transmitter design based on the book: and measurement lte ... · pdf filelte rf design and...
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![Page 1: Transmitter Design Based on the book: and Measurement LTE ... · PDF fileLTE RF Design and Measurement Course Summary •LTE adds new complexities for transmitter design and test](https://reader033.vdocuments.us/reader033/viewer/2022051600/5aa30c297f8b9a07758dd586/html5/thumbnails/1.jpg)
© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Based on the book:
LTE and the Evolution to
4G Wireless
Chapter 6.4
1 June 15-17, 2009
Transmitter Design and Measurement Challenges
4G World 2009
presented by:
David L. Barnerwww/agilent.com/find/4GWorld
Transmitter Design
and Measurement
Challenges
![Page 2: Transmitter Design Based on the book: and Measurement LTE ... · PDF fileLTE RF Design and Measurement Course Summary •LTE adds new complexities for transmitter design and test](https://reader033.vdocuments.us/reader033/viewer/2022051600/5aa30c297f8b9a07758dd586/html5/thumbnails/2.jpg)
© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Agenda
Introduction / General & Overall Issues
Power & Spectrum Characteristics
Vector (Frequency & Time) Measurements
Analysis of Signals After Digital Demodulation
2 June 15-17, 2009
Transmitter Design and Measurement Challenges
![Page 3: Transmitter Design Based on the book: and Measurement LTE ... · PDF fileLTE RF Design and Measurement Course Summary •LTE adds new complexities for transmitter design and test](https://reader033.vdocuments.us/reader033/viewer/2022051600/5aa30c297f8b9a07758dd586/html5/thumbnails/3.jpg)
© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Agenda
Introduction / General & Overall Issues
Power & Spectrum Characteristics
Vector (Frequency & Time) Measurements
Analysis of Signals After Digital Demodulation
3 June 15-17, 2009
Transmitter Design and Measurement Challenges
![Page 4: Transmitter Design Based on the book: and Measurement LTE ... · PDF fileLTE RF Design and Measurement Course Summary •LTE adds new complexities for transmitter design and test](https://reader033.vdocuments.us/reader033/viewer/2022051600/5aa30c297f8b9a07758dd586/html5/thumbnails/4.jpg)
© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
General Challenges
• Variable & wide bandwidths – From 1.4 up to 20 MHz
• A new TX scheme for UL (SC-FDMA)
• FDD and TDD modes
• Stressful signal characteristics in terms of spectrum, power,
time variations due to traffic type and loading
• Multiple antenna techniques & MIMO
• The need for making complex tradeoffs between In-Channel,
Out-of-Channel and Out-of-Band Performance
4 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
A Systematic & Structured Approach
• When measuring complex signals, it is tempting to go directly
to advanced digital modulation analysis.
• However, it is usually more productive and efficient to follow a
verification sequence that begins with basic spectrum
measurements and continues with vector measurements,
before switching to modulation analysis.
5 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Agenda
Introduction / General & Overall Issues
Power & Spectrum Characteristics
Vector (Frequency & Time) Measurements
Analysis of Signals After Digital Demodulation
6 June 15-17, 2009
Transmitter Design and Measurement Challenges
![Page 7: Transmitter Design Based on the book: and Measurement LTE ... · PDF fileLTE RF Design and Measurement Course Summary •LTE adds new complexities for transmitter design and test](https://reader033.vdocuments.us/reader033/viewer/2022051600/5aa30c297f8b9a07758dd586/html5/thumbnails/7.jpg)
© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Power & Spectrum Characteristics
Familiar measurements apply for LTE:
• Channel power
• Occupied bandwidth
• ACLR
• SEM
• Center frequency, flatness
Initial verification and measurement of these can be made fairly easily via Spectrum Analysis
However, other power measurements can only be made via Vector Signal Analysis (demod)
7 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Power & Spectrum Characteristics
• LTE’s wide bandwidth has interesting implications at allocated
spectrum band-edges
• Many LTE carriers will need to be at the edge of a band /
allocation
• This implies that many channels will be subject to Out-of-
Channel and Out-of-Band emission regulations simultaneously
• Out-of-Channel emissions can be made with ACLR/ACP and
SEM measurements
8 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Power & Spectrum Characteristics
9 June 15-17, 2009
Transmitter Design and Measurement Challenges
ACP Measurement
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Agenda
Introduction / General & Overall Issues
Power & Spectrum Characteristics
Vector (Frequency & Time) Measurements
Analysis of Signals After Digital Demodulation
10 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Power & Spectrum Characteristics
• Average power measurements are not new, even for time-varying signals
• LTE also requires accurate power measurements down to the resource element level (1 symbol x 1 subcarrier), and on a selective basis
• New power / demod measurements such as in-band emissions and OFDM Symbol TX Power introduced
(next slide provides details from 36.141)
11 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Power & Spectrum Characteristics
F.3.3 Resource Element TX power
Perform FFT (z’(ν)) with the FFT window timing. The result is called Z’(t,f). The RE TX power is then defined as:
From this the Reference Signal Transmit power (RSTP) is derives as follows:
It is an average power and accumulates the powers of the reference symbols within a sub frame divided by n, the number of reference symbols within a sub frame.
