usb 3.0: facing the challenges of superspeed usb … test 8 page 15 wusb/usb testing sept. 2008 hubs...

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USB/WUSB Test 1 WUSB/USB Testing Sept. 2008 Page 1 USB 3.0: Facing the Challenges of SuperSpeed USB Product Development Jim Choate Product Manager Agilent Technologies Copyright © 2008 Agilent Technologies Page 2 WUSB/USB Testing Sept. 2008 Presentation Goals Help you understand market need for USB 3.0 Provide progress update and schedule of development activities Provide high level overview of USB 3.0 architecture Compare and contrast to USB 2.0: what has changed and what is the same Disclaimer: The material and content that describes specific details of the USB 3.0 specification belongs to the USB 3.0 Promoters. Agilent is not speaking or presenting on behalf of the USB 3.0 Promoters.

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USB/WUSB Test 1

WUSB/USB Testing

Sept. 2008Page 1

USB 3.0: Facing the Challenges of SuperSpeed USB Product Development

USB 3.0: Facing the Challenges of SuperSpeed USB Product Development

Jim ChoateProduct Manager

Agilent Technologies

Copyright © 2008 Agilent Technologies

Page 2

WUSB/USB Testing

Sept. 2008

Presentation Goals

• Help you understand market need for USB 3.0

• Provide progress update and schedule of development activities

• Provide high level overview of USB 3.0 architecture

• Compare and contrast to USB 2.0: what has changed and what is the same

• Disclaimer: The material and content that describes specific details of the USB 3.0 specification belongs to the USB 3.0 Promoters. Agilent is not speaking or presenting on behalf of the USB 3.0 Promoters.

USB/WUSB Test 2

Page 3

WUSB/USB Testing

Sept. 2008

USB Market Overview

Physical Layer Overview

Cable/Connector challenges

Hubs

Frequently Asked Questions

Summary

Agenda

Page 4

WUSB/USB Testing

Sept. 2008

Hi-Speed USB (480 Mbps) is adequate for many products

Emerging applications will benefit from higher performance

Most other aspects of SuperSpeed USB will remain the same:

• Backward compatibility with USB 2.0• Maintain the extensive device driver infrastructure• Preserve USB ease of use expectations for Users

Background

One of the biggest challenges of USB 3.0Will be following the

amazing USB success

Market overview

USB/WUSB Test 3

Page 5

WUSB/USB Testing

Sept. 2008

USB 2.0 is now a performance bottleneck

High speed USB 2.0 = 480 Mbps signaling rate

– Real throughput is typically much less at around ½ this data rate (< 240Mbps) – Additional limitations due to IO performance limitations

• Approximately 35 MB/s maximum usable application data rate

Something faster is needed for large digital multi-media files

70 sec53.3 sec20 sec3.3 sec0.8 sec0.01 secUSB 3.0

13.9 min8.9 min3.3 min33 sec8.5 sec0.1 secUSB 2.0

9.3 hr5.9 hr2.2 hr22 min5.7 min5.3 secUSB 1.0

25 GB16 GB6 GB1 GB256 MB4 MB

HD-MovieUSB FlashSD-MovieUSB Flash256 FlashSong / Pic

Market overview

Page 6

WUSB/USB Testing

Sept. 2008

Removable Flash

Embedded FlashUSB Flash drives

MP3 Players (Flash)

