quality assurance and certification - sensing, fluid management, … · 2019. 12. 16. · quality...
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Quality SyStem Overview–redmOnd and KaOhSiung• ThequalitymanagementsystemofCraneElectronics,Inc.,RedmondandCraneElectronics
Corporation,KaohsiunghavebeencertifiedtoISO9001:2015andAS9100Doncertificates1655and1657bytheInternationalStandardsAuthority,Inc.(www.isaregistrar.com).
• OurRedmondandKaohsiungfacilitiesareontheDefenseLogisticsAgency’s(DLA)QualifiedManufacturersList(QML)ofhybridmicrocircuitswithproductscompliantuptoClassH(RedmondandKaohsiung)andClassK(Redmond)ofMIL-PRF-38534.OurmanufacturingfacilitiesareauditedbyaUSgovernmentorganizationwithcustomerparticipation.ThecertificatenumberforKaohsiungClassHisVQH-18-032974,forRedmondClassHandKitisVQH-10-019519.
• StandardMicrocircuitDrawings(SMD)ofourDC-DCconvertersareavailabletoClassHandKofMIL-PRF-38534.DLADrawingEMIfiltersareavailabletoClassHandKofMIL-PRF-38534.Thegovernmentdocumentsmaybeviewedathttps://landandmaritimeapps.dla.mil/programs/smcr/.
• Componentsandmaterialsusedinproductassemblyarepurchasedagainstpublishedrevisioncontrolledsourcecontroldrawings(SCD).CharacteristicsandallowedsuppliersarecontrolledbyspecificSCD.Asystemisinplacetoreviewcomponentsandmaterialspriortostocking.InstrumentssuchastheX-rayfluorescence(XRF)areusedtoensurethatsuppliercertificationsaccuratelydescribethematerial.OurhighreliabilityQMLproductscomplywithMIL-PRF-38534specifications,whichdonotallowtheuseofpuretin.Ourotherproductsmayhavepuretin.Refertoour“LeadandOtherRoHSMaterials”letterformoreinformation.www.interpoint.com/011.
• Documentedrevisioncontrolledproceduresandworkinstructionsareinuseforalloperationsthataffectquality.
• Radiationhardnessassurance(RHA)levelsavailablereferencedtoMIL-PRF-38534.OurRedmondfacilityhasaDLAapprovedRHAplanforInterpointpowerproducts.OurSMDproductswithRHA“P,”“L”,“R”and“H”levelmeetDLARHArequirements.
• Travelersareusedtosequenceandcontroloperationsatin-process,finalandspecialinspectionsituations.
• Qualitydocumentsarespecificallyidentifiedandretainedasspecifiedinourdocumentcontrolprocedure.Thestandardretentionperiodforcriticaldocumentsis15years.
• Personnelperformingqualityfunctionsaregiventheresponsibility,authorityandorganizationalfreedomtoidentifyandevaluatequalityconcernsaswellastoinitiatecorrectiveaction.
• Contractsarereviewedtoidentifyandmaketimelyprovisionsforspecialorunusualcircumstances.
• Asaminimum,selfauditsofthequalitysystemarecompletedannually.
TheapplicationnoteisanoverviewoftheCranequalitysystemforInterpoint®products.Itincludesalistofcertificationsandqualifications,anexplanationofourmodelnumberingsystemandtablesofthescreeninglevelsoffered.
This is to certify that the Quality Management System of
Crane Electronics, Inc. (Campus Structure)
(Additional Sites Listed on the Attachment)
Certificate of Registration
International Standards Authority, Inc. www.isaregistrar.com
525 Queensland Cir. Corona, CA 92879. USA
Tel: 951-736-0035
The conditions for maintaining this certificate of registration are set forth in ISA’s Registration Policies 5.1. This registration is granted subject to the organization maintaining compliance to the noted standard. The validity of this certificate is dependent upon ongoing surveillance audits.
