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DOC NoSP-Micro USB Rev A Page17

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

10 Scope This specification covers the requirements for product performance and test methods of

Micro USB Series Connectors of the part numbers specified as bellow

Product shall be of the design construction and physical dimensions specified in the applicable product

drawing

20 Rating

21 Voltage Rating 30 Vac (rms)

22 Temperature Range storage -20 to +60

operating -55 to +80 Nominal +20

23 Current Rating Signal only 10APin

Power apply 18APin (Pin No15) 05APin (Pin No2~4)

30 Test Condition

All tests shall be performed as bellow conditions unless otherwise specified

31 Temperature range +15 to +35

32 Humidity range 25 to 85

33 Atmospheric Pressure 86kPa to 106 kPa (860 to 1060 mber)

40 Test Methods and Requirements

41 Examination of product

Item Test Description Test Methods Requirement

411 Examination of

product (Outward

Appearance

Structure)

EIA 364-18 Shall be confirmed with eyes in

accordance with each drawing

Shall be confirmed by using proper

measuring instruments

1)Outward appearance shall be

good without such injurious problem

2)Structure shall be meet the design

and dimensional requirements of

drawing

DOC NoSP-Micro USB Rev A Page27

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

42 Electrical Performance

Item Test Description Test Methods Requirement

421 Low Level Contact

Resistance

EIA 364-23 (or MIL-STD-1344A

Method 30021 Test Condition B)

30mΩ(Max) when measured at

20mv(max) open circuit at

100mAContact resistance below 40 m

Ω after 10000 insertionextraction

cycles at a maximum rate of 500 cycles

per hour

1)Initial 30 mΩ Maximum

2)After test 40 mΩ Maximum

422 Insulation Resistance EIA 364-21 (or MIL-STD-202F Method

302 Test Condition B)

Test between adjacent contacts of

mated and unmated connector

assemblies

The object of this test procedure is to

detail a standard method to assess

the insulation resistance of MicroUSB

connectors This test procedure is used

to determine the resistance offered by

insulation connector to a 500V DC

potential current through or on the

surface of the members

1)Initial 100 MΩ Minimum

2)After test 100 MΩ Minimum

423 Dielectric

Withstanding Voltage

EIA 364-20 (or MIL-STD-202F Method

301 Test Condition B)

Test between adjacent contacts of

mated and unmated connector

assemblies

The object of this test procedure is to

detail a test method to prove that a

MICRO USB connector can operate

safely at its rated voltage and withstand

momentary over potentials due to

switching surges andor other similar

phenomena

100 V AC for one minute at sea level

1)No flashover or insulation

breakdown

2)Leakage current 05mA Maximum

DOC NoSP-Micro USB Rev A Page37

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

43 Mechanical Performance (Continued)

Item Test Description Test Methods Requirement

431 Durability EIA 364-09 Mate and unmate Connector

assemblies for 10000 cycles at

maximum rated of 500 cycles per hour

The object of this test procedure is to

detail a uniform test method for

determining the effects caused by

subjecting a connector to the

conditioning action of inserting and

extraction simulating the expected life

of the connectors Durability cycling

with a gauge is intended only to

produce mechanical stress Durability

performed with mating components is

intended to produce both mechanical

and wear stress

1)Shall meet visual requirement

show no physical damage

432 Mechanical Shock EIA-364-27B Subject mated connector to 50Grsquos half-sine shock pulses of 11msec duration Three shocks in each direction applied along three mutuall perpendicular planed for a total of 18 shocks

No discontinuities of 1 microsecond or

long duration See note

433 Vibration EIA-364-28D Subject mated connectors to 10~55~10Hz traversed in 1 minute at 152mm amplitude 2 hours each of 3 mutually perpendicular planes

No discontinuities of 1 microsecond or

long duration See note

DOC NoSP-Micro USB Rev A Page47

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

434 Connector Mating

Force

EIA 364-13 Shall be measured with TENSION

GAUGE or TENSION TESTER

Measure force necessary to mate

assemblies at maximum rate of

125mm (or 0492rdquo) per minute

The object of this test is to detail a

standard method for determining the

mechanical forces required for inserting

a Mini USB connector

35 Newtons (or 357Kgf) Maximum

435 Connector Unmating

Force

EIA 364-13 Test mothod in same 434

1)Initial 10 Newtons Minimum

2)After test 8~20 Newtons

Minimum

436 Contact Retention

Force

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same

direction

04 Kgf minimum

DOC NoSP-Micro USB Rev A Page57

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

44 Environmental Performance

Item Test Description Test Methods Requirement

441 Thermal Shock

EIA 364-32 Test Condition I (or MIL-202F

Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55 to +85

The object of this test is to determine the

resistance of a USB connector to exposure at

extremes of high and low temperatures and to

the shock of alternate exposures to these

extremes simulating the wrost case conditions

for storage transportation and application

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

442 Humidity EIA 364-31 Test Condition A Method III (or MIL-202F Method 103B Test Condition B) Temperature -10~65 Humidity 90 to 98Under 7 Cycles (168hr) The object of this test procedure is to detail a

standard method for the evaluation of the

properties of materials used in Micro USB

connectors as these influenced by the effects of

high humidity and heat

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

443 Salt Spray

MIL-STD-202F Method 101D Test Condition B Subject mated connectors to 48 hours at 35

with 5-Salt-solution concentration

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

444 Temperature Life EIA 364-17 Test Condition 3 Method A Subject mated connectors to temperature life

at 85 for 96hours

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

DOC NoSP-Micro USB Rev A Page67

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

44 Environmental Performance (Continued)

Item Test Description Test Methods Requirement

445 Solderability EIA 364-52 After one hour steam aging

The object of test procedure is to detail

a unfirm test methods for determining

USB connector solderability The test

procedure contained here utilizes the

solder dip technique It is not intended

to test or evaluate solder cup solder

eyelet other hand-soldered type or

SMT type terminations

The surface of the portion to be

soldered shall at least 95 covered

with new solder coatingas specified in

Category 2

1) for WAVE SOLDERING

MIL-STD-202F Method 210A Test

Condition B

Pre-heat 80 60 Seconds

Temperature 260 plusmn 5

Immersion duration 10 plusmn 1 sec

2) for MANUAL SOLDERING

MIL-STD-202F Method 210A Test

Condition A

Pre-heat No

Temperature 350 plusmn 10

Immersion duration 35 plusmn 05 sec

3) for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

1) No mechanical defect on housing

or other parts

446 Resistance to

Soldering Heat

DOC NoSP-Micro USB Rev A Page77

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

50 Test Sequence

Test Group (a) Sample Groups

Test Item Test Description A B C D E F G H I J K L

411 Examination of product 113 15 18 13 1 3 15 1 3 1 6

421 Low Level Contact Resistance 210 24 24 2 5

422 Insulation Resistance 3 11 26

423 Dielectric Withstanding Voltage 4 12 37

431 Durability 7

43 2 Mechanical Shock 3

43 3 Vibration 4

434 Connector Mating Force 58

435 Contact Unmating Force 69

436 Contact Retention Force 2

441 Thermal Shock 5

442 Humidity 4

443 Salt Spray 3

444 Temperature Life(see note c) 3

445 Solderability 2

446 Resistance to Soldering Heat 2

Number of Test Samples (Minimum)

5 5 5 5 5 5 5 5

QMFZ2 Component - Plastics

Friday October 24 2003

E106

764

POLYPLASTICS CO LTD

VECTRA DIV KASUMIGASEKI BLDG 6TH FL 2-5 KASUMIGASEKI 3-CHOME CHIYODA-KU TOKYO 100-6006 JAPAN

Mat

eria

l Des

igna

tion

E13

0i(d

)(e)

Prod

uct D

escr

iptio

n L

iqui

d C

ryst

al P

olym

er (L

CP)

the

rmot

ropi

c ar

omat

ic p

olye

ster

des

igna

ted

Vec

tra

furn

ishe

d as

pel

lets

Col

or

Min

Thi

ck (

mm

) Fl

ame

Cla

ss

HW

IH

AI

RT

I E

lec

RT

I Im

p R

TI

Str

IEC

GW

IT

IEC

GW

FI

ALL

0

75

V-0

2 4

240

220

240

- -

1

5 V-

0 1

4 24

0 22

0 24

0 -

-

3

0 V-

0 0

4 24

0 22

0 24

0 -

-

C

TI

4

HV

TR

0

D49

5 5

IEC

Bal

l Pre

ssur

e (deg

C)

-

Die

lect

ric

Stre

ngth

(kV

mm

) 39

ISO

Ten

sile

Str

engt

h (M

Pa)

-

ISO

Ten

sile

Impa

ct (k

Jm

2 ) -

Volume Resistivity (10

x ohm-cm) 16

ISO Flexural Strength (MPa) -

ISO Izod Impact (kJm

2 ) -

Dimensional Stability()

0

ISO Heat Deflection (degC)

-

ISO Charpy Impact (kJ

m2 )

-

(d)

Virgin and regrind up to 50 by weight incl have the same basic material characteristics for colors

NC and BK

(e)

In addition regrind at 26 to 50 have the same basic characteristics at a minimumof 15mm except

RTIs for the Mechanical wImpact property is 180C

Rep

ort D

ate

81

919

92

Und

erw

riter

s Lab

orat

orie

s Inc

reg

UL94 small-scale test data does not pertain to building materials furnishings and related contents UL 94 small-scale

test data is intended solely for determining the flammability of plastic materials used in components and parts

of end-product devices and appliances where the acceptability of the combination is determined by ULI

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Sample Description

StyleItem No

Color

Sample Receiving Date

Testing Period

============================================================================================

Test Requested

Test Method

(1)

(2)

(3)

(4)

(5)

Test Result(s)

Determination of Lead by ICP-AES

Determination of Mercury by ICP-AES

Determination of Hexavalent Chromium for non-metallic samplesby UVVis Spectrometry

Test Report

20090420

KA200941514

No KA200941514 Date 20090423 Page 1 of 6

POLYPLASTICS TAIWAN CO LTDNO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

VECTRA

NATURE BLACK

The following sample(s) waswere submitted and identified byon behalf of the client as

A130 VF2001BK010P E130G VF2201BK210P E130i VF2201BK205PBK210PBK211PE463i VF2201BK210P E471i VF2201BK210PBK211P E472i BK210P E473i VF2201BK210PE480i VF2201BK210PE481i VF2201BK210P L130 VF2201S135 VF2001BK010P S476 BK210P

20090420 TO 20090423

In accordance with the RoHS Directive 200295EC and its amendmentdirectives

With reference to IEC 623212008Procedures for the Determination of Levels of Regulated Substances inElectrotechnical Products

Determination of Cadmium by ICP-AES

Please refer to next page(s)

Determination of PBB and PBDE by GCMS

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Result

No1

nd 2

nd 2nd 2

nd 2

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

Dibromobiphenyl

Decabromobiphenyl

Pentabromobiphenyl

Nonabromodiphenyl ether

Hexabromodiphenyl ether

Octabromodiphenyl ether

TEST PART DESCRIPTION

Test Item (s)

Heptabromodiphenyl ether

Decabromodiphenyl ether

Cadmium (Cd)

Tetrabromobiphenyl

Dibromodiphenyl ether

Pentabromodiphenyl ether

Tetrabromodiphenyl ether

Monobromodiphenyl ether

Hexavalent Chromium Cr(VI) by alkalineextraction

(1)

Tribromodiphenyl ether

Lead (Pb)

Sum of PBBs

Hexabromobiphenyl

Mercury (Hg)

Monobromobiphenyl

Tribromobiphenyl

(3)

(4)

(2)

Method

(Refer to)MDL

Test results by chemical method (Unit mgkg)

NO1 MIXED ALL PARTSVECTRA

(5)

Test Report No KA200941514 Date 20090423 Page 2 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Heptabromobiphenyl

Octabromobiphenyl

Nonabromobiphenyl

Sum of PBDEs

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

16 This is the additional test report of KA200XXXXXX which wasissued on yyyymmdd

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Please refer to KA200XXXXXX for original information

6 The sample(s) waswere analyzed on behalf of the applicant as mixing sample in one testingThe above result(s) waswere only given as the informality value

2 nd = Not Detected

3 MDL = Method Detection Limit

5 - = Not Regulated

4 The exemption of DecaBDE in polymeric application according 2005717EC wasoverruled by the European Court of Justice by its decision of 01042008 Subsequently DecaBDEwill be included in the sum of PBDE after 01072008

15 This report supersedes all pervious documents bearing the testreport number KA200XXXXXX

Note 1 mgkg = ppm01wt = 1000ppm

Test Report No KA200941514 Date 20090423 Page 3 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 4 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

1) These samples were dissolved totally by pre-conditioning method according to below flow chart(Cr6+ test

method excluded)

2) Name of the person who made measurement Hungming Li

3) Name of the person in charge of measurement Ray Chang

Cr6+

Sample Material Digestion Acid

Steel copper aluminum solder Aqua regia HNO3 HCl HF H2O2

Glass HNO3HF

Gold platinum palladium ceramic Aqua regia

Silver HNO3

Plastic H2SO4 H2O2 HNO3 HCl

Others Any acid to total digestion

PbCd

Solution

ICP-AES

Acid digestion by suitable acid

depended on different sample

material (as below table)

Filtration

Residue

1) Alkali Fusion

2) HCl to dissolve

Sample Measurement

Cutting Preparation

Microwave digestion with

HNO3HClHF

Heat to appropriate

temperature to extract

Cool filter digestate

through filter

Add diphenyl-carbazide

for color development

Measure the absorbance

at 540 nm by UV-VIS

Add appropriate amount

of digestion reagent

Hg

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 5 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

PBBPBDE analytical FLOW CHART

1) Name of the person who made measurement Anson Tsao

2) Name of the person in charge of measurement Ray Chang

First testing process

Optional screen process

Confirmation process

Sample

Screen analysis

Issue Report

Sample pretreatment

Sample extractionSoxhlet method

ConcentrateDiluteExtracted solution

Analysis by GCMS

Filter

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

End of Report

Test Report No KA200941514 Date 20090423 Page 6 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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有限

公司

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

DOC NoSP-Micro USB Rev A Page27

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

42 Electrical Performance

Item Test Description Test Methods Requirement

421 Low Level Contact

Resistance

EIA 364-23 (or MIL-STD-1344A

Method 30021 Test Condition B)

30mΩ(Max) when measured at

20mv(max) open circuit at

100mAContact resistance below 40 m

Ω after 10000 insertionextraction

cycles at a maximum rate of 500 cycles

per hour

1)Initial 30 mΩ Maximum

2)After test 40 mΩ Maximum

422 Insulation Resistance EIA 364-21 (or MIL-STD-202F Method

302 Test Condition B)

Test between adjacent contacts of

mated and unmated connector

assemblies

The object of this test procedure is to

detail a standard method to assess

the insulation resistance of MicroUSB

connectors This test procedure is used

to determine the resistance offered by

insulation connector to a 500V DC

potential current through or on the

surface of the members

1)Initial 100 MΩ Minimum

2)After test 100 MΩ Minimum

423 Dielectric

Withstanding Voltage

EIA 364-20 (or MIL-STD-202F Method

301 Test Condition B)

Test between adjacent contacts of

mated and unmated connector

assemblies

The object of this test procedure is to

detail a test method to prove that a

MICRO USB connector can operate

safely at its rated voltage and withstand

momentary over potentials due to

switching surges andor other similar

phenomena

100 V AC for one minute at sea level

1)No flashover or insulation

breakdown

2)Leakage current 05mA Maximum

DOC NoSP-Micro USB Rev A Page37

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

43 Mechanical Performance (Continued)

Item Test Description Test Methods Requirement

431 Durability EIA 364-09 Mate and unmate Connector

assemblies for 10000 cycles at

maximum rated of 500 cycles per hour

The object of this test procedure is to

detail a uniform test method for

determining the effects caused by

subjecting a connector to the

conditioning action of inserting and

extraction simulating the expected life

of the connectors Durability cycling

with a gauge is intended only to

produce mechanical stress Durability

performed with mating components is

intended to produce both mechanical

and wear stress

1)Shall meet visual requirement

show no physical damage

432 Mechanical Shock EIA-364-27B Subject mated connector to 50Grsquos half-sine shock pulses of 11msec duration Three shocks in each direction applied along three mutuall perpendicular planed for a total of 18 shocks

No discontinuities of 1 microsecond or

long duration See note

433 Vibration EIA-364-28D Subject mated connectors to 10~55~10Hz traversed in 1 minute at 152mm amplitude 2 hours each of 3 mutually perpendicular planes

