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Www.tyndall.ie Lorenzo O. Mereni Valeria Dimastrodonato Gediminas Juska Robert J. Young Emanuele Pelucchi Physical properties of highly uniform InGaAs
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Grazing Incidence X-ray Scattering from Patterned Nanoscale Dot Arrays D.S. Eastwood, D. Atkinson, B.K. Tanner and T.P.A. Hase Nanoscale Science and Technology
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