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STMicroelectronics
« Trends in high speed, low power Analog to Digital converters »
Laurent Dugoujon Data-Converters Design Mgr.
LECC2002 9-13 September 2002, Colmar-France
Outline
Introduction/Generalities ADC challenges ST ADC products Power Optimisation Design views ADC Trends Conclusion
STMicroelectronics
Introduction/Generalities
DEFINITIONS
LECC2002 9-13 September 2002, Colmar-France
Analog to Digital Converter(ADC)
ANALOGINPUT
D0
D3
D2
D1DIGITALOUTPUT
Ex:4 bits A/D converter.
t
analoginput
SamplingClock signal
TSA04XX
0000
1111
outputbinarycodes
reconstructedsignal
t
010010111…
1
11
16 possible output codes
ADC
Full scale amplitude
LSB=Full scale/2N
62mV for 1V/4bits
LECC2002 9-13 September 2002, Colmar-France
ADC MAIN PARAMETERS ADC functionality parameters:
– Number of output bits– Sampling frequency noted FS
– Number of channels
ADC performance parameters:– Static parameters: DNL, INL– Dynamic parameters: SNR, SINAD, ENOB, Analog input
bandwidth.– Power consumption, Area, Package
STMicroelectronics
GeneralitiesADC Market, Applications
LECC2002 9-13 September 2002, Colmar-France
ADC Market
Source:WSTS
ADC, DAC, SWITCHES & MUX
Regions US 42% Europe 22% Japan 18% A/P 16%
Year 2000– 1.8B$ total value – 646Mu total volume
LECC2002 9-13 September 2002, Colmar-France
High Energy PhysicsElectronic chain
Detector
ADCPADataProcessor
DAQDCS
Sensor Signal formating Events acquisitionStorageControlAnalysis…
LECC2002 9-13 September 2002, Colmar-France
Hi-volumes & Hi-tech Applications
Consumer Audio
Industrial Control
Consumer Video
RF/Military
Sampling Frequency
Nbr. bits
HEP
HEP Detectorsrequirements
10
10MHz
+ low Power+ no. channels
AP
Astro-Physics
Telecom
STMicroelectronics
ADC Challenge
ACCURACY and SPEED?
LECC2002 9-13 September 2002, Colmar-France
Speed-Accuracy coupling
Fundamental relation (Heisenberg):
h/2.LSBR
Applied to A/D Converter:
R=50 Ohms, 2N.LSB = 1Volt, h=6.626 10-34
2N.Fsamp <= 3.44 1015
ex: 12 bits/840Gsamples/s
Or 18bits/10Gsamples/s
T/2
LSB/2
Vin
Time
LECC2002 9-13 September 2002, Colmar-France
Real signals world
How many Gigabit/s on a wire ?
Today commercial 10Gbit/s with ECL levels
Power, EMI, Integrity loss, Package parasitics,.. Are the limiting factors against higher rates !
LECC2002 9-13 September 2002, Colmar-France
Clock accuracy problems
Generation of Clock signal:
Clock signal is usually the fastest signal of the acquisition system and determines the sampling instants:
signal
clock
jitter
LECC2002 9-13 September 2002, Colmar-France
Low-jitter Clock generation
Clock jitter:It characterizes the Quality of the time reference,
often expressed in ps pk-to-pk or rms.
Available generator technologies:
RC + Logic Xtal, VCXO Sp. Plls Jitter 100-1000ps 10-100ps 0.5-10psCost ~0.1$ ~1$ ~10$
LECC2002 9-13 September 2002, Colmar-France
Clock Quality vs ADC specs
Aperture time and Clock jitter for a Nbit ADC sampling an Analog signal of FIN frequency must be less than:
1/(PI x FIN x 2(N+1) )In order not to add degradation in the achieved Signal/Noise
Ratio.
Example: 10 bit conversion of 10MHz input needs less than 16ps jitter. (good quality Xtal oscillator is OK)
12bit of same 10MHz input needs 4ps max jitter !
LECC2002 9-13 September 2002, Colmar-France
Accuracy/speed
24
6810
1412
16182022
010K 100K 1M 10M 100M 1G 10G 100G
Heisenberg
1ps jitter
Effect. bits
Samplerate S/s
LECC2002 9-13 September 2002, Colmar-France
Sampling rate trend summary
Today best system clock jitter is 1ps Corresponding to 12bit resolution of 40MHz input
signal
Prototypes ADCs reach 0.5ps aperture time (8bit/1.3GHz)
Going beyond 12bit-40MHz will require sub-ps jitter clock generator preferably integrated to the ADC chip for noise, power and cost reductions.
LECC2002 9-13 September 2002, Colmar-France
Resolution of real conversion systems is limited by the « noise floor » resulting from differents noise sources: thermal noise, transistors intrinsic noise, …
Input-referred noise can be expressed as:
<vn2> = 4 kTReqFs/2
This should be less than Quantization noise that is:Q2/12, Q=Full scale/2N
Then :
N < Log2{Vfs2/(6kTReqFs)}1/2 – 1Given a 2Volts full scale and 1000ohms Req, it gives 19bit sampling at 100Ksps (or 16bit at 10Msps)
Resolution Problems
RnoiseEquiv.
