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The top documents tagged [secondary ions]
Lecture-9 SIMS & NDT SIMS Basic Principles Instrumentation Mass Resolution Modes of Analysis Applications Non-Destructive Analysis (NDA) or Non-Destructive
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Secondary Ion Mass Spectrometry A look at SIMS and Surface Analysis
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Nanolitografi
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Recent results from NA61/SHINE Seweryn Kowalski for the NA61/SHINE Collaboration University of Silesia, Katowice
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NA61/SHINE experiment at the CERN SPS
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Beam Measurements After the Sources a t the Ion S ource Test Stand
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Presentation and description of facilities
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