Report copyright - Conductive Atomic Force Microscopy of Quantum Dots · Lateral*composi’on*of*Ge*QDs* • SelfHassembled*Ge*QDs*on*Si*substrates* – Sample*A:*1.7nm*of*Ge*at550°C* – Sample*B:*0.85nm*of*Ge*at640°C*
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