From RETP the OFDM Symbol TX power (OSTP) is derived as follows:
It accumulates all sub carrier powers of the 4th OFDM symbol. The 4th ,out of 14 OFDM symbols within a subframe, (using frame type 1 , normal CP length) contains exclusively PDSCH.
From the acquired samples, 10 values (per Frame) for each RSTP and OSTP can be derived.
KHzRETP 15|f)(t,Z| 2
subframewithinlocationsRERS
RETPn
RSTP1
subframewithinsymbolthoflocationsRENNall
RETPOSTP
4
RBsc
DLRB
12 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Vector (Frequency & Time) Measurements
• Power vs time measurements are of interest in LTE due to the varying structure of the signal (RS locations, channel locations, etc)
• Initially, these can be made without demodulating the signal, in order to verify absolute power levels using a VSA
• Wide BW LTE requires large Time Record Length (proportional to large number of FFT points)
• Example. 20MHz LTE @ 1Frame for 10ms requires 256,000 pt FFT
• CCDF behavior can also be measured – and in particular, using time-gating with a VSA
• NOT using time-gating significantly effects PAR during DTX (since lower average power)
13 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Vector (Frequency & Time) Measurements
14 June 15-17, 2009
Transmitter Design and Measurement Challenges
Time Gate
Time Gating CCDF
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Vector (Frequency & Time) Measurements
Spectrogram allows us to interpret the overall signal at a glance
• It allows us to visually recognize major signal characteristics,
especially for complex signals such as DL
• Any serious power or frequency issues, for example of drift or
symbol transitions, will be visible here
15 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Vector (Frequency & Time) Measurements
PDSCH
PDSCH
PDSCH
PDSCH
RS
PDSCH
5 unallocated subcarriers on either side
of synch signals
Primary synch
signal
Secondary synch
signal
16 June 15-17, 2009
Transmitter Design and Measurement Challenges
PBCH
Spectrogram of LTE DL
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Agenda
Introduction / General & Overall Issues
Power & Spectrum Characteristics
Vector (Frequency & Time) Measurements
Analysis of Signals After Digital Demodulation
17 June 15-17, 2009
Transmitter Design and Measurement Challenges
![Page 18: Transmitter Design Based on the book: and Measurement LTE ... · PDF fileLTE RF Design and Measurement Course Summary •LTE adds new complexities for transmitter design and test](https://reader033.vdocuments.us/reader033/viewer/2022051600/5aa30c297f8b9a07758dd586/html5/thumbnails/18.jpg)
© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Analysis of Signals After Digital Demodulation
• First we’ll focus on basic digital demodulation techniques
• Correct configuration in this step will help us properly verify
basic parameters and also give confidence when investigating
more intricate details of the signal
18 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Analysis of Signals After Digital Demodulation
Measurement example for setup, including:
• FDD / TDD
• UL / DL
• Bandwidth & span
• Sync type
• Number of Antennas
• MIMO decoding
19 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Analysis of Signals After Digital Demodulation
20 June 15-17, 2009
Transmitter Design and Measurement Challenges
Measurement Example – LTE DL
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Analysis of Signals After Digital Demodulation
21 June 15-17, 2009
Transmitter Design and Measurement Challenges
Coupled Markers
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Analysis of Signals After Digital Demodulation
22 June 15-17, 2009
Transmitter Design and Measurement Challenges
Equalizer Impact
Without EQ
With EQ
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Analysis of Signals After Digital Demodulation
Measuring EVM at different points in the CP
• EVM definition requires measurements be made at 2 different points in time during the CP
• VSA allows the designer to investigate the impact of time-domain distortion on the CP by changing the window length used to make EVM measurements
23 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
CP Len Nominal Symbol Len
FFT aligned with CP end
EVM is measured at two locations in time and
the maximum of the two EVM is reported. i.e.
