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The top documents tagged [active defects]
SRX Troubleshooting
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Platform ASICs Reliability
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I. Pintilie a , E. Fretwurst b , A. Junkes b , G. Lindström b
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Overview of Semiconductor Device Noise Research
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Generation of vacancy-related defects during focused swift-ion beam implantation of silicon
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Controlled Doping in Zinc Oxide Thin Films via Oxygen Plasma-Assisted Sol-Gel (OPASG) Processing
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Overview of Semiconductor Device Noise Research Gijs Bosman Noise Research Laboratory NEB 585 Electrical and Computer Engineering Department, University
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