ISO 9001:2015 AS9100D
The assessment was performed in accordance with the requirements of the latest version of AS9104 /1:2012-01 ISA is accredited under the ICOP Scheme.
has been assessed for conformance with the provisions set forth by
Certificate No. 1655Issue Date: 06/26/2018 Expiration Date: 06/25/2021 Certified since June 15, 2016
President_________________________________
Scope of Registration
Design, Manufacture, and Sales of Hybrid DC/DC Converters, Electromagnetic Interference Filters, And Custom Microelectronics.
This is to certify that the Quality Management System of
Crane Electronics Inc. Crane Electronics Corporation - Power Solution
No. 198 Xinsheng Rd., Qianzhen District, Kaohsiung City, R.O.C., 80672 Taiwan (Single Site Structure)
Certificate of Registration
International Standards Authority, Inc.
www.isaregistrar.com 525 Queensland Cir.
Corona, CA 92879. USA Tel: 951-736-0035
The conditions for maintaining this certificate of registration are set forth in ISA’s Registration Policies 5.1. This registration is granted subject to the organization maintaining compliance to the noted standard. The validity of this certificate is dependent upon ongoing surveillance audits.
ISO 9001:2015 AS9100D
Scope of Registration Manufacture of Hybrids, DC/DC Converters, EMI Filters, Microelectronics, Magnetics Transformer Rectifier Units and Custom Power Products for Aircraft, Aerospace and Defense Systems.
The assessment was performed in accordance with the requirements of the latest version of AS9104 /1:2012-01 ISA is accredited under the ICOP Scheme.
has been assessed for conformance with the provisions set forth by
Certificate No. 1657 Issue Date: 07/20/2018 Expiration Date: 07/19/2021 Certified since June 15, 2016
President_________________________________
DEFENSE LOGISTICS AGENCY LAND AND MARITIME
POST OFFICE BOX 3990 COLUMBUS, OH 43218-3990
Mr. Dale Fakkema September 4, 2018Crane Electronics, Inc.P.O. Box 97005Redmond, WA 98073-9705
Dear Mr. Fakkema:
Re: Class H Manufacturer Certification, Hybrid Microcircuits, MIL-PRF-38534, FSC 5962,VQ(VQH-18-032974) , CN 064074
Your hybrid facility at No.198, Xinsheng Rd., Qianzhen Dist., Kaohsiung City 80672, Taiwan (R.O.C.) was sample audited the week of March 21-23, 2018 for compliance with the requirements of MIL-PRF-38534.
An acceptable level of confidence has been established that the compliance with these requirements exists. Therefore, Crane Electronics Corporation is considered a certified Classes H manufacturer (certificate enclosed) effective August 30, 2018 retaining a Certification effective date of September 10, 1997.
This certification is for the following:
a. Product Assurance Program Plan: QA-083 Rev. AL.
b. Conversion of Customer Requirements: ENG-002 Rev. AT.
c. Controlled documentation baseline for processing MIL-PRF-38534 devices: QA-039 Rev. AP.
This certification is valid until terminated by written notification from the qualifying activity. The normal period of certification is two years from the date of the audit and, if warranted, may be withdrawn by DLA Land and Maritime-VQ at any time. Your facility may be re-audited on a drop-in basis at any time.
All screening, qualification, conformance, and periodic inspection must be performed at a facility, which has a DLA Land and Maritime-VQ letter of Laboratory Suitability for the applicable test method and condition.
If you have any questions, please contact Mr. Barker at (614) 692-0596.
