatial correlation
ICCD’16
Hierarchical Variation Modeling
5VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Systematic variation
• Spatial correlation
ICCD’16
Hierarchical Variation Modeling
5VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Systematic variation
• Spatial correlation• Grid granularity
ICCD’16
Hierarchical Variation Modeling
5VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Systematic variation
• Spatial correlation• Grid granularity
Random variation
• Independent• Device granularity
+
ICCD’16
VARIUS-TC: Overview
6VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
VARIUS-TCfloorplan
LUT
DEVICE
MODULE
CIRCUIT
MODULE
ARCHITECTURE
MODULE
1/f
1 / 𝐟𝐍𝐎𝐌
Path delay distribution
device parameters
1/f
𝟏
𝐟𝐍𝐎𝐌
𝟏
𝐟𝐕𝐀𝐑
Path delay distribution
# Memory Blocks
VMIN
ICCD’16
Look-Up Table
7VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
LUTOutput
Look-Up Table
7VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
VoltagesTechnology Parameters
Temperature Current
Input
ICCD’16
LUTOutput
Look-Up Table
7VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
VoltagesTechnology Parameters
Temperature Current
Input
ICCD’16
LUTOutput
Look-Up Table
7VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Voltages
VoltagesTechnology Parameters
Temperature Current
Input
ICCD’16
LUTOutput
Look-Up Table
7VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Temperature
Voltages
VoltagesTechnology Parameters
Temperature Current
Input
ICCD’16
LUTOutput
Look-Up Table
7VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Temperature
Technology Parameters
Voltages
VoltagesTechnology Parameters
Temperature Current
Input
ICCD’16
LUTOutput
Look-Up Table
7VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Temperature
Technology Parameters
Voltages
VoltagesTechnology Parameters
Temperature Current
Input
ICCD’16
LUT
Look-Up Table
7VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Temperature
Technology Parameters
Voltages
Current
VoltagesTechnology Parameters
Temperature Current
Input Output
ICCD’16
LUT
• LUT vs. closed-form formula:
Look-Up Table
7VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Temperature
Technology Parameters
Voltages
Current
VoltagesTechnology Parameters
Temperature Current
Input Output
ICCD’16
LUT
• LUT vs. closed-form formula:• Modularity eases experimentation with different designs (e.g., SOI variants)
Look-Up Table
7VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Temperature
Technology Parameters
Voltages
Current
VoltagesTechnology Parameters
Temperature Current
Input Output
ICCD’16
LUT
• LUT vs. closed-form formula:• Modularity eases experimentation with different designs (e.g., SOI variants)
• Robust closed-form formula may not always be available for emerging switches
Look-Up Table
7VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Temperature
Technology Parameters
Voltages
Current
VoltagesTechnology Parameters
Temperature Current
Input Output
ICCD’16
VARIUS-TC: Overview
8VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
VARIUS-TCfloorplan
LUT
DEVICE
MODULE
CIRCUIT
MODULE
ARCHITECTURE
MODULE
1/f
1 / 𝐟𝐍𝐎𝐌
Path delay distribution
device parameters
1/f
𝟏
𝐟𝐍𝐎𝐌
𝟏
𝐟𝐕𝐀𝐑
Path delay distribution
# Memory Blocks
VMIN
ICCD’16
Logic Timing Model
9VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
pd
f
τ
Logic Timing Model
9VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
pd
f
τ
Probability of a path with τ= τi being exercised
Logic Timing Model
9VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
τi
ICCD’16
pd
f
τ
Logic Timing Model
9VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
pd
f
τ
Logic Timing Model
9VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
τNOM
ICCD’16
pd
f
τ
Logic Timing Model
9VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
τNOM
ICCD’16
pd
f
τ
Logic Timing Model
9VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
τMINτNOM
ICCD’16
pd
f
τ
Logic Timing Model
9VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
τMINτNOM
Safe operating point
ICCD’16
pd
f
τ
Logic Timing Model
9VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
τMINτNOM
Safe operating point
fMAX=1/τMIN
ICCD’16
pd
f
τ
Logic Timing Model
9VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
τMINτNOM
Safe operating point
fMAX=1/τMIN
ICCD’16
pd
f
τ
Logic Timing Model
9VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
τMINτNOM
Error probability if
clocked at τNOM
Safe operating point
fMAX=1/τMIN
ICCD’16
VARIUS-TC: Overview
10VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
VARIUS-TCfloorplan
LUT
DEVICE
MODULE
CIRCUIT
MODULE
ARCHITECTURE
MODULE
1/f
1 / 𝐟𝐍𝐎𝐌
Path delay distribution
device parameters
1/f
𝟏
𝐟𝐍𝐎𝐌
𝟏
𝐟𝐕𝐀𝐑
Path delay distribution
# Memory Blocks
VMIN
ICCD’16
Memory Model
11VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• Supports 6T and 8T memory cell
Memory Model
11VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• Supports 6T and 8T memory cell
• Timing errors• Write timing
• Read timing
Memory Model
11VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• Supports 6T and 8T memory cell
• Timing errors• Write timing
• Read timing
• Stability errors• Hold error
• Write Stability
Memory Model
11VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
Hold Error
12VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
Hold Error
12VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
Hold Error
12VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
Hold Error
12VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
• The cell is not accessed.