No discontinuities of 1 microsecond or

long duration See note

DOC NoSP-Micro USB Rev A Page47

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

434 Connector Mating

Force

EIA 364-13 Shall be measured with TENSION

GAUGE or TENSION TESTER

Measure force necessary to mate

assemblies at maximum rate of

125mm (or 0492rdquo) per minute

The object of this test is to detail a

standard method for determining the

mechanical forces required for inserting

a Mini USB connector

35 Newtons (or 357Kgf) Maximum

435 Connector Unmating

Force

EIA 364-13 Test mothod in same 434

1)Initial 10 Newtons Minimum

2)After test 8~20 Newtons

Minimum

436 Contact Retention

Force

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same

direction

04 Kgf minimum

DOC NoSP-Micro USB Rev A Page57

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

44 Environmental Performance

Item Test Description Test Methods Requirement

441 Thermal Shock

EIA 364-32 Test Condition I (or MIL-202F

Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55 to +85

The object of this test is to determine the

resistance of a USB connector to exposure at

extremes of high and low temperatures and to

the shock of alternate exposures to these

extremes simulating the wrost case conditions

for storage transportation and application

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

442 Humidity EIA 364-31 Test Condition A Method III (or MIL-202F Method 103B Test Condition B) Temperature -10~65 Humidity 90 to 98Under 7 Cycles (168hr) The object of this test procedure is to detail a

standard method for the evaluation of the

properties of materials used in Micro USB

connectors as these influenced by the effects of

high humidity and heat

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

443 Salt Spray

MIL-STD-202F Method 101D Test Condition B Subject mated connectors to 48 hours at 35

with 5-Salt-solution concentration

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

444 Temperature Life EIA 364-17 Test Condition 3 Method A Subject mated connectors to temperature life

at 85 for 96hours

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

DOC NoSP-Micro USB Rev A Page67

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

44 Environmental Performance (Continued)

Item Test Description Test Methods Requirement

445 Solderability EIA 364-52 After one hour steam aging

The object of test procedure is to detail

a unfirm test methods for determining

USB connector solderability The test

procedure contained here utilizes the

solder dip technique It is not intended

to test or evaluate solder cup solder

eyelet other hand-soldered type or

SMT type terminations

The surface of the portion to be

soldered shall at least 95 covered

with new solder coatingas specified in

Category 2

1) for WAVE SOLDERING

MIL-STD-202F Method 210A Test

Condition B

Pre-heat 80 60 Seconds

Temperature 260 plusmn 5

Immersion duration 10 plusmn 1 sec

2) for MANUAL SOLDERING

MIL-STD-202F Method 210A Test

Condition A

Pre-heat No

Temperature 350 plusmn 10

Immersion duration 35 plusmn 05 sec

3) for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

1) No mechanical defect on housing

or other parts

446 Resistance to

Soldering Heat

DOC NoSP-Micro USB Rev A Page77

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

50 Test Sequence

Test Group (a) Sample Groups

Test Item Test Description A B C D E F G H I J K L

411 Examination of product 113 15 18 13 1 3 15 1 3 1 6

421 Low Level Contact Resistance 210 24 24 2 5

422 Insulation Resistance 3 11 26

423 Dielectric Withstanding Voltage 4 12 37

431 Durability 7

43 2 Mechanical Shock 3

43 3 Vibration 4

434 Connector Mating Force 58

435 Contact Unmating Force 69

436 Contact Retention Force 2

441 Thermal Shock 5

442 Humidity 4

443 Salt Spray 3

444 Temperature Life(see note c) 3

445 Solderability 2

446 Resistance to Soldering Heat 2

Number of Test Samples (Minimum)

5 5 5 5 5 5 5 5

QMFZ2 Component - Plastics

Friday October 24 2003

E106

764

POLYPLASTICS CO LTD

VECTRA DIV KASUMIGASEKI BLDG 6TH FL 2-5 KASUMIGASEKI 3-CHOME CHIYODA-KU TOKYO 100-6006 JAPAN

Mat

eria

l Des

igna

tion

E13

0i(d

)(e)

Prod

uct D

escr

iptio

n L

iqui

d C

ryst

al P

olym

er (L

CP)

the

rmot

ropi

c ar

omat

ic p

olye

ster

des

igna

ted

Vec

tra

furn

ishe

d as

pel

lets

Col

or

Min

Thi

ck (

mm

) Fl

ame

Cla

ss

HW

IH

AI

RT

I E

lec

RT

I Im

p R

TI

Str

IEC

GW

IT

IEC

GW

FI

ALL

0

75

V-0

2 4

240

220

240

- -

1

5 V-

0 1

4 24

0 22

0 24

0 -

-

3

0 V-

0 0

4 24

0 22

0 24

0 -

-

C

TI

4

HV

TR

0

D49

5 5

IEC

Bal

l Pre

ssur

e (deg

C)

-

Die

lect

ric

Stre

ngth

(kV

mm

) 39

ISO

Ten

sile

Str

engt

h (M

Pa)

-

ISO

Ten

sile

Impa

ct (k

Jm

2 ) -

Volume Resistivity (10

x ohm-cm) 16

ISO Flexural Strength (MPa) -

ISO Izod Impact (kJm

2 ) -

Dimensional Stability()

0

ISO Heat Deflection (degC)

-

ISO Charpy Impact (kJ

m2 )

-

(d)

Virgin and regrind up to 50 by weight incl have the same basic material characteristics for colors

NC and BK

(e)

In addition regrind at 26 to 50 have the same basic characteristics at a minimumof 15mm except

RTIs for the Mechanical wImpact property is 180C

Rep

ort D

ate

81

919

92

Und

erw

riter

s Lab

orat

orie

s Inc

reg

UL94 small-scale test data does not pertain to building materials furnishings and related contents UL 94 small-scale

test data is intended solely for determining the flammability of plastic materials used in components and parts

of end-product devices and appliances where the acceptability of the combination is determined by ULI

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Sample Description

StyleItem No

Color

Sample Receiving Date

Testing Period

============================================================================================

Test Requested

Test Method

(1)

(2)

(3)

(4)

(5)

Test Result(s)

Determination of Lead by ICP-AES

Determination of Mercury by ICP-AES

Determination of Hexavalent Chromium for non-metallic samplesby UVVis Spectrometry

Test Report

20090420

KA200941514

No KA200941514 Date 20090423 Page 1 of 6

POLYPLASTICS TAIWAN CO LTDNO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

VECTRA

NATURE BLACK

The following sample(s) waswere submitted and identified byon behalf of the client as

A130 VF2001BK010P E130G VF2201BK210P E130i VF2201BK205PBK210PBK211PE463i VF2201BK210P E471i VF2201BK210PBK211P E472i BK210P E473i VF2201BK210PE480i VF2201BK210PE481i VF2201BK210P L130 VF2201S135 VF2001BK010P S476 BK210P

20090420 TO 20090423

In accordance with the RoHS Directive 200295EC and its amendmentdirectives

With reference to IEC 623212008Procedures for the Determination of Levels of Regulated Substances inElectrotechnical Products

Determination of Cadmium by ICP-AES

Please refer to next page(s)

Determination of PBB and PBDE by GCMS

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Result

No1

nd 2

nd 2nd 2

nd 2

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

Dibromobiphenyl

Decabromobiphenyl

Pentabromobiphenyl

Nonabromodiphenyl ether

Hexabromodiphenyl ether

Octabromodiphenyl ether

TEST PART DESCRIPTION

Test Item (s)

Heptabromodiphenyl ether

Decabromodiphenyl ether

Cadmium (Cd)

Tetrabromobiphenyl

Dibromodiphenyl ether

Pentabromodiphenyl ether

Tetrabromodiphenyl ether

Monobromodiphenyl ether

Hexavalent Chromium Cr(VI) by alkalineextraction

(1)

Tribromodiphenyl ether

Lead (Pb)

Sum of PBBs

Hexabromobiphenyl

Mercury (Hg)

Monobromobiphenyl

Tribromobiphenyl

(3)

(4)

(2)

Method

(Refer to)MDL

Test results by chemical method (Unit mgkg)

NO1 MIXED ALL PARTSVECTRA

(5)

Test Report No KA200941514 Date 20090423 Page 2 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Heptabromobiphenyl

Octabromobiphenyl

Nonabromobiphenyl

Sum of PBDEs

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

16 This is the additional test report of KA200XXXXXX which wasissued on yyyymmdd

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Please refer to KA200XXXXXX for original information

6 The sample(s) waswere analyzed on behalf of the applicant as mixing sample in one testingThe above result(s) waswere only given as the informality value

2 nd = Not Detected

3 MDL = Method Detection Limit

5 - = Not Regulated

4 The exemption of DecaBDE in polymeric application according 2005717EC wasoverruled by the European Court of Justice by its decision of 01042008 Subsequently DecaBDEwill be included in the sum of PBDE after 01072008

15 This report supersedes all pervious documents bearing the testreport number KA200XXXXXX

Note 1 mgkg = ppm01wt = 1000ppm

Test Report No KA200941514 Date 20090423 Page 3 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 4 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

1) These samples were dissolved totally by pre-conditioning method according to below flow chart(Cr6+ test

method excluded)

2) Name of the person who made measurement Hungming Li

3) Name of the person in charge of measurement Ray Chang

Cr6+

Sample Material Digestion Acid

Steel copper aluminum solder Aqua regia HNO3 HCl HF H2O2

Glass HNO3HF

Gold platinum palladium ceramic Aqua regia

Silver HNO3

Plastic H2SO4 H2O2 HNO3 HCl

Others Any acid to total digestion

PbCd

Solution

ICP-AES

Acid digestion by suitable acid

depended on different sample

material (as below table)

Filtration

Residue

1) Alkali Fusion

2) HCl to dissolve

Sample Measurement

Cutting Preparation

Microwave digestion with

HNO3HClHF

Heat to appropriate

temperature to extract

Cool filter digestate

through filter

Add diphenyl-carbazide

for color development

Measure the absorbance

at 540 nm by UV-VIS

Add appropriate amount

of digestion reagent

Hg

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 5 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

PBBPBDE analytical FLOW CHART

1) Name of the person who made measurement Anson Tsao

2) Name of the person in charge of measurement Ray Chang

First testing process

Optional screen process

Confirmation process

Sample

Screen analysis

Issue Report

Sample pretreatment

Sample extractionSoxhlet method

ConcentrateDiluteExtracted solution

Analysis by GCMS

Filter

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

End of Report

Test Report No KA200941514 Date 20090423 Page 6 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

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Initi

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Max

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Yao

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Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

DOC NoSP-Micro USB Rev A Page37

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

43 Mechanical Performance (Continued)

Item Test Description Test Methods Requirement

431 Durability EIA 364-09 Mate and unmate Connector

assemblies for 10000 cycles at

maximum rated of 500 cycles per hour

The object of this test procedure is to

detail a uniform test method for

determining the effects caused by

subjecting a connector to the

conditioning action of inserting and

extraction simulating the expected life

of the connectors Durability cycling

with a gauge is intended only to

produce mechanical stress Durability

performed with mating components is

intended to produce both mechanical

and wear stress

1)Shall meet visual requirement

show no physical damage

432 Mechanical Shock EIA-364-27B Subject mated connector to 50Grsquos half-sine shock pulses of 11msec duration Three shocks in each direction applied along three mutuall perpendicular planed for a total of 18 shocks

No discontinuities of 1 microsecond or

long duration See note

433 Vibration EIA-364-28D Subject mated connectors to 10~55~10Hz traversed in 1 minute at 152mm amplitude 2 hours each of 3 mutually perpendicular planes

No discontinuities of 1 microsecond or

long duration See note

DOC NoSP-Micro USB Rev A Page47

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

434 Connector Mating

Force

EIA 364-13 Shall be measured with TENSION

GAUGE or TENSION TESTER

Measure force necessary to mate

assemblies at maximum rate of

125mm (or 0492rdquo) per minute

The object of this test is to detail a

standard method for determining the

mechanical forces required for inserting

a Mini USB connector

35 Newtons (or 357Kgf) Maximum

435 Connector Unmating

Force

EIA 364-13 Test mothod in same 434

1)Initial 10 Newtons Minimum

2)After test 8~20 Newtons

Minimum

436 Contact Retention

Force

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same

direction

04 Kgf minimum

DOC NoSP-Micro USB Rev A Page57

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

44 Environmental Performance

Item Test Description Test Methods Requirement

441 Thermal Shock

EIA 364-32 Test Condition I (or MIL-202F

Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55 to +85

The object of this test is to determine the

resistance of a USB connector to exposure at

extremes of high and low temperatures and to

the shock of alternate exposures to these

extremes simulating the wrost case conditions

for storage transportation and application

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

442 Humidity EIA 364-31 Test Condition A Method III (or MIL-202F Method 103B Test Condition B) Temperature -10~65 Humidity 90 to 98Under 7 Cycles (168hr) The object of this test procedure is to detail a

standard method for the evaluation of the

properties of materials used in Micro USB

connectors as these influenced by the effects of

high humidity and heat

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

443 Salt Spray

MIL-STD-202F Method 101D Test Condition B Subject mated connectors to 48 hours at 35

with 5-Salt-solution concentration

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

444 Temperature Life EIA 364-17 Test Condition 3 Method A Subject mated connectors to temperature life

at 85 for 96hours

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

DOC NoSP-Micro USB Rev A Page67

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

44 Environmental Performance (Continued)

Item Test Description Test Methods Requirement

445 Solderability EIA 364-52 After one hour steam aging

The object of test procedure is to detail

a unfirm test methods for determining

USB connector solderability The test

procedure contained here utilizes the

solder dip technique It is not intended

to test or evaluate solder cup solder

eyelet other hand-soldered type or

SMT type terminations

The surface of the portion to be

soldered shall at least 95 covered

with new solder coatingas specified in

Category 2

1) for WAVE SOLDERING

MIL-STD-202F Method 210A Test

Condition B

Pre-heat 80 60 Seconds

Temperature 260 plusmn 5

Immersion duration 10 plusmn 1 sec

2) for MANUAL SOLDERING

MIL-STD-202F Method 210A Test

Condition A

Pre-heat No

Temperature 350 plusmn 10

Immersion duration 35 plusmn 05 sec

3) for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

1) No mechanical defect on housing

or other parts

446 Resistance to

Soldering Heat

DOC NoSP-Micro USB Rev A Page77

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

50 Test Sequence

Test Group (a) Sample Groups

Test Item Test Description A B C D E F G H I J K L

411 Examination of product 113 15 18 13 1 3 15 1 3 1 6

421 Low Level Contact Resistance 210 24 24 2 5

422 Insulation Resistance 3 11 26

423 Dielectric Withstanding Voltage 4 12 37

431 Durability 7

43 2 Mechanical Shock 3

43 3 Vibration 4

434 Connector Mating Force 58

435 Contact Unmating Force 69

436 Contact Retention Force 2

441 Thermal Shock 5

442 Humidity 4

443 Salt Spray 3

444 Temperature Life(see note c) 3

445 Solderability 2

446 Resistance to Soldering Heat 2

Number of Test Samples (Minimum)

5 5 5 5 5 5 5 5

QMFZ2 Component - Plastics

Friday October 24 2003

E106

764

POLYPLASTICS CO LTD

VECTRA DIV KASUMIGASEKI BLDG 6TH FL 2-5 KASUMIGASEKI 3-CHOME CHIYODA-KU TOKYO 100-6006 JAPAN

Mat

eria

l Des

igna

tion

E13

0i(d

)(e)

Prod

uct D

escr

iptio

n L

iqui

d C

ryst

al P

olym

er (L

CP)

the

rmot

ropi

c ar

omat

ic p

olye

ster

des

igna

ted

Vec

tra

furn

ishe

d as

pel

lets

Col

or

Min

Thi

ck (

mm

) Fl

ame

Cla

ss

HW

IH

AI

RT

I E

lec

RT

I Im

p R

TI

Str

IEC

GW

IT

IEC

GW

FI

ALL

0

75

V-0

2 4

240

220

240

- -

1

5 V-

0 1

4 24

0 22

0 24

0 -

-

3

0 V-

0 0

4 24

0 22

0 24

0 -

-

C

TI

4

HV

TR

0

D49

5 5

IEC

Bal

l Pre

ssur

e (deg

C)

-

Die

lect

ric

Stre

ngth

(kV

mm

) 39

ISO

Ten

sile

Str

engt

h (M

Pa)

-

ISO

Ten

sile

Impa

ct (k

Jm

2 ) -

Volume Resistivity (10

x ohm-cm) 16

ISO Flexural Strength (MPa) -

ISO Izod Impact (kJm

2 ) -

Dimensional Stability()

0

ISO Heat Deflection (degC)

-

ISO Charpy Impact (kJ

m2 )

-

(d)

Virgin and regrind up to 50 by weight incl have the same basic material characteristics for colors

NC and BK

(e)

