standard operating manual - hong kong university of
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NANOSYSTEM FABRICATION FACILITY (NFF), HKUST
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Standard Operating Manual ___________________________________________________________
STS ICP Compound Semiconductor Etcher
NANOSYSTEM FABRICATION FACILITY (NFF), HKUST
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Contents
1. Picture and Location
2. Process Capabilities
2.1 Cleanliness Standard
2.2 Possible Etching Materials
2.3 Process Specification
3. Contact List and How to Become a Qualified User
3.1 Emergency Responses and Communications
3.2 Training to Become a Qualified User
4 Operating Procedures
4.1 System Description
4.2 Safety Warnings
4.3 Operation Precautions and Rules
4.4 Initial Status Checks
4.5 Initial System Checks
4.6 Preparation before Etching
4.7 Recipe Selection
4.8 During the Run
4.9 Process Recording during the Process
4.10 Clean up
4.11 Check out
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1. Picture and Location
Fig. 1: STS ICP Compound Semiconductor Etcher
This tool is located at NFF Phase II Room 2240.
2. Process Capabilities
2.1 Cleanliness Standard
STS ICP compound semiconductor etcher is classified as Non-Standard equipment
2.2 Possible Etching Materials
1. GaN
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2. Sapphire
3. III-V semiconductor
4. Silicon
2.3 Process Specification
What the STS ICP compound semiconductor etcher CAN do
Sapphire, GaN and III-V compound semiconductor material of,
1. 2 inches full substrate
2. Small samples
All the substrate or samples should be placed on a specific 6” top plate for etching
What the STS ICP compound semiconductor etcher CANNOT do
1. Substrate larger than 2 inches in diameter
2. Tiny samples that can be blow away.
3. Dirty samples that will contaminate the top plate
4. Metal film etching
3. Contact List and How to Become a User
3.1 Emergency Responses and Communications
In case of emergency issues, please contact NFF staffs,
1. Preason Lee – Deputy Safety office (x7900),
2. CK Wong – senior technician (x7226)
In case of technical help, please contact NFF staffs,
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1. CK Wong – senior technician (x7896)
2. Casper Chung –technician (x7896)
3. Brial Kwok – technician (x7896)
3.2 Training to Become a Qualified ICP compound semiconductor User
Please follow the procedures below to become a qualified user:
1. Read all materials provided on the NFF website of the ICP compound
semiconductor etcher.
2. E-mail to NFF requesting ICP compound semiconductor operation training.
4. Operating Procedures
4.1 System Description
The STS ICP system is used to etch GaN, sapphire, III-V compound semiconductor
material, which offer anisotropic etch with low undercut.
The ICP system uses inductive coupled design, so high density plasma can be formed in
the process chamber, this in return capable for III-V compound semiconductor material
etching. Cl2 and BCl3 gases are used for the etching, and He gas is used for backside
cooling to ensure better control of the etch rate, selectivity and profile.
4.2 Safety Warnings
1. If the equipment failure while being used, never try to fix the problem by
yourself, please contact NFF etching module staffs
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2. In emergency, please push any one of the red emergency buttons (Fig. 2) to
interrupt the equipment power, and report to the NFF staffs immediately. DO
NOT attempt to resume the equipment on before the problem is solved.
3. If something going wrong during process and you are not sure what happened,
please check and write down the alarm/warning message and report to NFF
etching module staffs. Alarm/warning message will be displayed at the bottom of
the display (Fig.3). DO NOT attempt to resume the equipment on before the
alarm/warning message is verified.
Fig. 2: Emergency button Fig.3: Alarm/Warning message
4.3 Operation Precautions and Rules
1. Please reserve the time slot on your own, and make sure you use your own time
slot to do the etching process.
2. The system can be reserve from Monday to Friday, 9:00~18:00
3. Reservation will be forfeited if the user has not show up for 10 minutes and it
may cause $200 penalty.
4. Do not operate the equipment unless you are properly trained and approved by
NFF staffs
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5. Please fill all the details of the log-sheet attached, i.e. date, name, project number,
email, project details, material to be etch…
6. Do not leave an on-going etching process unattended
7. Do not skip any cycle purge steps during the process
8. Do not change details of the recipe, if you need to start a new recipe, please
consult NFF etching module staffs
4.4 Initial Status checks
1. Please check the status of ICP Compound semiconductor etcher shutdown notice
posted in the NFF reservation website.