NoiselessADC
Req
Vin
LECC2002 9-13 September 2002, Colmar-France
Accuracy/speed
24
6810
1412
16182022
010K 100K 1M 10M 100M 1G 10G 100G
Heisenberg1Kohm thermal
1ps jitter
Effect. bits
Samplerate S/s
LECC2002 9-13 September 2002, Colmar-France
High-speed ADCs ST products & services
TSA0801: 8-bit, single-Channel, 40Msps, 40mW
TSA1001: 10-bit, single-Channel, 25Msps, 35mW
TSA1002: 10-bit, single-Channel, 50Msps, 50mW
TSA1201: 12-bit, single-Channel, 50Msps, 130mW
TSA1203: 12-bit, dual-Channel, 40Msps, 230mW
TSA1204: 12-bit, dual-Channel, 20Msps, 120mW
TSA1005: 10-bits, dual Channel, 40 Msps, 200mW
2.5V supply voltage
TQFP48
+ Evaluation boards, Applications notes, support, IP integration, consulting…
LECC2002 9-13 September 2002, Colmar-France
ST ADCs Accuracy/speed
24
6810
1412
16182022
010K 100K 1M 10M 100M 1G 10G 100G
Heisenberg1Kohm thermal
1ps jitter
Effect. bits
Samplerate S/s
products
prototypes
LECC2002 9-13 September 2002, Colmar-France
Power optimisation
MeritFig.=2ENOB x Fs / Power ( x 10-11 )
TSA10019.7b, 25Msps35mW
MF=5.9
Closestcompetitor
MF=3.2
TSA10029.7b, 50Msps50mW
MF=8.3
Closestcompetitor
MF=4.2
TSA120110.5b, 50Msps130mW
MF=5.6
Closestcompetitor
MF=4.7
TSA1203 (dual)10.5b, 40Msps230mW
MF=5
Closestcompetitor
MF=2
Closest competitor
MF=1.2
TSA08017.9b, 40Msps40mW
MF=2.4
ADCs Vsupply=2.5V
Competitors Vsupply= 5V or 3.3V…
LECC2002 9-13 September 2002, Colmar-France
Designarchitectures
1E+4 1E+5 1E+6 1E+7 1E+8 1E+9
Sampling Frequency (Fs) (Hz)
5
10
15
20
25
30
Res
olu
tio
n (
n)
Sigma Delta Dual
Slope
Audio
SensorsInstrumentation
Successive Approximation Pipelined
Folded
High SpeedBasestation
InstrumentationIF sampling
Flash
Radars,RF
LECC2002 9-13 September 2002, Colmar-France
Very High Speed ADC (8bits/2Gsps)
Interleaved SAR ADCs
SA ADC 1
SA ADC 24
SA ADC 13
SA ADC 12
VIN 8
8
8
8M
UX
1
2:1
8M
UX
1
2:1
8
CO
MP
DAC
S/H
Die: 4mm2, IP: 0.45mm224 // unitary SAR ADC
0.18m CMOS
LECC2002 9-13 September 2002, Colmar-France
Pipelined ADCs
S/H
2bit 2bit
x2Vi-1 Vi
Digital correction
Output bits
1 pipeline stage
LECC2002 9-13 September 2002, Colmar-France
Folded-cascode Amplifier
pol
inpinm
opom
vcp
vcn
VDD
GND
Vtp=Vtn=0.7V
2.5V / 0.25m CMOS
G=90dBTHD=-86dBBW3dB=100MHz
LECC2002 9-13 September 2002, Colmar-France
CERN Alice-TPC ALTRO chip
LECC2002 9-13 September 2002, Colmar-France
7.7 mm
8.3 mm
Data Memory1K x 40
Pedestal Memory1K x 10
ProcessingLogic
3.8 mm
12 mm
14.1 mm
TQFP 176
24mm
CERN ALTRO chip: Layout and Package
Process STM HCMOS-7 (0.25 µ)Area 64 mm2
Dimensions 7.70 × 8.35 mm2
Transistors 6 MillionEmbedded Memory 800-KbitNo. ADCs 16Supply Voltage 2.5VPower Consumption 260mW @ 10 MSPSPackage TQFP-176
LECC2002 9-13 September 2002, Colmar-France
CERN ALTRO ADC results
MAX sampling rate in the TPC BW at PASA outputTPC requirement: ENOB > 9
2.5
k
k
k
k
LECC2002 9-13 September 2002, Colmar-France
0
2
4
6
8
10
12
1 10 100 1000
Rpol (k)
bits
0
20
40
60
80
100
120
mW
90 k
12 mW
9.7
ADC Operating Point
Effective Number of Bits
Power Consumption per Channel
ADC Power Consumption
20 k
30 mW
MPW values
Engineering Run values
Measured Analogue Power Consumption: 80 mA
(st.dev = 1.12 mA)
12.5 mW / channel
Optimised ADC power in ALTRO
LECC2002 9-13 September 2002, Colmar-France
CERN ALTRO spectrum analysis
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
0 1 2 3 4 5
f (MHz)
dB
c
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
0 1 2 3 4 5
f (MHz)
dB
c
Without Readout Clock With Readout Clock
HD2 HD3
HD2HD3
RDOclock
HD4HD4
LECC2002 9-13 September 2002, Colmar-France
INPUT SIGNAL AFTER 1st BASELINE CORRECTION
AFTER TAIL CANCELLATION AFTER 2nd BASELINE CORRECTION
ALTRO chip: Digital Processor Performance
LECC2002 9-13 September 2002, Colmar-France
ADC Trends Resolution-SpeedParalelism to exploit technology intrinsic speed of successive
generations technology (X2 every 2years)Intensification of integrated Digital Post-processing Number of channelsLower core sizes and power will allow higher integration Associated FunctionsInternal Clock re-generation will appear, Built-In-Self-Test,… PowerNew low-voltage cells/architectures for 1V technology on the
way… PackagesParasitics and size reduction associated to better dissipation
LECC2002 9-13 September 2002, Colmar-France
Conclusions
ADCs are used in many applications HEP is not so specific in terms of need Application Environment can degrades ADC perf. High Merit-figure ADC design needs large efforts Multi-ADCs integration is a powerfull path Digital integration is the same natural path We will use Moore’s law to buy resolution.speed