×
Log in
Upload File
Most Popular
Study
Business
Design
Technology
Travel
Explore all categories
The top documents tagged [single event upset seu]
3D-DRESD R4R
357 views
Soft Errors Hardening Techniques in Nanometer SRAM Memories Author: Gabriel Torrens Caldentey Thesis Advisors:Sebastià Bota Ferragut, Ph.D. Jaume Segura
212 views
SEE Mitigation Strategies for Digital Circuit Design Applicable to ASIC and FPGAs Prof. Fernanda Lima Kastensmidt, Ph.D. Instituto de Informatica Universidade
268 views
1 CSPP/IMAPP Users' Group Meeting May 21-23, 2013 EOS Terra and Aqua Status Angelita (Angie) C. Kelly EOS Science Interface Manager Constellation Mission
217 views
Beamline Overview Collaboration Meeting 16 June 2014 Ken Moffeit 1:30pm - 3:00pmBeamline overview (15’+5’)Ken Moffeit Status of the beamline construction
216 views
Set and seu analysis of cntfet based designs in harsh environments
347 views
Test Methodology of Error Detection and Recovery using CRC in Altera FPGA Devices
59 views
Tracking and Particle ID June 15-16, 2011 Kevin Stenson Yesterday: Building a tracker Today: Future tech, reconstructing tracks and identifying particles
216 views
Historical and Recent Solar Activity and Geomagnetic Storms Affecting Spacecraft Operations Joe H. Allen, SCOSTEP GOMAC 2002 Session 14: Modern Space Systems
215 views
1 A Design Approach for Radiation-hard Digital Electronics Rajesh Garg Nikhil Jayakumar Sunil P Khatri Gwan Choi Department of Electrical and Computer
214 views
May 14-16, 2008 NATW'2008 1 Probabilistic Soft Error Rate Estimation from Statistical SEU Parameters Fan Wang* Vishwani D. Agrawal Department of Electrical
215 views
12004 MAPLD: 141Buchner Single Event Effects Testing of the Atmel IEEE1355 Protocol Chip Stephen Buchner 1, Mark Walter 2, Moses McCall 3 and Christian
214 views
Next >