2. According to the reserved time slot, please check-in the equipment on your own
3. After check-in the equipment, please check correct name and project number that
printed on the etching module LCD screen (Fig. 4).
4. If you failed to check in the machine, there is an interlock, and you cannot
operate the machine.
5. Before operate the machine, please make sure you have read and fill the details
of the check list.
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Fig.4: Reservation and Equipment check-in status LCD
4.5 Initial system checks
- Make sure the system is logged in STANDARD mode.
- Make sure there is no alarm/warning message is given out at the bottom of the display.
- Check the equipment is ready (Fig. 5) for the etching process in the main PC screen:
1. DP (dry pump) is turned ON
2. TB (turbo pump) is turned ON
3. GV (High vacuum gate valve) is OPEN
4. MP (load lock mechanical pump) is turned ON
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- Check any wafer left in the chamber or load lock chamber
If you have any questions on the above procedures, please contact module staffs for help.
Fig. 5: Process screen with equipment status
4.6 Preparation before Etching
You are advised to do the following steps before start do the etching process.
1. Confirm the gases involves in the etching process, this is because CH4 and SF6
gases share the same gas pipe. There is a label indicates the gas pipe is currently
occupied by CH4 or SF6 (Fig. 6). If you need to swap between CH4 and SF6,
please consult NFF staff.
2. Make sure the shutoff valves of the Cl2 and BCl3 gas delivery system are opened,
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so that the gas can be delivered to the system.
3. Check the cooling chiller located behind the main console is ON, and default
temperature is 20oC (Fig. 7)
4. Clean the back side of carrier top plate with IPA (Fig.8).
5. Perform a 10-20 minutes “O2 Clean” process before etching process.
Fig. 6: CH4/ SF6 gas usage indicator
Fig.7: Cooling Chiller Fig.8: Carrier top plate
4.7 Recipe Selection
Please make sure you select a right recipe, using wrong recipe may get unexpected
results. Please read the following Recipe Loading procedures:
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1. Click on the RECIPE button in the PC Process Control Window (Fig. 5), then the
recipe menu will be displayed (Fig. 9)
2. Check the recipe name you need. If not, click on the OPEN button, and select the
right recipe from the pull down menu (Fig. 10).
Fig.9: Recipe Menu Fig.10: Open Recipe
3. In the recipe menu, click on the etching step (Fig.11), then there are few pages of
parameters, please confirm all the parameters including etch time, pressure, gas
flow and RF power are correct:
i. General page: Only Process time is allowed to change (Fig. 11)
Fig. 11: Recipe General Page
ii. Pressure page: Check the process pressure set point. Sometimes, it is
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represents in percentage of valve opening angle (APC%). If you need to
change the pressure, please consult module staffs. (Fig. 12)
Fig. 12: Recipe Pressure Page
iii. Gases flow page: Check the gases flow are correct. If you need to change
the gases flow, please consult module staffs (Fig.13). However, illegal gases
combination will cause series damage to the equipment and personnel, e.g.
CH4 gas is prohibited when O2 gas is introduced (Fig. 14).
Fig. 13: Recipe Gases flow page Fig.14: Illegal gases combination
iv. RF page: Check the RF power set point. If you need to change the power,
please consult module staffs. (Fig. 15)
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Fig.15: Recipe RF power page
4. After set the etching time, confirm all the parameters are correct, then save and
quit this menu.
5. Back to the PC Process Control Window, click on the SELECT button, select the
recipe (Fig. 5) just saved, and the data will be loaded into the memory for
etching process.
6. Confirm the recipe is loaded into the memory (Fig. 5)
7. If the recipe you want to use is not listed in the menu, please consult NFF
module staffs.
Also, user has their own responsibility to record all the details parameters of recipe; we
will not provide you data-log check services.
4.8 Process Run
There are two methods to run the process, 1) manually, and 2) automatically.
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1) Manual Operation
Manual operation involves the following steps:
i) load lock chamber vent
ii) set substrate
iii) pump down and wafer loading
iv) run etching recipe
v) wafer unloading and load lock vent
i) Load lock chamber vent: Verify the Load-lock chamber is in vacuum or not. If the
chamber is in vacuum, click the VENT button in PC Transfer Window (Fig.16). During
venting, a chamber releasing warning message will be display at the bottom of the
screen (Fig 17).
Fig. 16: Manual operation in Transfer Window
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Fig.17: Chamber releasing message
ii) Set substrate: place substrate or samples on the carrier plate, and set the plate on the
load lock arm (Fig. 18).
