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The top documents tagged [n test generation]
COE 571 Digital System Testing An Introduction Dr. Aiman H. El-Maleh Computer Engineering Department King Fahd University of Petroleum & Minerals Dr. Aiman
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1 Lecture 23 Design for Testability (DFT): Full-Scan n Definition n Ad-hoc methods n Scan design Design rules Scan register Scan flip-flops Scan test sequences
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