Sincerely,
ALAN WILLChiefSourcing and Qualifications Division
WILL.ALAN.J.1230187076
Digitally signed by WILL.ALAN.J.1230187076 Date: 2018.09.06 13:11:21 -04'00'
Crane Aerospace & Electronics Power Solutions
Quality assurance and CertificationApplicAtion note
APP-009RevAL-2018.12.07Crane Aerospace & ElectronicsPower Solutions – Interpoint® Products10301 Willows Road NE, Redmond, WA 98052+1 425-882-3100 • [email protected]/interpoint
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Quality aSSuranCe CertifiCatiOnS and StandardS redmOnd and KaOhSiung• ANSI/ESDS20.20—ElectrostaticDischargeControlProgram.Weuseamulti-levelESDdamagepreventionapproachincluding
operatortraining,continuouslymonitoringwristgrounding-straps,staticdissipativesmocksforpersonnel,staticdissipativeworksurfacesandfloors,airionizersatworkstationsandfaradaycagesforpartsmovement.
• ANSI/IPC-A-600—AcceptabilityofPrintedBoards• ANSI/IPC-A-610—AcceptabilityofElectronicAssemblies.TheRedmondfacilityhasIPC-610certifiedoperators.• ANSI-Z540—CalibrationLaboratoriesandMeasuringandTestEquipment—GeneralRequirements• ASQC-Z1.4—Procedures,SamplingandTablesforInspectionbyAttributes• ISO9001:2008/AS9100C—QualitySystems.Modelforqualityassuranceindesign,development,production,installation,and
servicing.RedmondandKaohsiungfacilitiesareregisteredwithQMI-SAIGlobalforISO9001:2008/AS9100C.• ISO14644—CleanroomsandControlledEnvironments.Particlecountmonitoring,laminarflowbenchesandcontamination
preventingsmocksforpersonnelallcontributetomaintainingtherequiredlevelsofcleanliness.• MIL-STD-883—TestMethodStandardforMicrocircuits• MIL-PRF-38534—HybridMicrocircuits,GeneralSpecificationsfor• QualityCertification—Employeeswhoworkwithproductsareindividuallycertifiedintherequiredskills.Trainingand
certificationaredocumentedandrecordsaremaintained.Inspectorsaretestedforcolorvisionandvisualacuity.• QML-38534—QualifiedManufacturer’sListofProductsQualifiedunderPerformanceSpecificationMIL-PRF-38534Hybrid
Microcircuits,GeneralRequirementsfor• RestrictionofHazardousSubstances(RoHS),WasteElectricalandElectronicEquipment(WEEE)andRegistration,Evaluation,
andAuthorizationofChemicals(REACh)areaddressedin“LeadandOtherRoHSMaterials”availableatwww.interpoint.com/011
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part numberingOurpartnumberingindicatestheseries(family),inputvoltage,outputvoltage,numberofoutputs,packageconfigurationandscreeninglevel.ThescreeningandRHAlevelsfoundinthisQualityAssurancedocumentappearattherightendofthepartnumber.Productswithstandardscreeningdonothaveascreeninglevelinthepartnumber:e.g.MTR2812DistheMTRSeries™28voltinput(nominal),±12voltoutputs,flangedpackageandstandardscreening.Refertoindividualdatasheetstodeterminewhatscreeningoptionsareavailableforaparticularproduct.ScreeningmethodsarereferencedtoMIL-STD-883perMIL-PRF-38534.
MTR 28 12 D F / 883 Base Model
Input Voltage
Output Voltage
Screening
Number of Outputs
Case/Lead Option(Standard case has no designator in thisposition. F=flanged model; U, V, W, Y and Zrefer to various options on select products. See individual products for more information.)
(S = single, D = dual, T = triple)
(Main and aux. VOUT for triple models)
(Standard screening has no designatorin this position. See screening levels at right.)
TheexampleshowsanMTR,28Vin,±12Vout,flangedcasewith/883(ClassH)screening.MTR2812D/883isamodelintheMTRSeries™.
SMHF 28 05 S F / K RBase Model
Input VoltageOutput Voltage
Environmental Screening
Number of Outputs(S = single, D = dual)
Radiation HardnessAssurance (RHA)
Case Option(Non-flanged case has no designator in this position)
TheexamplebelowshowsanSMHF,28Vin,+5Vout,flangedcase,ClassKscreeningandRHAlevelR.SMHF2805SF/KRisamodelintheSMHFSeries™.
