utilizing current test strategies to drive diagnostics ......•multiple design teams, multiple...
TRANSCRIPT
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Utilizing current test strategies to drive diagnostics development, deployment and
support through software tools
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NDIA October 2006
Answer on a student’s Geometry test
So Why Is it So Hard To Understand or Do we Just Make It Hard?
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NDIA October 2006
Using The Learning Organization Process to Improve
External/Internal Disturbances
Understanding
Behavior
Data
Physics
Act
Analyze
Measure
Predict
Decide
LearnKnowledge
Results
Object of Interest
TheoryExperiment
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NDIA October 2006
So Why Do We Test…….
- To Measure the Health of the Process- To Reduce Risk of Variability
- To Identify ProblemsRisk
Design ManufacturingValidation Support
Verify Design
Ship Product that Works
Warranty Cost
Meet Spec
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NDIA October 2006
The Problem
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NDIA October 2006
How Much is Really at Risk ?
75%
80%
85%
90%
95%
100%
0.0% 2.0% 4.0% 6.0% 8.0% 10.0% 12.0% 14.0%
Shipped Defect Rate Exposure
Yiel
d at
Tes
t Sta
ge
50% Coverage 60% Coverage 70% Coverage80% Coverage 90% coverage
1.0%
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NDIA October 2006
EffectivenessEffectiveness Effectiveness
Faul
t Sp
ectr
um
Typical Test Strategy
Characteristics:Broad coverage at each testHigh level of redundant testLeakage of early defects caught later by testFault coverage is unpredictable
SubAssy
Top Level Assy
Ship
Repair
TestSMT
Repair Repair
Test Test
Faul
t Sp
ectr
um
Faul
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um
Effectiveness
Faul
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NDIA October 2006
Process Test Coverage Redundancy
• Insufficient• Excess• Cold Solder• Marginal Joints• Voids
• Shorts• Open
• Missing• Gross Shorts• Lifted Leads• Bent Leads•Excess•Bridging
•Tombstone•Misalignment
•Polarity, Extra Part,•Non-Elec. parts•Bypass Caps, L’s•Lifted Power/Gnd
• Inverted•Polarity
• Dead Part• Wrong Part• Bad Part• Short/Open on PCB• Functionally Bad
Solder
Correctness
Electrical
AOI
ICT X-Ray
Functional
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NDIA October 2006
Functional
5.5%Unique Coverage3.9% (FA)
Correctness
AOI
5.0% Unique Coverage2.8% (FA)
Solder 66.6%Unique Coverage33.5% (FA)
X-Ray
~10% NOT COVERED
Example Design CoverageICT → AXI → AOI → Functional
Electrical12.2%Unique Coverage51.1% (FA)
ICT
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NDIA October 2006
ICT
Electrical
0.9% UniqueCoverage2.9% (FA)
Solder X-Ray44.0%Unique Coverage
Correctness AOI
3.2% Unique Coverage
~10% NOT COVERED
Example of CoverageFunctional → AXI → AOI → ICT
Functional41.2% Unique Coverage
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NDIA October 2006
What is Needed
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NDIA October 2006
Coverage Mapping and What We Know
Process Test Coverage (Static) -Functional Coverage (Dynamic) -
A
B
C
Input
Fail
Pass
Pass
X +/- %
Y +/- %
Z +/- %
Output
C1
T1
IC3HY1
IC1 T1
C1
IC2
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NDIA October 2006
X +/- %
Y +/- %
Z +/- %
Output
C1
T1 IC2
IC3HY1
IC1 T1
C1
Process Test Coverage (Static) -Functional Coverage (Dynamic) -
A
B
C
Input
Fail
Pass
Pass
Coverage Mapping and What We May Know
??
?? ??
??
