Summary Actel ProAsic/3E Irradiation Tests

Antonio Pellegrino (work by Syracuse group)Nikhef, OT FE Architecture Mini-Review 06-03-2013

o introduction• doses

o irradiation tests• work done by SPECS group• work done by Syracuse group

o summary & outlook

2

Radiation Dose estimates

(see

M. K

arac

son

talk

at

14 F

eb E

lect

roni

cs m

eeti

ng)

OT FE Boxes (T1)

Dose per collision (Gy)

3

Radiation Dose estimates (cont’d)

(see M. Karacson talk at 14 Feb Electronics meeting)At FE location of T3 : ~210-14 Gray per collision

Assume (el+inel = 72 mb) 0.721014 collisions per fb-1

N(L,el+inel) = L·el+inel N(1fb-1,72mb) = 1015 b-1·7210-3 b = 0.721014

At FE location of T3 : ~1.44 Gray (0.144 krad) per fb-1

e.g. ~7.2 krad for 50 fb-1

Adopting a factor 2 safety for the simulation uncertainty and another factor 2 safety for the FE

irradiation testsa good figure to remember as radiation-hardness specification is ~30 krad

http://lhc-statistics.web.cern.ch/LHC-Statistics/ : 73d,17h,45m stable-beam 2012LHC~0.637107s

L(1yLHC,101032 cm-2s-1) = 0.637107s · 103310-24 b-1s-1 = 6.37 fb-1

to get the feeling…

4

A word about FPGA’s

ALTERA ARRIA GX FPGA 35K 780FBGA (EP1AGX35DF780I6)• 90-nm process technology (Arria II family 40-nm)• based on technology of Altera's Stratix® II GX FPGA

Actel ProAsic3/E A3PE1500 (A3PE1500-2FGG484)• 130-nm process technology• based on nonvolatile flash technology

Heidelberg design based on:

Nikhef design based on:

Background consideration: nonvolatile flash technology should be more radiation-tolerant (also already experience with SPECS and

TFC-FAN FPGAs in CtrlBox). However, processes that combine Flash and CMOS are typically 2-3 generations behind leading-edge CMOS

processes used by SRAM-based FPGAs.Irradiation Tests mandatory!

5

Irradiation Tests Actel ProAsic3E

o see talk by R. Mountain in LHCb Electronis Upgrade Meeting 14/Oct/2010

o see talk by R. Mountain in LHCb Electronis Upgrade Meeting 21/Jul/2011• roughly reproduce results from SPECS test• RAM: few SEU every 3min run (few krad per run)• similarly for Flash ROM

o see talk by JC Wang in LHCb Electronics Upgrade Meeting 14/Feb/2012• dedicated test of PLL and Nikhef TDC firmware (see next slides)

• SPECS project tested Proasic already in 2004 (SPECS + TFC-fan in CtrlBox) (D. Breton, J. Lefrançois et al., unpublished)

• programmable up to ~17 krad• still functioning until ~30 krad, then high current and malfunction

Tests of 3APE1500(-2) in 2010-2012 with 200Mev protons at Boston hospital

(Syracuse University, M. Artuso, E. Cowan, Bin Gui, D. Hsu, R. Mountain, JC Wang)

6

Actel Tests – People & Setup

Front

Back

AlignmentLaser spot

Proton Radio-Chromatograph

~28 mm (package)

Position (cm)

Rela

tive

Flu

x

• 226 MeV proton beam• test 2 Actel’s at a time

“back” 68% radiation of “front”

7

Actel PLL & TDC Test Setup

Set a 5-bit number for comparator to

check against measured TDC

(Nikhef + Syracuse)Twisted pair cable

provides delay for TDC to measure

Generate two 320 MHz and one 80 MHz clocks of fixed phases

Measure 40 MHz time signal, with

1280 MHz equivalent precision.

Check if frequencies of produced clocks

are correct

Check if measured TDC value agrees with U13/14 Re

cord

dur

ing

3min

(23

3 BX’

s) r

uns

(~2

krad

)

8

Irradiation Dose Actel PLL & TDC

Chips are tested in pairsFPGA 4 (front) & FPGA 3

(back)FPGA 2 (front) & FPGA 1

(back)FPGA J (front) & FPGA L

(back)Dose(back) ~ 68%

Dose(front)

All FPGAs receives 30 kRad or more, except for FPGA 1 that was intentionally removed for other

tests

talk by JC Wang in LHCb Electronics Upgrade Meeting 14/Feb/2012

9

Irradiation Results Actel PLL & TDC

Near station Computer crashed

Verification OKReconfiguration OKVerification OK

38

1.2x109

1

Verification failedReconfiguration

failed x3Power-cycle reconfiguration failed

Change comparator value to 11: large error count is seen. Change back to 10.

37

Results for FPGA 2 (received 45.6

krad)PLL lock error.

(run was with high intensity)

LED indicates TDC = 12

talk by JC Wang in LHCb Electronics Upgrade Meeting 14/Feb/2012

10

Summary irradiation tests Actel

talk by JC Wang in LHCb Electronics Upgrade Meeting 14/Feb/2012

talk by R. Mountain in LHCb Electronis Upgrade Meeting 14/Oct/2010talk by R. Mountain in LHCb Electronis Upgrade Meeting 21/Jul/2011

o programmable up to ~17 krado still functioning until ~30 krad, then high current and malfunctiono RAM: few SEU every 3min run (few krad per run)oafter irradiation, all chips fail firmware verification and reconfigurationo but they still seem to function as TDC’so hardly any PLL lock losto few TDC errors up to ~30 krad, then TDC values seem to “shift”

Preliminary

Write-up with final analysis forthcomingMajor thanks to Erika, Marina, Bin, Dylan, JC, Ray etc.

Actel kind of “passes” the tests, but margin quite narrow...(future generation from Microsemi 100 krad TID in 65-nm tech?)(if enough manpower at Nikhef, also looking at SMARTFUSION2, IGLOO2)