Table 1: Screening levelS (non Space)level DeScripTion of levelS
883 ClassH,QML,hasanSMDnumber,markedwith“QML”
883 ClassH,QML,doesnothaveanSMDnumber,markedwith“CH”.
8831 MIL-STD-883screening,nonQML,markedwith“SX”ES1 Extendedscreening,pertheproduct’sdatasheetStandard1 Standardscreening,pertheproduct’sdatasheet1.Non-compliantproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.
Table 2: Screening anD rHa levelS, Space proDucTS
level DeScripTion of levelS
KR ClassK,QML,RHAlevelR,100krad(Si)KL ClassK,QML,RHAlevelL,50krad(Si)KP ClassK,QML,RHAlevelP,30krad(Si)ER ClassE,QML,RHAlevelR,100krad(Si)EL ClassE,QML,RHAlevelL,50krad(Si)EP ClassE,QML,RHAlevelP,30krad(Si)HR ClassH,QML,RHAlevelR,100krad(Si)HL ClassH,QML,RHAlevelL,50krad(Si)HP ClassH,QML,RHAlevelP,30krad(Si)KH ClassK,QML,filtersonlyRHAlevelH1
HH ClassH,QML,filtersonlyRHAlevelH1
BR ClassKscreening,non-QML2,RHAlevelR,100krad(Si)BL ClassKscreening,non-QML2,RHAlevelL,50krad(Si)BP ClassKscreening,non-QML2,RHAlevelP,30krad(Si)AR ClassHscreening,non-QML2,RHAlevelR,100krad(Si)
AL ClassHscreening,non-QML2,RHAlevelL,50krad(Si)
AP ClassHscreening,non-QML2,RHAlevelP,30krad(Si)OO Spaceprototype,screening(non-QML2)pertheproduct’s
datasheet.“O”intheRHAdesignatorpositioninInterpointmodelnumbersindicatesDLARHA“-”definedasnoRHA.
NotesTable21.RHA“H”appliestofiltersonly.OurEMIfiltersaredesignedwithpassivecomponentsprovidingmaximumtoleranceforspaceenvironmentrequirements.RHA“H”isdefinedasradiationtolerantupto1000krad(Si)totaldose.
2.Non-QMLproducts“A”,“B”and“O”maynotmeetalloftherequirementsofMIL-PRF-38534.
Iforderingbymodelnumberadda“-Q”torequestsolderdippedleads(e.g.MTR-2812DF/883-Q).AvailableonlyforClassH.
Iforderingbymodelnumberadda“-Q”torequestsolderdippedleads(e.g.SMHF2805SF/KR-Q).AvailableonlyforClassH,EandK.
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SCreening tableS page
“Table3:ElementEvaluationSpaceDC-DCConvertersPrototype,ClassH,EandK”................ 5
“Table4:EnvironmentalScreeningSpaceDC-DCConvertersPrototype,ClassH,EandK”..... 6
“Table5:SpaceRadiationHardnessAssuranceDC-DCConvertersClassH,EandKwithRHAP,LandR”.......................................................................................................................................... 7
“Table6:EnvironmentalScreeningSpaceDC-DCConvertersPrototype,AandB,non-QML”.... 8
“Table7:SpaceRadiationHardnessAssuranceDC-DCConvertersAandBnon-QMLwithRHAP,LandR”...................................................................................................................................... 9
“Table8:ElementEvaluationSpaceEMIFiltersPrototype,ClassHandK”................................ 10
“Table9:EnvironmentalScreeningSpaceEMIFiltersPrototype,ClassHandK,withRHAH”.. 11
“Table10:ElementEvaluationHighReliabilityDC-DCConvertersandEMIFilters/883(ClassH)” ..................................................................................................................................................12
“Table11:EnvironmentalScreeningHighReliabilityDC-DCConvertersandEMIFiltersStandard,/ESand/883(ClassH)”.............................................................................................................. 13
“Table12:EnvironmentalScreeningDC-DCConvertersandEMIFiltersStandardand/ES,Non-QML”......................................................................................................................................... 14
“Table13:EnvironmentalScreeningIndustrialDC-DCConvertersandEMIFiltersStandard,Non-QML”......................................................................................................................................... 15
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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.
