the latest developments in on- line measurement …...the latest developments in on-line measurement...
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NDC Technologies Proprietary & Confidential Information. Document Reference Number
The Latest Developments in On-line Measurement and Control for
Film Extrusion & Coating Applications
NDC Technologies Proprietary & Confidential Information. Document Reference Number NDC Technologies Proprietary & Confidential Information. Document Reference Number SHEAD 2016
NDC Business Focus
High Value Measurement & Control Solutions for raw & intermediate materials used in manufacturing of consumer goods
Robust stable measurements, unaffected by the environment, fit for process control
NDC Technologies Proprietary & Confidential Information. Document Reference Number NDC Technologies Proprietary & Confidential Information. Document Reference Number SHEAD 2016
Measurement TechnologiesNIR, Gamma Backscatter, Beta Transmission, X-Ray Backscatter, Transmission
X-ray Fluorescence Microwave, UV Fluorescence, Laser Calliper, Laser diameter Ultrasonics, X-ray Thickness, Width and Flatness
Food & Bulk On line and At line IR
measurement solutionsfor composition analysis
Web - Packaging Film thickness, coat weight,
moisture, scanning profile measurementdisplay & control systems
Cable & Tube Diameter, speed,
length, ovality, wall thickness
NDC Technologies Businesses
Metals Thickness, width,
flatness and coating weight
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►Measurement & control Systems
►10,000 Systems installed worldwide:
►Measuring thickness, basis weight, coating weight and barrier layers for:
Converting Paper Nonwovens Extrusion Flexible Packaging Rubber & PVC Calendering
NDC Web Solutions
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• 1940’s – start of the nuclear era [Manhattan Project (1942 to 1946).
• 1951 first nuclear energy generation
• 1948 Tracerlab (USA) invented and sold the 1st on-line basis weight sensor; a Krypton 85 beta transmission gauge.
• 1965 NDC was founded by a former employee of Tracerlab (Mr Fishman) who invented and marketed the gamma backscatter sensor
A very Brief History of the Gauging Industry
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A very Brief History of the Gauging Industry
An advert you are unlikely to see today!
September 1949
Indeed you are more likely to see these signs
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• Measurex founded in 1969 -> very influential and significant player within the history of our industry bringing out the first computer based systems.
• Alfrey & Schrenk developed multilayer film technology in the 60’s. Early 70’s Brun developed 1st NIR sensor to measure barrier layers. Only in mid 80’s did these films commercially take off. NIR development grew from there.
• Egan (part of Davis Standard) filed the 1st autodie patent (1972). But it was EDI/Welexwho in 1974 went commercial with the air cooled bolt heater concept (LFE was the gauge partner).
• 1995 the worlds first 10.4m film line (BOPP) was commissioned.
• 2016 the worlds first 6.3m CPP lines was commissioned
A very Brief History of the Gauging Industry
NDC Technologies Proprietary & Confidential Information. Document Reference Number NDC Technologies Proprietary & Confidential Information. Document Reference Number SHEAD 2016
Manufacturing Considerations
Quality Variation without
Automatic Control
Quality Variation with
Automatic Control
Target before optimization
Target Shift to Reduce Raw
Material Consumption
Target after optimization
Lower Quality Limit
Production Increase %
Product Change Time 10-30%
Start Up Time 10-30%
MD/CD Scrap Reduction 30-50%
Downstream Savings %
Reduced Scrap due to: SlittingQuality rejectsRegrindDowngradeCustomer returns
10-20% of machine direction & profile scrap
Quality Improvements %
MD Spread Reduction 30-50%
CD Spread Reduction 50-80%
Material Savings %
Weight or Thickness Down Gauging
1-5%
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Achieving Optimum Results with Gauging
Application-matched Measurements & Controls ǀ No Surprises ǀ & Reliable
Accuracy Control CapabilityRepeatable Measurements
Effective Controls
Intuitive OS
Doc. results/Confidence
Management Decisions
ROI
UptimeSupport/trainingTCOAcceptance
ContdResults
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Consider - TCO
In Korea buying a system with a radiation sensor
Initial purchase cost $X
Cost of ownership: Importation licenseMonthly Radiation Safety Administration
Fee (per person)Source exchange/disposal fee + shipping
TCO after 10-years = $X
So total cost of the system = $2X
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X X
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Low repeatabilityLow accuracy
High repeatabilityHigh accurate
High repeatabilityLow accurate
Low repeatabilityHigh accuracy
XX X
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Consider – Application Matched Solutions
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Speciality Films & Flexible Packaging
Parameter Requirements
Product Quality Minimal quality variationFlat roll structureRuns efficiently through conversionMeets customer specifications
Process Minimum raw material use Performance Fast start up
