value added applications for optech sensors

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Engineering | Architecture | Design-Build | Surveying | Planning | GeoSpatial Solutions Optech ILSC June 26, 2013 GEOSPATIAL SOLUTIONS Value-added Applications for Optech Sensors

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Josh Nimetz, Merrick's LiDAR / Imaging Technical Lead gave the following presentation at the Optech Imaging and LiDAR Solutions Conference (ILSC) in Toronto, Ontario on June 26, 2013.

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Page 1: Value Added Applications for Optech Sensors

Engineering | Architecture | Design-Build | Surveying | Planning | GeoSpatial Solutions

Optech ILSCJune 26, 2013

GEOSPATIAL SOLUTIONS

Value-added Applications for Optech Sensors

Page 2: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Summary of Merrick & Company GeoSpatial Market Sector Team

A brief background on the data - the 2011 NERC alert mandate

The Merrick suite of remote sensors optimized for data collection of electric transmission facilities

The MARS® tools designed for production and analyses of transmission facilities data Power line detection and QA/QC tools

Power line LiDAR QC report - report on LAS statistics (by Tile)

Optimum image selection tool

Presentation Overview

Page 3: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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500 employees at 12 National and 4 International offices

Merrick & Company Office Locations

Page 4: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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LiDAR acquisition & processing (airborne)

High Definition Scanning (terrestrial)

Photogrammetric mapping

Imagery acquisition & processing RGB

Multispectral

Hyperspectral

Thermal

Orthophoto processing

Multi-sensor data fusion

Satellite imagery

MARS® software

Application development

Programming

MARS® LiDAR processing software

Unlimited Detail Data Visualization and Management - Euclideon Geoverse

Surveying

UAS mapping

GeoSpatial Solutions & Capabilities

Page 5: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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BU Leader Brian Raber, CMS, GISP, GISS – Vice PresidentDisciplines Photogrammetry, LiDAR, Satellite Imagery, GIS Solutions, Remote 

Sensing, Software Development & SalesKey Offices Greenwood Village, CO

Colorado Springs, CO Guadalajara and Mexico City Albuquerque, NM

Markets($18.7 millionSales – FY2013 ending 04/13)

Local Government (11%)  Federal Government (9%)  Private (2%) Water (4%) Energy (40%) International: (34%) 

Core Clients TVA, USGS, FEMA, TNRIS  Xcel, Tri‐State, WAPA, Idaho Power, PNM SEMAR, INEGI CFE, PEMEX

Cook County, IL., Tallahassee, FL  NRCS Nebraska / Oklahoma USACE Mobile, Omaha Districts HDR,URS

Number of Professionals: 56

GeoSpatial Solutions Market Sector Team Facts

Page 6: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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National Electric Reliability Corporation (NERC), entity empowered by the U.S. Federal Energy Regulatory Commission (FERC).

Image courtesy of Argonne National Labs

National Electric Reliability Corporation (NERC)

Page 7: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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NERC Mandate - April 2011

Image courtesy of http://www.technet.pnnl.gov/sensors/electronics/projects/images/electronics477_large.jpg

Electric power transmission owners survey actual field conditions to determineelectric power transmission facilities (> 100 kV) are built as designed and to ensure compliance with reliability standards.

Page 8: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Electric power transmission owners survey actual field conditions to determineelectric power transmission facilities (> 100 kV) are built as designed and to ensure compliance with reliability standards.

NERC Mandate - April 2011

Image courtesy Wikipedia

Toronto, on evening of August 14, 2003 blackout

Page 9: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Why LiDAR Technology?

Repeatable, accurate, and dependable technology

Cost effective for system/large circuits

Technology very good at collecting and measuring transmission features: structures, insulators, attachment points, vegetation, and ground

Page 10: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Typical LiDAR densities for electric power line collection range from 20-30+ points per square meter

In general, the more density the better for feature collection, definition, and extraction

Page 11: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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2010 - Merrick integrates a suite of sensors onboard a helicopter platform

Designed to fulfill the aerial mapping needs of our electric transmission clients

Merrick’s Helicopter Suite of Sensors

Page 12: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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A TAC 60 MP nadir camera (for visible color orthos)

(2) CS-4800 interline CCD cameras, forward oblique

Merrick’s Helicopter Suite of Sensors

Orion C200 LiDAR system

CS-MS1920 false color infrared interline transfer CCD (810, 550, 670 nm)

Page 13: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Merrick’s Helicopter Suite of Sensors

AIMMS 20 meteorological sensor Cloud Cap gimbaled video camera

Page 14: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Merrick’s Helicopter Suite of Sensors

Page 15: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Data visualization, management & processing application Developed specifically for LiDAR data in 2002

Merrick’s Production Engine for processing LiDAR data

MARS® license and technical support included with project

Merrick’s Advanced Remote Sensing (MARS®) software

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Copyright © 2013 Merrick & Company - All rights reserved.