Table 3: elemenT evaluaTion Space Dc-Dc converTerS proToType, claSS H, e anD K
ElEmEnt Evaluation SpacE Dc-Dc convErtErS prototypE, claSS H, E anD K
non-Qml 1 Qml
prototypE claSS H claSS E claSS K
componEnt-lEvEl tESt pErformED
/o /H /E 2 /Km/S 3 m/S 3 p 4 m/S 3 p 4 m/S 3 p 4
ElementElectrical n n n n n n n
Visual n n n n n n
InternalVisual n n n
TemperatureCycling n n n n
ConstantAcceleration n n n n
InterimElectrical n n
Burn-in n n
PostBurn-inElectrical n n
SteadyStateLife n n
VoltageConditioningAging n n
VisualInspection n n
FinalElectrical n n n n n n
WireBondEvaluation n n n n n n
SEM n n
C-SAM:Inputcapacitorsonly5 n n n
Notes1.Non-QMLproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.2,ClassEisbasedonClassKrequirementsofMIL-PRF-38534withtheexceptionthatConstantAccelerationislimitedto3000gmaximumincludingqualificationtesting.
3.M/S=Activecomponents(microcircuitandsemiconductordie)4.P=Passivecomponents,ClassH,EandKelementevaluation.Notapplicabletospaceprototype(“O”)elementevaluation.5.AdditionaltestnotrequiredbyH,EorK.
DefinitionsElementEvaluation:Componenttesting/screeningperMIL-STD-883asdeterminedbyMIL-PRF-38534SEM:scanningelectronmicroscopyC-SAM:C–ModeScanningAcousticMicroscopy
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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.
EnvironmEntal ScrEEning SpacE Dc-Dc convErtErS prototypE, claSS H, E anD K, rHa p, l anD r
non-Qml 1 Qml 2, 3
prototypE claSS H claSS E 4 claSS KtESt pErformED /oo 5 /Hp /Hl /Hr /EKp /EKl /EKr /Kp /Kl /Krnon-destruct wire bond pull, method 2023 n6 n6 n6 n n n n n n
pre-cap inspection, method 2017, 2032 n n n n n n n n n n
temperature Cycle (10 times)
Method1010,Cond.C,-65°Cto+150°C,ambient n n n n n n n n n n
Constant acceleration Method2001,3000g n n n n n n n n n n
pind, test method 2020, Cond. a n6 n6 n6 n n n n n n
pre burn-in test, group a, Subgroups 1 and 4 n n6 n6 n6 n n n n n n
burn-in method 1015, +125°C case, typical 7
96hours n
160hours n n n
2x160hours(includesmid-BItest) n n n n n n
final electrical test, mil-prf-38534, group a, Subgroups1and4:+25°Ccase n
Subgroups1through6,-55°C,+25°C,+125°Ccase n n n n n n n n n
hermeticity test, method 1014GrossLeak,Cond.B2,Kr85 n n n n n n
GrossLeak,Cond.C1,fluorocarbon n n n n
FineLeak,Cond.B1,Kr85 n n n n n n
FineLeak,Cond.A2,helium n n n n
radiography, method 2012 n n n n n n
post radiography electrical test, +25°C case n6 n6 n6 n6 n6 n6
final visual inspection, method 2009 n n n n n n n n n n
TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.
Notes1.Non-QMLprototypeproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.
