using image pro plus software to develop particle mapping on genesis solar wind collector surfaces
DESCRIPTION
Curatorial Facility clean collection. Curatorial Facility. UPW. UV - O 3. Particle Counts. USING IMAGE PRO PLUS SOFTWARE TO DEVELOP PARTICLE MAPPING ON GENESIS SOLAR WIND COLLECTOR SURFACES. Lab TRXRF. SEM. Yes. Clean ?. No. SEM. Wet cleaning. Lab TRXRF. SRTRXRF. TOF-SIMS. - PowerPoint PPT PresentationTRANSCRIPT
M.C. Rodriguez1, J.H. Allton2, and P.J. Burkett3 . 1 Geocontrol Systems- ESCG at NASA/Johnson Space Center, Houston, TX 77058; [email protected], 2 NASA/Johnson Space Center, Houston, TX 77058, 3
Jacobs- ESCG at NASA /Johnson Space Center, Houston, TX 77058.
This is an example of selecting an outline of the area of interest (AOI) of the collector surface. The Image Pro Plus software can
automatically select an outline of an area and assess the features within the AOI. Here, sample 60440 is shown after UPW cleaning at
JSC (left) and after later acid-etch.
This is an example of how the software uses color to separate and store information. In the image (60440 position 3) on the left, the blue features were observed after UPW cleaning at JSC, and the red are present after UPW+ acid-etch. In the image on the right, the features are separated by size
classes.
Wet cleaning
Curatorial Facility
UPW UV - O3
Lab TRXRF
SEM
SRTRXRF TOF-SIMS
Lab TRXRF
Particle Counts
SEM
Clean ?
Yes
No
Yes No
Clean ?
Curatorial Facility clean
collection
Size (µm)
Fig. 1. Sample 60440, after UPW and acid-etch. Each red box is approx. 1 mm2 in area.
Fig. 2. Position 1 on sample 60440, after UPW and acid-etch. Each tile is 222 x 160 µm.
Fig. 3. Position 3 on sample 60440, after UPW and acid-etch. Each tile is 222 x 160
µm.
Fig. 4. Position 2 on sample 60440, after UPW and acid-etch. Each tile is 222 x 160 µm.
These samples are the next in line for image processing. Once returned to JSC, they will be imaged again in the same locations as part of the “Master Cleaning Plan”. Each sample was images at 50X in three locations (1 mm² areas).
Sample 60508 FZ-Si B/C array
Sample 61052 FZ-Si B/C array Sample 61049 FZ-Si B/C array