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Recent advances in thermal wave detection and ranging for non-destructive testing and evaluation of materials
Ravibabu Mulaveesalaa,c*, V.S.Ghalib,c, Vanita aroraa, Juned.A.Siddiquic, Amarnath.Muniyappac and
Masahiro Takeid a Department of Electrical Engineering., Indian Institute of Technology Ropar, India;
b Signal Processing Research Group, K L University, Green Fields, Vaddeswaram, Guntur (Dist.), Andhra Pradesh, 522 502, India.;
c InfraRed Imaging Laboratory (IRIL), Electronics and Communication Engineering Research Group, PDPM-Indian Institute of Information Technology Design and Manufacturing, Jabalpur,
Airport road, Khamaria (P.O), Jabalpur, India-482005; d Graduate School of Chiba University, Artificial System Science, 1-33 Yayoi Inage Chiba #263-
8522 Japan.
ABSTRACT Thermal Wave Detection and Ranging (TWDAR) for non-destructive testing (TNDT) is a whole field, non-contact and non-destructive inspection method to reveal the surface or subsurface anomalies in the test sample, by recording the temperature distribution over it, for a given incident thermal excitation. Present work proposes recent trends in non-stationary thermal imaging methods which can be performed with less peak power heat sources than the widely used conventional pulsed thermographic methods (PT & PPT) and in very less time compared to sinusoidal modulated Lock-in Thermography (LT). Furthermore, results obtained with various non-stationary thermal imaging techniques are compared with the phase based conventional thermographic techniques. Keywords: Active thermography, Pulse compression, Frequency modulated thermal wave imaging, Barker code.
1. INTRODUCTION Thermal Non-destructive Testing (TNDT) has become a favorite choice among the various widely used subsurface imaging methods due to its whole field, non-contact and nondestructive evaluation procedure to assess the structural integrity of the objects. It has been carried using either in passive or active approaches. In passive approach inherent thermal response of the test object is captured and analyzed to reveal subsurface features. Capturing the thermal response in the absence of any external stimulation limits its applicability in producing better contrast for defects located at deeper depths in the test specimen. Whereas, in active approach, with its controlled heat stimulus along with its well supported processing techniques makes it as a reliable qualitative and quantitative testing procedure for surface and subsurface defect detection. In this method, a controlled stimulus is given and temperature map of the test object surface is captured using infrared imager. Thermal waves generated from the constituent frequency components of the stimulation in addition to various processing methods facilitate better depth analysis and fine subsurface details.
Among various excitation methods, Pulsed Thermography (PT), Lock-in Thermography (LT) and Pulse Phased Thermography (PPT) are widely used in numerous thermographic applications. In PT1, a short pulsed, high peak power stimulus is given to the sample and temporal temperature map has been captured. Influence of non-uniform emissivity and non-uniform heating over the surface may result in erroneous predictions in this direct contrast method and limits its applicability in spite of its quickest evaluation. In modulated wave thermography i.e., LT2and Frequency modulated thermal wave imaging3,4 (FMTWI) make use of low peak power sources for longer durations and improve penetration of thermal waves. Less attenuation provided by low frequency thermal waves has been used by LT to provide deeper depth details. But mono frequency excitation may not better resolve the defects at different depths and demands repetitive experimentation using a number of frequencies in realistic applications. In PPT5, test object is stimulated as it was done in PT, but analysis is carried by the application of Fast Fourier Transform (FFT) over thermal profiles of each pixel and detection can be carried from phasegrams at different frequencies.
Thermosense: Thermal Infrared Applications XXXV, edited by Gregory R. Stockton, Fred P. Colbert, Proc. of SPIE Vol. 8705, 870510 · © 2013 SPIE · CCC code: 0277-786X/13/$18 · doi: 10.1117/12.2018465
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