Fast grade changeMinimum scrapFast problem identification
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Web Gauging Requirements
Item ExpectationsItem Expectations
Measurement Accurate, repeatable measurementMeasurement sensitivity <0.1 micronsAccurate die bolt mappingNon-contacting measurementNon-nuclear measurement
Profile High streak resolution <5mm Resolution
Scan Speed Fast scan up to 650mm/second
Controls Robust control strategies
HMI Interface Provide an effective process interface
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Introducing FilmPro
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Accurate Measurements: Introducing FilmPro
One gauge provides superior measurement across a wide range of films Efficient optical design for best precision New modular Fringe Suppression Optics (FSO) for thin, clear films Multilayer discrimination for up to 6 components Measures:
Clear, pigmented and some black tinted films Weight and thickness of voided, microporous and breathable films Oil content in microporous film
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IR Measurement Discrimination
LDPE, HDPE, LLDPEEVA*, PP EVOH PET
Polyamides (PA) Surlyn™ PS
Polyethylene
Polyester
100
0
50
1.5 3.02.0 Wavelength (micrometres)
2.5
%Tr
ansm
issi
on
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Weight
Insight into Short Term Machine Direction Variation
The Fast Fourier Transform Package (FFT) can be used to pinpoint high-frequency disturbances from out-of-round rolls, bad bearings and material surging
This FFT display identifies a dominant thickness disturbance every 1.8secs, or 1.99m, which was found to be an out-of-round roll
Thickness
Density
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Black Stretch Film CD sample
0
5
10
15
20
25
30
35
40
45
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
CPE black stretch film
LabFilmpro
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FilmPro Measurement Accuracy
Thin, Clear PET Voided PET
y = 1x + 0.036R² = 0.9997
0
5
10
15
20
25
30
0 5 10 15 20 25 30
Blen
ded
algo
rithm
out
put
Thickness (um)
TFG-Y 2114 (GN937) vs SIOS reference values Thin clear BOPP
BOPP 0-30um
Linear (BOPP 0-30um)
Thin Film PP
Thin, Clear PETy = 1.0039x + 0.218
R² = 0.9995
0
10
20
30
40
50
60
70
80
0 10 20 30 40 50 60 70 80
Unca
libra
ted
algo
rithm
out
put
Thickness (um)
TFG-Y 2114 (GN937) vs SIOS reference valueThin clear and filled PP and PE
BOPP clear
Linear (BOPP clear)
BOPP Filled & Clear Thin, Clear PA
PE Film Stretch Blown
0
10
20
30
40
50
60
70
80
90
100
0.00 20.00 40.00 60.00 80.00 100.00
FG71
0s
Thickness (SIOS) /um
PE film (stretch, blown, biax)
Dolci & Interplast black PE
refuse sacks
clear,blue & green PE
white PE
Black Stretch CD
0
5
10
15
20
25
30
35
40
45
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19Ax
is Ti
tle
CPE black stretch film
Lab
Std 3010 filled alg
New 3024 alg
CPE Black Stretch Film
0
5
10
15
20
25
30
35
40
45
50
0.00 10.00 20.00 30.00 40.00 50.00
FG71
0s
Thickness (SIOS) /um
CPE black stretch film
Dolci black PE
Dolci semi-clear
Dolci pale
Dolci medium
Dolci dark
Interplast black PE
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FilmPro Summary
Fast, accurate thickness measurement for film, sheet and coated products
Measurements include thickness, mass, moisture, density and oil content
Safe, reliable and more accurate than other sensor technologies
Pre-selected wavelengths are based on sound spectroscopy and chemical/physical rationale:• Most applications require only 3-4
component wavelengths with additional reference wavelengths
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Coating & Laminating Applications
Flexible Packaging Coated / Laminated Papers
Coated Paperboard
Packaging Laminates Pouches Multi-wall bags
Industrial grade papers Release liners Adhesive tapes & labels Photographic papers Crystal & powder
packaging NCR, CB, CF & CFB Labels
Bleached board Food packaging
– Liquid Packaging– Cup Stock
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Common Coating & Laminating Structures
NDC IR technology provides measurement visibility into the base, coating and laminating structures– Extruded sheet and films (clear or pigmented) and coatings:
• PE, PP, PA, BOPP, PET etc.– Co-extrusion layer thickness:
• PE, PA, EVOH, PP, Surlyn and other polymers where spectra do not overlap. Continuous multi-layer measurement for up to six components Near and mid-IR measurement capability
Board
PE
BoardPEFoilIonomerPE
Tie
PE
PE
PETieEVOHTie
Tie
Option
NDC710S
NDC710SNDC710SNDC710S
NDC710S
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NDC710S Infrared Backscatter SensorBackscatter sensor for measuring thin to thick organic
coatings and moisture:
– Clear & pigmented coatings– Moisture in paper, textiles and nonwovens– Able to discriminate up to 6 multi-layer coatings
Coatings on paper, board, textiles, polymer films and other scattering substrates:
Water or solvent-based Impregnation Solvent-less Barrier coatings Wax dip Lacquers Impregnation Hot melt Polymer extrusions
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NDC710S Infrared Backscatter Sensor
RPS09
Custom-made filters:-Up to 10 filters handle a broad range of IR measurement applications -6 simultaneous component measurement
