test & test-modes for wireless - nmi
TRANSCRIPT
Test & Test-modes for Wireless Devices. June 2, 2015
Tim Masson
Application Engineer
Keysight Technologies
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Six bands, Seven radios and Eight standards –
you want to test it - - - How Fast?!!
Objective If you are responsible for RF test of WLAN, cellular, or
other wireless connectivity based devices...
This presentation will show you ways to increase your
testing throughput (faster), while maintaining high
quality product (better), at the lowest long term cost
(cheaper).
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Agenda – RF testing background
– Make your testing faster
– Make your testing better
– Make your testing less expensive
– Keysight can help
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The Need for RF Test
– How do we ensure devices play well together?
– How do we ensure devices will work in a wide range of (RF)
environments?
– How do we do this quickly and inexpensively given the
volumes of products and consumer cost demands?
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– With Billions & Billions of “Things” connecting by 2020
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Test Occurs Throughout the Product Lifecycle
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– Each phase has unique test & test equipment needs
Product
Development Production Test Conformance Testing
Design/develop device with
desired parameters such as:
• Leading edge technology
features
• Long battery life
• Low cost
Ensure device will work in a
variety of user environments
In cellular:
• Ensure device conforms to
standards / network
requirements
In WLAN / unlicensed bands:
• Ensure device will meet
applicable FCC/ETSI (or
other regulatory authority)
standards
• Final device calibration,
if required
• Verification that no
manufacturing defects
are present
• Fast measurements to
keep costs down
• Measurement accuracy
to keep yield up
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Testing can be simple Testing can be thorough
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But does it ensure the quality? But will it be cost effective?
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Balance between Quality and Cost
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Testing used to seem so simple …
“One- Box” test set did almost everything.
– Base station Emulation – controlled the DUT using OTA signalling protocols
– Power-up the DUT and it registers & attaches to the Test Set
– Set-up a ‘call’ to get DUT to transmit
• Handover/Hand-off to change channel
• Power-control to set transmit levels
• Loopback to enable BER/Sensitivity Test
• Audio generation & analysis to check microphone/earpiece/loudspeaker
5G and IoT 7
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One-box Tester …
5G and IoT 8
Agilent/Keysight ‘8960’ – over 30000 units installed in mobile phone
manufacturing test (circa 2008 …)
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Handset testing 2001 - 2011
– Supports major standards
• CDMA/CDMA2000/1xEVDO
• GSM/GPRS/EGPRS
• WCDMA/HSPA
• TD-SCDMA
– All manufacturing tests required
– Test ‘primitives’ to support Handset ‘Calibration’
– Designed for a factory environment
5G and IoT 9
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The world just moved on ….
Multi-band – multi-format – multi-standard
GSM/GPRS/WCDMA/HSPA/LTE/LTE-A (4G)
The Smart-phone revolution
Staggering growth in production volumes
Consumer demand for M O R E -- but expect to pay LESS
DATA services – increasing complexity
Standardisation of CHIPSETS
5G and IoT 11
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and we wanted …
Our Music
WLAN connectivity
Navigation – GPS & Gallileo & Beidou & & & …
Cameras
Bluetooth connectivity
Large high, resolution true colour displays
Thinner, but Larger
And above all Better Battery Life!
5G and IoT 12
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As devices gained in complexity...
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– Test times, and costs, rocketed higher
Increasing
Device
Complexity
Co
st
of
Test
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Increasing
Device
Complexity
Co
st
of
Test
No
n-s
ign
ali
ng
Fa
st
Seq
ue
nced
No
n-s
ign
ali
ng
New manufacturing test
techniques
• Non-signaling Test
• Chipset-enhanced
Sequencing
New Techniques were needed To slow and reverse the trend
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Signalling vs non-signalling Test Signalling Non-signalling
Control
RF RF & Control Automation
Embedded
Automation
Multi-channel test-set supports
Higher density, multiway tests
& virtually any format
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Boot-up time … DUT needs to power-up from ‘cold’?
Sync-to-network
Registration & Authentication tasks
Call–set-up – Answer – Connect
Now you can start ‘testing’
DUT State Changes: Power/Channel/Band/Format
Test the next format
DUT State Changes: Power/Channel/Band/Format
… and so on
What ‘kills’ test throughtput?
5G and IoT 16
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Signaling => Non-signaling => Fast Sequenced NS
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System
Search
Device
Registration
Device
Configuration
Change
Config Measure Measure
Change
Config Measure
Change
Config Measure
Change
Config Measure
Setup Measure/Measure Setup Measure Setup Measure/Measure
Setup Measure/Measure/Measure/Measure/Measure
...
