twin-x - amco instruments · lab-x320: instrument with two analysis ‘heads’ fitted with fe55...

Twin-XA unique combination of technologiesdelivering greater flexibility andperformance to benchtop EDXRF

Oxford Instruments Analytical

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Oxford Instruments, at High Wycombe, UK, operates Quality Management Systems approved to the requirements of BS EN ISO 9001. This publication is thecopyright of Oxford Instruments Analytical Limited and provides outline information only which (unless agreed by the company in writing) may not be used,applied or reproduced for any purpose or form part of any order or contract or be regarded as a representation relating to the products or services concerned.Oxford Instruments’ policy is one of continued improvement. The company reserves the right to alter, without notice, the specification, design or conditions ofsupply of any product or service. Oxford Instruments acknowledges all trade marks and registrations.

© Oxford Instruments Analytical Ltd, 2003. All rights reserved. Part no: OIA/079/A/0203

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With a comprehensive trainingagenda for technical engineersand end users combined with a

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1968Portable MineralAnalyser (PMA)introduced,offeringstationary/transportableanalysis

1972Lab-X100: Radioactive isotope(Fe55) based instrument formeasuring Al to Fe in theperiodic table

1976Lab-X320: Instrument with twoanalysis ‘heads’ fitted with Fe55and Cd109 radioistopes foranalysis over a wider elementalrange

1982Introduction of Lab-X2000 withelectronics console, ‘one pushbutton’ operation and a rangeof source/detector combinationsfor optimised performance

1987Introduction of Lab-X1000 withnew design and automatic threeposition turntable

1993Introduction of Lab-X3000incorporating an X-ray tube withunique patented technologyallowing measurements from Alto U in the periodic table

1998Introduction of Lab-X3000S:Optimised “sulphur in oil”analyser with lowest detectionlimits

2000Introduction of Lab-X3500 withPC interface option allowing fullkeyboard operation andtransmission of results into Exceldatabases

2003Introduction ofTwin-X, theculminationof 35 yearsexperience inbenchtop XRF!

Oxford Instruments brings youthe next generation ofbenchtop EDXRF analysis.Twin-X is the result ofcombining two provendetector technologies to giveunprecedented versatility andperformance in one compactinstrument.

Each detector is highly tunedfor a specific group ofelements on the periodictable. The patented ‘Focus 5+’detection system is the proventechnology first introduced inthe Lab-X3000.

‘Focus 5+’ outperforms pindiode detectors on low atomicnumber elements such as Na,Mg, Al, Si, P, S, Cl, K, Ca...

The PIN detector focuses onthe analysis of complex metalmatrices. The PIN detectordelivers high sensitivity andresolution for higher atomicnumber elements such as Cr,Mn, Fe, Co, Ni, Cu, Zn...

Twin-X can be configuredwith one or both of thesedetectors. Any combination of‘Focus 5+’ and PIN detectorgives the unique advantage oftailoring the Twin-X toexactly suit your needs.

The marriage of the twotechnologies offers the bestperformance ever put into abenchtop EDXRFspectrometer.

Food & Healthcare Minerals Petroleum

Metals Polymers

Laboratory Education Environment

Introducing a new con cept in benchtop XRF...

■ Easy to use - can be operated byanyone

■ Rugged robustdesign - for use in harshenvironments

■ High PrecisionAnalysis - sensitivity acrossthe range Na-U

■ Flexible andcompact -integrated PC and software

35 Years of benchtopXRF experience Twin-X

Analysis of liquids, tosolids, to powders -

Twin-X delivers



Rugged and Robust Design

Auto-sampler

Twin Detection Systems

Integrated PC

Remote Diagnostics

■ Membrane keypad - resistant to dust,spills and dirty hands

■ High resistance to dust ingress -cooling fans do not carry dust tosensitive internal components

■ High resistance to Electro-magneticinterference - passes the highestindustrial standards

■ Integrated design - no cabling, mainspower only - He as an option

■ Minimise downtime

■ Reduce maintenance costs

■ Expert on-line advice

■ Password protected

■ Easy to operate; one-touch analysis

■ No expert knowledge required

■ Flat panel colour display

■ 32 bit Windows® operating system

■ Networking capabilities

■ USB/Ethernet serial interface

Unique SamplePositioning System

The TwinDetectionSystems

Powerful SoftwareTwin-X - twice the performance

Easy to Use...

■ Autosampler guaranteesconsistent, repeatable results fromeach position on the sample tray

■ 10 Position tray - for unattendedoperation

■ High precision sample placement -for more precise results

■ Integrated system check samples -for simple system tests

■ Sample spinner (optional) - reduceserrors due to sample preparation,particle size and inhomogeneity

■ Low helium usage (optional) - reducesoperational costs

■ Tested to 1 million cycles, fully loaded -equivalent to 15 years of operation at200 samples a day

■ Method development tool - simple, stepwise methodcreation

Preparesample

Insert

Windows® based 32-bit

Simple, flexible data output for theneeds of today and tomorrow

The Twin-X software is based on an embedded PCplatform and displayed on an integrated ‘flat panel’color monitor. The powerful software includes:

1

2

3Get results

Focus 5+ PIN Detector

■ Proportional counterdetector - offering highsensitivity

■ Primary beam filtering -offering optimisedexcitation

■ Secondary beam filtering- for improved resolutionbetween elements

■ PIN diode detector -offering high resolutionfor low Z elements

■ Primary beam filtering -offering optimisedexcitation

■ Wide element range - for greater flexibility

■ Each detector is highly tuned for a specific group ofelements - the combination gives the best performance

across the elemental range Na-U

Press ‘Start’key

■ Spectrum Scan tool - direct interface with detectors

■ Regression analysis tool - includes alpha, intensity, ratio,overlap and background corrections

■ Stored result library - flexible and searchable

■ Oxford Instruments manufactured X-ray tube technology- offering high reliability

twin-x - amco instruments · lab-x320: instrument with two analysis ‘heads’ fitted with fe55...

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