ICCD’16
Hold Error
12VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
• The cell is not accessed.
• Node VL looses its state.
ICCD’16
Hold Error
12VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
• The cell is not accessed.
• Node VL looses its state.• Excessive leakage
ICCD’16
Hold Error
12VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
• The cell is not accessed.
• Node VL looses its state.• Excessive leakage
VARIUS-TC
• Minimum Vdd (VMIN) to exclude state loss
ICCD’16
Evaluation Setup
13VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
Evaluation Setup
13VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
• Device parameters• PTM, FinFET, 16nm
ICCD’16
Evaluation Setup
13VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
• Device parameters• PTM, FinFET, 16nm
• Parametric sweep• LFin, TFin, φg
ICCD’16
Evaluation Setup
13VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
• Device parameters• PTM, FinFET, 16nm
• Parametric sweep• LFin, TFin, φg
• 3 levels of variation• low, medium, high
ICCD’16
Evaluation Setup
13VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
• Device parameters• PTM, FinFET, 16nm
• Parametric sweep• LFin, TFin, φg
• 3 levels of variation• low, medium, high
• Many-core system• 16 tiles
ICCD’16
Evaluation Setup
13VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
• Device parameters• PTM, FinFET, 16nm
• Parametric sweep• LFin, TFin, φg
• 3 levels of variation• low, medium, high
• Many-core system• 16 tiles
• 4 core per tile
• Private L1, Shared L2
ICCD’16
Impact on Logic Timing
14VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
Impact on Logic Timing
14VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Planar CMOS
ICCD’16
Impact on Logic Timing
14VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
FinFET
Planar CMOS
ICCD’16
Impact on Logic Timing
14VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
Impact on Logic Timing
14VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
Impact on Logic Timing
14VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
more variation
ICCD’16
Impact on Logic Timing
14VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
more variation
PV can still cause significant performance loss.
ICCD’16
Impact on VMIN
15VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
Impact on VMIN
15VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
Impact on VMIN
15VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
more variation
ICCD’16
Impact on VMIN
15VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
more variation
ICCD’16
Impact on VMIN
15VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
more variation
PV can still increase the minimum operating voltage significantly.
ICCD’16
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• Reducing operating voltage reduces power consumption.
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• Reducing operating voltage reduces power consumption. Frequency reduces, too.
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• Reducing operating voltage reduces power consumption. Frequency reduces, too.
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Throughput ∝ Ncores × fcores
ICCD’16
• Reducing operating voltage reduces power consumption. Frequency reduces, too.
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Throughput ∝ Ncores × fcores
ICCD’16
• Reducing operating voltage reduces power consumption. Frequency reduces, too.
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Throughput ∝ Ncores × fcores
ICCD’16
• Reducing operating voltage reduces power consumption. Frequency reduces, too.
• Process Variation …
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Throughput ∝ Ncores × fcores
ICCD’16
• Reducing operating voltage reduces power consumption. Frequency reduces, too.
• Process Variation …
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Throughput ∝ Ncores × fcores
ICCD’16
• Reducing operating voltage reduces power consumption. Frequency reduces, too.
• Process Variation …
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Throughput ∝ Ncores × fcores
ICCD’16
• Reducing operating voltage reduces power consumption. Frequency reduces, too.
• Process Variation …
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Throughput ∝ Ncores × fcores
VNOM
ICCD’16
• Reducing operating voltage reduces power consumption. Frequency reduces, too.
• Process Variation …
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Throughput ∝ Ncores × fcores
VNOM
VMIN
ICCD’16
• Reducing operating voltage reduces power consumption. Frequency reduces, too.
• Process Variation …
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Throughput ∝ Ncores × fcores
ICCD’16
• Reducing operating voltage reduces power consumption. Frequency reduces, too.