Solid State Disk

Other

SuperSpeed USB Applications

Solid State/Flash Storage Market in 2010

Cameras, Phones, PDAs

44% External USB Storage

26%

SSD, mobile and external

18%

Market overview

USB/WUSB Test 4

Page 7

WUSB/USB Testing

Sept. 2008

Market Requirements Summary• Performance 10X USB2 - PHY signal rate of 5 Gbps

– data throughput > 200 MB/s

• Optimize for power efficiency

• Connector & Cable backward compatible with USB 2.0

• Protocol scalable to provide extension beyond 5Gbps

• Minimize SW impact

– Same Programming and Device models as USB 2.0

• Support Virtualization for Devices

Market overview

Page 8

WUSB/USB Testing

Sept. 2008

STDs Development

Product Development

0.9

Initial Deployment

Broad Deployment

SuperSpeed USB Timeline

2008 2009 2010 2011

USB 3.0 Specification CompleteCompliance Program/Industry Enabling Development

Market overview

USB 3.0 Developers Conference

USB/WUSB Test 5

Page 9

WUSB/USB Testing

Sept. 2008

USB 3.0 Industry Events Update

•USB 3.0 Promoter and Contributor Groups formed in 2007

•Industry review and Intel Developer Forum updates provided further information in first quarter of this year

•USB 3.0 Adopter participation begins when final spec is released in 2H’08• Joined by Adopter Agreement

•Compliance test requirements and enabling work beginning in July

•USB-IF will continue to manage Logos, test events and marketing/promotion

•USB 3.0 specification Rev 0.9 available to contributors.

•IDF demo of USB 3.0 cables and 5Gbps USB3.0 test chip

•IDF announcement of USB 3.0 developers conference in November timeframe.

http://www.usb.org/usb30

Market overview

Page 10

WUSB/USB Testing

Sept. 2008

What is different for USB 3.0•USB 2.0 High-Speed

480MbpsNRZI, Half Duplex

(1 bi-directional link)4 signals

Dp, DmVCC, GND

Cable Lmax= 5meterIconfigLP/FP = 100mA/500mANo SSC

•USB 3.0 SuperSpeed5 Gbps8B/10B PRBS, Full Simplex

(2 uni-directional links)8 signals

4 USB2 4 SS Signals

Cable Lmax= Spec Detail IconfigLP/FP = Spec DetailSSC

PHY overview

RX

Half DuplexTX

RX

TXRX

Full SimplexTX RX

TX

USB/WUSB Test 6

Page 11

WUSB/USB Testing

Sept. 2008

SuperSpeed Measurement Requirements•Compliance Testing:

Still being defined - will reflect many of the same requirements as PCI Express 2.0 (5GT/s) and SATA compliance testing

Compliance will be measured at the end of the “compliance channel”SMA termination for TX signals, phase matched SMA cableTerminate link under test with high speed oscilloscopeMeasure transmitted waveform with high speed oscilloscopeUse compliance pattern1M UI of dataCompute:

eye diagram, Rj, Dj, Tj@10^-12 BER, average data rate, rise/fall time,

SSTX+

SSTX-

PHY overview

Page 12

WUSB/USB Testing

Sept. 2008

Achieve Success at 5GT/s with Good designs and Agilent Tools

•Cable, connector and channel characterization and testing will be crucial to ensuring links are reliable and meet performance requirements

• TDR/TDT measurements will be essential to ensuring designs meet differential impedance targets

• VNA measurements will allow verification of return loss, insertion loss and near/far end cross talk requirements

•Those same S-parameter measurements will allow de-embed of fixture and cabling to characterized your transmitter design to package/die.