In addition regrind at 26 to 50 have the same basic characteristics at a minimumof 15mm except

RTIs for the Mechanical wImpact property is 180C

Rep

ort D

ate

81

919

92

Und

erw

riter

s Lab

orat

orie

s Inc

reg

UL94 small-scale test data does not pertain to building materials furnishings and related contents UL 94 small-scale

test data is intended solely for determining the flammability of plastic materials used in components and parts

of end-product devices and appliances where the acceptability of the combination is determined by ULI

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Sample Description

StyleItem No

Color

Sample Receiving Date

Testing Period

============================================================================================

Test Requested

Test Method

(1)

(2)

(3)

(4)

(5)

Test Result(s)

Determination of Lead by ICP-AES

Determination of Mercury by ICP-AES

Determination of Hexavalent Chromium for non-metallic samplesby UVVis Spectrometry

Test Report

20090420

KA200941514

No KA200941514 Date 20090423 Page 1 of 6

POLYPLASTICS TAIWAN CO LTDNO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

VECTRA

NATURE BLACK

The following sample(s) waswere submitted and identified byon behalf of the client as

A130 VF2001BK010P E130G VF2201BK210P E130i VF2201BK205PBK210PBK211PE463i VF2201BK210P E471i VF2201BK210PBK211P E472i BK210P E473i VF2201BK210PE480i VF2201BK210PE481i VF2201BK210P L130 VF2201S135 VF2001BK010P S476 BK210P

20090420 TO 20090423

In accordance with the RoHS Directive 200295EC and its amendmentdirectives

With reference to IEC 623212008Procedures for the Determination of Levels of Regulated Substances inElectrotechnical Products

Determination of Cadmium by ICP-AES

Please refer to next page(s)

Determination of PBB and PBDE by GCMS

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Result

No1

nd 2

nd 2nd 2

nd 2

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

Dibromobiphenyl

Decabromobiphenyl

Pentabromobiphenyl

Nonabromodiphenyl ether

Hexabromodiphenyl ether

Octabromodiphenyl ether

TEST PART DESCRIPTION

Test Item (s)

Heptabromodiphenyl ether

Decabromodiphenyl ether

Cadmium (Cd)

Tetrabromobiphenyl

Dibromodiphenyl ether

Pentabromodiphenyl ether

Tetrabromodiphenyl ether

Monobromodiphenyl ether

Hexavalent Chromium Cr(VI) by alkalineextraction

(1)

Tribromodiphenyl ether

Lead (Pb)

Sum of PBBs

Hexabromobiphenyl

Mercury (Hg)

Monobromobiphenyl

Tribromobiphenyl

(3)

(4)

(2)

Method

(Refer to)MDL

Test results by chemical method (Unit mgkg)

NO1 MIXED ALL PARTSVECTRA

(5)

Test Report No KA200941514 Date 20090423 Page 2 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Heptabromobiphenyl

Octabromobiphenyl

Nonabromobiphenyl

Sum of PBDEs

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

16 This is the additional test report of KA200XXXXXX which wasissued on yyyymmdd

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Please refer to KA200XXXXXX for original information

6 The sample(s) waswere analyzed on behalf of the applicant as mixing sample in one testingThe above result(s) waswere only given as the informality value

2 nd = Not Detected

3 MDL = Method Detection Limit

5 - = Not Regulated

4 The exemption of DecaBDE in polymeric application according 2005717EC wasoverruled by the European Court of Justice by its decision of 01042008 Subsequently DecaBDEwill be included in the sum of PBDE after 01072008

15 This report supersedes all pervious documents bearing the testreport number KA200XXXXXX

Note 1 mgkg = ppm01wt = 1000ppm

Test Report No KA200941514 Date 20090423 Page 3 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 4 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

1) These samples were dissolved totally by pre-conditioning method according to below flow chart(Cr6+ test

method excluded)

2) Name of the person who made measurement Hungming Li

3) Name of the person in charge of measurement Ray Chang

Cr6+

Sample Material Digestion Acid

Steel copper aluminum solder Aqua regia HNO3 HCl HF H2O2

Glass HNO3HF

Gold platinum palladium ceramic Aqua regia

Silver HNO3

Plastic H2SO4 H2O2 HNO3 HCl

Others Any acid to total digestion

PbCd

Solution

ICP-AES

Acid digestion by suitable acid

depended on different sample

material (as below table)

Filtration

Residue

1) Alkali Fusion

2) HCl to dissolve

Sample Measurement

Cutting Preparation

Microwave digestion with

HNO3HClHF

Heat to appropriate

temperature to extract

Cool filter digestate

through filter

Add diphenyl-carbazide

for color development

Measure the absorbance

at 540 nm by UV-VIS

Add appropriate amount

of digestion reagent

Hg

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 5 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

PBBPBDE analytical FLOW CHART

1) Name of the person who made measurement Anson Tsao

2) Name of the person in charge of measurement Ray Chang

First testing process

Optional screen process

Confirmation process

Sample

Screen analysis

Issue Report

Sample pretreatment

Sample extractionSoxhlet method

ConcentrateDiluteExtracted solution

Analysis by GCMS

Filter

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

End of Report

Test Report No KA200941514 Date 20090423 Page 6 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

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Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

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Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

DOC NoSP-Micro USB Rev A Page47

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

434 Connector Mating

Force

EIA 364-13 Shall be measured with TENSION

GAUGE or TENSION TESTER

Measure force necessary to mate

assemblies at maximum rate of

125mm (or 0492rdquo) per minute

The object of this test is to detail a

standard method for determining the

mechanical forces required for inserting

a Mini USB connector

35 Newtons (or 357Kgf) Maximum

435 Connector Unmating

Force

EIA 364-13 Test mothod in same 434

1)Initial 10 Newtons Minimum

2)After test 8~20 Newtons

Minimum

436 Contact Retention

Force

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same

direction

04 Kgf minimum

DOC NoSP-Micro USB Rev A Page57

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

44 Environmental Performance

Item Test Description Test Methods Requirement

441 Thermal Shock

EIA 364-32 Test Condition I (or MIL-202F

Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55 to +85

The object of this test is to determine the

resistance of a USB connector to exposure at

extremes of high and low temperatures and to

the shock of alternate exposures to these

extremes simulating the wrost case conditions

for storage transportation and application

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

442 Humidity EIA 364-31 Test Condition A Method III (or MIL-202F Method 103B Test Condition B) Temperature -10~65 Humidity 90 to 98Under 7 Cycles (168hr) The object of this test procedure is to detail a

standard method for the evaluation of the

properties of materials used in Micro USB

connectors as these influenced by the effects of

high humidity and heat

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

443 Salt Spray

MIL-STD-202F Method 101D Test Condition B Subject mated connectors to 48 hours at 35

with 5-Salt-solution concentration

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

444 Temperature Life EIA 364-17 Test Condition 3 Method A Subject mated connectors to temperature life

at 85 for 96hours

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

DOC NoSP-Micro USB Rev A Page67

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

44 Environmental Performance (Continued)

Item Test Description Test Methods Requirement

445 Solderability EIA 364-52 After one hour steam aging

The object of test procedure is to detail

a unfirm test methods for determining

USB connector solderability The test

procedure contained here utilizes the

solder dip technique It is not intended

to test or evaluate solder cup solder

eyelet other hand-soldered type or

SMT type terminations

The surface of the portion to be

soldered shall at least 95 covered

with new solder coatingas specified in

Category 2

1) for WAVE SOLDERING

MIL-STD-202F Method 210A Test

Condition B

Pre-heat 80 60 Seconds

Temperature 260 plusmn 5

Immersion duration 10 plusmn 1 sec

2) for MANUAL SOLDERING

MIL-STD-202F Method 210A Test

Condition A

Pre-heat No

Temperature 350 plusmn 10

Immersion duration 35 plusmn 05 sec

3) for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

1) No mechanical defect on housing

or other parts

446 Resistance to

Soldering Heat

DOC NoSP-Micro USB Rev A Page77

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

50 Test Sequence

Test Group (a) Sample Groups

Test Item Test Description A B C D E F G H I J K L

411 Examination of product 113 15 18 13 1 3 15 1 3 1 6

421 Low Level Contact Resistance 210 24 24 2 5

422 Insulation Resistance 3 11 26

423 Dielectric Withstanding Voltage 4 12 37

431 Durability 7

43 2 Mechanical Shock 3

43 3 Vibration 4

434 Connector Mating Force 58

435 Contact Unmating Force 69

436 Contact Retention Force 2

441 Thermal Shock 5

442 Humidity 4

443 Salt Spray 3

444 Temperature Life(see note c) 3

445 Solderability 2

446 Resistance to Soldering Heat 2

Number of Test Samples (Minimum)

5 5 5 5 5 5 5 5

QMFZ2 Component - Plastics

Friday October 24 2003

E106

764

POLYPLASTICS CO LTD

VECTRA DIV KASUMIGASEKI BLDG 6TH FL 2-5 KASUMIGASEKI 3-CHOME CHIYODA-KU TOKYO 100-6006 JAPAN

Mat

eria

l Des

igna

tion

E13

0i(d

)(e)

Prod

uct D

escr

iptio

n L

iqui

d C

ryst

al P

olym

er (L

CP)

the

rmot

ropi

c ar

omat

ic p

olye

ster

des

igna

ted

Vec

tra

furn

ishe

d as

pel

lets

Col

or

Min

Thi

ck (

mm

) Fl

ame

Cla

ss

HW

IH

AI

RT

I E

lec

RT

I Im

p R

TI

Str

IEC

GW

IT

IEC

GW

FI

ALL

0

75

V-0

2 4

240

220

240

- -

1

5 V-

0 1

4 24

0 22

0 24

0 -

-

3

0 V-

0 0

4 24

0 22

0 24

0 -

-

C

TI

4

HV

TR

0

D49

5 5

IEC

Bal

l Pre

ssur

e (deg

C)

-

Die

lect

ric

Stre

ngth

(kV

mm

) 39

ISO

Ten

sile

Str

engt

h (M

Pa)

-

ISO

Ten

sile

Impa

ct (k

Jm

2 ) -

Volume Resistivity (10

x ohm-cm) 16

ISO Flexural Strength (MPa) -

ISO Izod Impact (kJm

2 ) -

Dimensional Stability()

0

ISO Heat Deflection (degC)

-

ISO Charpy Impact (kJ

m2 )

-

(d)

Virgin and regrind up to 50 by weight incl have the same basic material characteristics for colors

NC and BK

(e)

In addition regrind at 26 to 50 have the same basic characteristics at a minimumof 15mm except

RTIs for the Mechanical wImpact property is 180C

Rep

ort D

ate

81

919

92

Und

erw

riter

s Lab

orat

orie

s Inc

reg

UL94 small-scale test data does not pertain to building materials furnishings and related contents UL 94 small-scale

test data is intended solely for determining the flammability of plastic materials used in components and parts

of end-product devices and appliances where the acceptability of the combination is determined by ULI

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Sample Description

StyleItem No

Color

Sample Receiving Date

Testing Period

============================================================================================

Test Requested

Test Method

(1)

(2)

(3)

(4)

(5)

Test Result(s)

Determination of Lead by ICP-AES

Determination of Mercury by ICP-AES

Determination of Hexavalent Chromium for non-metallic samplesby UVVis Spectrometry

Test Report

20090420

KA200941514

No KA200941514 Date 20090423 Page 1 of 6

POLYPLASTICS TAIWAN CO LTDNO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

VECTRA

NATURE BLACK

The following sample(s) waswere submitted and identified byon behalf of the client as

A130 VF2001BK010P E130G VF2201BK210P E130i VF2201BK205PBK210PBK211PE463i VF2201BK210P E471i VF2201BK210PBK211P E472i BK210P E473i VF2201BK210PE480i VF2201BK210PE481i VF2201BK210P L130 VF2201S135 VF2001BK010P S476 BK210P

20090420 TO 20090423

In accordance with the RoHS Directive 200295EC and its amendmentdirectives

With reference to IEC 623212008Procedures for the Determination of Levels of Regulated Substances inElectrotechnical Products

Determination of Cadmium by ICP-AES

Please refer to next page(s)

Determination of PBB and PBDE by GCMS

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Result

No1

nd 2

nd 2nd 2

nd 2

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

Dibromobiphenyl

Decabromobiphenyl

Pentabromobiphenyl

Nonabromodiphenyl ether

Hexabromodiphenyl ether

Octabromodiphenyl ether

TEST PART DESCRIPTION

Test Item (s)

Heptabromodiphenyl ether

Decabromodiphenyl ether

Cadmium (Cd)

Tetrabromobiphenyl

Dibromodiphenyl ether

Pentabromodiphenyl ether

Tetrabromodiphenyl ether

Monobromodiphenyl ether

Hexavalent Chromium Cr(VI) by alkalineextraction

(1)

Tribromodiphenyl ether

Lead (Pb)

Sum of PBBs

Hexabromobiphenyl

Mercury (Hg)

Monobromobiphenyl

Tribromobiphenyl

(3)

(4)

(2)

Method

(Refer to)MDL

Test results by chemical method (Unit mgkg)

NO1 MIXED ALL PARTSVECTRA

(5)

Test Report No KA200941514 Date 20090423 Page 2 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Heptabromobiphenyl

Octabromobiphenyl

Nonabromobiphenyl

Sum of PBDEs

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

16 This is the additional test report of KA200XXXXXX which wasissued on yyyymmdd

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Please refer to KA200XXXXXX for original information

6 The sample(s) waswere analyzed on behalf of the applicant as mixing sample in one testingThe above result(s) waswere only given as the informality value

2 nd = Not Detected

3 MDL = Method Detection Limit

5 - = Not Regulated

4 The exemption of DecaBDE in polymeric application according 2005717EC wasoverruled by the European Court of Justice by its decision of 01042008 Subsequently DecaBDEwill be included in the sum of PBDE after 01072008

15 This report supersedes all pervious documents bearing the testreport number KA200XXXXXX

Note 1 mgkg = ppm01wt = 1000ppm

Test Report No KA200941514 Date 20090423 Page 3 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 4 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

1) These samples were dissolved totally by pre-conditioning method according to below flow chart(Cr6+ test

method excluded)

2) Name of the person who made measurement Hungming Li

3) Name of the person in charge of measurement Ray Chang

Cr6+

Sample Material Digestion Acid

Steel copper aluminum solder Aqua regia HNO3 HCl HF H2O2

Glass HNO3HF

Gold platinum palladium ceramic Aqua regia

Silver HNO3

Plastic H2SO4 H2O2 HNO3 HCl

Others Any acid to total digestion

PbCd

Solution

ICP-AES

Acid digestion by suitable acid

depended on different sample

material (as below table)

Filtration

Residue

1) Alkali Fusion

2) HCl to dissolve

Sample Measurement

Cutting Preparation

Microwave digestion with

HNO3HClHF

Heat to appropriate

temperature to extract

Cool filter digestate

through filter

Add diphenyl-carbazide

for color development

Measure the absorbance

at 540 nm by UV-VIS

Add appropriate amount

of digestion reagent

Hg

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 5 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

PBBPBDE analytical FLOW CHART

1) Name of the person who made measurement Anson Tsao

2) Name of the person in charge of measurement Ray Chang

First testing process

Optional screen process

Confirmation process

Sample

Screen analysis

Issue Report

Sample pretreatment

Sample extractionSoxhlet method

ConcentrateDiluteExtracted solution

Analysis by GCMS

Filter

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

End of Report

Test Report No KA200941514 Date 20090423 Page 6 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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有限