EVM1 measured at EVM Window Start
EVM2 measured at EVM Window End
Reported EVM = max(EVM1, EVM2)
Agilent 89600 VSA EVM SettingFFT aligned with CP center
FFT aligned with CP start
Total Transmitted Symbol Len
Demodulation and Cyclic Prefix
EVM Analysis Windows (DL & UL)
24 June 15-17, 2009
Transmitter Design and Measurement Challenges
If EVM vs Time gets noticeably better when selecting EVM window center, it could be due to high ISI coming from a baseband filter that is very tight (optimized for ACLR).
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Analysis of Signals After Digital Demodulation
• Controlling the measurement interval allows detailed analysis
on very specific and precisely-chosen portions of the signal
• This allows measurement results to be isolated to certain
areas of trouble or interest
• Some terms are introduced to describe the timing and analysis
portions associated with the 89601 VSA (next slide)
25 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Analysis of Signals After Digital Demodulation
Terms:
• Result Length
– Length (in slots) of acquired IQ used in analysis and aligned to Frame start boundary event
• Measurement Offset
– Delay offset (in slots or symbols) relative to Frame start boundary event and beginning of Measurement Interval
• Measurement Interval
– Measurement interval (in slots or symbols) ,starting from Measurement Offset, used for analysis
Note: Symbol by Symbol Resolution!
26 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Analysis of Signals After Digital Demodulation
27 June 15-17, 2009
Transmitter Design and Measurement ChallengesSlot 0, Symbol 5 = S-SS + PDSCH
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Analysis of Signals After Digital Demodulation
IQ errors: IQ image and LO leakage
• IQ distortion can be easily seen in the following example
resulting in mirror images about the center frequency using
spectrum and spectrogram displays
• An MXG Signal Generator can emulate IQ impairments
• LO Leakage = Adding MXG IQ Offset (via MXG front panel)
• IQ Image = Adding MXG IQ Gain Imbalance (via MXG front panel)
28 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Analysis of Signals After Digital Demodulation
29 June 15-17, 2009
Transmitter Design and Measurement Challenges
IQ Imbalance Impact
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Summary
• LTE adds new complexities for transmitter design and test.
• More than ever, it’s imperative to have a structured and
systematic approach to signal test.
• Considered measurements made with an eye to
troubleshooting, and cause vs effect, will bring benefits to the
design and test engineering community.