•Signal BW and channel length will result

in closed eye measurements

PHYPHY

Tx Channel

Measured EyeDe-embedded Eye

Equalization will also be needed to open eye at RX

PHY overview

USB/WUSB Test 7

Page 13

WUSB/USB Testing

Sept. 2008

Cable and Connector Challenges

•Deliver low cost

•Backward compatibility with USB 2.0

•Minimize connector types

•Meet performance rqts for 5Gbps

•Ease of use

•EMI/ESD

STD A

STD B

Micro

US

B2

UTP

VC

C/G

ND

Gnd

USB3 US

B3 S

TP

Gnd

USB3

USB2USB2

Vbus

Gnd Gnd

Cable/Connector Cost And complexity will increase

Cable/Conn Challenges

Page 14

WUSB/USB Testing

Sept. 2008

token data hndsh

OUT

host

token hndshdata

IN

device

USB

2

Tran

sact

ions

hndsh

datadata

hndsh

SSTX

SSRX

Host

SSTX

SSRX

Device

Bus turnaround times require 100s of bit times

Full Simplex bus topology greatly improves bus utilization

Link Layer Improvements

USB

3Tr

ansa

ctio

ns

Link/Protocol

USB/WUSB Test 8

Page 15

WUSB/USB Testing

Sept. 2008

HubsProvide fan out for USB3 connectivity

Two separate logical controllers

USB 2.0 Speeds

SuperSpeed

Upstream Connection supports both

Port Port

SS Hub

2.0 Dev

Port

Port Port

Port

3.0Dev

Port

2.0 Hub

Host

Hubs

Page 16

WUSB/USB Testing

Sept. 2008

Frequently Asked Questions

1. Does USB 3.0 define or require an optical connection?• NO, this was discussed during the initial phases of the investigation but

was ruled out due to cost. USB 3.0 will be wired only.

2. Is USB 3.0 going to be backward compatible with USB 2.0?• Yes, USB 3.0 requires that the host port is compatible with all USB 2.0

supported speeds: Low speed, Full speed and High speed.

3. Why does SuperSpeed require 4 new signals, SSTXP, SSTXN, SSRXP, SSRXN?

• Backwards compatibility requires support for Low and Full-Speed USB. These run at 3.3V signal levels which is not compatible with IO buffers designed to run at 5Gbps

4. How will users know that a USB port supports SuperSpeed?• USB 3.0 ports will be color-coded Blue to make them recognizable.

FAQ

USB/WUSB Test 9

Page 17

WUSB/USB Testing

Sept. 2008

SummarySuperSpeed USB addresses USB 2.0 performance bottleneck and retains attributes that made USB so successful

•Maintains backward compatibility

•10x performance

•Same programming and device models as USB 2.0

•Optimized for power efficiency

•Protocol scalable to 20Gb/s

USB 3.0 will deliver Performance and Power Efficiency

Agilent has the tools and expertise to help you validate your designs

Page 18

WUSB/USB Testing

Sept. 2008

presented by:

Jim Choate

Agilent Solutions for testing Certified Wireless USB based on WiMedia Technology

Agilent Solutions for testing Certified Wireless USB based on WiMedia Technology

Copyright © 2008 Agilent Technologies

USB/WUSB Test 10

Page 19

WUSB/USB Testing

Sept. 2008

Ultrawideband Technology

UWBUWB

Direct SpectrumDirect Spectrum MBMB--OFDMOFDM

RADARRADAR CommunicationsCommunications WiMediaWiMedia

Certified Wireless USBCertified Wireless USB

(USB(USB--IF)IF)BluetoothBluetooth

ExtensionsExtensions

IEEEIEEE

••Certified Wireless USB, based on WiMedia, MBCertified Wireless USB, based on WiMedia, MB--OFDM, UWBOFDM, UWB

Page 20

WUSB/USB Testing

Sept. 2008

Certified High Speed USB• Most successful interface standard, about 3 billion ports• 480 MBit data rates

Certified Wireless USB:• High speed USB replacement (480 MBits/s), Any other questions?• Based on WiMedia Alliance OFDM UWB Technology• Not just wireless USB (low speed mice and keyboards)• Low power, short range, high data rates

Bluetooth:• Headsets and automotive the current “killer” applications (1 MBit/s)• Bluetooth now planning to use WiMedia UWB for higher data rates• Years away

Connecting the last 5 meters

USB/WUSB Test 11

Page 21

WUSB/USB Testing

Sept. 2008

WiMedia UWB Platform

PAL: Protocol Adaptation Layer

WiMedia UWB Radio Platform

&/or

PAL PAL WLP

&/or &/or

PAL

IP

MAC & Policies

UWB PHY (MB-OFDM)

Page 22

WUSB/USB Testing

Sept. 2008

Companies Driving the IndustryWiMedia Promoters• Intel, HP, Kodak, Samsung, Sony, Microsoft

First Silicon Chip Providers• Alereon, Realtek, Staccato, Tzero, Wisair, Focus Enhancement