公司

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

DOC NoSP-Micro USB Rev A Page57

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

44 Environmental Performance

Item Test Description Test Methods Requirement

441 Thermal Shock

EIA 364-32 Test Condition I (or MIL-202F

Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55 to +85

The object of this test is to determine the

resistance of a USB connector to exposure at

extremes of high and low temperatures and to

the shock of alternate exposures to these

extremes simulating the wrost case conditions

for storage transportation and application

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

442 Humidity EIA 364-31 Test Condition A Method III (or MIL-202F Method 103B Test Condition B) Temperature -10~65 Humidity 90 to 98Under 7 Cycles (168hr) The object of this test procedure is to detail a

standard method for the evaluation of the

properties of materials used in Micro USB

connectors as these influenced by the effects of

high humidity and heat

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

443 Salt Spray

MIL-STD-202F Method 101D Test Condition B Subject mated connectors to 48 hours at 35

with 5-Salt-solution concentration

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

444 Temperature Life EIA 364-17 Test Condition 3 Method A Subject mated connectors to temperature life

at 85 for 96hours

1)Shall meet visual

requirement show no physical

damage

2)Shall meet requirements of

additional tests as specified in

TEST SEQUENCE in Section 5

DOC NoSP-Micro USB Rev A Page67

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

44 Environmental Performance (Continued)

Item Test Description Test Methods Requirement

445 Solderability EIA 364-52 After one hour steam aging

The object of test procedure is to detail

a unfirm test methods for determining

USB connector solderability The test

procedure contained here utilizes the

solder dip technique It is not intended

to test or evaluate solder cup solder

eyelet other hand-soldered type or

SMT type terminations

The surface of the portion to be

soldered shall at least 95 covered

with new solder coatingas specified in

Category 2

1) for WAVE SOLDERING

MIL-STD-202F Method 210A Test

Condition B

Pre-heat 80 60 Seconds

Temperature 260 plusmn 5

Immersion duration 10 plusmn 1 sec

2) for MANUAL SOLDERING

MIL-STD-202F Method 210A Test

Condition A

Pre-heat No

Temperature 350 plusmn 10

Immersion duration 35 plusmn 05 sec

3) for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

1) No mechanical defect on housing

or other parts

446 Resistance to

Soldering Heat

DOC NoSP-Micro USB Rev A Page77

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

50 Test Sequence

Test Group (a) Sample Groups

Test Item Test Description A B C D E F G H I J K L

411 Examination of product 113 15 18 13 1 3 15 1 3 1 6

421 Low Level Contact Resistance 210 24 24 2 5

422 Insulation Resistance 3 11 26

423 Dielectric Withstanding Voltage 4 12 37

431 Durability 7

43 2 Mechanical Shock 3

43 3 Vibration 4

434 Connector Mating Force 58

435 Contact Unmating Force 69

436 Contact Retention Force 2

441 Thermal Shock 5

442 Humidity 4

443 Salt Spray 3

444 Temperature Life(see note c) 3

445 Solderability 2

446 Resistance to Soldering Heat 2

Number of Test Samples (Minimum)

5 5 5 5 5 5 5 5

QMFZ2 Component - Plastics

Friday October 24 2003

E106

764

POLYPLASTICS CO LTD

VECTRA DIV KASUMIGASEKI BLDG 6TH FL 2-5 KASUMIGASEKI 3-CHOME CHIYODA-KU TOKYO 100-6006 JAPAN

Mat

eria

l Des

igna

tion

E13

0i(d

)(e)

Prod

uct D

escr

iptio

n L

iqui

d C

ryst

al P

olym

er (L

CP)

the

rmot

ropi

c ar

omat

ic p

olye

ster

des

igna

ted

Vec

tra

furn

ishe

d as

pel

lets

Col

or

Min

Thi

ck (

mm

) Fl

ame

Cla

ss

HW

IH

AI

RT

I E

lec

RT

I Im

p R

TI

Str

IEC

GW

IT

IEC

GW

FI

ALL

0

75

V-0

2 4

240

220

240

- -

1

5 V-

0 1

4 24

0 22

0 24

0 -

-

3

0 V-

0 0

4 24

0 22

0 24

0 -

-

C

TI

4

HV

TR

0

D49

5 5

IEC

Bal

l Pre

ssur

e (deg

C)

-

Die

lect

ric

Stre

ngth

(kV

mm

) 39

ISO

Ten

sile

Str

engt

h (M

Pa)

-

ISO

Ten

sile

Impa

ct (k

Jm

2 ) -

Volume Resistivity (10

x ohm-cm) 16

ISO Flexural Strength (MPa) -

ISO Izod Impact (kJm

2 ) -

Dimensional Stability()

0

ISO Heat Deflection (degC)

-

ISO Charpy Impact (kJ

m2 )

-

(d)

Virgin and regrind up to 50 by weight incl have the same basic material characteristics for colors

NC and BK

(e)

In addition regrind at 26 to 50 have the same basic characteristics at a minimumof 15mm except

RTIs for the Mechanical wImpact property is 180C

Rep

ort D

ate

81

919

92

Und

erw

riter

s Lab

orat

orie

s Inc

reg

UL94 small-scale test data does not pertain to building materials furnishings and related contents UL 94 small-scale

test data is intended solely for determining the flammability of plastic materials used in components and parts

of end-product devices and appliances where the acceptability of the combination is determined by ULI

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Sample Description

StyleItem No

Color

Sample Receiving Date

Testing Period

============================================================================================

Test Requested

Test Method

(1)

(2)

(3)

(4)

(5)

Test Result(s)

Determination of Lead by ICP-AES

Determination of Mercury by ICP-AES

Determination of Hexavalent Chromium for non-metallic samplesby UVVis Spectrometry

Test Report

20090420

KA200941514

No KA200941514 Date 20090423 Page 1 of 6

POLYPLASTICS TAIWAN CO LTDNO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

VECTRA

NATURE BLACK

The following sample(s) waswere submitted and identified byon behalf of the client as

A130 VF2001BK010P E130G VF2201BK210P E130i VF2201BK205PBK210PBK211PE463i VF2201BK210P E471i VF2201BK210PBK211P E472i BK210P E473i VF2201BK210PE480i VF2201BK210PE481i VF2201BK210P L130 VF2201S135 VF2001BK010P S476 BK210P

20090420 TO 20090423

In accordance with the RoHS Directive 200295EC and its amendmentdirectives

With reference to IEC 623212008Procedures for the Determination of Levels of Regulated Substances inElectrotechnical Products

Determination of Cadmium by ICP-AES

Please refer to next page(s)

Determination of PBB and PBDE by GCMS

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Result

No1

nd 2

nd 2nd 2

nd 2

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

Dibromobiphenyl

Decabromobiphenyl

Pentabromobiphenyl

Nonabromodiphenyl ether

Hexabromodiphenyl ether

Octabromodiphenyl ether

TEST PART DESCRIPTION

Test Item (s)

Heptabromodiphenyl ether

Decabromodiphenyl ether

Cadmium (Cd)

Tetrabromobiphenyl

Dibromodiphenyl ether

Pentabromodiphenyl ether

Tetrabromodiphenyl ether

Monobromodiphenyl ether

Hexavalent Chromium Cr(VI) by alkalineextraction

(1)

Tribromodiphenyl ether

Lead (Pb)

Sum of PBBs

Hexabromobiphenyl

Mercury (Hg)

Monobromobiphenyl

Tribromobiphenyl

(3)

(4)

(2)

Method

(Refer to)MDL

Test results by chemical method (Unit mgkg)

NO1 MIXED ALL PARTSVECTRA

(5)

Test Report No KA200941514 Date 20090423 Page 2 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Heptabromobiphenyl

Octabromobiphenyl

Nonabromobiphenyl

Sum of PBDEs

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

16 This is the additional test report of KA200XXXXXX which wasissued on yyyymmdd

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Please refer to KA200XXXXXX for original information

6 The sample(s) waswere analyzed on behalf of the applicant as mixing sample in one testingThe above result(s) waswere only given as the informality value

2 nd = Not Detected

3 MDL = Method Detection Limit

5 - = Not Regulated

4 The exemption of DecaBDE in polymeric application according 2005717EC wasoverruled by the European Court of Justice by its decision of 01042008 Subsequently DecaBDEwill be included in the sum of PBDE after 01072008

15 This report supersedes all pervious documents bearing the testreport number KA200XXXXXX

Note 1 mgkg = ppm01wt = 1000ppm

Test Report No KA200941514 Date 20090423 Page 3 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 4 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

1) These samples were dissolved totally by pre-conditioning method according to below flow chart(Cr6+ test

method excluded)

2) Name of the person who made measurement Hungming Li

3) Name of the person in charge of measurement Ray Chang

Cr6+

Sample Material Digestion Acid

Steel copper aluminum solder Aqua regia HNO3 HCl HF H2O2

Glass HNO3HF

Gold platinum palladium ceramic Aqua regia

Silver HNO3

Plastic H2SO4 H2O2 HNO3 HCl

Others Any acid to total digestion

PbCd

Solution

ICP-AES

Acid digestion by suitable acid

depended on different sample

material (as below table)

Filtration

Residue

1) Alkali Fusion

2) HCl to dissolve

Sample Measurement

Cutting Preparation

Microwave digestion with

HNO3HClHF

Heat to appropriate

temperature to extract

Cool filter digestate

through filter

Add diphenyl-carbazide

for color development

Measure the absorbance

at 540 nm by UV-VIS

Add appropriate amount

of digestion reagent

Hg

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 5 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

PBBPBDE analytical FLOW CHART

1) Name of the person who made measurement Anson Tsao

2) Name of the person in charge of measurement Ray Chang

First testing process

Optional screen process

Confirmation process

Sample

Screen analysis

Issue Report

Sample pretreatment

Sample extractionSoxhlet method

ConcentrateDiluteExtracted solution

Analysis by GCMS

Filter

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

End of Report

Test Report No KA200941514 Date 20090423 Page 6 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

DOC NoSP-Micro USB Rev A Page67

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

44 Environmental Performance (Continued)

Item Test Description Test Methods Requirement

445 Solderability EIA 364-52 After one hour steam aging

The object of test procedure is to detail

a unfirm test methods for determining

USB connector solderability The test

procedure contained here utilizes the

solder dip technique It is not intended

to test or evaluate solder cup solder

eyelet other hand-soldered type or

SMT type terminations

The surface of the portion to be

soldered shall at least 95 covered

with new solder coatingas specified in

Category 2

1) for WAVE SOLDERING

MIL-STD-202F Method 210A Test

Condition B

Pre-heat 80 60 Seconds

Temperature 260 plusmn 5

Immersion duration 10 plusmn 1 sec

2) for MANUAL SOLDERING

MIL-STD-202F Method 210A Test

Condition A

Pre-heat No

Temperature 350 plusmn 10

Immersion duration 35 plusmn 05 sec

3) for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

1) No mechanical defect on housing

or other parts

446 Resistance to

Soldering Heat

DOC NoSP-Micro USB Rev A Page77

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

50 Test Sequence

Test Group (a) Sample Groups

Test Item Test Description A B C D E F G H I J K L

411 Examination of product 113 15 18 13 1 3 15 1 3 1 6

421 Low Level Contact Resistance 210 24 24 2 5

422 Insulation Resistance 3 11 26

423 Dielectric Withstanding Voltage 4 12 37

431 Durability 7

43 2 Mechanical Shock 3

43 3 Vibration 4

434 Connector Mating Force 58

435 Contact Unmating Force 69

436 Contact Retention Force 2

441 Thermal Shock 5

442 Humidity 4

443 Salt Spray 3

444 Temperature Life(see note c) 3

445 Solderability 2

446 Resistance to Soldering Heat 2

Number of Test Samples (Minimum)

5 5 5 5 5 5 5 5

QMFZ2 Component - Plastics

Friday October 24 2003

E106

764

POLYPLASTICS CO LTD

VECTRA DIV KASUMIGASEKI BLDG 6TH FL 2-5 KASUMIGASEKI 3-CHOME CHIYODA-KU TOKYO 100-6006 JAPAN

Mat

eria

l Des

igna

tion

E13

0i(d

)(e)

Prod

uct D

escr

iptio

n L

iqui

d C

ryst

al P

olym

er (L

CP)

the

rmot

ropi

c ar

omat

ic p

olye

ster

des

igna

ted

Vec

tra

furn

ishe

d as

pel

lets

Col

or

Min

Thi

ck (

mm

) Fl

ame

Cla

ss

HW

IH

AI

RT

I E

lec

RT

I Im

p R

TI

Str

IEC

GW

IT

IEC

GW

FI

ALL

0

75

V-0

2 4

240

220

240

- -

1

5 V-

0 1

4 24

0 22

0 24

0 -

-

3

0 V-

0 0

4 24

0 22

0 24

0 -

-

C

TI

4

HV

TR

0

D49

5 5

IEC

Bal

l Pre

ssur

e (deg

C)

-

Die

lect

ric

Stre

ngth

(kV

mm

) 39

ISO

Ten

sile

Str

engt

h (M

Pa)

-

ISO

Ten

sile

Impa

ct (k

Jm

2 ) -

Volume Resistivity (10

x ohm-cm) 16

ISO Flexural Strength (MPa) -

ISO Izod Impact (kJm

2 ) -

Dimensional Stability()

0

ISO Heat Deflection (degC)

-

ISO Charpy Impact (kJ

m2 )

-

(d)

Virgin and regrind up to 50 by weight incl have the same basic material characteristics for colors

NC and BK

(e)

In addition regrind at 26 to 50 have the same basic characteristics at a minimumof 15mm except

RTIs for the Mechanical wImpact property is 180C

Rep

ort D

ate

81

919

92

Und

erw

riter

s Lab

orat

orie

s Inc

reg

UL94 small-scale test data does not pertain to building materials furnishings and related contents UL 94 small-scale

test data is intended solely for determining the flammability of plastic materials used in components and parts

of end-product devices and appliances where the acceptability of the combination is determined by ULI

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Sample Description

StyleItem No

Color

Sample Receiving Date

Testing Period

============================================================================================

Test Requested

Test Method

(1)

(2)

(3)

(4)

(5)

Test Result(s)

Determination of Lead by ICP-AES

Determination of Mercury by ICP-AES

Determination of Hexavalent Chromium for non-metallic samplesby UVVis Spectrometry

Test Report

20090420

KA200941514

No KA200941514 Date 20090423 Page 1 of 6

POLYPLASTICS TAIWAN CO LTDNO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

VECTRA

NATURE BLACK

The following sample(s) waswere submitted and identified byon behalf of the client as

A130 VF2001BK010P E130G VF2201BK210P E130i VF2201BK205PBK210PBK211PE463i VF2201BK210P E471i VF2201BK210PBK211P E472i BK210P E473i VF2201BK210PE480i VF2201BK210PE481i VF2201BK210P L130 VF2201S135 VF2001BK010P S476 BK210P

20090420 TO 20090423

In accordance with the RoHS Directive 200295EC and its amendmentdirectives

With reference to IEC 623212008Procedures for the Determination of Levels of Regulated Substances inElectrotechnical Products

Determination of Cadmium by ICP-AES

Please refer to next page(s)

Determination of PBB and PBDE by GCMS

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Result

No1

nd 2

nd 2nd 2

nd 2

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

Dibromobiphenyl

Decabromobiphenyl

Pentabromobiphenyl

Nonabromodiphenyl ether

Hexabromodiphenyl ether

Octabromodiphenyl ether

TEST PART DESCRIPTION

Test Item (s)

Heptabromodiphenyl ether

Decabromodiphenyl ether

Cadmium (Cd)

Tetrabromobiphenyl

Dibromodiphenyl ether

Pentabromodiphenyl ether

Tetrabromodiphenyl ether

Monobromodiphenyl ether

Hexavalent Chromium Cr(VI) by alkalineextraction

(1)

Tribromodiphenyl ether

Lead (Pb)

Sum of PBBs

Hexabromobiphenyl

Mercury (Hg)

Monobromobiphenyl

Tribromobiphenyl

(3)

(4)

(2)

Method

(Refer to)MDL

Test results by chemical method (Unit mgkg)

NO1 MIXED ALL PARTSVECTRA

(5)

Test Report No KA200941514 Date 20090423 Page 2 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Heptabromobiphenyl

Octabromobiphenyl

Nonabromobiphenyl

Sum of PBDEs

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

16 This is the additional test report of KA200XXXXXX which wasissued on yyyymmdd

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Please refer to KA200XXXXXX for original information

6 The sample(s) waswere analyzed on behalf of the applicant as mixing sample in one testingThe above result(s) waswere only given as the informality value

2 nd = Not Detected

3 MDL = Method Detection Limit

5 - = Not Regulated

4 The exemption of DecaBDE in polymeric application according 2005717EC wasoverruled by the European Court of Justice by its decision of 01042008 Subsequently DecaBDEwill be included in the sum of PBDE after 01072008

15 This report supersedes all pervious documents bearing the testreport number KA200XXXXXX

Note 1 mgkg = ppm01wt = 1000ppm

Test Report No KA200941514 Date 20090423 Page 3 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 4 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

1) These samples were dissolved totally by pre-conditioning method according to below flow chart(Cr6+ test

method excluded)

2) Name of the person who made measurement Hungming Li

3) Name of the person in charge of measurement Ray Chang

Cr6+

Sample Material Digestion Acid

Steel copper aluminum solder Aqua regia HNO3 HCl HF H2O2

Glass HNO3HF

Gold platinum palladium ceramic Aqua regia

Silver HNO3

Plastic H2SO4 H2O2 HNO3 HCl

Others Any acid to total digestion

PbCd

Solution

ICP-AES

Acid digestion by suitable acid

depended on different sample

material (as below table)