31 June 15-17, 2009
Transmitter Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Based on the book:
LTE and the Evolution
to 4G Wireless
Chapter 6.5
32 June 15-17, 2009
Transmitter Design and Measurement Challenges
4G World 2009
presented by:
David L. Barner
Receiver Design and
Measurement
Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Key Objectives
June 17-18, 200933
• Understand SISO RX test challenges
• Understand Agilent SISO solutions available to
address RX test challenges
June 17-18, 200933
Receiver Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Key LTE FDD eNB Test Challenges
LTE Conformance Tests Require Sophisticated Signals
• Various modulation bandwidths (1.4 MHz to 20 MHz)
• Various modulation types (QSPK, 16QAM, 64QAM)
• Transport channel coding with specific configurations, i.e. Fixed Reference Channels (FRC)
• Interfering Signals
• AWGN
• Emulation of channel propagation conditions
New Conformance Tests Require Special Test Configuration
• Three performance requirements tests require dynamic changes in signal characteristics
• Closed loop control of RV index based on HARQ feedback
• Closed loop control of RF frame timing based on TA feedback
• Interference and Rx diversity tests require MIMO-like test configurations
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
eNB Receiver Conformance Tests
Receiver characteristics
• Reference sensitivity level
• Dynamic range
• Adjacent Channel Selectivity (ACS)
• Blocking characteristics
• Intermodulation characteristics
• In-channel selectivity
• Spurious emissions
Note: UE conformance tests are still being defined
Solving test needs:
Flexibility to easily create varying signals that simulate real-world conditions
Signal generation capability that evolves as the standard evolves to ensure
most accurate test results
Performance Requirements• Performance requirements for PUSCH
• Multipath fading propagation conditions
• UL timing adjustment
• HARQ-ACK multiplexed on PUSCH
• High speed train conditions
• Performance requirements for PUCCH
• ACK missed detection for sing user PUCCH format 1a
• CQI missed detection for PUCCH format 2
• ACK missed detection for multi user PUCCH format 1a
• Performance Requirements for PRACH
•These test are performed open loop
•Performance metric = BLER
•These tests require HARQ feedback
•Performance metric = throughput
June 17-18, 200935
Receiver Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Receiver Characteristics Wanted Signal Interfering Signal Dynamic Range(wanted interferer)
Agilent Solution
7.2 Reference Sensitivity LevelFRC A1-1, 1-2, 1-3
QPSK ModNone required for this test -- Signal Studio & MXG
7.3 Dynamic RangeFRC A2-1, 2-2, 2-3
16QAM ModAWGN 12.4 dB Signal Studio & MXG
7.4 In-Channel SelectivityFRC 1-2, 1-3, 1-4, 1-5
QPSK ModE-UTRA with all BW 21.5 dB Signal Studio & MXG
7.5 Adjacent Channel SelectivityFRC A1-1, 1-2, 1-3
QPSK Mod
E-UTRA
Offsets up to 2.5 MHz*48.1 dB Signal Studio & MXG
7.5 Narrowband BlockingFRC A1-1, 1-2, 1-3
QPSK Mod
E-UTRA
Offsets up to 4.66 MHz*51.1 dB Signal Studio & MXG
7.6 Blocking
(in-band)
FRC A1-1, 1-2, 1-3
QPSK Mod
CW or E-UTRA
Offsets up to 7.5 MHz*57.1 dB Signal Studio + MXG + PXB
7.6 Blocking
(out-of-band)
FRC A1-1, 1-2, 1-3
QPSK Mod
CW
Offsets up to 12.75 GHz85.1 dB Signal Studio & MXG + PSG
7.6 Blocking
(Co-location with other base stations)
FRC A1-1, 1-2, 1-3
QPSK Mod
CW
Freq from 728 MHz to 2690 MHz116.1 dB Signal Studio & MXG + MXG
7.7 Receiver Spurious Emissions NA NA NA MXA Spectrum Analyzer
7.8 Receiver IntermodulationFRC A1-1, 1-2, 1-3
QPSK Mod
CW offset up to 7.5 MHz* &
E-UTRA offset up to 18.2 MHz*48.1 dB Signal Studio & MXG + PXB
7.8 Receiver Intermodulation
(Narrow Band Intermodulation)
FRC A1-1, 1-2, 1-3
QPSK Mod
CW offset up to 415 kHz* &
E-UTRA offset up to 1780 kHz*48.1 dB Signal Studio & MXG + PXB
