P A R I S F R A N C E

19 21 SE

PT

MEASURE AND CREATE THE FUTURE CHAIR OF THE SCIENTIFIC

AND TECHNICAL COMMITTEEJean-Remy FILTZ - LNE (FR)

CO-CHAIR Pierre CLAUDEL - CETIAT (FR)Miruna DOBRE - SFP ECONOMIE (BE)

GENERAL SECRETARIAT 33 (0)4 67 06 20 36 n info@cfmetrologie.com n www.cim2017.com

ORGANISING COMMITTEE

C A L L F O R P A P E R S

TO COMMUNICATE AND EXPAND YOUR NETWORK:

CLICK HERE

n submit a paper before 15 January 2017

n book a stand and exhibitn receive the programme

and plan your participation

18th INTERNATIONAL METROLOGY CONGRESS

CIM2017

AIMSn improve your measurement,

analysis and testing processes and control your risks

n explore the evolution of techniques, advances in R&D and industrial applications

PARTICIPANTS1 000 participants from 50 countriesn end-users of measurement

technology in industry and laboratories

n quality managers and decision makers

n manufacturers of measurement equipment and service providers

n academics and researchers

THEMES

R&D AND BEST PRACTICES FOR MEASUREMENT IN INDUSTRY

n a diversified conference programme and round tables sessions

n technical site visits and demonstrationsn an exhibition showcasing innovations and solutions

A 3 day conference to discover the technologies in measurement, explore industrial challenges and the latest innovations through:

n Drone and monitoring: the role for measurement?

n Measurement and declaration of conformity: ISO 17025 evolves

n Dynamic measurement and factory of the future: the metrology asset

n Metrology today in the pharmaceutical industry

n What progress for measurement to nanoscale?

n The measurement for water quality

ROUND TABLES SESSIONS

18th INTERNATIONAL METROLOGY CONGRESS

CIM2017

n Process

Uncertainties - Traceability - Interlaboratory comparisons - Calibration - Verification - Training - Cost optimisation - Certification - Metrology function

n Technics

Mass - Force - Flow - Pressure - Dimensional - Electricity - Time-frequency - Temperature - Hygrometry - Optics and photonics - Ionising radiation - Acoustics - Chemical measures - Biological measures

n Prospects

Dynamic measures - Additive manufacturing - Data metrology - News tools - New SI - Smart grids - Nanotechnology - Biotechnology and health - Environmental concerns

n Regulation

n International recognition

n Reply to authors 1st March 2017n Final papers due 15 July 2017n Selection for peer reviewed

journals

A U T H O R S I N F O S