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The top documents tagged [faults f1]
Dec. 19, 2005ATS05: Agrawal and Doshi1 Concurrent Test Generation Auburn University, Department of Electrical and Computer Engineering Auburn, AL 36849,
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Jan 6-10th, 2007VLSI Design 20071 A Reduced Complexity Algorithm for Minimizing N-Detect Tests Kalyana R. Kantipudi Vishwani D. Agrawal Department of Electrical
214 views
Independence Fault Collapsing and Concurrent Test Generation Thesis Advisor: Vishwani D. Agrawal Committee Members: Victor P. Nelson, Charles E. Stroud
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Diagnostic and Detection Fault Collapsing for Multiple Output Circuits
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