• Process Variation …
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Throughput ∝ Ncores × fcores
ICCD’16
• Reducing operating voltage reduces power consumption. Frequency reduces, too.
• Process Variation …• If > 2x area increase is not
affordable…
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Throughput ∝ Ncores × fcores
ICCD’16
• Reducing operating voltage reduces power consumption. Frequency reduces, too.
• Process Variation …• If > 2x area increase is not
affordable…
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Throughput ∝ Ncores × fcores
0.5V
ICCD’16
• Reducing operating voltage reduces power consumption. Frequency reduces, too.
• Process Variation …• If > 2x area increase is not
affordable…
Example Use Case
16VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
Throughput ∝ Ncores × fcores
0.5V 0.6V
ICCD’16
Related Work
17VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-NTV is tailored for planar CMOS only.
Related Work
17VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-NTV is tailored for planar CMOS only.
• FinCANON and McPAT-PVT are architecture-level FinFET-based models.
Related Work
17VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-NTV is tailored for planar CMOS only.
• FinCANON and McPAT-PVT are architecture-level FinFET-based models.• Modular
Related Work
17VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-NTV is tailored for planar CMOS only.
• FinCANON and McPAT-PVT are architecture-level FinFET-based models.• Modular
• TCAD-based device-level simulations
Related Work
17VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-NTV is tailored for planar CMOS only.
• FinCANON and McPAT-PVT are architecture-level FinFET-based models.• Modular
• TCAD-based device-level simulations
• VARIUS-TC’s strength
Related Work
17VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-NTV is tailored for planar CMOS only.
• FinCANON and McPAT-PVT are architecture-level FinFET-based models.• Modular
• TCAD-based device-level simulations
• VARIUS-TC’s strength• Probabilistic model to analyze processor logic and error modes of memory
Related Work
17VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
Conclusion
18VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-TC
Conclusion
18VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-TC• Models process variation in emerging devices at architecture-level.
Conclusion
18VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-TC• Models process variation in emerging devices at architecture-level.
• VARIUS-TC facilities
Conclusion
18VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-TC• Models process variation in emerging devices at architecture-level.
• VARIUS-TC facilities• Extraction of a safe operating frequency and voltage
Conclusion
18VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-TC• Models process variation in emerging devices at architecture-level.
• VARIUS-TC facilities• Extraction of a safe operating frequency and voltage
• Generation of critical path delay, power, and VMIN distributions
Conclusion
18VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-TC• Models process variation in emerging devices at architecture-level.
• VARIUS-TC facilities• Extraction of a safe operating frequency and voltage
• Generation of critical path delay, power, and VMIN distributions
• Calculation of error probabilities for
Conclusion
18VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-TC• Models process variation in emerging devices at architecture-level.
• VARIUS-TC facilities• Extraction of a safe operating frequency and voltage
• Generation of critical path delay, power, and VMIN distributions
• Calculation of error probabilities for
• logic (timing)
Conclusion
18VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-TC• Models process variation in emerging devices at architecture-level.
• VARIUS-TC facilities• Extraction of a safe operating frequency and voltage
• Generation of critical path delay, power, and VMIN distributions
• Calculation of error probabilities for
• logic (timing)
• memory (timing and stability) error modes
Conclusion
18VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-TC• Models process variation in emerging devices at architecture-level.
• VARIUS-TC facilities• Extraction of a safe operating frequency and voltage
• Generation of critical path delay, power, and VMIN distributions
• Calculation of error probabilities for
• logic (timing)
• memory (timing and stability) error modes
• Design space exploration
Conclusion
18VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
ICCD’16
• VARIUS-TC• Models process variation in emerging devices at architecture-level.
• VARIUS-TC facilities• Extraction of a safe operating frequency and voltage
• Generation of critical path delay, power, and VMIN distributions
• Calculation of error probabilities for
• logic (timing)
• memory (timing and stability) error modes
• Design space exploration
• Modularity eases experimentation with different designs (e.g., SOI variants)
Conclusion
18VARIUS-TC: A Modular Architecture-Level Model of
Parametric Variation for Thin-Channel Switches10/5/2016
LTAI
VARIUS-TC: A Modular Architecture-Level Model of Parametric Variation
for Thin-Channel Switches
S. Karen Khatamifard, Michael Resch, Nam Sung Kim†, Ulya R. Karpuzcu
University of Minnesota †University of Illinois
{khatami, resc0059, ukarpuzc}@umn.edu {nskim}@illinois.edu
10/5/2016
http://altai.ece.umn.edu/varius