USB Industry Forum (Certified Wireless USB)• NEC, PHILIPS (NXP), Lucid Port, Microsoft, HP, Synopsis,

Leading Consumer Product Manufactures• Listed WiMedia membersAll current portable products with USB ports, a high percentage will consider Certified Wireless USB

USB/WUSB Test 12

Page 23

WUSB/USB Testing

Sept. 2008

Short Range Wireless enabled by UWB

PCs and Peripherals

External Hard Drives, CD/DVD, burners

Printers

MP3

Digital Cameras

Potential Certified Wireless USB products for 2006/2007

Page 24

WUSB/USB Testing

Sept. 2008

Why is Ultra Wideband so special?

f

3432MHz

3960MHz

4488MHz

Band#1

Band#2

Band#3

-41.3dBm

2400MHz

UWB is sometimes called an underlay technology, because it can transmit in the “noise floor” of narrow band signals.More BW translates to higher data rates even with simple modulation techniques

WLAN 30 MHz Occupied BW

528 MHz Occupied BW

USB/WUSB Test 13

Page 25

WUSB/USB Testing

Sept. 2008

UWB Bands and WW Regulations

Page 26

WUSB/USB Testing

Sept. 2008

WiMedia PHY: Time Domain

time

OFDM Symbol(IFFT Output)

ZPS(Zero-padded Suffix)

Symbol (312.5ns)

165NSYMTotal number of samples per symbol

37NZPSNumber of samples in zero-padded suffix

3.2 MHzFSYMSymbol Rate

128NFFTTotal number of subcarriers (FFT size)

242.42 nsTFFTIFFT and FFT period

70.08 nsTZPSZero-padded suffix duration in time

ValueParameterDescription

528MHzFsSampling Frequency

312.5 nsTSYMSymbol Interval

Packet/FrameSynchronization Sequence Frame Payload

30 sym for standard (24 + 6)18 sym for burst (12 + 6)

12 symPSDU

Channel EstimationSequence

Freq. 528 MHz

PacketPLCP Preamble PLCP Header

time

Amp.

6*(0, 1, …,37) sym

USB/WUSB Test 14

Page 27

WUSB/USB Testing

Sept. 2008

WiMedia PHY: Frequency DomainFCC, Unlicensed 3100 MHz – 10600 MHz, -41.3 dBm/1 MHz

528 MHz x 14 Bands

128 subcarriers,4.125 MHzspacing

12 QPSK PilotsQPSK, DCM 5 Guards5 Guards

528 MHz/Band

4.125 MHzSubcarrier Frequency Spacing6Number of null subcarriers

128NFFTTotal number of subcarriers (FFT size)

ValueParameterDescription

10Number of guard subcarriers12Number of pilot subcarriers

100Number of data subcarriers

528 MHzFsSampling Frequency

Logical Frequency Subcarriers -61 . . . . . . . . . . . . . . . . . . . .+610

Page 28

WUSB/USB Testing

Sept. 2008

WiMedia PHY: Time and Freq.

timeFreq.

3168 MHz

3696 MHz

4224 MHz

4752 MHz

…..Band #1

Band #2

Band #3

Symbol

BandGroup

1

TFC: Time Frequency Code

3333337222222611111152233114332211323123123213211

Band ID (Band number) for TFCTFC Number

TFI: Time-Frequency Interleaving

FFI: Fixed Frequency Interleaving

Data A

Data B

Data C

Data D

Data E

Data F

Data G

….. Time-Domain Spreading-Transmit same information over two symbols in TFI mode.- Spreading factor is 2.-Data A = Data B but over the different sub-bands.

copy

Frequency-Domain Spreading-Transmit same information

USB/WUSB Test 15

Page 29

WUSB/USB Testing

Sept. 2008

OFDM with Frequency Switching

Time

Frequency3432 MHz

3960 MHz

4488 MHz

3432 MHz

3960 MHz

4488 MHz

3432 MHz

3960 MHz

4488 MHz

1

Sym

b31

2.5 ns

128 subcarriers

528 MHz

TFC1 (Band Group 1)Frequency switch (3.1-4.9 GHz)