Notes
• * from channel edge of wanted signal
• Either ARB or real-time Signal Studio can be used
• Tests do not require channel emulation
• Test are performed open loop, i.e. no HARQ or timing adjustment feedback required
Agilent 3GPP LTE eNB Test SolutionseNB Conformance Tests – Receiver Characteristics
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Agilent 3GPP LTE eNB Test SolutionseNB Conformance Tests – Performance Requirements
Performance Requirements Wanted Signal Channel ModelChannel
ConfigurationFeedback
Agilent
Solution
8.2.1 PUSCH in Multipath Fading
Propagation Conditions
FRC A3, A4, A5
QPSK, 16QAM, 64QAM
EPA 5 Hz
EVA 5, 70 Hz
ETU 70, 300 Hz
1x2 (2x RX diversity)
1x4 (4x RX diversity)HARQ Real-time
8.2.2. UL Timing Adjustment
FRC A7, A8
QPSK & 16QAM
(SRS is optional)
Moving Propagation Model
a. ETU 200 Hz
b. AWGN
2x2 (2x RX diversity)
2x4 (2x RX diversity)
(Stationary & moving UE)
HARQ &
timing adjustment
Real-time +
Waveform Playback
8.2.3 HARQ-ACK Multiplexed on
PUSCH
FRC A3-1, A4-3 to A4-8
QPSK, 16QAMETU 70 Hz 1x2 (2x RX diversity) -- Waveform Playback
8.2.4 High Speed Train Conditions
FRC A3-2 to A3-7
QPSK
(PUCCH is optional)
High Speed Train with:
a. Open Space
b. Tunnel for multi-antenna
1x2 (2x RX diversity)
1x4 (4x RX diversity)HARQ Real-time
8.3.1 ACK Missed Detection
for Single User PUCCH Format 1aPUCCH ACK
EPA 5 Hz
EVA 5, 70 Hz
ETU 70, 300 Hz
1x2 (2x RX diversity)
1x4 (4x RX diversity)--
Real-time or
Waveform Playback
8.3.2 CQI Missed Detection
for PUCCH Format 2PUCCH CQI ETU 70 Hz
1x2 (2x RX diversity)
1x4 (4x RX diversity)--
Real-time or
Waveform Playback
8.3.3 ACK Missed Detection
for Multi User PUCCH Format 1aPUCCH ACK ETU 70 Hz
4x2 (2x RX diversity)
(Requires 3 interferers)-- Waveform Playback
8.4.1 PRACH False Alarm
Probability and Missed DetectionPRACH Preamble
ETU 70 Hz
AWGN (no fading)
1x2 (2x RX diversity)
1x4 (4x RX diversity)-- Waveform Playback
Notes
• All tests require channel emulation and AWGN
• All tests require RX diversity if supported by eNB
• Industry is requesting up to 4-way RX diversity for all tests, i.e. 1x4, 2x4, & 4x4 MIMO
• Agilent Solution indicates type of Signal Studio for 3GPP LTE FDD software. N5106A PXB MIMO receiver tester and N5182A MXG vector signal
generator are also required.
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LTE RF Design and Measurement Course
Page 38
Agilent 3GPP LTE Test Solutions Rx RF/BB Front End Verification
Generate simple test signals
• Create CW signals
• Create multi-tone signals
Generate simple LTE signals
• Ultimate physical layer flexibility
• Supports March 09 version of LTE standard
• Selectable BW from 1.4 MHz to 20 MHz
• Select PUSCH modulation: QSPK, 16QAM, 64QAM
• Configurable data payloads
• Allocate resource blocks in frequency & time
Measure basic RF parameters
• Analyze amplitude flatness
• Measure gain at each stage
• Analyze phase linearity
• Determine noise figure
• Measure EVM of components & subsystems
Signal Studio- Uplink FDD LTE
- ARB basic capability
MXG Vector Signal Generator Receiver Front End
MXA Signal Analyzer
Analog I/Q,
Digital I/Q,
DigRF
RF
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LTE RF Design and Measurement Course
Page 39
Agilent 3GPP LTE Test Solutions Rx Conformance Test
Real-time LTE Signal Generation
• PXB accepts closed loop feedback
• HARQ ACK/NACK signals
• Timing adjustment feedback
• LTE signal continuously adjusted based on feedback
• Predefined Fixed Reference Channel definitions
Real-time Channel Emulation
• Standards based channel models
• Custom defined channel models
• 24 paths of fading
• 120 MHz modulation bandwidth
• Simplified power calibration
Interfering Signals
• Add CW blocking signals
• Add modulated signals for blocking &interoperability test
• Calibrated AWGN for accurate C/N ratios
