tracker week 11th february 2004 0 cclrc, rutherford appleton laboratory, oxon, uk imperial college,...
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Tracker Week 11th February 2004
http://www.te.rl.ac.uk/esdg/cms-fed 1
CCLRC, Rutherford Appleton Laboratory, Oxon, UKImperial College, London, UKBrunel University, London, UK
presented by John Coughlan RAL
FED Status & Production Plans
Tracker Week 11th February 2004
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FED-PMC Production
Feb 2003 : Request for production of 40 (incl spares) more FED-PMC Mk3. Components on last time buy.
July 2003 : 28 delivered. Commissioning suspended.
Sept 2003 : Resistor problem reported;
11 cards repaired and returned
Dec 2003 : Commissioning restarted
Jan 2004 : 6 cards delivered (+ 3 USA repaired)
Feb 2004 : Final 6 cards just sent completes order.
Tracker Week 11th February 2004
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9U FEDv1 Production Summary
Productions
Jan 2003 : 2 boards. Working.
June 2003 : 3 boards. Working.
Oct 2003 : 6 boards. Major problems.
Feb 2004 : 6 boards. In production. New manufacturers.
Locations of 5 working FEDs
2 at CERN in Tracker Lab. (one is to go to PISA next week).
2 at Imperial
1 at RALFEDv1 commissioning activities
Recent visits to Assembly plants
Tender Process
Future FED productions
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Problem FED Batch (Oct 2003)
XRAY imageBGA 676 pins 1 mm pitch
Oct 2003: All 6 boards exhibited power shorts. BGAs.
All 6 were re-worked, replace BGAs (larger devices).
Dec 2003:006 : 2 Bscan errors007 : 1 Bscan error008 - 011 : Numerous Bscan errrors.None of these 6 boards should be sent outside UK.
Possible causes: Chemical contamination of pcbs depleting solder resist. Uncured solder resist ink leeching from vias (latter seen on similar boards).
Plans:Recover OptoRx from 008-011Send one board to National Physical Lab for analysis.Attempting recompense from pcb and/or assembler
Note: Dual supply: PCB and AssemblySame manufacturers for all 11 boards.
solder bridges x
Components
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FEDv1 CommissioningMajor Activities in progress to verify FEDv1 Design:
Front-End FPGA Algorithms : Test existing logic. (RAL)
S-LINK : Test readout logic using DAQ FEDKit. (Imperial & RAL)
Power : Measure driving all 96 FED opto inputs. (Imperial)
Temperature : Test over-temperature shutdown. (RAL)
Analogue : ADC circuit change (Imperial)
FPGA in-situ reprogramming: Implementing Compact Flash interface firmware. Last major firmware block. (RAL)
Final Software: Implementing software to operate in Tracker DAQ environment. (Imperial & RAL + Trk DAQ group, centre of gravity now moved to CERN with FEDs)
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FEDv1 Commissioning
ADC 1 10 10
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256 cycles 256 cycles
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No hits
Se
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averages8header status
nx256x16
trig4
Synch inSynch out
Sy
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emulator in
mu
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Serial I/O
Se
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B’Scan
Lo
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Config
Cluster Finding FPGA VERILOG Firmware
Full flags
data
Global reset
Co
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Sub resets
10
10
Ph
as
eR
eg
iste
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ha
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2 x 256 cycles 256 cycles nx256x16
trig1Synch error
4x
Temp Sensor
Delay Line
Opto Rx
Clock 40 MHzD
LL
1x2x4x
per adc channel phase compensation required to bring
data into step
+ Raw Data mode, Scope mode, Test modes...
160 MHz
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FEDv1 Commissioning
Working: APV Re-ordering. Pedestal registers loading/reading and subtraction.
Processed raw data mode is fully tested. Common mode median calculation and subtraction. Common mode median override. Cluster threshold registers loading/reading.