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NDIA October 2006
Process Test Coverage (Static) -Functional Coverage (Dynamic) -
A
B
C
Input
X +/- %
Y +/- %
Z +/- %
OutputT1 IC2IC1
IC3HY1
Fail
Pass
Pass
80%
20%
Coverage Mapping and What We Want to Know
C1
Possible NTF
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NDIA October 2006
The Answer
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NDIA October 2006
Desired Production Test Process
Characteristics:Test in right placeMinimize redundant testEffectively catch defects at originFault coverage is predictable
SubAssy
Top Level Assy
Ship
Repair
TestSMT
Repair Repair
Test Test
EffectivenessEffectiveness
Effectiveness
Faul
t Sp
ectr
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Faul
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Faul
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Effectiveness
Faul
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NDIA October 2006
What is Needed For Effective Test Strategies•A common Framework for describing Test Strategies.•Standardized documentation for test.•Metrics to make test tradeoffs between test strategies (AXI, AOI, ICT, Functional, etc) for gaps and overlaps.•Ability to simulate a Test Strategy as the product is being developed to feedback DFX input.•A consistent, repeatable process throughout the product life cycle.
What is not needed is…….•An automated way to develop test plans•A tool to eliminate the need for test developers
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NDIA October 2006
HIGH98%HIGH98%HIGH98%HIGH98%HIGH98%4Analog LIBMED90%MED90%MED90%MED90%HIGH90%4Other LIBHIGH100%HIGH100%HIGH100%HIGH100%HIGH100%28Other LIBLOW82%LOW82%LOW82%POOR81%HIGH81%6Other LIBLOW88%MED91%LOW88%LOW88%HIGH88%5Analog LIBHIGH98%HIGH98%HIGH98%HIGH98%HIGH98%24Other LIBHIGH98%HIGH98%HIGH98%HIGH98%HIGH98%6Mixed LIBHIGH98%HIGH98%HIGH98%HIGH98%HIGH98%6Digital LIBHIGH100%HIGH100%HIGH100%HIGH100%HIGH100%4Other LIBHIGH98%HIGH98%HIGH98%HIGH98%HIGH98%28Other LIBMED95%MED95%MED95%MED95%HIGH95%4Other LIBLOW83%LOW83%LOW83%LOW83%HIGH83%6Mixed LIBLOW82%LOW82%LOW82%POOR76%LOW38%80Other LIBHIGH95%HIGH95%LOW82%POOR76%NO0%6Digital LIBHIGH95%HIGH95%LOW82%POOR76%NO0%6Digital LIBLOW82%HIGH95%LOW82%POOR76%NO0%6Digital LIBHIGH95%HIGH95%LOW83%LOW83%HIGH83%8Digital LIBMED95%MED95%MED95%MED95%HIGH95%24Other LIBHIGH100%HIGH100%LOW86%LOW86%HIGH86%48Digital LIBHIGH98%HIGH98%HIGH98%HIGH98%HIGH98%6Other LIBMED95%MED95%MED95%MED95%HIGH95%28Mixed LIBLOW83%LOW82%LOW83%POOR79%NO0%1Single PinLOW82%LOW82%LOW82%POOR76%NO0%5Other LIBLOW82%LOW82%LOW82%POOR76%NO0%2ConnectorHIGH100%HIGH100%HIGH100%HIGH100%HIGH100%10Other LIBMED93%MED93%MED93%MED93%HIGH93%6Analog LIBMED95%MED95%MED95%MED95%HIGH95%5Analog LIBHIGH100%HIGH100%HIGH100%HIGH100%HIGH100%2ResistorHIGH98%HIGH98%HIGH98%HIGH98%HIGH98%2ResistorLOW83%MED94%LOW83%POOR79%NO0%2ResistorLOW83%MED94%LOW83%POOR79%NO0%2ResistorMED95%MED95%MED95%MED95%HIGH95%2ResistorMED94%MED94%LOW83%POOR79%NO0%2Resistor
GradeScoreGradeScoreGradeScoreGradeScoreGradeScorePinsType
FT+AXI+AOI+ICTCurrent Access
FT+AXI+AOI+ICTFull Access
FT + AXI + AOIFT + AXIFunctionalCoverage
Component
Sample of Product Coverage Mapping
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NDIA October 2006
Test Optimization Software: Knowledge Transfer
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NDIA October 2006
•Multiple design teams, multiple locations, using common design rules, common design tools for uniform test strategies.
•Transfer product designs, processes, test and repair knowledge in a predictable, repeatable manner to anyone anywhere.
•Model, simulate and predict test performance, quality, and cost drivers.
•Deliver manufacturing specifications without flying engineers everywhere.
•Have a common language for communicating product/process functionality.