RF
Digital I/Q
Feedback
Signal StudioUplink FDD LTE
Real-time capability
eNBPXB MIMO Rx Tester
MXG Vector Signal Generator
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Page 40
Agilent 3GPP LTE Test Solutions RF/BB Channel Emulation
Advanced Channel Emulation
• 120 MHz fading bandwidth
• 24 paths of fading per channel
• Up to 8 independent fading channels
• Custom MIMO correlation settings
• Configurable antenna parameters
• Standards based channel models
• Simplified power calibration
• RF to RF fading with MXA
Simplified Signal Routing & Summing
• Combine independent channels for diversity or MIMO
• Windows operating system
• Intuitive GUI
Scalable Architecture
• Connect to ESG, MXG, & DSIM for signal creation
• Connect to MXA for RF fading applications
• Field upgradable with calibrated DSP blocks
Signal StudioMXG Vector Signal Generator
PXB MIMO Rx Tester
00h
01h
Tx0 Rx0
Rx1
RX Diversity
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Page 41
Agilent 3GPP LTE Test Solutions RF/BB Interference and Interoperability Test
Configuration flexibility
• Create: LTE, W-CDMA/HSPA, GSM/EDGE, cdma2000,
1xEV-DO, WiMAX, WLAN …
• Up to four internal baseband generators
• Sum CW carriers with wanted signal
• Sum modulated carriers with wanted signal
• Sum custom Matlab waveforms with wanted signal
• Add calibrated AWGN for accurate C/N ratios
Scalable Test Solutions
• Tailor capability & performance from SISO to MIMO
• Easily upgrade as your test needs evolve
• Connect to ESG, MXG, & DSIM for signal creation
• Connect to MXA for RF fading applications
• Field upgradable with calibrated DSP blocks
High Performance
• Real-time uplink FDD LTE signal creation
• Real-time MIMO channel emulation
• Simplified power calibration
• Wide bandwidth – ready for LTE Advanced (Rel 10)
PXB MIMO Rx Tester Interoperability testing
0
Signal StudioMXG Vector Signal Generator
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
PXB Closed Loop Test ConceptHARQ & Timing Adjustment Tests
10MHz
HARQ ACK/NACK
Digital I/Q
Baseband w/ Fading
10MHzLAN
GPIB
Frame Pulse
Signal Studio
N7624B 3GPP LTE FDD
eNB
RF
Throughput Testing Equipment Configuration
N5182A MXG
N5106A PXB
Timing Adjustment
CMOS 3.3 V inputs from eNB
•HARQ – Level Triggered
•Timing Adjustment – Serial Data
Dynamically Changing RF
•Frame Timing based on TA
•RV Index based on ACK/NACK
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Timing AdjustmentConformance Test Concept
Moving UE simulates changing propagation path lengths
In this example, the mobile UE is assigned blue Resource Blocks
Stationary UE
eNB Frame Timing
1 symbol (2048·Ts)
Normal Cyclic Prefix
Res
ou
rce
Blo
ck
s
Moving UE signal can arrive at wrong eNB frame timing as path length changes
UE transmission interferes with next symbol without timing adjustment
Details
• Stationary UE and moving UE transmit in same
subframe, but with different subcarriers
• Moving UE simulates changing propagation path
lengths & therefore different arrival times at eNB
• eNB must command moving UE to advance or delay
timing of transmission such that the signal arrives at
eNB with proper frame timing, i.e. does not overlap into
adjacent symbols
• Timing adjustment test is performed with even
subfames occupied
• Sounding Reference Signal (SRS) is optional for this
test
• This test is performed with real-time HARQ feedback
eNB
Timing Adjustment transmitted back to
UE, to align UE with eNB frame timing
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LTE RF Design and Measurement Course
Common RF Front End MeasurementsAmplitude Flatness
June 17-18, 200944
Issues
• LTE can correct some amplitude / phase
errors with RS
• Errors will manifest themselves as EVM
• Important because LTE BW is wider than
other cellular standards
• Need to test individual components, i.e.