To do: Cluster finding. Disable strip function (by disabling a strip one can exclude it from the
CM calculation and the cluster finding). Testing FED error flags (disabling APVs, setting incorrect skew values,
etc).
Front-End FPGA Algorithms: Raw Data ; Processed Raw Data ; Zero Suppression
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FEDv1 Commissioning
Slink Receiver
Generic PCI Card
Slink Transmitter
Transition Card (ECAL)
VM
E B
ackp
lane
FED Controller
Slink Controller
Control via VXI-MXI-2
LVDS Cable
FED
S-LINK
BE FPGA:
Pattern Generator Logic
Set-up based at Imperial with logic from RAL
Quickly Transferring Event Data successfully
Studying clock signal reflections
Need to speed up tests & understand occasional hang-ups
Tracker Week 11th February 2004
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FEDv1 Commissioning
Power
Nr cards 1 20
5V (A) 6.5 130.0 +1.5V is derived from +5V rail.
3.3V (A) [3] 10.0 200.0 2.5V is derived from 3.3V
12V (A) 0.7 14.0 -5V is derived from +12V rail.
Typical Power (W) 80 1,603 estimate
Maximum Power (W) 96 1,926 estimate
Measured Power (W) [1] 75 1,500 No Inputs
*expect max 17 FEDs/crate
*
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Multi Channel FED Tester
DACs
Fibre reels
8-way MU optical connectors
Clks provided via QPLLs
Analogue Optical Hybrids
Cross-point switches
VME interface
System control FPGA
G. Iles & Co.
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FED Pulse Shaping Issues
Undershoot developed here by the
AD9218Effect not present on
scope
Un-optimised pulse shape from a FED channel emulatortest bench:NOT FROM THE FED
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FEDv1 Commissioning
FED Software Enhancements
Makefile update for easy project building and release FED Shared Libraries created with minimal dependencies
available for integration into other software projects. Version 1 Fed Standalone debug software suite Assert and Exception handling upgrade for DAQ use XDAQ FED Supervisor upgraded to XDAQ version 2 Installation script to set up software to use the FED XML description integration commenced, waiting for
upgrade to HAL version with xerces
See Online Software Meeting
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FEDv1 Future ProductionsProduction Plans
Feb/March 2004 : Finalise design changes for FEDv2.
Sign off against FED User Requirements Document.
April/May 2004 : Implement changes FEDv2 and review.
June/July 2004 : Manufacture 2 off FEDv2s.*
Q4/2004: Pre-production 20 off FEDv2s using company awarded tender.
Q2-Q4/2005: Production staged 500 off FEDv3s @ 50 month.
*NB: Some FPGAs now on long lead times (12+ weeks).
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FEDv2 Design ChangesMajor Changes:
Power Block : Rationalises design. Changes well defined. Now being tested on sister board CALICE project.
ADC : AD9218 Device Bug. Change to 1Vpp mode. Reduce gain by half. Implemented on existing boards.
FPGA Configuration : Reprogram VME Boot device in-situ. tbd.
QDR Memory : Need to switch to next generation device. (same as CALICE)
S-LINK & TTS Signals : New Transition Card.
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FEDv1 Assembly Companies
In last couple of months made visits to a number of Assembly plants (in UK)
Evaluate facilities in order to prepare tender documents.
Long term looking for a “one stop shop” solution for production:
Procurement, PCB manufacture, Assembly & Test
Advantages:
One company is responsible.
Can get guarantees.
Easier to manage.
Possibly cheaper.
Catching any problems early at company saves effort.
Disadvantages:
New procedures to learn. More effort in specification. Less control.
Minimise risk by understanding processes, equipment, test facilities.
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FEDv1 Assembly Companies
Have seen 3 companies that would be capable of staged 500 off FED production.
Medium size facilities 100-200 employees.
Professional approach.
All offer one stop shop solution.
All have a similar range of facilities with slight variations.
All offer advanced Quality Control and Test Facilities.