Filtration

Residue

1) Alkali Fusion

2) HCl to dissolve

Sample Measurement

Cutting Preparation

Microwave digestion with

HNO3HClHF

Heat to appropriate

temperature to extract

Cool filter digestate

through filter

Add diphenyl-carbazide

for color development

Measure the absorbance

at 540 nm by UV-VIS

Add appropriate amount

of digestion reagent

Hg

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 5 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

PBBPBDE analytical FLOW CHART

1) Name of the person who made measurement Anson Tsao

2) Name of the person in charge of measurement Ray Chang

First testing process

Optional screen process

Confirmation process

Sample

Screen analysis

Issue Report

Sample pretreatment

Sample extractionSoxhlet method

ConcentrateDiluteExtracted solution

Analysis by GCMS

Filter

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

End of Report

Test Report No KA200941514 Date 20090423 Page 6 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

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有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

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Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

DOC NoSP-Micro USB Rev A Page77

ApprovedDate CheckedDate WrittenDate

TAKE WING

Micro USB series

connector

Product Specification

CARSON

41008 ~ TONY

41008

50 Test Sequence

Test Group (a) Sample Groups

Test Item Test Description A B C D E F G H I J K L

411 Examination of product 113 15 18 13 1 3 15 1 3 1 6

421 Low Level Contact Resistance 210 24 24 2 5

422 Insulation Resistance 3 11 26

423 Dielectric Withstanding Voltage 4 12 37

431 Durability 7

43 2 Mechanical Shock 3

43 3 Vibration 4

434 Connector Mating Force 58

435 Contact Unmating Force 69

436 Contact Retention Force 2

441 Thermal Shock 5

442 Humidity 4

443 Salt Spray 3

444 Temperature Life(see note c) 3

445 Solderability 2

446 Resistance to Soldering Heat 2

Number of Test Samples (Minimum)

5 5 5 5 5 5 5 5

QMFZ2 Component - Plastics

Friday October 24 2003

E106

764

POLYPLASTICS CO LTD

VECTRA DIV KASUMIGASEKI BLDG 6TH FL 2-5 KASUMIGASEKI 3-CHOME CHIYODA-KU TOKYO 100-6006 JAPAN

Mat

eria

l Des

igna

tion

E13

0i(d

)(e)

Prod

uct D

escr

iptio

n L

iqui

d C

ryst

al P

olym

er (L

CP)

the

rmot

ropi

c ar

omat

ic p

olye

ster

des

igna

ted

Vec

tra

furn

ishe

d as

pel

lets

Col

or

Min

Thi

ck (

mm

) Fl

ame

Cla

ss

HW

IH

AI

RT

I E

lec

RT

I Im

p R

TI

Str

IEC

GW

IT

IEC

GW

FI

ALL

0

75

V-0

2 4

240

220

240

- -

1

5 V-

0 1

4 24

0 22

0 24

0 -

-

3

0 V-

0 0

4 24

0 22

0 24

0 -

-

C

TI

4

HV

TR

0

D49

5 5

IEC

Bal

l Pre

ssur

e (deg

C)

-

Die

lect

ric

Stre

ngth

(kV

mm

) 39

ISO

Ten

sile

Str

engt

h (M

Pa)

-

ISO

Ten

sile

Impa

ct (k

Jm

2 ) -

Volume Resistivity (10

x ohm-cm) 16

ISO Flexural Strength (MPa) -

ISO Izod Impact (kJm

2 ) -

Dimensional Stability()

0

ISO Heat Deflection (degC)

-

ISO Charpy Impact (kJ

m2 )

-

(d)

Virgin and regrind up to 50 by weight incl have the same basic material characteristics for colors

NC and BK

(e)

In addition regrind at 26 to 50 have the same basic characteristics at a minimumof 15mm except

RTIs for the Mechanical wImpact property is 180C

Rep

ort D

ate

81

919

92

Und

erw

riter

s Lab

orat

orie

s Inc

reg

UL94 small-scale test data does not pertain to building materials furnishings and related contents UL 94 small-scale

test data is intended solely for determining the flammability of plastic materials used in components and parts

of end-product devices and appliances where the acceptability of the combination is determined by ULI

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Sample Description

StyleItem No

Color

Sample Receiving Date

Testing Period

============================================================================================

Test Requested

Test Method

(1)

(2)

(3)

(4)

(5)

Test Result(s)

Determination of Lead by ICP-AES

Determination of Mercury by ICP-AES

Determination of Hexavalent Chromium for non-metallic samplesby UVVis Spectrometry

Test Report

20090420

KA200941514

No KA200941514 Date 20090423 Page 1 of 6

POLYPLASTICS TAIWAN CO LTDNO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

VECTRA

NATURE BLACK

The following sample(s) waswere submitted and identified byon behalf of the client as

A130 VF2001BK010P E130G VF2201BK210P E130i VF2201BK205PBK210PBK211PE463i VF2201BK210P E471i VF2201BK210PBK211P E472i BK210P E473i VF2201BK210PE480i VF2201BK210PE481i VF2201BK210P L130 VF2201S135 VF2001BK010P S476 BK210P

20090420 TO 20090423

In accordance with the RoHS Directive 200295EC and its amendmentdirectives

With reference to IEC 623212008Procedures for the Determination of Levels of Regulated Substances inElectrotechnical Products

Determination of Cadmium by ICP-AES

Please refer to next page(s)

Determination of PBB and PBDE by GCMS

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Result

No1

nd 2

nd 2nd 2

nd 2

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

Dibromobiphenyl

Decabromobiphenyl

Pentabromobiphenyl

Nonabromodiphenyl ether

Hexabromodiphenyl ether

Octabromodiphenyl ether

TEST PART DESCRIPTION

Test Item (s)

Heptabromodiphenyl ether

Decabromodiphenyl ether

Cadmium (Cd)

Tetrabromobiphenyl

Dibromodiphenyl ether

Pentabromodiphenyl ether

Tetrabromodiphenyl ether

Monobromodiphenyl ether

Hexavalent Chromium Cr(VI) by alkalineextraction

(1)

Tribromodiphenyl ether

Lead (Pb)

Sum of PBBs

Hexabromobiphenyl

Mercury (Hg)

Monobromobiphenyl

Tribromobiphenyl

(3)

(4)

(2)

Method

(Refer to)MDL

Test results by chemical method (Unit mgkg)

NO1 MIXED ALL PARTSVECTRA

(5)

Test Report No KA200941514 Date 20090423 Page 2 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Heptabromobiphenyl

Octabromobiphenyl

Nonabromobiphenyl

Sum of PBDEs

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

16 This is the additional test report of KA200XXXXXX which wasissued on yyyymmdd

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Please refer to KA200XXXXXX for original information

6 The sample(s) waswere analyzed on behalf of the applicant as mixing sample in one testingThe above result(s) waswere only given as the informality value

2 nd = Not Detected

3 MDL = Method Detection Limit

5 - = Not Regulated

4 The exemption of DecaBDE in polymeric application according 2005717EC wasoverruled by the European Court of Justice by its decision of 01042008 Subsequently DecaBDEwill be included in the sum of PBDE after 01072008

15 This report supersedes all pervious documents bearing the testreport number KA200XXXXXX

Note 1 mgkg = ppm01wt = 1000ppm

Test Report No KA200941514 Date 20090423 Page 3 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 4 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

1) These samples were dissolved totally by pre-conditioning method according to below flow chart(Cr6+ test

method excluded)

2) Name of the person who made measurement Hungming Li

3) Name of the person in charge of measurement Ray Chang

Cr6+

Sample Material Digestion Acid

Steel copper aluminum solder Aqua regia HNO3 HCl HF H2O2

Glass HNO3HF

Gold platinum palladium ceramic Aqua regia

Silver HNO3

Plastic H2SO4 H2O2 HNO3 HCl

Others Any acid to total digestion

PbCd

Solution

ICP-AES

Acid digestion by suitable acid

depended on different sample

material (as below table)

Filtration

Residue

1) Alkali Fusion

2) HCl to dissolve

Sample Measurement

Cutting Preparation

Microwave digestion with

HNO3HClHF

Heat to appropriate

temperature to extract

Cool filter digestate

through filter

Add diphenyl-carbazide

for color development

Measure the absorbance

at 540 nm by UV-VIS

Add appropriate amount

of digestion reagent

Hg

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 5 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

PBBPBDE analytical FLOW CHART

1) Name of the person who made measurement Anson Tsao

2) Name of the person in charge of measurement Ray Chang

First testing process

Optional screen process

Confirmation process

Sample

Screen analysis

Issue Report

Sample pretreatment

Sample extractionSoxhlet method

ConcentrateDiluteExtracted solution

Analysis by GCMS

Filter

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

End of Report

Test Report No KA200941514 Date 20090423 Page 6 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

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股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

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公司

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Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

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  • M103-xxxx-LK(FAI+TEST)pdf
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QMFZ2 Component - Plastics

Friday October 24 2003

E106

764

POLYPLASTICS CO LTD

VECTRA DIV KASUMIGASEKI BLDG 6TH FL 2-5 KASUMIGASEKI 3-CHOME CHIYODA-KU TOKYO 100-6006 JAPAN

Mat

eria

l Des

igna

tion

E13

0i(d

)(e)

Prod

uct D

escr

iptio

n L

iqui

d C

ryst

al P

olym

er (L

CP)

the

rmot

ropi

c ar

omat

ic p

olye

ster

des

igna

ted

Vec

tra

furn

ishe

d as

pel

lets

Col

or

Min

Thi

ck (

mm

) Fl

ame

Cla

ss

HW

IH

AI

RT

I E

lec

RT

I Im

p R

TI

Str

IEC

GW

IT

IEC

GW

FI

ALL

0

75

V-0

2 4

240

220

240

- -

1

5 V-

0 1

4 24

0 22

0 24

0 -

-

3

0 V-

0 0

4 24

0 22

0 24

0 -

-

C

TI

4

HV

TR

0

D49

5 5

IEC

Bal

l Pre

ssur

e (deg

C)

-

Die

lect

ric

Stre

ngth

(kV

mm

) 39

ISO

Ten

sile

Str

engt

h (M

Pa)

-

ISO

Ten

sile

Impa

ct (k

Jm

2 ) -

Volume Resistivity (10

x ohm-cm) 16

ISO Flexural Strength (MPa) -

ISO Izod Impact (kJm

2 ) -

Dimensional Stability()

0

ISO Heat Deflection (degC)

-

ISO Charpy Impact (kJ

m2 )

-

(d)

Virgin and regrind up to 50 by weight incl have the same basic material characteristics for colors

NC and BK

(e)

In addition regrind at 26 to 50 have the same basic characteristics at a minimumof 15mm except

RTIs for the Mechanical wImpact property is 180C

Rep

ort D

ate

81

919

92

Und

erw

riter

s Lab

orat

orie

s Inc

reg

UL94 small-scale test data does not pertain to building materials furnishings and related contents UL 94 small-scale

test data is intended solely for determining the flammability of plastic materials used in components and parts

of end-product devices and appliances where the acceptability of the combination is determined by ULI

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Sample Description

StyleItem No

Color

Sample Receiving Date

Testing Period

============================================================================================

Test Requested

Test Method

(1)

(2)

(3)

(4)

(5)

Test Result(s)

Determination of Lead by ICP-AES

Determination of Mercury by ICP-AES

Determination of Hexavalent Chromium for non-metallic samplesby UVVis Spectrometry

Test Report

20090420

KA200941514

No KA200941514 Date 20090423 Page 1 of 6

POLYPLASTICS TAIWAN CO LTDNO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

VECTRA

NATURE BLACK

The following sample(s) waswere submitted and identified byon behalf of the client as

A130 VF2001BK010P E130G VF2201BK210P E130i VF2201BK205PBK210PBK211PE463i VF2201BK210P E471i VF2201BK210PBK211P E472i BK210P E473i VF2201BK210PE480i VF2201BK210PE481i VF2201BK210P L130 VF2201S135 VF2001BK010P S476 BK210P

20090420 TO 20090423

In accordance with the RoHS Directive 200295EC and its amendmentdirectives

With reference to IEC 623212008Procedures for the Determination of Levels of Regulated Substances inElectrotechnical Products

Determination of Cadmium by ICP-AES

Please refer to next page(s)

Determination of PBB and PBDE by GCMS

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Result

No1

nd 2

nd 2nd 2

nd 2

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

Dibromobiphenyl

Decabromobiphenyl

Pentabromobiphenyl

Nonabromodiphenyl ether

Hexabromodiphenyl ether

Octabromodiphenyl ether

TEST PART DESCRIPTION

Test Item (s)

Heptabromodiphenyl ether

Decabromodiphenyl ether

Cadmium (Cd)

Tetrabromobiphenyl

Dibromodiphenyl ether

Pentabromodiphenyl ether

Tetrabromodiphenyl ether

Monobromodiphenyl ether

Hexavalent Chromium Cr(VI) by alkalineextraction

(1)

Tribromodiphenyl ether

Lead (Pb)

Sum of PBBs

Hexabromobiphenyl

Mercury (Hg)

Monobromobiphenyl

Tribromobiphenyl

(3)

(4)

(2)

Method

(Refer to)MDL

Test results by chemical method (Unit mgkg)

NO1 MIXED ALL PARTSVECTRA

(5)

Test Report No KA200941514 Date 20090423 Page 2 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Heptabromobiphenyl

Octabromobiphenyl

Nonabromobiphenyl

Sum of PBDEs

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

16 This is the additional test report of KA200XXXXXX which wasissued on yyyymmdd

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Please refer to KA200XXXXXX for original information

6 The sample(s) waswere analyzed on behalf of the applicant as mixing sample in one testingThe above result(s) waswere only given as the informality value

2 nd = Not Detected

3 MDL = Method Detection Limit

5 - = Not Regulated

4 The exemption of DecaBDE in polymeric application according 2005717EC wasoverruled by the European Court of Justice by its decision of 01042008 Subsequently DecaBDEwill be included in the sum of PBDE after 01072008

15 This report supersedes all pervious documents bearing the testreport number KA200XXXXXX

Note 1 mgkg = ppm01wt = 1000ppm

Test Report No KA200941514 Date 20090423 Page 3 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 4 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

1) These samples were dissolved totally by pre-conditioning method according to below flow chart(Cr6+ test

method excluded)

2) Name of the person who made measurement Hungming Li

3) Name of the person in charge of measurement Ray Chang

Cr6+

Sample Material Digestion Acid

Steel copper aluminum solder Aqua regia HNO3 HCl HF H2O2

Glass HNO3HF

Gold platinum palladium ceramic Aqua regia

Silver HNO3

Plastic H2SO4 H2O2 HNO3 HCl

Others Any acid to total digestion

PbCd

Solution

ICP-AES

Acid digestion by suitable acid

depended on different sample

material (as below table)

Filtration

Residue

1) Alkali Fusion

2) HCl to dissolve

Sample Measurement

Cutting Preparation

Microwave digestion with

HNO3HClHF

Heat to appropriate

temperature to extract

Cool filter digestate

through filter

Add diphenyl-carbazide

for color development

Measure the absorbance

at 540 nm by UV-VIS

Add appropriate amount

of digestion reagent

Hg

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 5 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

PBBPBDE analytical FLOW CHART

1) Name of the person who made measurement Anson Tsao

2) Name of the person in charge of measurement Ray Chang

First testing process

Optional screen process

Confirmation process

Sample

Screen analysis

Issue Report

Sample pretreatment

Sample extractionSoxhlet method

ConcentrateDiluteExtracted solution

Analysis by GCMS

Filter

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

End of Report

Test Report No KA200941514 Date 20090423 Page 6 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Sample Description

StyleItem No

Color

Sample Receiving Date

Testing Period

============================================================================================

Test Requested

Test Method

(1)

(2)

(3)

(4)

(5)

Test Result(s)

Determination of Lead by ICP-AES

Determination of Mercury by ICP-AES

Determination of Hexavalent Chromium for non-metallic samplesby UVVis Spectrometry

Test Report

20090420

KA200941514

No KA200941514 Date 20090423 Page 1 of 6

POLYPLASTICS TAIWAN CO LTDNO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

VECTRA

NATURE BLACK

The following sample(s) waswere submitted and identified byon behalf of the client as

A130 VF2001BK010P E130G VF2201BK210P E130i VF2201BK205PBK210PBK211PE463i VF2201BK210P E471i VF2201BK210PBK211P E472i BK210P E473i VF2201BK210PE480i VF2201BK210PE481i VF2201BK210P L130 VF2201S135 VF2001BK010P S476 BK210P

20090420 TO 20090423

In accordance with the RoHS Directive 200295EC and its amendmentdirectives

With reference to IEC 623212008Procedures for the Determination of Levels of Regulated Substances inElectrotechnical Products

Determination of Cadmium by ICP-AES

Please refer to next page(s)