Amplifiers, Filters, Mixers, etc
How to test
• LTE signals could be used
– Some configurations of LTE do not utilize
all subcarriers
– Power not constant over LTE BW
• Alternate approach with multitone signals
– Space tones over BW of interest
– Correction techniques enable flatness of
~0.1 dB
Signal Studio for Multitone Distortion
June 17-18, 200944
Receiver Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Common RF Front End MeasurementsAmplitude Flatness
June 17-18, 200945
Amplitude Flatness Test Calibration Configuration
MXG Signal Generator
MXA Signal Analyzer
10 MHz ReferenceLAN
RF Input
RF Output
Signal Studio for
Multitone Distortion DUT
June 17-18, 200945
Receiver Design and Measurement Challenges
Additional Benefit:
Entire System is calibrated!
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Common RF Front End MeasurementsAmplitude Flatness
June 17-18, 200946
Multitone Performance with Corrections
• 50 Tones
• Spaced over 100 MHz
Before Corrections After Corrections
Note: Scale per div is 0.2 dB in each graph Corrected flatness is ~ 0.1 dB!
June 17-18, 200946
Receiver Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
Common RF Front End MeasurementsPhase Linearity
June 17-18, 200947
Issues
• LTE can correct some amplitude / phase
errors with RS
• Errors will manifest themselves as EVM
• Important because LTE BW is wider than
other cellular standards
• Need to test individual components, i.e.
Amplifiers, Filters, Mixers, etc
How to test
• Can’t measure phase w/ Spectrum Analyzer
• High degree of integration may make
network analyzer impractical
• VSA can measure Amplitude flatness and
also Phase linearity of modulated LTE signal
MXG + 89601A VSA Measurement
June 17-18, 200947
Receiver Design and Measurement Challenges
Ampl. Flatness
Phase Linearity
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
RF-IC
DigRF
Common RF Front End MeasurementsAnalog-to-Digital Converter
MXG Signal Generator
Digital Stimulus / Analysis
89601A VSA Software
Signal Studio for 3GPP LTE
Issues
• Analyzing data in digital domain
How to test
• Modulated LTE stimulus
• Use Logic Analyzer or DSIM/ESG with 89601 VSA
June 17-18, 200948
Receiver Design and Measurement Challenges
Digital I/Q DSIM
N5102A
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LTE RF Design and Measurement Course
Common RF Front End Measurements
June 17-18, 200949
Other Things to Consider…
• Automatic Gain Control (AGC)
• Noise Figure
• Receiver Error Vector Magnitude
• Receiver Performance under Impaired
Conditions…
June 17-18, 200949
Receiver Design and Measurement Challenges
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LTE RF Design and Measurement Course
Receiver Performance under Impaired Conditions-Phase Noise Impairments
June 17-18, 2009
• LTE subcarrier spacing is 7.5 kHz or 15 kHz
• Close subcarrier spacing makes RX highly susceptible to phase noise problems
• Results in degraded EVM
• Signal generator can be used as LO, but typically have much better phase noise than
RX
• N5182A phase noise characteristic an be degraded very precisely
– Determine performance required for LO in RX
– Determine performance of RX with impaired signal from TX
“Pedestal” set to -90 dBc
June 17-18, 200950
Receiver Design and Measurement Challenges
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
June 17-18, 2009
Pedestal Phase Noise Set at
-90 dBc/Hz
MXG non-impaired phase
noise characteristic at -116
dBc/Hz
N5182A MXB Phase Noise Plots
(w and w/o Phase Noise Impairments)
June 17-18, 200951
Receiver Design and Measurement Challenges
Receiver Performance under Impaired Conditions-Phase Noise Impairments
~26 dBc/Hz
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
June 17-18, 2009
Phase noise characteristic with
pedestal set at -90 dBc/Hz
Two Carriers Spaced at 15 kHz (w and w/o Phase Noise Impairments)
MXG noise floor
June 17-18, 200952
Receiver Design and Measurement Challenges
Receiver Performance under Impaired Conditions-Phase Noise Impairments
~26 dBc/Hz
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
June 17-18, 2009
EVM has increased from less
than 0.5% to more than 6%
EVM degradation due to added Phase Noise
impairment at -90 dBc/Hz
June 17-18, 200953
Receiver Design and Measurement Challenges
Receiver Performance under Impaired Conditions-Phase Noise Impairments
Note:
Constellation appears
more Gaussian than
expected rotation.
Why?
