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The top documents tagged [field emission source]
1 Microtexture: Electron Diffraction in the SEM (L16) Texture, Microstructure & Anisotropy, Fall 2009 A.D. Rollett, P. Kalu
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Silicon VLSI backplanes which shows cracking in the Al mirror Image provided by Dr Neil Collings
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Scanning electron microscopy Katedra experimentálnej fyziky FMFI UK B r a t i s l a v a
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Silicon VLSI backplanes which shows cracking in the Al mirror Image provided by Dr Neil Collings
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Silicon VLSI backplanes which shows cracking in the Al mirror Image provided by Dr Neil Collings
19 views
Focused ion beam (FIB)
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