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Application Highlights Stand-alone software application, no third party software required

No file size limitation

Rapid response to customized programming needs Allows multi-core data processing to maximize performance of PC

hardware

Provides support for WMS imagery (ex. Bing Maps)

Visualize & process airborne, terrestrial & mobile LiDAR datasets

Natively supports LiDAR (LAS v1.1 – v1.4, imagery (RGB & hyperspectral, thermal) and GIS vector datasets – Data Fusion

Robust QC Module for USGS specifications

Merrick’s Advanced Remote Sensing Software (MARS®)

Page 17: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Merrick MARS® software for electric transmission facilities data post-processing.

Power line detection and QA/QC tools Power line LiDAR QC report - report on LAS statistics (by

Tile) Optimum image selection tool

Page 18: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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MARS® Power Line Tool

For the point cloud classification of transmission facilities and QA / QC of classification results.

Page 19: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Workflow

Begin with centerline file and bare earth points to seed the process

Test filter settings in localized area. Once optimized…

Line / facilities detection filter over larger region

QA / QC windows are launched for manual clean-up

Attachment points are classified

For the point cloud classification of transmission facilities and QA / QC of classification results.

MARS® Power Line Tool

Page 20: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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For the point cloud classification of transmission facilities and QA / QC of classification results.

MARS® Power Line Tool

Page 21: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Primary MARS® data window QA / QC tower side view QA / QC tower front view

QA / QC tower nadir view QA / QC structure to structure span view

QA / QC Viewer

MARS® Power Line Tool

Page 22: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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QA / QC Viewer Each window is dynamic

Points can be filtered and view extents, scale and rotation can be changed

MARS® Power Line Tool

Page 23: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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MARS® Power Line QC report - Report on LAS Statistics (by Tile)

Page 24: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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MARS® Power Line QC report - Report on LAS Statistics (by Tile)

Black line items: Points exist on a required class. We expect to have points on this class.

Teal line items: Points do not exist on a required class. This flags a potential issue. Classification of the transmission facilities is incomplete.

Red line items: Points exist on a non-required class.Another potential issue. This may be okay for outlier or erroneous points.

Page 25: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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MARS® Optimum Image Selection Tool

Page 26: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Begin with a calibrated camera model

Create an exterior orientation file with position and attitude for each image exposure station

Project the image footprint on to a surface Surface must be in same coordinate

system / units as LiDAR bare earth

In Optimum Image Selection Tool Image with shortest slant-range to given

horizontal coordinate (E, N) is selected

Image ID is either written to point shapefile attribute table or called up in viewer window

MARS® Optimum Image Selection Tool

Page 27: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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MARS® Optimum Image Selection Tool

Page 28: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Calibrated exterior orientation file for aft oblique camera.

MARS® Optimum Image Selection Tool

Page 29: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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MARS® Optimum Image Selection Tool

Page 30: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Projected aft oblique image footprints in OrthoMaster.

MARS® Optimum Image Selection Tool

Page 31: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Projected aft oblique image footprints cleaned up for export. Note the images captured during the turn have been omitted

MARS® Optimum Image Selection Tool

Page 32: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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An image footprint file

MARS® Optimum Image Selection Tool

Page 33: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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MARS® Optimum Image Selection Tool

Page 34: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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An output transmission tower shapefile attributed with the optimum oblique image pair

The optimum oblique image captures the structure with the highest resolution possible (i.e. nearest to the heel of the oblique)

MARS® Optimum Image Selection Tool

Page 35: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Page 38: Value Added Applications for Optech Sensors

Copyright © 2013 Merrick & Company - All rights reserved.

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Thank you….any questions?

Josh Nimetz, CMSMerrick & Company

303-353-3650

[email protected]

For MARS® sales and technical support, contact:

Mark Stucky, GISPMerrick & Company

303-353-3662

[email protected]

www.merrick.com