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
June 17-18, 2009
5 MHz LTE signal with 20
MHz AWGN at 30 dB C/N
LTE Signal with AWGN
June 17-18, 200954
Receiver Design and Measurement Challenges
Receiver Performance under Impaired Conditions-AWGN Impairments
Although specified, is
not a real representation
of actual interference
due to NB allocations
used in OFDM systems
-Just a simplified model!
-Better for CDMA
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
June 17-18, 2009
Many Systems employ IQ Demoduators
Typical impairments
• I/Q DC offsets, IQ Quadrature Phase
• I/Q Gain Imbalance
• I/Q Skew (Delay)
Issues
• Creates LO feedthrough
• Creates unwanted images
• Results in degraded EVM (Classic “V”)
Can add with signal generator
• Compensate for errors in RX
• Determine impact from TX
LTE Signal w/ IQ impairments
Image
LO
Feedthrough
Original signal
(offset +30 MHz)
June 17-18, 200955
Receiver Design and Measurement Challenges
Receiver Performance under Impaired Conditions-IQ Impairments
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
June 17-18, 2009
LTE signal with 5 ns skew between I & Q
•EVM decreases from
0.5% to ~2%
•More noticeable in
EVM vs subcarrier
June 17-18, 200956
Receiver Design and Measurement Challenges
Receiver Performance under Impaired Conditions-IQ Impairments
Classic “V”:
Timing error gets
progressively worse
as subcarriers get
farther away CF
![Page 56: Transmitter Design Based on the book: and Measurement LTE ... · PDF fileLTE RF Design and Measurement Course Summary •LTE adds new complexities for transmitter design and test](https://reader033.vdocuments.us/reader033/viewer/2022051600/5aa30c297f8b9a07758dd586/html5/thumbnails/56.jpg)
© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
June 17-18, 2009
• Can receiver correctly reject interfering carriers?
• Selectivity tests
• Blocking tests
• IMD immunity tests
W-CDMA LTE
June 17-18, 200957
Receiver Design and Measurement Challenges
Receiver Performance under Impaired Conditions-Interference
Multi-Carrier output from single MXG
Note:
Don’t require multiple
Sig Gens, power combiners,
or isolators!
![Page 57: Transmitter Design Based on the book: and Measurement LTE ... · PDF fileLTE RF Design and Measurement Course Summary •LTE adds new complexities for transmitter design and test](https://reader033.vdocuments.us/reader033/viewer/2022051600/5aa30c297f8b9a07758dd586/html5/thumbnails/57.jpg)
© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
June 17-18, 2009
Propagation Conditions’ three major components:
• Delay spread (Amplitude / phase fluctuations) – result of multipath profile
• Doppler spreading – result of TX or RX movement
• TX/Rx Antenna Correlation Matrix
Amplitude fluctuations as a function of time
Deep Fade
~ 40dB!
June 17-18, 200958
Receiver Design and Measurement Challenges
Receiver Performance under Impaired Conditions-Fading
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© Agilent Technologies, Inc. 2009
LTE RF Design and Measurement Course
June 17-18, 2009
Effect of Amplitude and Phase changes on a QPSK constellation
QPSK modulated carrier faded with two paths of Rayleigh fading
June 17-18, 200959
Receiver Design and Measurement Challenges
Receiver Performance under Impaired Conditions-Fading
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LTE RF Design and Measurement Course
Baseband Measurements
Tools for Creating RF-RF Faded Signals
June 17-18, 2009
LTE RF Design and Measurement Course
60
Page 60
RF
Analog I/Q- Direct from PXB
- Connect to any DUT or RF
vector signal generator
with analog I/Q inputs
RF
Digital I/Q
Signal OutputsSignal Inputs Signal Creation Tools
ESG or MXGPXB
MXA
N5102A
Page 60
Agilent Restricted
June 17-18, 200960
Receiver Design and Measurement Challenges
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LTE RF Design and Measurement Course
Questions?
“Excuse me, is this the Society for
Asking Stupid Questions?”
www/agilent.com/find/4GWorld
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LTE RF Design and Measurement Course
Backup
June 17-18, 200962
Receiver Design and Measurement Challenges