2.AllprocessesareQMLqualifiedandperformedbycertifiedoperators.3.ClassHorKQMLproductsthathavenoSMDnumberaremarked“CHP,CHL,CHR,CKP,CKLorCKR”perMIL-STD-38534,TableIIIinsteadof“QML”.
4.ClassEisbasedonClassKrequirementsofMIL-PRF-38534withtheexceptionthatConstantAccelerationislimitedto3000gmaximumincludingqualificationtesting.
5.“O”intheRHAdesignatorpositioninInterpointmodelnumbersindicatesDLARHA“-”definedasnoRHA.
6.NotrequiredbyDLAbutperformedtoassureproductquality.7.Burn-intemperaturedesignedtobringthecasetemperatureto+125°Cminimum.Burn-inisapoweredtest.
Table 4: environmenTal Screening Space Dc-Dc converTerS proToType, claSS H, e anD K
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Tableisgeneralinformationandisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.
SpacE raDiation HarDnESS aSSurancE ScrEEning Dc-Dc convErtErS claSS H, E anD K, rHa 1 p, l anD r
non-Qml 2 Qml 3
prototypE claSS H claSS E 4 claSS KQualification pEr mil-StD /oo 5 /Hp /Hl /Hr /EKp /EKl /EKr /Kp /Kl /Krrha p: 30 krad(Si) total dose 1, 6, 7 n n n
rha l: 50 krad(Si) total dose 1, 6, 7 n n n
rha r: 100 krad(Si) total dose 1, 6, 7 n n n
See, let 86 mev cm2/mg 1, 8 n n n n n n n n n
TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.
Notes1.OurRedmondfacilityhasaDLAapprovedRHAplanforInterpointpowerproducts.OurSMDproductswithRHA“P”,“L”or“R”codemeetDLArequirements.
2.Non-QMLprototypeproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.
3.ClassHorKQMLproductsthathavenoSMDnumberaremarked“CHP,CHL,CHR,CKP,CKLorCKR”perMIL-STD-38534,TableIIIinsteadof“QML”.
4.ClassEisbasedonClassKrequirementsofMIL-PRF-38534withtheexceptionthatConstantAccelerationislimitedto3000gmaximumincludingqualificationtesting.
5.“O”intheRHAdesignatorpositioninInterpointmodelnumbersindicatesDLARHA“-”definedasnoRHA.
6.Radiationsensitivecomponentsinternaltothedevicesareprocuredwithradiationguaranteesorundergoradiationlotacceptancetesting(RLAT)performedperconditionA,method1019ofMIL-STD-883.
7.RepresentativedeviceswereinitiallyHighDoseRate(HDR)testedusingconditionAofmethod1019ofMIL-STD883toensureRHAdesignatorlevels.RepresentativedeviceshavealsobeenLowDoseRate(LDR)testedusingconditionDofmethod1019ofMIL-STD-883totheRHAdesignatorlevels.Representativedeviceswillalsobere-testedafterdesignorprocesschangesthatcanaffectRHAresponseofthisdevice.
8.Singleeventtestingwasperformedonaconverterto86MeV-cm2/mgusing15MeV/nucleongoldionswithnolatch-up,burn-out,functionalinterrupts,orgaterupturesexhibited.Singleeventupsets(outputvoltagetransients)maybepresentupto86MeV-cm2/mg.
Table 5: Space raDiaTion HarDneSS aSSurance Dc-Dc converTerS claSS H, e anD K wiTH rHa p, l anD r
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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.