Determination of PBB and PBDE by GCMS

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Result

No1

nd 2

nd 2nd 2

nd 2

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

Dibromobiphenyl

Decabromobiphenyl

Pentabromobiphenyl

Nonabromodiphenyl ether

Hexabromodiphenyl ether

Octabromodiphenyl ether

TEST PART DESCRIPTION

Test Item (s)

Heptabromodiphenyl ether

Decabromodiphenyl ether

Cadmium (Cd)

Tetrabromobiphenyl

Dibromodiphenyl ether

Pentabromodiphenyl ether

Tetrabromodiphenyl ether

Monobromodiphenyl ether

Hexavalent Chromium Cr(VI) by alkalineextraction

(1)

Tribromodiphenyl ether

Lead (Pb)

Sum of PBBs

Hexabromobiphenyl

Mercury (Hg)

Monobromobiphenyl

Tribromobiphenyl

(3)

(4)

(2)

Method

(Refer to)MDL

Test results by chemical method (Unit mgkg)

NO1 MIXED ALL PARTSVECTRA

(5)

Test Report No KA200941514 Date 20090423 Page 2 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Heptabromobiphenyl

Octabromobiphenyl

Nonabromobiphenyl

Sum of PBDEs

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

16 This is the additional test report of KA200XXXXXX which wasissued on yyyymmdd

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Please refer to KA200XXXXXX for original information

6 The sample(s) waswere analyzed on behalf of the applicant as mixing sample in one testingThe above result(s) waswere only given as the informality value

2 nd = Not Detected

3 MDL = Method Detection Limit

5 - = Not Regulated

4 The exemption of DecaBDE in polymeric application according 2005717EC wasoverruled by the European Court of Justice by its decision of 01042008 Subsequently DecaBDEwill be included in the sum of PBDE after 01072008

15 This report supersedes all pervious documents bearing the testreport number KA200XXXXXX

Note 1 mgkg = ppm01wt = 1000ppm

Test Report No KA200941514 Date 20090423 Page 3 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 4 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

1) These samples were dissolved totally by pre-conditioning method according to below flow chart(Cr6+ test

method excluded)

2) Name of the person who made measurement Hungming Li

3) Name of the person in charge of measurement Ray Chang

Cr6+

Sample Material Digestion Acid

Steel copper aluminum solder Aqua regia HNO3 HCl HF H2O2

Glass HNO3HF

Gold platinum palladium ceramic Aqua regia

Silver HNO3

Plastic H2SO4 H2O2 HNO3 HCl

Others Any acid to total digestion

PbCd

Solution

ICP-AES

Acid digestion by suitable acid

depended on different sample

material (as below table)

Filtration

Residue

1) Alkali Fusion

2) HCl to dissolve

Sample Measurement

Cutting Preparation

Microwave digestion with

HNO3HClHF

Heat to appropriate

temperature to extract

Cool filter digestate

through filter

Add diphenyl-carbazide

for color development

Measure the absorbance

at 540 nm by UV-VIS

Add appropriate amount

of digestion reagent

Hg

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 5 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

PBBPBDE analytical FLOW CHART

1) Name of the person who made measurement Anson Tsao

2) Name of the person in charge of measurement Ray Chang

First testing process

Optional screen process

Confirmation process

Sample

Screen analysis

Issue Report

Sample pretreatment

Sample extractionSoxhlet method

ConcentrateDiluteExtracted solution

Analysis by GCMS

Filter

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

End of Report

Test Report No KA200941514 Date 20090423 Page 6 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

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有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
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    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

Result

No1

nd 2

nd 2nd 2

nd 2

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd -

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

nd 5

Dibromobiphenyl

Decabromobiphenyl

Pentabromobiphenyl

Nonabromodiphenyl ether

Hexabromodiphenyl ether

Octabromodiphenyl ether

TEST PART DESCRIPTION

Test Item (s)

Heptabromodiphenyl ether

Decabromodiphenyl ether

Cadmium (Cd)

Tetrabromobiphenyl

Dibromodiphenyl ether

Pentabromodiphenyl ether

Tetrabromodiphenyl ether

Monobromodiphenyl ether

Hexavalent Chromium Cr(VI) by alkalineextraction

(1)

Tribromodiphenyl ether

Lead (Pb)

Sum of PBBs

Hexabromobiphenyl

Mercury (Hg)

Monobromobiphenyl

Tribromobiphenyl

(3)

(4)

(2)

Method

(Refer to)MDL

Test results by chemical method (Unit mgkg)

NO1 MIXED ALL PARTSVECTRA

(5)

Test Report No KA200941514 Date 20090423 Page 2 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Heptabromobiphenyl

Octabromobiphenyl

Nonabromobiphenyl

Sum of PBDEs

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

16 This is the additional test report of KA200XXXXXX which wasissued on yyyymmdd

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Please refer to KA200XXXXXX for original information

6 The sample(s) waswere analyzed on behalf of the applicant as mixing sample in one testingThe above result(s) waswere only given as the informality value

2 nd = Not Detected

3 MDL = Method Detection Limit

5 - = Not Regulated

4 The exemption of DecaBDE in polymeric application according 2005717EC wasoverruled by the European Court of Justice by its decision of 01042008 Subsequently DecaBDEwill be included in the sum of PBDE after 01072008

15 This report supersedes all pervious documents bearing the testreport number KA200XXXXXX

Note 1 mgkg = ppm01wt = 1000ppm

Test Report No KA200941514 Date 20090423 Page 3 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 4 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

1) These samples were dissolved totally by pre-conditioning method according to below flow chart(Cr6+ test

method excluded)

2) Name of the person who made measurement Hungming Li

3) Name of the person in charge of measurement Ray Chang

Cr6+

Sample Material Digestion Acid

Steel copper aluminum solder Aqua regia HNO3 HCl HF H2O2

Glass HNO3HF

Gold platinum palladium ceramic Aqua regia

Silver HNO3

Plastic H2SO4 H2O2 HNO3 HCl

Others Any acid to total digestion

PbCd

Solution

ICP-AES

Acid digestion by suitable acid

depended on different sample

material (as below table)

Filtration

Residue

1) Alkali Fusion

2) HCl to dissolve

Sample Measurement

Cutting Preparation

Microwave digestion with

HNO3HClHF

Heat to appropriate

temperature to extract

Cool filter digestate

through filter

Add diphenyl-carbazide

for color development

Measure the absorbance

at 540 nm by UV-VIS

Add appropriate amount

of digestion reagent

Hg

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 5 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

PBBPBDE analytical FLOW CHART

1) Name of the person who made measurement Anson Tsao

2) Name of the person in charge of measurement Ray Chang

First testing process

Optional screen process

Confirmation process

Sample

Screen analysis

Issue Report

Sample pretreatment

Sample extractionSoxhlet method

ConcentrateDiluteExtracted solution

Analysis by GCMS

Filter

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

End of Report

Test Report No KA200941514 Date 20090423 Page 6 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

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公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

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74

sd

198

sd

527

Be m

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Spec

Con

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Res

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nce

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ata

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RO

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SER

IES

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Mea

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ints

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  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

16 This is the additional test report of KA200XXXXXX which wasissued on yyyymmdd

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Please refer to KA200XXXXXX for original information

6 The sample(s) waswere analyzed on behalf of the applicant as mixing sample in one testingThe above result(s) waswere only given as the informality value

2 nd = Not Detected

3 MDL = Method Detection Limit

5 - = Not Regulated

4 The exemption of DecaBDE in polymeric application according 2005717EC wasoverruled by the European Court of Justice by its decision of 01042008 Subsequently DecaBDEwill be included in the sum of PBDE after 01072008

15 This report supersedes all pervious documents bearing the testreport number KA200XXXXXX

Note 1 mgkg = ppm01wt = 1000ppm

Test Report No KA200941514 Date 20090423 Page 3 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 4 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

1) These samples were dissolved totally by pre-conditioning method according to below flow chart(Cr6+ test

method excluded)

2) Name of the person who made measurement Hungming Li

3) Name of the person in charge of measurement Ray Chang

Cr6+

Sample Material Digestion Acid

Steel copper aluminum solder Aqua regia HNO3 HCl HF H2O2

Glass HNO3HF

Gold platinum palladium ceramic Aqua regia

Silver HNO3

Plastic H2SO4 H2O2 HNO3 HCl

Others Any acid to total digestion

PbCd

Solution

ICP-AES

Acid digestion by suitable acid

depended on different sample

material (as below table)

Filtration

Residue

1) Alkali Fusion

2) HCl to dissolve

Sample Measurement

Cutting Preparation

Microwave digestion with

HNO3HClHF

Heat to appropriate

temperature to extract

Cool filter digestate

through filter

Add diphenyl-carbazide

for color development

Measure the absorbance

at 540 nm by UV-VIS

Add appropriate amount

of digestion reagent

Hg

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 5 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

PBBPBDE analytical FLOW CHART

1) Name of the person who made measurement Anson Tsao

2) Name of the person in charge of measurement Ray Chang

First testing process

Optional screen process

Confirmation process

Sample

Screen analysis

Issue Report

Sample pretreatment

Sample extractionSoxhlet method

ConcentrateDiluteExtracted solution

Analysis by GCMS

Filter

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

End of Report

Test Report No KA200941514 Date 20090423 Page 6 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

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有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

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Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 4 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

1) These samples were dissolved totally by pre-conditioning method according to below flow chart(Cr6+ test

method excluded)

2) Name of the person who made measurement Hungming Li

3) Name of the person in charge of measurement Ray Chang

Cr6+

Sample Material Digestion Acid

Steel copper aluminum solder Aqua regia HNO3 HCl HF H2O2

Glass HNO3HF

Gold platinum palladium ceramic Aqua regia

Silver HNO3

Plastic H2SO4 H2O2 HNO3 HCl

Others Any acid to total digestion

PbCd

Solution

ICP-AES

Acid digestion by suitable acid

depended on different sample

material (as below table)

Filtration

Residue

1) Alkali Fusion

2) HCl to dissolve

Sample Measurement

Cutting Preparation

Microwave digestion with

HNO3HClHF

Heat to appropriate

temperature to extract

Cool filter digestate

through filter

Add diphenyl-carbazide

for color development

Measure the absorbance

at 540 nm by UV-VIS

Add appropriate amount

of digestion reagent

Hg

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 5 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

PBBPBDE analytical FLOW CHART

1) Name of the person who made measurement Anson Tsao

2) Name of the person in charge of measurement Ray Chang

First testing process

Optional screen process

Confirmation process

Sample

Screen analysis

Issue Report

Sample pretreatment

Sample extractionSoxhlet method

ConcentrateDiluteExtracted solution

Analysis by GCMS

Filter

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

End of Report

Test Report No KA200941514 Date 20090423 Page 6 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

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有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No KA200941514 Date 20090423 Page 5 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

PBBPBDE analytical FLOW CHART

1) Name of the person who made measurement Anson Tsao

2) Name of the person in charge of measurement Ray Chang

First testing process

Optional screen process

Confirmation process

Sample

Screen analysis

Issue Report

Sample pretreatment

Sample extractionSoxhlet method

ConcentrateDiluteExtracted solution

Analysis by GCMS

Filter

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

End of Report

Test Report No KA200941514 Date 20090423 Page 6 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested This test report cannot be reproduced except in full without prior written permission of the Company 除非另有說明此報告結果僅對測試之樣品負責本報告未經本公司書面許可不可部份複製

This Test Report is issued by the Company under its General Conditions of Service printed overleaf or available on request and accessible at httpwwwsgscomterms_and_conditionshtm Attention is drawn to the limitation of liability indemnification and jurisdiction issues defined therein Any holder of this Test Report is advised that information contained hereon reflects the

Companyrsquos findings at the time of its intervention only and within the limits of Clientrsquos instructions if any The Companyrsquos sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents Any unauthorized alteration forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law

SGS Taiwan Ltd No 208 Chung Hwa 2nd Road San Min District Kaohsiung Taiwan 高雄市三民區中華二路208號

台灣檢驗科技股份有限公司 t (886-7) 323-0920 f (886-7) 315-7484 wwwtwsgscom Member of SGS Group

End of Report

Test Report No KA200941514 Date 20090423 Page 6 of 6

POLYPLASTICS TAIWAN CO LTD KA200941514

NO13 JIANYE RD DALIAO TOWNSHIP KAOHSIUNG COUNTY 831TAIWAN (ROC)

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

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有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

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Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

金电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 22

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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有限

公司

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

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74

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198

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red

num

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Ope

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Spec

Con

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Res

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ata

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USB

SER

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Mea

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Spec

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  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698002

Yellow transparent liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

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公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

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Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

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有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

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ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

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Max

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ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

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Max

fina

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ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

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股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

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Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

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74

sd

198

sd

527

Be m

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tact

pos

ition

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Uni

t

Ope

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Spec

Con

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Res

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nce

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ata

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RO

USB

SER

IES

CO

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Mea

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  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

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74

sd

198

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527

Be m

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red

num

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Spec

Con

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Res

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ata

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SER

IES

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Mea

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Spec

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  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0900169802 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169802

CAN09-001698002

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

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有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

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有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

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Max

fina

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ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 1 of 7

SHENZHEN DUOXIN INDUSTRIAL COLTD

JIANGBIAN THIRD INDUSTRIAL ZONESONGGANG TOWNBAOAN DISTRICTSHENZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

镍电镀液

SGS Job No 11561118 - GZ

SGS Internal Reference No 21

Date of Sample Received 13 Jan 2009

Testing Period 13 Jan 2009 - 16 Jan 2009

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

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股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

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公司

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Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

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Uni

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Ope

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r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

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st N

o

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Spec

imen

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de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 2 of 7

Test Results

ID for specimen 1 CAN09-001698001

Green liquid Description for specimen 1

Heavy metal(s)

MDLResultUnit Test Method (Reference)Test Item(s)

Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

alkaline extraction

NDmgkg 2IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Test Method (Reference) MDLResultUnitTest Item(s)

Flame Retardants

Sum of PBBs mgkg - ND -

Monobromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromobiphenyl mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Sum of PBDEs mgkg - ND -

Monobromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Dibromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tribromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Tetrabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Pentabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Hexabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Heptabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Octabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Nonabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Decabromodiphenyl ether mgkg IEC 623212nd CDV (11195CDV) GC-MS ND 5

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

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10

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12

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Res

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USB

SER

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Mea

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Spec

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  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 3 of 7

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 - = Not regulated

5 = The exemption of DecaBDE in polymeric application according 2005717EC was overruled by the

European Court of Justice by its decision of 01042008 Subsequently DecaBDE will be included in the sum of

PBDE after 01072008

Test Method (Reference) MDLResultUnitTest Item(s)

PFOS (Perfluorooctane sulfonates)

Perfluorooctane sulfonates

(PFOS)

PFOS Acid

PFOS Metal Salt

PFOS Amide

mgkg EPA 3540C 1996 LC-MS ND 10

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

Reference Information Directive 2006122EC

(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration

equal to or higher than 0005 by mass

(2) May not be placed on the market in semi-finished products or articles or parts thereof if the concentration of

PFOS is equal to or higher than 01 by mass calculated with reference to the mass of structurally or

microstructurally distinct parts that contain PFOS or for textiles or other coated materials if the amount of PFOS

is equal to or higher than 1μg msup2 of the coated material

Remark The result(s) of specimen isare of the total weight of wet sample

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

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股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

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Max

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Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 4 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

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pos

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Spec

Con

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Res

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ata

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USB

SER

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R

Mea

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Spec

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  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 5 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

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Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 6 of 7

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

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TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

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股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0900169801 Date 17 Jan 2009 Page 7 of 7

Sample photo

CANEC0900169801

CAN09-001698001

SGS authenticate the photo on original report only

End of Report

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

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Uni

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Ope

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r5P

CS

Spec

Con

tact

Res

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nce

Tes

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ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

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ints

posi

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Spec

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  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 1 of 4

SHEN ZHEN XIN KAI HUI METAL MATERIAL SALES DEPARTMENT

NO910XING HE BUILDINGSHAJING STREET OFFICESHAJING TOWN BAO AN AREASHEN ZHEN CITY

CHINA

The following sample(s) waswere submitted and identified on behalf of the clients as

SUS 301

SGS Job No 11347843 - SZ

Date of Sample Received 13 Oct 2008

Testing Period 13 Oct 2008 - 17 Oct 2008

Test Requested Selected test(s) as requested by client

Please refer to next page(s)Test Method

Test Results Please refer to next page(s)

Conclusion Based on the performed tests on submitted sample(s) the results comply

with the RoHS Directive 200295EC and its subsequent amendments

Signed for and on behalf of

SGS-CSTC Ltd

Sr EngineerHuang Fang Sunny

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

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198

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Spec

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  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 2 of 4