High-speed filter wheel:-8000rpm for fast measurement response- 7.5msec measurement rate
Brushless DC motor:-5 year warranty
IR source:-Off-axis collecting mirror for efficient source focussing - 20W Low heat generation source -5 year source warranty
Window Contamination Monitor:-Checks dust and dirt build up and scattered light from contamination -Detects powders, haze and condensation
Environmentally designed: -IP 65 sealed sensor enclosure
Coating Films
Sintered Air Purge:-Keeps optical path clean
Segmented mirror: -High-efficiency segmented mirror -Improves pass-line insensitivity
Near & Mid IR measurement capability: -Detectors can measure wavelengths from 1 to 5μ
Measurement beam: -27mm wide beam -10mm beam for high-resolution APC applications
Reference detector:-Used for baseline correction -Compensates for optical and electrical changes
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NDC710S Direct Coat Weight Measurement The following coatings are measured with the –CH
band: Label stock Wax barriers on paper Polymer extrusion on paper/foils:
• Sugar wraps• Sacking • Packaging• Aseptic cartons
Cold seal adhesives on paper/films Wallpaper PVC plastisol coatings on paper UV Cured lacquers on paper Acrylic coatings on paper pre-metallizing Epoxy resin coatings (carbon fiber applications)
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NDC SR710S Infrared Backscatter Sensor Designed to measure the thickness of clear coatings
on shiny or reflective surfaces
Lacquer coat weights from 0.5-25gm2
Ultra thin coatings from 20-1000mg/m2
Applications include: Clear and lightly pigmented thin organic lacquer
coatings, adhesive coatings. Wax on aluminum or steel and thin water-based
coatings.
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NDC SR710S Coating & Laminating ApplicationsFlexible packaging:
– Vinyl, acrylic, epoxy, polyester, nitrocellulose & lacquers Can stock:
– Vinyl lacquers and lube coatings on aluminumAir conditioning foil:
– Water based coatings on foilsMetallized packaging:
– Lacquers on metallized surfaces and di-isocyanateadhesives in laminating
PE/Surlyn coatings:– Aluminium (aseptic packaging)
Cigarette– Foil laminated to paper
Protective/heat seal lacquers: – Aluminum (yoghurt tops etc.)
RPS09
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Thin Coatings Measurement:Dealing with Optical Fringe Interference
With shiny substrates, two strong reflections are captured by the gauge; one off the primary surface, with no absorption data, and the second off the substrate surface, which contains the needed absorption information
The two signals combine with a phase shift. If they are in phase, the gauge signal is stronger; out of phase, and the signal is weaker; this creates measurement errors
The phase shift / intensity depends on the coating thickness and refractive index Thin, clear coatings are the most problematic between 1 and 25 microns
Reflected intensity = RI Incident Light
Reflected intensity = R2
Thickness = d
Extra path length taken by the incident light
Coating
Foil or Shiny Substrate
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Interference Suppression Using Polarized Infrared Light at the Brewster Angle
Foil or Shiny Substrate
Polarized incident light at the Brewster angle
57O
R1R2
At the Brewster angle, R1 becomes zero and prevents optical interference
The Brewster angle is a function of the refractive index of the coating
0O
Angle of Incidence
1.0
0,9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
10o0o 20o 30o 40o 50o 60o 70o 80o 90o
Reflectance
57oa
bc
Curves a and c represent the two planes of polarized light Curve b represents unpolarized light At the Brewster angle, one plane of
polarized light (curve c) is not reflected by the coating surface This totally eliminates optical interference
effects
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NDC SR710S Infrared Backscatter Sensor
Sintered Air Purge:-Keeps optical path clean
Window Contamination Monitor:-Checks dust and dirt build up and scattered light from contamination -Detects powders, haze and condensation
Brushless DC motor:-5 year warranty
Custom-made filters:-Up to 10 filters handle a broad range of IR measurement applications -6 simultaneous component measurement
Measurement beam: -25wide beam -10mm beam for high resolution APC applications- Presented to the product at the Brewster angle
IR source:-Off-axis collecting mirror for efficient source focussing -20W low heat generation source -5 year source warranty
High-speed filter wheel:-8000rpm for fast measurement response with 7.5msec measurement rate
Reference Detector:- Monitors and compensates for source output
Steering Mirror:- Achieves the required Brewster angle
Polarizer
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SlimTrak Scanner
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OptiMike OM190HP Sensor Specifications
Measurement Range: 50 to 5000 microns
Measurement Backing Roll: High-performance stainless steel
Reproducibility ± 2-sigma : ± 0.5 microns
Accuracy ± 2-sigma : ± 5.0 microns
Response Time 10msec
100% Streak Response 1.6 mm
Measurement Resolution 0.10 microns
Maximum Sheet Temperature: 50°C
Maximum Sheet Width: 2500mm
Roll Wrap: 1mm product: 64o
5mm product: 85o
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