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Assembly Facilities
DD i Europe 2002 18
Manufacturing Process
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Assembly Facilities
DD i Europe 2002 17
Services availableServices available
Floor 2 ServicesFloor 1 Services
Box Build Assem bly
Final Asse mbly
Front E nd Engine eringFastrack
SMT Asse mbly
TestT/H As sembly
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Assembly Facilities
DD i Europe 2002 19
• Configured Line
• Dek 265 Fully Auto Printer, Highvolume (50K/hr) - S iemens I s-placeHS50/F5 + 10 Zone BTU Pyramax Oven
• Configured Line
• EKRA E5 Fully Auto Printer, Medium -high volume (20K/ hr) - Mydata MY15+ 10Zone BTU Pyramax Oven
• Configured Line
• Dek 248 + Vision, Medium volume(15K/ hr) – 2 x Tenryu + 5 Zone S iroccoOven
• Configured Cell
• Dek 248 + Vision, Low - mediumvolume (6K/hr) - 4 x Mydata TP9 2 x 6Zone Surf
PCB Assembly CapabilitiesPCB Assembly Capabilities
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Assembly Facilities
DD i Europe 2002 23
• Automated Optical I nspection(AOI ) x 2
• Optical inspection
• 3D X- ray (BGA) I nspection
Quality Inspection ProcessesQuality Inspection Processes
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Assembly Facilities
DD i Europe 2002 51
Takaya 9400 FICT ATE
Programming Debug ATE facility. Off-line Programming bureau facility. Fabmaster CAD file conversion software.
Customers include:
BAE, Malvern, Sun Micro, Marconi
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FEDv1 Current ProductionImpressed with companies and their Quality Control and Test Facilities.
Much better than our previous prototype assembler.
Have learnt a lot by visits.
(Have also offered useful general advice on manufacturing issues, e.g. pcb metal finishes, Pb free directive).
Decided to switch and assemble existing 6 FEDv1 PCBs with one of these new companies to get experience: DDi Technologies.
(DDi also manufactured PCBs hence could offer manufacture guarantees, effectively one stop shop).
In process of setting up for assembly, exchanging design files and modification lists.Learning curve.Thermal profile in ovens using one of the bad boards from previous production.
Will Assemble, AOI, all FPGAs X-Rayed and do Flying Probe Test on assembled boards.
Delivery date for 6 boards is March 8th.
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EU Tender ProcessEU Procurement Directives:
Goods & Services > £150 K
Open Procedure : Any party can tender, suitable for off the shelf items (e.g. components)
Restricted Procedure : Only N selected parties are invited to tender. N to be specified in advance. Two part process. Market survey + Tender.
Publish OJEC Notice for Expressions of Interest. Can pre-notify selected companies.
Associated Questionnaire. Rather general document. Elicit size, history of company, financial standing, standards adherence, facilities etc.
Evaluation and Selection of N companies to tender. Detailed enquiries. Visits.
Issue Tender. Detailed specification.
Still learning about these procedures. And how they fit with CERN (and CMS) procedures.
RAL is just about to issue a general pcb manufacture notice. Can benefit a lot from their experience.
Some issues to decide, eg is separate tender for FPGAs necessary?
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Restricted Procedure
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Testing At Assembly plant.
Do as much as possible. Discuss with companies. Positive responses. Q. Cost?
Boundary Scan. Flying probe or ATE. VME Crate single card tests. (without Opto inputs, using internal test
features). Major software effort to devise suitable tests with diagnostics. Draft document for “Reduced Test Setup at Assembly” just released.
Full System Tests at RAL/Imperial Full crate tests. Interfaces to TTC. Full optical soak system tests before shipping.
Installation and commissioning. Ship FEDs to Prevessin staging point. Repeat standalone soak tests? Install boards individually at CMS.
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Spares Manufacture all in one go.
