track g when did test - da integrated
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DA-Integrated Confidentialwww.da-integrated.com
Chipex 2011
When Did Test Become a Designer’s Challenge?
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DA-Integrated Confidentialwww.da-integrated.com
Chipex 2011
When Did Test Become a Designer’s Challenge?
Conclusion: in 2001!
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DA-Integrated Confidentialwww.da-integrated.com
Chipex 2011
When Did Test Become a Designer’s Challenge?
Conclusion: in 2001!
• about DA-Integrated
• evolution of microelectronics from a test perspective
• business realities of ATE industry
• 4 principles of IC test design considerations
• trends and predictions
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DA-Integrated Confidentialwww.da-integrated.com
DA-Integrated is a pure play services provider
Featuring all the capabilities and tools of a fabless
semiconductor company, we serve
• Systems companies, as their semiconductor division
• Fabless startups, as the complement to their core capability
• Established fabless and IDM, as elastic resource and
advanced capabilities
DA-Integrated
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DA-Integrated Confidentialwww.da-integrated.com
Test is Design and Manufacturing
Founded in 2002 as the world’s first fully independent test
development services provider
The key strength in test development is design and
manufacturing engineering capability
Growth of our business has been based on high level of
expertise, independence and breadth of capability
DA-Integrated
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Evolution of silicon IC from a test perspective
• Through to the mid-1990’s, a silicon IC was a smaller,
cheaper commoditized version of an electronic function
IC Evolution
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DA-Integrated Confidentialwww.da-integrated.com
Evolution of silicon IC from a test perspective
• Through to the mid-1990’s, a silicon IC was a smaller,
cheaper commoditized version of an electronic function
• VLSI, Embedded Memory, Serial IO allowed the silicon IC to
become a system enabler
The DUTs are now by far the highest performance electronic
devices in the lab!
IC Evolution
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Business realities of ATE industry
• Cost of test = time * rate
• Time α IC Complexity
• Rate α IC Complexity
• Test development effort (interval, cost) α IC Complexity
All trending in the wrong direction!
ATE Realities
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DA-Integrated Confidentialwww.da-integrated.com
Revenue of Two Semiconductor Bellwether Companies
$0
$2,000,000,000
$4,000,000,000
$6,000,000,000
$8,000,000,000
$10,000,000,000
$12,000,000,000
1989
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Big ATE Revenue Big Fab Equipment Revenue
Churn in ATE industry since 2001
• Divesting
• Buyouts
• Mergers
• Exits
• Restructuring
• Downsizing
• Platform Discontinuation
ATE Realities
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DA-Integrated Confidentialwww.da-integrated.com
Best Practices
BIST
TAP
BOST
PIPELINE
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Best Practices
BIST
TAP
BOST
PIPELINE
Built-in self test (BIST)
has been employed for embedded memory BIST (mBIST) and digital logic (Scan)
for many years.
In general, BIST means including an on-chip circuit that verifies the correct
structural fabrication of the device and provides a highly simplified electrical
signature enabling a vastly simplified and, often, faster production screen.
Embracing the reality that the sole purpose of production test is to verify the
absence of manufacturing defects is often the most difficult challenge for SoC
developers.
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Best Practices
BIST
TAP
BOST
PIPELINE
Test access ports (TAPs)
can be created as a standalone input/output (I/O) or by muxing TAP functionality
with system function-related I/O.
Fundamentally, electrical access to BIST I/O or functional I/O of embedded blocks
must be provided to enable practical production testing.
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Best Practices
BIST
TAP
BOST
PIPELINE
Built-out self test (BOST)
refers to the use of custom circuitry or instrumentation that is not fully integrated
into either the SoC device or the ATE system.
Usually, BOST is included on loadboards as custom circuitry or modules.
Traditionally, BOST was frowned upon due to factory floor considerations such as
scalability, calibration and maintenance.
However, with SoC ATE instrumentation quickly losing ground to SoC device
functionality, production test solutions, including BOST, are becoming
common.
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Best Practices
BIST
TAP
BOST
PIPELINE
Pipelined test flows
directly address the mismatch of test instrument cost versus utilization by
disassembling test into multiple stages. A major drawback of highly
sophisticated SoC ATE systems is that the value and cost of any specific
instrument is inversely proportional to its utilization and contribution to fault
coverage.
The principles of defect clustering dictate that the low-complexity tests such as
supply current testing, direct current (DC) parametrics and low-speed signal
tests capture the vast majority of the defect-related dropout and justifiably
occupy the bulk of test time.
The high-performance, high-cost instruments provide only incremental fault
coverage along with a non-linear contribution to test cost while sitting idle for
the majority of the test interval.
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ConclusionWhen Did Test Become a Designer’s Challenge?
2001
Testers are becoming:
- Operator and Handler interfaces
- Data handling machines
- Power supplies
- TAP controllers
Product Definition, Device architects, Designers must have a thorough understanding of
manufacturing test to be considered current
Test Engineers must have a thorough understanding of design and develop new skills to define and
implement BIST, TAP, BOST
Industry and Supply Management must adapt to Pipelined testing
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DA-Integrated Confidentialwww.da-integrated.com
Your Microelectronics Partner
DA-Integrated is the Semiconductor Industry's first and leading provider of comprehensive
Integrated Circuit Development and Supply Engineering Services.
DA-Integrated features the full suite of tools and expertise of a fabless semiconductor company,
offered as pure play services, complementing our customer’s core capability.
Customer Core ExpertiseProduct Definition,
Internal IC Capability,Application Oriented Technology and IP
DA-DesignArchitecture,
Digital and Analog Design,Verification,
DFT, Physical DesignDA-Test
ATE Solutions, Hardware, SoftwareInstruments, Loadboard Circuitry,
Test Related IP
DA-OperationsSpecialized Production Facilities,
High Complexity, Moderate Volume
DA-SupplySupply Management,
Reliability,Product Engineering
Thank You