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The top documents tagged [defect coverage]
presentation
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HP Quality Center Portfolio Overview Valérie Joubert SOGETI – Managed Testing Services Carole Malinge HP Software & Solutions France Sogetis Second Testing
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Jan 6-10th, 2007VLSI Design 20071 A Reduced Complexity Algorithm for Minimizing N-Detect Tests Kalyana R. Kantipudi Vishwani D. Agrawal Department of Electrical
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Coverage-Based Testing Strategies and Reliability Modeling for Fault-Tolerant Software Systems
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Automated Counterfeit IC Physical Defect Characterization
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