TIB module performance at X5 Test beam – preliminary

studies

G.Segneri et al.Universita` and INFN - Pisa

Test Beam meeting – October 23 2003

Outline

• Detector behavior under different bias voltages

• Studies on Detector Response Uniformity

Voltage scan for TIB Detectors

• Study of the detector properties (noise, charge, S/N, cluster width and response function) as a function of the applied voltage

Used runs: TIB peak: 1198, 99, 1202, 03, 04, 14, 15 -

120 GeV TIB dec.: 30020, 24, 27, 33, 36, 39, 42, 46 – 120 GeV , 25 ns beam

Beam Position in TIB Modules

muon beam pion beam

TIB Voltage scan -peak

• Peculiar behaviour at 300 V – hysteresis effect?

TIB Voltage scan – peak (II)

TIB Voltage scan – dec.

TIB Voltage scan – dec. (II)

20% increase in S/N ratio for Vbias = 2Vfd

Response Function

Cluster ShapePeak modeVbias=200V

Dec. modeVbias=200V

Peak modeVbias=450V

Dec. modeVbias=450V

TIB Voltage scan under controlled environmental

conditionsRun numbers:T<23 oC: 30133, 37, 40,

42, 45, 47, 50R.H.<20%: 30154, (62-

66), (69-74)

120 GeV muon beam

beamT<23 oC

Performance reproducible under controlled RH condition signal and noise depend on RH but not their ratio

TIB Voltage scan under controlled environmental

conditions (II)

Voltage Scan for TOB Detectors

Used runs: 30145, 47, 51, 63, 64, 65 – 120 GeV , 25 ns beam – deconvolution mode

TOB mod # 7 TOB mod # 8

TOB mod # 12TOB mod # 11

TOB mod # 10TOB mod # 9

TOB Voltage scan

Noise constant above 200 V Charge collection improvement at very high voltage

TOB module voltage scan (II)

25% decrease in S/N for Vbias = Vfd

TOB module voltage scan (III)

Less 10% of charge loss at Vbias/Vdepl>1.5 Constant cluster width above Vbias=300 V

Comparison TIB/TOB

95% of S/N highest value at 1.7 (1.5) Vdepl for TOB (TIB) modules

Sensor Uniformity Studies• Study of the TIB sensor properties (noise,

charge, S/N, respone function) as a function of the cluster position

Used runs: Run 1351-3: peak mode, pion beam, approx.

500,000 events Run 1484: dec mode, 25 ns pion beam,

approx. 1,500,000 events

Groups of 16 strips

Groups of 8 strips Groups of 16 strips

Conclusions

• TIB and TOB modules behave as expected except

in some runs to be understood • Dependence on RH to be investigated more

deeply (next talk?)• Uniformity of detector performance as a

function of the position was successfully tested in high statistics runs

• Work still in progress…