Need 440 for CMS Tracker. 60 working spares (for lifetime of CMS). Guesstimate. Assume final 500 delivered pass all commissioning tests.
Issues for later productions. Component availability. Memories. Expert availability. Design and Test. Changes in pcb and assembly processes. Standards. Markets. Pb Free Directive
Failure rates Hard to determine yet. Based on previous experiments assume normal failure rate is low after
commissioning, bath tub distribution (catastrophic crate loss?). Consider accelerated ageing tests offered by assembly companies? Assume most failures can be repaired. OptoRx can be removed.
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Pb Free Directive We know it’s coming…
WEEE July 2006. In principle a good thing. Japan already claims Pb Free. Military, Automotive exempt (but small markets). We may be exempt. Contract manufacturers constrained to switch for mainstream
production. No drop in replacement to eutectic Sn/Pb solder. Alternatives require higher soldering temperatures. Manufacturing processes not fully understood. BGAs solder type? No long term experience of alternative solder e.g. failure in service. May require changing pcb base material from FR4.
Would advise to make FEDs before industry switches…
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Summary FEDv1
6 more FEDv1’s in production. Commissioning tests at (CERN, Imperial & RAL) proceeding well. Target is to finalise changes for FEDv2 in next couple of months.
Design FEDv2 Implement design changes in April/May Manufacture couple of boards in summer.
Manufacture Looking a one stop shop solution. Presently evaluating possible candidates for large FED production (also
outside UK). Proposal document for test at Assembly plant. Learning fast about operation of processes and facilities.
EU Tender Investigating EU procedures. Learn from present RAL tender.
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End
Intentionally left blank
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First FED Prototype (Jan 2003)
Primary Side(Secondary side has 1/2 analogue)
OptoRx
CFlash
VME64x9U board
34 x FPGAs ~40K-2M gates
Analogue
TTC Power
Event Buffers
96 channels
JTAGBoundary Scan
Deliver FED “Package”:HardwareFirmwareSoftware
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First Fully Assembled BoardPrimary Side Secondary Side
9U VME64x
PCB (2mm) 14 layers (incl 6 power & ground)
96 ADC channels : AD9218 Dual package 10 bit @ 40 MHz
~ 6 K components (smallest 0402) ; ~ 25 K tracks
1/2 Analogue circuitry on Secondary Side
Highest density at Front-End Units
FE Unit
BGAs 676 pins @ 1 mm pitch
Test with JTAG Boundary Scan
32http://www.te.rl.ac.uk/esdg/cms-fedTracker Week 11th February 2004
CMS Tracker FED
TrimDAC
differential op-amp ADC 9218
To readout
0v
RLoad
100
100 -> 50
33http://www.te.rl.ac.uk/esdg/cms-fedTracker Week 11th February 2004
CMS Tracker FED Firmware Status
Clocks
Data
SerialControls
VMELINK
VMEBus
VMESystemSystemACEACE
SystemACE
Clocks
EPROMEPROM
EPROM
TTCrxQDR Write QDR Read
SerialComms
Headers
TTCchanA
VME LinkRegs
S-LINKS-LINK S-LINK
Clocks
Data
SerialComms
ScopeMode
HeaderMode
FIFOs
Input
Regs
SerialControls
ScopeMode
Frame-FindngMode
Output
Input
Regs
Opto Rx DACOpto Rx DAC
DELAY FPGA x 3 x 8
FE FPGA x 8
BE FPGA
VME FPGA
ADCADC
Under Simulation
Under Test on FED
Only for FEDv2Only for FEDv2 Controls
Data Readout
Control
Throttle TCSInput
Cluster FindingCluster FindingModeMode
EdEd
SaeedSaeed
IvanIvan
EdEd
Ed, JohnEd, John
Saeed, IvanSaeed, Ivan
Chan BChan B
I2C
Temp
“Working” on FED
External Devices
TempTemp
14th July 2003
To be Implemented
QDR QDR