Band_ID1

Band_ID2

Band_ID3

Page 30

WUSB/USB Testing

Sept. 2008

Agilent E8267DPSG Series

Vector Signal Generator

Analogue IQ

UWB Signal Creation

UWB Signal Verification,EVM measurement

Advanced Design System

Signal Generation

DemodulationBase Band Modulation

Agilent N6030AArbitrary Waveform

Generator Agilent 89601AVSA Software

Agilent E4440APSA Series 26.5GHzSpectrum Analyzer

Agilent Infiniium DSO 91304A13GHz,40GSaOscilloscope

Spectrum Testing

New!!Version 9.0.Available NOW

DUT

Rx Tx

Simulation

Agilent N7619ASignal Studio for Multiband OFDM

UWB

Available NOW

Regulatory Test, FCC

Custom components on UWB Library support WiMedia Today

WiMedia Compliant LibraryShip date 9/15/06.

Agilent Transmitter“Golden Radio”

Agilent Receiver

WiMedia RF Measurement Solution

USB/WUSB Test 16

Page 31

WUSB/USB Testing

Sept. 2008

RF tests for WiMedia based radios

Example PHY Compliance Tests

• Transmit Center Frequency• Transmit Power Control• Power Spectral Density Mask• Adjacent Channel Power Ratio (ACPR)• Error Vector Magnitude (EVM)• Receiver Power Sensitivity• Receiver Frequency Offset Sensitivity

Page 32

WUSB/USB Testing

Sept. 2008

Random Noise

Phase Noise

AM/AM Distortion

AM/PM Distortion

Delay Distortion/ISI

Interference

Constellation DiagramConstellation Diagram

Radio Quality Measurements

USB/WUSB Test 17

Page 33

WUSB/USB Testing

Sept. 2008

Agilent E8267DAgilent E8267DPSG Series PSG Series

Vector Signal Vector Signal GeneratorGenerator

Agilent Infiniium Agilent Infiniium DSO 81304BDSO 81304B

13GHz, 40GSa13GHz, 40GSaOscilloscopeOscilloscope

89601A VSA Software89601A VSA Software

ADS2004AADS2004AUWB Design LibraryUWB Design Library

Agilent N6030A Agilent N6030A Wideband Wideband ArbArb

Agilent PSA E4440AAgilent PSA E4440A26.5 GHz Spectrum 26.5 GHz Spectrum

AnalyzerAnalyzer

Agilent N7619A Agilent N7619A Signal StudioSignal Studio

Agilent Transceiver Test Setup

Page 34

WUSB/USB Testing

Sept. 2008

WiMedia UWB Demodulation with 89601A

USB/WUSB Test 18

Page 35

WUSB/USB Testing

Sept. 2008

WiMedia UWB Demodulation with 89601A

Page 36

WUSB/USB Testing

Sept. 2008

Summary

• Certified Wireless USB is next mainstream standard for wireless connectivity.

• Certified Wireless USB is based on WiMedia PHY technology.

• Agilent builds Certified Wireless USB tests from years of RF measurement experience.

• Agilent solution provides a full test/analysis environment for PHY measurements on Certified Wireless USB transceivers.

• Agilent, Contributor member of WiMedia, USB-IF and Certified Wireless USB

• Agilent Provides “Gold Suite” testing at all USB-IF workshops.

USB/WUSB Test 19

Page 37

WUSB/USB Testing

Sept. 2008

Further Information

www.agilent.com/find/uwb

Ultra-Wideband Communication RF Measurements Application Note AN1488 5989-0506EN

Cutler, Robert “Effects of Physical Layer Impairments on OFDM Systems” RF Design, May, 2002 p. 36 www.rfdesign.com

IEEE 802.15.3 Home Page http://www.ieee802.org/15/

Agilent Application Note 1380-1 “RF Testing of Wireless LAN Products”

Agilent Application Note “Agilent PSA Series Swept and FFT Analysis”

www.usb.org/wusb/homewww.wimedia.org