Test Results

ID for specimen 1 CAN08-055608001

Silver-gray metal sheet Description for specimen 1

RoHS Directive 200295EC

MDL LimitResultUnit Test Method (Reference)Test Item(s)

100Cadmium (Cd) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Lead (Pb) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

1000Mercury (Hg) NDmgkg 2IEC 623212nd CDV (11195CDV) ICP-OES

Hexavalent Chromium (CrVI) by

boiling water extraction

Negative- IEC 623212nd CDV (11195CDV) UV-Vis

Note

1 mgkg = ppm

2 ND = Not Detected (lt MDL)

3 MDL = Method Detection Limit

4 = Spot-Test

Negative = Absence of CrVI coating Positive = Presence of CrVI coating

(The tested sample should be further verified by boiling-water-extraction method if the spot test result

is negative or cannot be confirmed)

Boiling-water-extraction

Negative = Absence of CrVI coating

Positive = Presence of CrVI coating the detected concentration in boiling-water-extraction solution is

equal or greater than 002 mgkg with 50 cmsup2 sample surface area

5 = Positive indicates the presence of CrVI on the tested areas

Negative indicates the absence of CrVI on the tested areas

6 - = Not regulated

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

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股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 3 of 4

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

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股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Test Report No CANEC0805560801 Date 17 Oct 2008 Page 4 of 4

Sample photo

CANEC0805560801

CAN08-055608001

SGS authenticate the photo on original report only

End of Report

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

NOTest

Equipment

(量测设备)Sample1 Sample2 Sample3 Sample4 Sample5 Sample6 Sample7 Sample8

Judgement

(判定)

Note

(备注)

1 B 475 474 472 472 474 473 474 471 OK

2 C 690 695 691 691 692 688 695 693 OK

3 C 188 188 185 187 186 187 186 186 OK

4 C 778 779 781 779 780 777 778 780 OK

5 B 217 212 215 214 215 215 212 216 OK

6 B 067 066 066 067 067 068 067 067 OK

7 B 260 260 259 262 260 261 260 261 OK

8 C 493 491 495 495 495 492 496 493 OK

鈦文科技股份有限公司

TAKE WING TECHNOLOGY COLTD

DIMENSION TEST REPORT(尺寸测量记录表)Sample name

(樣品名稱)MICRO USB FEMALE

Report No

(报告编号) TD-CN457S030R-1Sample No

(送 样 次 数)T3

Sample Qty

(樣品數量) 8PCS

Test Equipment (量测设备)A Projector(投影机) B CMM(2次元) CCallipers(卡尺) D Micrometer callipers(千分尺)E

Plug guage(塞规) FOther(其它)

Inspection SPEC

(测试规格)

Material

Number

(料號)M103-xxxx-LK

Test Date

(测试日期) 2008423

475plusmn015

690plusmn006002

185plusmn006002

780plusmn015

215plusmn015

065plusmn015

260plusmn015

500plusmn015

Tested by

(检验员) 薛娜丽

Judgement(结果判定)

ACCountermeasure

(改善对策)

Checked by

(核决) DavidInspected by

(审核) 黄进

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

Report No

Inspected by(審核) jim Tested by (检验员)

15

24

1313

C

18

37

5

5

4

Sample name(樣品名稱) 研发部

12 Humidity

Test Requester(委托部門單位)

MICRO USB B TYPEFEMALE (SMT

TYPE)

Sample Qty(樣品數量)

Test Group(樣品群組)

40PCS

AmbientTemp

(環 境溫度)

鈦文科技股份有限公司TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORTTD-CN457S030R-1

25RelativeHumidity

(相對濕度)58

Test Star Date(實驗開始日期)

200835Test Finish Date(實驗完成日期)

2008414

MaterialNumber(料號)

M103-xxxx-LK

PlasticMaterial

(塑膠材質)

Contact Material (端子材質)

Shell Material(鐵殼)

Test Reasons(測試原因)

New Produce Validate (新產品) ECN (工程變更產品) Abnormal Quality Validate(異常品) Normal Quality Validate(承認) Purchase Product Validate (購買品)(Vender(廠商) ) Theproduct credibility test(产品可靠性测试) Other(其它)

Componentsource

(零件來源)

Plastic (塑膠) ( Purchase(購買) Self-mastery(自制) ) Contact (端子) (

Purchase(購買) Self-mastery(自制)) Shell (鐵殼) ( Purchase(購買) Self-

mastery(自制) ) Other(其它)

Test Group(测试群组)

A B HD E GFExamination of

product

Contact Resistance

Insulation Resistance

Test Description (測試項目)

NO

4

1

2

3

14

Contact MatingForce

Contact UnmatingForce

5

8

9

10

6

7

15

16

Solderability

Contact RetentionForce

Thermal Shock

Salt Spray

High Temperaturelife

Resistance toSoldering Heat

11

13

DielectricWithstanding Voltage

Mechanical Shock

Vibration

Durability

2

113 15

210 24

311 26

13

412

5

69

7

58

2

5

3

5

3

4

3

5

16

25

2

5

Note(備注)

Checked by(核準) 许冬彬

5 5

Judgement(结果判定)

David

OK

Improve a counterplan改善对策

Number of Test Samples(minimum)

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

A-14

Checked by(核準)

Inspected by(審核)

Insulation Resistance

3Initial 100 MΩ

Minimum

许冬彬

李志勇

03

55

Connector Mating Force

35

Newt

ons (or 357Kgf)

Maximum

35

4Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

03

5D

iele

ctric

With

stan

ding

Vol

tage

Tes

ter

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

Insu

latio

n R

esis

tanc

eTe

ster

1Appearance

No defects that would

impair normal

operations

Mic

ro-o

hm M

eter

2Low level

Contact resistance

Initial 30 mΩ

Maximum

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

鈦文

科技

股份

有限

公司

Test

Rea

sons

(測試

原因

)

58

Con

tact

Mat

eria

l (端

子材

質)

研发部

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Sam

ple

nam

e(樣

品名

稱)

GR

OU

P A

5PC

STe

st G

roup

(樣品

群組

)

2008

31

0

Test

Req

uest

er(委

托部門

單位

)

Com

pone

nt so

urce

(零件

來源

)

Sam

ple

Qty

(樣

品數

量)

Mat

eria

l Num

ber

(料號

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Faul

t ra

te(不

良率

)

Vis

ualiz

atio

n

Test

con

ditio

ns(測

試條

件)

Test

seq

uenc

e(測

試順

序)

35

PASS

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Test

dat

e(測

試日

期)

Not

e(备

注)

0 0 0

PASS

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

Equ

ipm

ent

(測試設備

編碼

)

PASS

PASS

PASS

EIA 364-20 (or MIL-STD-202F Method 301 Test

Condition B)100 V AC for one minute at sea

level

Leakage current 05mA Maximum

EIA 364-13 Shall be measured with TENSION GAUGE

or TENSION TESTERMeasure force necessary to

mate assemblies at maximum rate of 125mm (or

0492

) per minute

Mat

ing

And

Unm

atin

gFo

rce

Test

er

Tested by (检验员)

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

A-24

Checked by(核準)

Inspected by(審核)

Con

tact

Mat

eria

l (端

子材

質)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

35

Newt

ons (or 357Kgf)

Maximum

李志勇

8Connector Mating Force

Am

bien

t Tem

p(環

境溫

度)

Test

Rea

sons

(測試

原因

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Tested by (检验员)

310

03

10

许冬彬

9Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Mat

ing

And

Unm

atin

g Fo

rce

Test

er0

PASS

PASS

Shall me

et visual

requirement show no

physical damage

Dur

abili

ty te

ster

7Durability

03

6

6Connec

tor Unmating Force

Initial

10 Ne

wton

s

Minimum

After

test

8~20 N

ewt

ons

Minimu

m

PASS

Test

con

ditio

ns(測

試條

件)

EIA

364

-13

Sha

ll be

mea

sure

d w

ith T

ENSI

ON

GA

UG

E or

TEN

SIO

N T

ESTE

RM

easu

re fo

rce

nece

ssar

y to

mat

e as

sem

blie

s at m

axim

um ra

te o

f 12

5mm

(or

049

2rdquo) p

er m

inut

e

35

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Not

e(备

注)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)

研发部

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)25

R

elat

ive

Hum

idity

(相對

濕度

)20

083

5Te

st S

tar D

ate

(實驗

開始

日期

)58

PERFORMANCE TEST REPORT

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st R

eque

ster

(委托部門

單位

)

Mat

ing

And

Unm

atin

g Fo

rce

Test

er

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

0

Test

Gro

up(樣

品群

組)

GR

OU

P A

EIA

364

-09

Mat

e an

d un

mat

e C

onne

ctor

ass

embl

ies f

or 1

0000

cycl

es a

t max

imum

rate

d of

500

cyc

les p

er h

our

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

EIA

364

-13

Mea

sure

forc

e ne

cess

ary

to m

ate

unm

ate

conn

ecto

r ass

embl

ies a

t max

imum

rate

of12

5m

mm

in

Test

Equ

ipm

ent

(測試設備

編碼

)

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

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股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

A-34

Checked by(核準)

Inspected by(審核)

58

5PC

S

Con

tact

Mat

eria

l (端

子材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

13Appearance

No defects that would

impair normal

operations

许冬彬

Vis

ualiz

atio

n0

310

李志勇

PASS

310

03

1012

Dielec

tric Withstanding

Voltage

No

flashoverampsparkoveramp

excess

leakageampbreakdown

011

Insulation Resistance

After test100 MΩ

Minimum

Insu

latio

nR

esis

tanc

e Te

ster

PASS

PASS

Not

e(备

注)

10Low level

Contact resistance

After test 40 mΩ

Maximum

Mic

ro-o

hmM

eter

00

310

Test

con

ditio

ns(測

試條

件)

EIA 364-23 Subject mated contacts

assembled in housing to 20mV maximum open

circuit at 100 mA maximum

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Insp

ectio

n ST

D (測

試標

準)

Test

Equ

ipm

ent

(測試設備

編碼

)Fa

ult

rate

(不良

率)

Test

dat

e(測

試日

期)

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

2008

35

2008

31

0

TAKE WING TECHNOLOGY COLTD

鈦文

科技

股份

有限

公司

PERFORMANCE TEST REPORT

Judg

emen

t(判

定)

PASS

Test

Req

uest

er(委

托部門

單位

)

Test

Fin

ish

Dat

e(實

驗完成日期

)

Shel

l Mat

eria

l(鐵

殼)

Tested by (检验员)

EIA 364-21 Test voltage 500V DC between

adjacent contacts of mated and unmated

connector assemblies

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)100 V AC for one minute

at sea level

Leakage current 05mA Maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Die

lect

ricW

ithst

andi

ngV

olta

geT

este

r

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

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股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

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许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

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Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

A-44

PIN

1PI

N2

PIN

3PI

N4

PIN

5

PIN

1

PIN

2

PIN

3

PIN

4

PIN

5

Checked by(核準)

Inspected by(審核)

李志勇

Uni

tmΩ

00

310

0 0

281

20

253

6

263

7

PASS

PASS

115

165

234

1

266

9

PASS

PASS

PASS

085

075

264

8

275

2

Uni

tKgf

0 0

PASS

PASS

PASS

Uni

tKgf

0

PASS

PASS

0

Uni

tmΩ

000 0 0

085

085

085

280

2

070

075

075

265

2

263

326

85

274

628

20

256

3

270

5

281

2

263

327

69

Afte

r Dur

abili

ty te

stum

mat

ing

forc

e

262

5

279

6

272

5

085

281

1

265

326

69

268

4

080

Sam

ple1

Initi

al

um

mat

ing

forc

e

Afte

r Dur

abili

ty te

stLo

w le

vel

Con

tact

resi

stan

ce

Afte

r Dur

abili

ty te

stM

atin

g fo

rce

283

1

243

2

224

2

236

723

51

Test

Des

crip

tion

(測試

項目

)

Initi

al

Low

leve

lC

onta

ct re

sist

ance

许冬彬3

5

Initi

al

M

atin

g fo

rce

115

150

120

测 试 数 据

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Faul

t ra

te(不

良率

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Test

dat

e(測

試日

期)

Not

e(备

注)

Sam

ple5

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

2008

31

0Te

st F

inis

h D

ate

(實驗完成日期

)A

mbi

ent T

emp

(環 境

溫度

)25

R

elat

ive

Hum

idity

(相對

濕度

)58

Test

Gro

up(樣

品群

組)

GR

OU

P A

研发部

Test

Req

uest

er(委

托部門

單位

)Sa

mpl

e na

me

(樣品

名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Tested by (检验员)

PASS

PASS

PASS

PASS

241

524

22

250

924

22

229

723

47

230

223

47

234

623

68

230

823

85

236

9

165

105

155

110

160

Sam

ple2

Sam

ple4

Sam

ple3

243

523

66

236

7

246

625

36

241

8

235

9

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

B-12

Checked by(核準)

Inspected by(審

核)

The distance from the sample for 30~40 CM Lig

ht

flux is 500~900 lux Inspect angle is 30~60deg

Visu

aliz

atio

n

Cont

act

resi

stan

ce

Test

er

Salt

Spr

ay

Test

er

Cont

act

resi

stan

ce

Test

er

Visu

aliz

atio

n

The

dist

ance

fro

m th

e sa

mple

for

30~

40 C

M

Ligh

t fl

ux i

s 50

0~90

0 lu

x

Insp

ect

angl

e is

30~

60deg

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

Rea

sons

(測試

原因

)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

P

urch

ase(購

買)

Sel

f-ma

ster

y(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Sel

f-ma

ster

y(自

制)

)

Othe

r(其

它)

Ne

w Prod

uce

Vali

date

(新

產品

)

ECN

(工程

變更

產品

)

Ab

norm

al Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條件

)Ju

dgem

ent

(判定

)Fa

ult

rate

(不良

率)

Test

Equ

ipm

ent

(測

試設

備編

碼)

0

许冬

PASS

03

9

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

35

1Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

3Sa

lt S

pray

4Low l

evel

Cont

act

resi

stan

ce

03

5

02

Low l

evel

Cont

act

resi

stan

ce

Init

ial

30

Max

imum

0PA

SSEI

A 36

4-23

Sub

ject

mat

ed c

onta

cts

asse

mble

d

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

PASS

Afte

r te

st

40 m

Ω M

axim

um

PASS

EIA

364-

23 S

ubje

ct m

ated

con

tact

s as

semb

led

in h

ousi

ng t

o 20

mV m

axim

um o

pen

circ

uit

at

100

mA m

axim

um

MIL-

STD-

202F

Me

thod

101

D T

est

Cond

itio

n B

Subj

ect

mate

d co

nnec

tors

to

48 h

ours

at

35

wit

h 5

-Sal

t-so

luti

on c

once

ntra

tion

35

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Subj

ect

mate

d co

nnec

tors

to

48

hour

s at

35

wi

th 5

-Sa

lt-

solu

tion

con

cent

rati

on

5Ap

pear

ance

No

defe

cts

that

wou

ld i

mpai

r

nor

mal

oper

atio

ns

39

Tested by (

检验

员)

志勇

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

B-22

Checked by(核準)

Inspected by(審

核)

Not

e(備

注)

Test

con

ditio

ns(測

試條件

)Te

st E

quip

men

t (測

試設

備編

碼)

Sam

ple

1Sa

mpl

e 2

Sam

ple

3Sa

mpl

e 4

Sam

ple

5

PIN 3

234

2

254

7

245

623

85

245

1

243

824

22

235

824

25

261

324

65

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名稱

)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

BTe

st R

eque

ster

(委托

部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完

成日

期)

2008

31

0

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Rea

sons

(測試

原因

)New

Pro

duce

Val

idat

e (新

產品

)

ECN

(工

程變

更產

品)

Abno

rmal

Qua

lity

Va

lida

te(異

常品

)

Norm

al Q

uali

ty V

alid

ate(

承認

)

Pu

rcha

se

Prod

uct

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The

pro

duct

credi

bili

ty t

est(

产品

可靠

性测

试)

Othe

r(其

它)

Com

pone

nt so

urce

(零件

來源

)

Pla

stic

(塑

膠)

(

Pu

rcha

se(購

買)

Se

lf-m

aste

ry(自

制)

)

Cont

act

(端子

) (

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Sh

ell (鐵

殼)

(

Pur

chas

e(購

買)

Se

lf-m

aste

ry(自

制)

)

Othe

r(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

242

525

08

236

4

0

236

924

44

237

5

256

623

51

Not

e(备

注)

PIN 1

PIN 2

245

2

247

1

254

70

39

246

5

Faul

t ra

te(不

良率

)

242

224

44

0

Test

dat

e(測

試日

期)

250

723

68

242

624

41

252

3

39

250

8

PASS

236

925

07

250

825

66

245

3

许冬

PASS

03

9

Tested by (

检验

员)