...
Signaling
Non-Signaling
RF based + Fast Sequenced Non-Signaling
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We need to evolve to faster non-signaling test
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Basic Non-
signaling
Sync/
Sequence
RF + Multi-
sequence
Basic RF
stimulus/
measure
Sequencer
RF Based
Sequence /
Multi-Format
Test Equipment
Capability
Chipset
Capability
Non-Signaling Test
Non-Signaling PLUS
Sequence
Measurements
Non-Signaling PLUS
RF Based Fast
Sequence
Measurements
Te
st T
ime
Re
du
ctio
n
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De
ve
lop
me
nt E
ffo
rt
Go
es U
p
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Make Your Testing Faster
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– Considerations for maximum throughput
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Chipset test capabilities
Maximize system uptime
Test equipment capabilities &
speed Test techniques
How much you test
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Chipset Test Capabilities
Select chipsets with fast test modes
Focus design access on chipset control modes
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– There used to be dozens of Chipset manufacturers
Now there are only a few
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Basic Non-signaling
Add Sequence Capability
Add Multi-sequence
Add RF Based / Multi-
format / Multi-sequence
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Test Equipment Speed
– Measurement and analysis speed
– Computer/processor power and the ability for future upgrades
– Ensure your test equipment is able to use the fastest chipset test
modes (e.g. high speed source and analyzer sequencer capability)
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What is important?
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Test Optimization Techniques
– Ping Pong - Overlap testing and load/unload time
– Pipeline - Overlap testing of DUT receiver and DUT
transmitter where independent operation is allowed
– Combination techniques
– Smart Scheduling Instruments
– Single instruction – multiple measurement
– ‘Calibrate-then-test’ or Calibrate from Test Data?
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TRX1
Ping-Pong
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Summary:
Connect 4 two-antenna DUTs
Test these while connecting 4 additional DUTs
repeat
DUT 2
1 2
Boot up
Calibration
Tx test
Rx test
Rx Diversity test
Tx
Tx
Rx
Rx
Rx Tx
RxD
RxD
RxD
Boot
Boot
Boot
Boot
Cal
Cal
Cal
Cal Tx Rx RxD DUT 1
Next
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Unload / Load
Unload / Load Unload / Load
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Pipeline
time
Time saved
DUT1
RFI|O3
DUT2
RFIO|4
Tx-DUT1 Rx-DUT1 Boot/DUT2 Tx-DUT2 Rx-DUT2
Rx-DUT1 Tx-DUT1
Rx-DUT2 Tx-DUT2
Pipeline: test DUT1 Tx, DUT2 Rx in parallel; then swap
Boot-DUT1
Boot-DUT1
Boot/DUT2
Serial Test: 2 DUTs
DUT1
RFI|O3
DUT2
DUT1
Summary:
DUT1 Rx is tested while DUT2 Tx is tested
I/O is switched then
DUT1 Tx is tested while DUT2 Rx is tested
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TRX1
Combination: Ping Pong & Pipeline
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Connect 16 single antenna DUT, Ping Pong + Pipeline
DUT 1
DUT 2
DUT 3
DUT 4
DUT1/DUT2 Pipeline
DUT3/DUT4 Pipeline
Boot up Boot
Cal WiCon Cal
Boot
Tx WiCon Tx
Rx WiCon Rx
Cal
Boot Cal
Boot Tx
Tx Boot
Rx
Rx
Boot Cal Boot Tx Rx
Boot Cal Tx Boot Rx
Next Unload / Load
Unload / Load
Unload / Load
Unload / Load
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3
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4
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TRX1
Single Instruction Multi-format Testing
Connect 1 device per TRX
(1 Tx/Rx &1 Rx for cellular, 1 Tx/Rx for WiCON, 1 Rx for GNSS)
1 2
Tx Rx RxD Boot Cal DUT 1
Cellular
Next
Tx Rx Cal Rx Tx Boot Cal
WiCon
1
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Favored Technique when:
Load and Handling time is long
compared to test time
Test Equipment Requirements:
Number or ports to handle antennas
Support of all required formats
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Making Test Faster Summary
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Chipset Test Capability:
• Select chipsets with fastest test modes
Test Equipment Capability:
• Computer/processor horsepower and the ability for future upgrades
• Ensure test equipment supports the fastest chipset test modes
Test Techniques:
• Optimize throughput based on device test needs
How much you test:
• Eliminate tests that do not catch unique faults
Plan proactively for system uptime requirements
• Consider your support requirements to maximize your system
uptime and optimize your budget