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The top documents tagged [euv soft xray microscopes]
1 Uranium Oxide as a Highly Reflective Coating from 2.7 to 11.6 Nanometers William R. Evans, Richard L. Sandberg, David D. Allred*, Jed E. Johnson, R
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16 August 2006 Using Simultaneous Reflection and Transmission Measurements of Oxide to Help Determine Optical Constants in the EUV D. D. Allred, G. A
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2 May 2006 2 May 2006 Determining Optical Constants for ThO 2 Thin Films Sputtered Under Different Bias Voltages from 1.2 to 6.5 eV by Spectroscopic Ellipsometry
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