243

524

62

PASS

PASS

00

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

245

1

PASS

0

PASS

39

03

9

246

5

PASS

236

424

84

PASS

03

9

PASS

39

PASS

0

PASS

39

39

39

李志

241

5

261

3

253

1

246

8

241

625

31

261

1

238

9

测 试 数 据

Initi

al

Low

leve

lC

onta

ct re

sist

ance

Afte

r Sal

t Spr

ay te

stLo

w le

vel

Con

tact

resi

stan

ce

PIN 5

PIN 4

PIN 3

PIN 5

PIN 1

PIN 2

PIN 4

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

C-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

Visualization

Insulation

Resistance Tester

Dielectric

Withstanding

VoltageTester

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

Humidity Tester

3

Test

dat

e(測

試日

期)

Not

e(备

注)

PASS

03

6

PASS

0

Judg

emen

t(判

定)

EIA 364-21 Test voltage 500VDC between

adjacent contacts of mated and unmated

connector assemblies

2Insulation

Resistance

Initial 100 MΩ Minimum

1Appearance

No defects that would impair

normal operations

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

36

PASS

03

6Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

4Humidity

No defects that would impair

normal operations

EIA 364-31 Test Condition A Method III

(or MIL-202F Method 103B Test Condition

B)-10~65

90~98 RH

168 hours(7cycle)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

许冬彬

PASS

03

6

李志勇

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

C-22

Thermal Shock

Tester

PASS

03

85

Thermal Shock

1)Shall meet visual requirement

show no physical damage2)Shall

meet requirements of additional

tests as specified in TEST

SEQUENCE in Section 5

EIA 364-32 Test Condition I (or MIL-

202F Method 107G Condition A)

Subject mated connectors to ten cycles

between ndash55

to +85

Insulation

Resistance Tester

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

EIA 364-21 Test voltage 100VDC between

adjacent contacts of mated and unmated

connector assemblies

鈦文

科技

股份

有限

公司

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

CTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

dat

e(測

試日

期)

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Test

con

ditio

ns(測

試條

件)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

03

10

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)

6Insulation

Resistance

Aftet test 100 MΩ

Minimum

PASS

Insp

ectio

n ST

D (測

試標

準)

Judg

emen

t(判

定)

7Dielectric

Withstanding

Voltage

100 V AC for one minute at

sea level

1)No flashover or

insulation breakdown

2)Leakage current 05mA

Maxi

mum

PASS

03

10

EIA 364-20 (or MIL-STD-202F Method 301

Test Condition B)Apply a voltage 100V AC

for 1 minute between adjacents Terminals

and between terminals to ground

Dielectric

Withstanding

VoltageTester

8Appearance

No defects that would impair

normal operations

Inspected by(審核)

Checked by(核

準)

李志勇

The distance from the sample for 30~40

CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

Not

e(備

注)

许冬彬

PASS

03

10

Tested by (

检验

员)

Visualization

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

D-11

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目

視無

外觀

不良

現象

)2样品做焊锡性测试后

在10

倍放大镜下观察吃锡面积大于

95

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

DTe

st R

eque

ster

(委托部門

單位

)研

发部

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制) )

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Judg

emen

t(判

定)

Test

con

ditio

ns(測

試條

件)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st d

ate

(測試

日期

)N

ote

(备注

1Appearance

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

PASS

03

6

2Solderability

MICRO Usb contact solder

tails shall pass 95

coverage aft

er one hour

steam aging as specified in

category 2

0IA 364-52 After one hour steam aging

The object of test procedure is to detail a

unfirm test methods for determining

36

Solder pot

PASS

No defects that would

impair normal operations

Visualization

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

Not

e(備

注)

PASS

03

63

Appearance

许冬彬

Checked by(核準)

Inspected by(審核)

李志勇

Tested by (检验员)

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

E-11

03

73

Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

Sample5

Sample6

Test

Equ

ipm

ent

(測

試設備

編碼

)

Mating And

Unmating Force

Tester

Test

con

ditio

ns

(測試

條件

)

The distance from the sample for 30~40 CM

Light flux is 500~900 luxInspect angle is

30~60deg

EIA 364-35 Shall be measured with TENSION

GAUGE or TENSION TESTER in same direction

Visualization

PASS

Pin

3

Pin

4

Not

e (备

注)

测试

数据

样品

Pin 1

Pin 2

1 S

hall

mee

t vis

ual r

equi

rem

ents

show

no

phys

ical

dam

age(目視無外觀不良現

) 2

保持力测试单位为

UN

IT

KG

F

PASS

Sample1

Molding

式产品

PASS

03

7

Sample2

Sample3

Visualization

Sample4

1Appe

aran

ceNo

def

ects

tha

t would

impa

ir n

orma

l op

erations

2Co

ntac

t Re

tent

ion

Forc

e

1)I

niti

al

04 Kgf

mini

mum

2)A

fter

tes

t 04 Kgf

mini

mum

Faul

t ra

te(不

良率

)

03

7

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標準

)

Test

Rea

sons

(測試

原因

)

New

Prod

uce

Vali

date

(新

產品

)

ECN (工

程變

更產

品)

Abnormal Q

uality Validate(異

常品

) Normal Quality Validate(承認) Purchase Product

Vali

date

(購

買品

)(Ve

nder

(廠商

)

)

The product credibility test(

产品

可靠

性测

试)

Other(其它)

Com

pone

nt so

urce

(零件來

源)

P

last

ic (

塑膠

)

(

Pur

chas

e(購

買)

Self-mastery(自

制)

)

Contact (端

子) (

Purchase(購買) Self-mastery(自制) )

Sh

ell

(鐵殼

)

(

P

urch

ase(

購買

)

Self-mastery(自

制) )

Other(其

它)

Test

dat

e(測

試日期

)N

ote

(备注)

)Ju

dgem

ent

(判定

)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-x

xxx-

LKPl

astic

Mat

eria

l(塑

膠材

質)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P E

Test

Req

uest

er(委

托部門

單位

)研发部

Sam

ple

nam

e(樣

品名稱

)M

ICR

O U

SB B

TY

PEFE

MA

LE (S

MT

TYPE

)Sa

mpl

e Q

ty

(樣品

數量

)5P

CS

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PER

FOR

MA

NC

E TE

ST R

EPO

RT

Checked by(核準)

Inspected by(審

核)

许冬彬

李志勇

Tested by (检验员)

Pin

5

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

F-12

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

许冬彬

PASS

03

95

Appearance

No defects tha

t would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

PASS

0Contact resistance

Tester

No appearance damaged

contact resistance30

mΩ Max

Meet Dielectric

strength

EIA 364-17 Test Condition 3 Method A

Subject mated connectors to temperature life at

85 for 96hours

39

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Temperature Life

Tester

4Low level

Contact resistance

After test4

0 mΩ

maximum

02

Low level

Contact resistance

Initial30 mΩ

maximum

PASS

3Temperature Life

03

6

1Appearance

No defects tha

t would

impair normal

operations

36

03

6Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P F

Test

Req

uest

er(委

托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

李志勇

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

F-22

Checked by(核準)

Inspected by(審核)

Tested by (

检验

员)

243

124

22

250

624

26

243

1

241

223

74

241

724

69

248

4

237

624

33

235

725

08

245

8

245

925

34

246

524

21

236

424

15

237

625

36

244

6

237

623

86

232

424

21

237

424

17

246

324

52

5PC

STe

st G

roup

(樣品

群組

)

Sam

ple

5

236

424

32

Sam

ple

1

GR

OU

P F

236

5

Not

e (备

注)

Test

Req

uest

er(委

托部門

單位

)研

发部

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Not

e(备

注)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st d

ate

(測試

日期

)Te

st E

quip

men

t (測試設備

編碼

)

03

6

36

0

39

39

0

243

43

9PA

SS0

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Mat

eria

l Num

ber

(料號

)M1

03-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

con

ditio

ns(測

試條

件)

测 试 数 据

样品

Initi

al

Low

leve

lC

onta

ct re

sist

ance

pin 1

250

624

15

PASS

03

6

pin 3

PASS

pin 2

Sam

ple

2Sa

mpl

e 3

Sam

ple

4

231

8

pin 4

PASS

03

623

64

237

624

31

243

7

243

1

235

5PA

SS0

36

pin 5

PASS

236

923

42

242

224

23

238

9

03

9

39

Afte

r Tem

pera

ture

Life

test

Low

leve

lC

onta

ct re

sist

ance

pin 1

pin 4

pin 5

pin 3

pin 2

PASS

李志勇

PASS

0

许冬彬

PASS

PASS

0

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

G-11

Checked by(核準)

Inspected by(審核)

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Not

e(備

注)

Appearance

No defects that would impair

normal operations

3Visualization

许冬彬

PASS

03

7

Tested by (

检验

员)

Resistance to

Soldering Heat

No mechanical defect on housing

or other parts

PASS

Resistance to

Soldering Heat

Tester

for REFLOW SOLDERING

EIAJ RCX-0101102

Pre-heat 150(Min)~200(Max)

60 ~180 Seconds

Temperature 260 plusmn 5

Immersion duration 10~40 sec

2

PASS

03

7

0

1Appearance

No defects that would impair

normal operations

Visualization

37

The distance from the sample for 30~40

CM

Light flux is 500~900 luxInspect angle

is 30~60deg

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)Te

st s

eque

nce

(測試

順序

)Te

st D

escr

iptio

n(測

試項

目)

Insp

ectio

n ST

D (測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

Other(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

Con

tact

Mat

eria

l (端

子材

質)

Shel

l Mat

eria

l(鐵

殼)

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

35

Test

Fin

ish

Dat

e(實

驗完成日期

)20

083

10

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Gro

up(樣

品群

組)

GR

OU

P G

Test

Req

uest

er(委

托部門

單位

)研

发部

李志勇

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

S

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

H-13

Checked by(核

準)

Inspected by(審核)

李志

Sam

ple

nam

e(樣

品名

稱)

MIC

RO

USB

B T

YPE

FEM

ALE

(SM

T TY

PE)

Sam

ple

Qty

(樣

品數

量)

5PC

STe

st G

roup

(樣品

群組

)G

RO

UP

HTe

st R

eque

ster

(委托部門

單位

)研

发部

鈦文

科技

股份

有限

公司

TAKE WING TECHNOLOGY COLTD

PERFORMANCE TEST REPORT

Am

bien

t Tem

p(環

境溫

度)

25

Rel

ativ

e H

umid

ity(相

對濕

度)

58

Test

Sta

r Dat

e(實

驗開

始日

期)

2008

41

0Te

st F

inis

h D

ate

(實驗完成日期

)20

084

14

Mat

eria

l Num

ber

(料號

)M103-xxxx-LK

Plas

tic M

ater

ial

(塑膠

材質

)C

onta

ct M

ater

ial

(端子

材質

)Sh

ell M

ater

ial

(鐵殼

)

Test

seq

uenc

e(測

試順

序)

Test

Des

crip

tion

(測試

項目

)In

spec

tion

STD

(測

試標

準)

Test

Rea

sons

(測試

原因

)

New Produce Validate (新

產品

)

ECN (工

程變

更產

品)

Abnormal Quality Validate(異

常品

)

Normal Quality Validate(承

認)

Purchase

Product Validate (購

買品

)(Vender(廠

商) )

The product credibility test(

产品

可靠

性测

试)

O

ther(其

它)

Com

pone

nt so

urce

(零件

來源

)

Plastic (塑

膠) (

Purchase(購

買)

Self-mastery(自

制) )

Contact (端

子) (

Purchase(購

買)

Self-mastery(自

制)

)

Shell (鐵

殼) (

Purchase(購

買)

Self-mastery(自

制) )

Other(其

它)

The distance from the sample for 30~40 CM

Light flux is 500~900 lux

Inspect angle is 30~60deg

PASS

Test

dat

e(測

試日

期)

Not

e(备

注)

Judg

emen

t(判

定)

Faul

t ra

te(不

良率

)Te

st E

quip

men

t (測試設備

編碼

)Te

st c

ondi

tions

(測試

條件

)

1Appearance

No defects that would

impair normal

operations

411

04

11Visualization

Contact resistance

Tester

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

5Low

level

Contact re

sistance

After test40 mΩ

maximum

02

Low

level

Contact re

sistance

Initial30 mΩ

maximum

PASS

4Vibr

ation

No discontinuities of

1 microsecond or long

duration See note

EIA-364-28D

Subject mated connectors to 10~55~10Hz traversed

in 1 minute at 152mm amplitude 2 hours each of

3 mutually perpendicular planes

413

EIA 364-23 Subject mated contacts assembled in

housing to 20mV maximum open circuit at 100 mA

maximum

PASS

Vibration Tester

412

0

PASS

6Appearance

No defects that would

impair normal

operations

Visualization

The distance from the sample for 30~40 CMLight

flux is 500~900 luxInspect angle is 30~60deg

Tested by (

检验

员)

冬彬

PASS

04

13

412

0Contact resistance

Tester

3Mechanical Shock

No discontinuities of

1 microsecond or long

duration See note

EIA-364-27B

Subject mated connector to 50Gs half-sine

shock pulses of 11msec duration Three shocks in

each direction applied along three mutuall

perpendicular planed for a total of 18 shocks

Mechanical

ShockTester

PASS

0

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

H-23

1

試樣

描述

M

ICR

O U

SB

SE

RIE

S C

NN

EC

TOR

樣品

數量

5Pcs

托單

委托

日期

2008

-04-

12

完成

日期

2008

-04-

12

試樣

簡述

2 試

驗條

件 試

驗時

試驗

地點

驗環

2008

-04-

12-2

008-

04-1

2實

驗室

28

0 C

65

RH

3

試驗

設備

儀器

名稱

號規

計量

有效

气錘

式沖

擊試

驗机

K

DS

T-12

00S

P

2008

-03-

20-2

009-

03-1

9 振

動試

驗機

K

D-9

363A

MS

20

08-0

3-20

-200

9-03

-19

微歐

姆計

ZE

NTE

CH

-502

AC

20

07-0

9-14

-200

8-09

-13

4

試驗

方法

(依據

產品

規范

委托

方提

供)

驗 項

試 驗

方 法

頻率

10-

55-1

0HZ

振幅

15

2mm

時間

6H

加速

度50

G次

數18

接觸

電阻

四線

法測

其接

触電

5 試

驗結

T

est

Dat

a

測定

值現

試驗

項目

大值

小值

均值

標准

規格

(依

據產

品規

范 委

托方

提供

) 判

初期

接觸

電阻

278

9 21

10

245

01

98

30 mΩ

Max

P

ass

振 動

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

沖 擊

≧0

1μ se

c的

瞬斷

無物

理損

傷依

終期

電阻

判定

≧0

1μ se

c的

瞬斷

無物

理損

傷4

0 mΩ

Max

(fin

al)

Pas

s

終期

接觸

電阻

237

2 12

07

197

4 5

27

40 mΩ

Max

P

ass

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf

H-33

Prod

uct T

itle

Pro

duct

Num

ber

Sam

ple

Size

12

34

51

23

45

1Pin

211

024

08

247

026

71

273

822

32

244

026

65

254

821

12

2Pin

234

527

15

242

924

42

256

525

45

120

714

19

236

913

69

3Pin

215

822

47

213

121

92

225

714

13

145

121

55

146

912

94

4Pin

246

025

22

266

524

55

244

315

39

237

826

72

137

112

75

5Pin

230

227

89

250

327

18

252

224

32

237

224

61

235

518

13

max

27

89

max

26

72

min

21

10

min

12

07

avg

245

0av

g19

74

sd

198

sd

527

Be m

easu

red

num

ber o

f con

tact

pos

ition

spe

cim

ens

5

Uni

t

Ope

rato

r5P

CS

Spec

Con

tact

Res

ista

nce

Tes

t D

ata

MIC

RO

USB

SER

IES

CO

NN

ECTO

R

Mea

sure

d po

ints

posi

tion

ofsp

ecim

ens

Initi

alfin

al

LT08

1560

1Te

st N

o

Initi

al3

0mΩ

Max

fina

l40m

ΩM

ax

Yao

jie

Spec

imen

s co

de

  • M103-xxxx-LK(FAI+TEST)pdf
    • M103-xxxx-LK 全尺寸報告pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-1pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-2pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-3pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-4pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-5pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-6pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-7pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-8pdf
    • MICRO USB B TYPE FEMALE 測試報告(080428)-9pdf
      • LCP_MSDSpdf
        • MSDS 1pdf
        • MSDS 2pdf
        • MSDS 3pdf
        • MSDS 4pdf
        • MSDS 5pdf
        • MSDS 6pdf
        • MSDS 7pdf
        • MSDS 8pdf