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The top documents of siva-r
Project duration and staffing
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Polarizing properties of embedded symmetric trilayer stacks under conditions of frustrated total internal reflection
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[IEEE 2013 IEEE Workshop on Applications of Computer Vision (WACV) - Clearwater Beach, FL, USA (2013.01.15-2013.01.17)] 2013 IEEE Workshop on Applications of Computer Vision (WACV)
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