•Consistent repair and diagnostic process with no variability, any time, any where and by anybody.
Elements for a true Product Life Cycle Test Strategy
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NDIA October 2006
Example of Change
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NDIA October 2006
Using The Learning Organization Process to Improve
Act
Decide
Knowledge
External/Internal Disturbances
Learn
Effectiveness
Faul
t Sp
ectr
um
Effectiveness
Faul
t Spe
ctru
m
HIGH98%HIGH98%HIGH100%HIGH100%LOW82%POOR76%LOW82%POOR76%MED90%MED90%LOW82%POOR76%LOW82%POOR76%
Measure
Analyze
Understanding
Predict
X-Ray ICT
AOI Func
Object of Interest
FailPass
Pass
?? ??
????
Behavior
Results
80%
20%
FailPass
Pass
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NDIA October 2006
Original Manufacturing Flow
Yield= 67% Yield= 86% Yield= 96%Yield= 0% Yield= 78%
Pristine Yield= 43%
DIAGNOSE
REPAIR
RE-T
EST
6Days
DIAGNOSE
REPAIR
RE-T
EST
30Mins
DIAGNOSE
REPAIR
RE-T
EST
1Day
DIAGNOSE
REPAIR
RE-T
EST
4Days
DIAGNOSE
REPAIR
RE-T
EST
2Days
DT
DT
Thru-HoleSMT MDAI I
SRU Assembly
Cells
SRU Cell Test
LRUAssembly
Cell
LRU CellTest
Final System Assembly and Configuration
Final Assembly
System TestShipESS
LRU CellTest
Repair Diagnostics
Repair Diagnostics Repair Diagnostics Repair DiagnosticsRepair Diagnostics
RepairRepair
Pristine Yield= 0%
0% 20% 40% 60% 80% 100%
Solder/Workmanship
Wrong/Bad Parts
Placement
Other
LRU
SRU
Distribution of Defects by Symptom
Complexity and Variability at Every Step
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NDIA October 2006
Redesigned Manufacturing Flow
Thru-HoleSMT MDA
SRU Assembly
Cells
SRU Cell Test
LRUAssembly
Cell
Final System Assembly and Configuration
Final Assembly
System TestShipESS
LRU CellTest
Repair DiagnosticsRepair Diagnostics
DT
XRAY
Repair Repair Diagnostics
DIAGNOSE
REPAIR
RE-T
EST
15Mins
DIAGNOSE
REPAIR
RE-T
EST
30Mins
DIAGNOSE
REPAIR
RE-T
EST
60Mins
DIAGNOSE
REPAIR
RE-T
EST
60Mins
Yield= 95% Yield= 98% Yield= 98%Yield= 80% Yield= 98%
Pristine Yield= 72%
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NDIA October 2006
What is the impact of Efficient Test and Effective Diagnostics?
Increase in quality and reduction in diagnostic and repair of products
$.67 Million
Increase productivity of production lines due to increased test capacity (20% * 200 units/yr * $20K/unit)
$.8 Million
Savings in elimination of new tests and testers at SRU (at $500K) and LRU (at $1,000K) test cells* (($500K * 4 + $1,000 * 4) * 25%)Reduction in total cycle time due to increased quality and re-alignment of processes ( 5days * $240day * 960 units/year )
$1.15 Million
$1.50 Million
5 year ROI
Financial Impact of Redesign Flow
$2.62 Million First Year
$16.3 Million
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NDIA October 2006
Conclusion
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NDIA October 2006
Leverage Points in the Product Life Cycle
80-90% of manufacturing cost determined before QUAL90% of achievable first pass yield determined by QUAL80% of potential profitability fixed at DEV80% of MTBR determined before DEV
DevelopmentConcept DefinitionInvestigation FirstProduction
Shipment SupportLifeHW Qualification
STRTSTRT DEFDEF DEVDEV QUALQUAL SHPSHP SUPSUP CLOCLO
SW Qualification
Current tools will allow you to leverage these advantages by:Eliminating Complexity and VariabilityEnsuring Efficient and Effective Test Strategies before releaseDeveloping Automated Diagnostics with little additional
resources during developmentUsing Test and Diagnostics as part of a learning organization
throughout the total product life cycle to leverage Results!!
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NDIA October 2006
Questions???