Fig.18: Set substrate and carrier plate
iii) Pump down and wafer loading: Close the Load-lock chamber door gently after set
your samples and plate. In the PC Transfer Window, click on the Next Carousel text
bar (Fig.16), and type in simple lot name, i.e. project no. Then, press the
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PUMP+MAP button (Fig. 16). Make sure the chamber door was correctly closed;
otherwise the load lock chamber can not be pump down. Wait a few minutes to
evacuate the load lock chamber. When the crossover pressure reached, then click on
the LOAD button, and load lock arm will send the carrier plate into process chamber.
Then, carrier plate sits at the center of process chamber and the clamp down. Finally,
load lock gate valve will be closed, and process chamber will pump down to base
pressure.
iv) Run etching recipe: Normally, an etching recipe includes a few steps:
1) Waiting for base pressure: chamber pressure must be pump down to 0mTorr before
proceed to the next step, readout can be observed from the VAT controller display
(Fig. 19)
Fig.19: Chamber pressure readout
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2) Helium leak up rate check: In order to control the substrate temperature during
etching, Helium gas is introduced to the backside of the carrier plate. Then
mechanical wafer clamp is use to force the carrier plate to the O-ring mounted on the
electrode, so the helium pressure can be keep at specific pressure designed in recipe.
Typically, helium leak up rate displayed cannot exceed 30mTorr/min; otherwise the
process will be halted at this step (Fig. 20)
Fig.20: Helium leak up rate test
3) Waiting for Match: matching unit will move to the pre-set position designed in
recipe.
4) Gas Stabilization: different gas channels will deliver stable gas to the chamber.
5) Etching: RF power will be given, and RF matching unit start to match the impedance
inside the chamber. Effective RF matching can minimize the reflected power, and
increase the forward power until it reached the set point, then plasma ignite, and you
can observed the plasma light through the side viewports and in the PC screen (Fig.
21)
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Fig. 21: Plasma ignite
6) Pump out and Cycle purges: after etching process, chamber must be pump down to
base pressure, and then a series of cycle purge will be carry out in order to remove the
residue gas/hazard gas remain in the chamber.
However, during the etching process, all the etching parameters can be obtained
through the display screen. Also, in the PC Process Control Window, “SKIP/ABORT”
function keys can be used to skip or terminate the process during the run.
V) Wafer Unloading and Load lock Vent
Once the cycle purges completed, click the UNLOAD button to unload the carrier plate
back to the load lock chamber. After the carrier plate is successfully unloaded and the
gate door fully close, click VENT button to vent the chamber. The load lock chamber
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door will be release around 1minute (Fig.21).
2) Automatic Operation
Automatic operation involves the following steps:
i) Load lock chamber vent
ii) Set substrate
iii) Select process sequence
i) Load lock chamber vent: Same as manual operation, verify the Load-lock
chamber is in vacuum or not. If the chamber is in vacuum, click the VENT button
in PC Transfer Window (Fig.16). During venting, a chamber releasing warning
message will be displayed at the bottom of the screen (Fig 17).
ii) Set wafer: same as manual operation, place samples on the carrier plate, and set the
plate on the load lock arm (Fig. 18).
iii) Select process sequence: in PC Sequencer window, click OPEN to open the
sequencer library, and select the right sequence to be use (Fig. 22). To check details
of the sequence, click VIEW to open the sequence editor (Fig.22), which provide
you the information of the recipe inserted. If you cannot find a sequence that
contains the recipe you want to use, please consult NFF staff. Please be reminded a
sequence is not a recipe, it only executes the sample loading/unloading. So, run a
sequence contains wrong recipe will get unexpected result.
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Fig. 22: Sequence selection menu
After confirming the selected sequence in the screen (Fig.23), in PC Sequencer Window,
click on the text bar of the Next Carousel, and input simple log name, i.e. project
number (Fig.23). Next, click RUN button to initiate the process sequence (Fig. 23).
When all the steps executed automatically, you just need to collect back the samples
when the sequence completed.
Fig.23: Sequencer Window
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If there is any problem during sample transfer, in the PC Transfer Window, click
ABORT button to stop the transportation or pump down sequences.
4.9 Process Recording during the process
1. Please be reminded you are required to fill all the details of the log sheets
2. However, if you fail to do this, a punishment will be given
3. Write down any problems or comments in the log sheets
4.10 Clean up
1. Clean up the area
2. Return items to their proper locations
4.11 Check out
Check out the equipment in the NFF equipment reservation website immediately after
use.