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The top documents tagged [agrawal bushnellvlsi]

Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 23/19alt1 Lecture 23 Design for Testability (DFT): Full-Scan (Lecture 19alt in the Alternative Sequence)
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 23/19alt1 Lecture 23 Design for Testability (DFT): Full-Scan (Lecture 19alt in the Alternative Sequence)
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Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 31/22alt1 Lecture 31 System Test (Lecture 22alt in the Alternative Sequence) n Definition n Functional
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 31/22alt1 Lecture 31 System Test (Lecture 22alt in the Alternative Sequence) n Definition n Functional
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Copyright 2005, Agrawal & BushnellVLSI Test: Lecture 16alt1 Lecture 16alt Analog Circuit Test (Alternative to Lectures 17, 18, 19 and 30) Analog circuits
Copyright 2005, Agrawal & BushnellVLSI Test: Lecture 16alt1 Lecture 16alt Analog Circuit Test (Alternative to Lectures 17, 18, 19 and 30) Analog circuits
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Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 20/17alt1 Lecture 20 Delay Test (Lecture 17alt in the Alternative Sequence) n Delay test definition
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 20/17alt1 Lecture 20 Delay Test (Lecture 17alt in the Alternative Sequence) n Delay test definition
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Copyright 2005, Agrawal & BushnellVLSI Test: Lecture 19alt1 Lecture 19alt I DDQ Testing (Alternative for Lectures 21 and 22) n Definition n Faults detected
Copyright 2005, Agrawal & BushnellVLSI Test: Lecture 19alt1 Lecture 19alt I DDQ Testing (Alternative for Lectures 21 and 22) n Definition n Faults detected
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Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 281 Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard n Motivation n Bed-of-nails tester n System
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 281 Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard n Motivation n Bed-of-nails tester n System
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Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 301 Lecture 30 IEEE 1149.4 JTAG Analog Test Access Port and Standard n Motivation n Bus overview n
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 301 Lecture 30 IEEE 1149.4 JTAG Analog Test Access Port and Standard n Motivation n Bus overview n
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Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 9alt1 Lecture 9alt Combinational ATPG (A Shortened version of Original Lectures 9-12) n ATPG problem
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 9alt1 Lecture 9alt Combinational ATPG (A Shortened version of Original Lectures 9-12) n ATPG problem
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Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 11alt1 Lecture 11alt Advances in Combinational ATPG Algorithms Branch and Bound Search FAN – Multiple
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 11alt1 Lecture 11alt Advances in Combinational ATPG Algorithms Branch and Bound Search FAN – Multiple
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Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 14/13alt1 Lecture 14 Sequential Circuit ATPG Simulation-Based Methods (Lecture 13alt in the Alternative
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 14/13alt1 Lecture 14 Sequential Circuit ATPG Simulation-Based Methods (Lecture 13alt in the Alternative
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Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 171 Lecture 17 Analog Circuit Test -- A/D and D/A Converters Motivation Present state-of-the-art
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 171 Lecture 17 Analog Circuit Test -- A/D and D/A Converters Motivation Present state-of-the-art
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Copyright 2005, Agrawal & BushnellVLSI Test: Lecture 20alt1 Lecture 20alt DFT: Partial, Random-Access & Boundary Scan n Definition n Partial-scan architecture
Copyright 2005, Agrawal & BushnellVLSI Test: Lecture 20alt1 Lecture 20alt DFT: Partial, Random-Access & Boundary Scan n Definition n Partial-scan architecture
221 views