Table 6: environmenTal Screening Space Dc-Dc converTerS proToType, a anD b, non-Qml
EnvironmEntal ScrEEning SpacE Dc-Dc convErtErS prototypE, a anD B
non-Qml 1, 2
prototypE a BtESt pErformED /oo 3 /ap /al /ar /Bp /Bl /Brnon-destruct wire bond pull, method 2023 n4 n4 n4 n n n
pre-cap inspection, method 2017, 2032 n n n n n n n
temperature Cycle (10 times)
Method1010,Cond.C,-65°Cto+150°C,ambient n n n n n n n
Constant acceleration Method2001,3000g n n n n n n n
pind, test method 2020, Cond. a n4 n4 n4 n n n
pre burn-in test, group a, Subgroups 1 and 4 n n4 n4 n4 n n n
burn-in method 1015, +125°C case, typical 5
96hours n
160hours n n n
2x160hours(includesmid-BItest) n n n
final electrical test, mil-prf-38534, group a, Subgroups1and4:+25°Ccase n
Subgroups1through6,-55°C,+25°C,+125°Ccase n n n n n n
hermeticity test, method 1014GrossLeak,Cond.B2,Kr85 n n n
GrossLeak,Cond.C1,fluorocarbon n n n n
FineLeak,Cond.B1,Kr85 n n n
FineLeak,Cond.A2,helium n n n n
radiography, method 2012 n n n
post radiography electrical test, +25°C case n4 n4 n4
final visual inspection, method 2009 n n n n n n n
TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.
Notes1.Non-QMLprototypeproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.
2.AllprocessesareQMLqualifiedandperformedbycertifiedoperators.AandBareonlyavailableonselectmodels.
3.“O”intheRHAdesignatorpositioninInterpointmodelnumbersindicatesDLARHA“-”definedasnoRHA.
4.NotrequiredbyDLAbutperformedtoassureproductquality.5.Burn-intemperaturedesignedtobringthecasetemperatureto+125°Cminimum.Burn-inisapoweredtest.
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Tableisgeneralinformationandisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.
SpacE raDiation HarDnESS aSSurancE ScrEEning Dc-Dc convErtErS a anD B, rHa 1 p, l anD r
non-Qml 2
prototypE a BQualification pEr mil-StD /oo 3 /ap /al /ar /Bp /Bl /Brrha p: 30 krad(Si) total dose 1, 4, 5 n n
rha l: 50 krad(Si) total dose 1, 4, 5 n n
rha r: 100 krad(Si) total dose 1, 4, 5 n n
See, let 86 mev cm2/mg 1, 6 n n n n n n
TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.
Notes1.OurRedmondfacilityhasaDLAapprovedRHAplanforInterpointpowerproducts.OurSMDproductswithRHA“P”,“L”or“R”codemeetDLArequirements.
2.Non-QMLprototypeproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.AandBareonlyavailableonselectmodels.
3.“O”intheRHAdesignatorpositioninInterpointmodelnumbersindicatesDLARHA“-”definedasnoRHA.
4.Radiationsensitivecomponentsinternaltothedevicesareprocuredwithradiationguaranteesorundergoradiationlotacceptancetesting(RLAT)performedperconditionA,method1019ofMIL-STD-883.
5.Arepresentativeconverterwashighdoserate(HDR)testedusingconditionAofmethod1019ofMIL-STD-883to150krads(Si)toensureRHAdesignatorlevel“R”(100krad(Si)).Arepresentativeconverterwasalsolowdoserate(LDR)testedusingconditionDofMethod1019ofMIL-STD-883to100krad(Si).
6.Singleeventtestingwasperformedonaconverterto86MeV-cm2/mgusing15MeV/nucleongoldionswithnolatch-up,burn-out,functionalinterrupts,orgaterupturesexhibited.Singleeventupsets(outputvoltagetransients)maybepresentupto86MeV-cm2/mg.
Table 7: Space raDiaTion HarDneSS aSSurance Dc-Dc converTerS a anD b non-Qml wiTH rHa p, l anD r
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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.
Table 8: elemenT evaluaTion Space emi filTerS proToType, claSS H anD K
ElEmEnt Evaluation SpacE Emi filtErS prototypE, claSS H anD K
non-Qml 1 Qml
prototypE claSS H claSS K
componEnt-lEvEl tESt pErformED
/o /H /Kp 2 p 2
ElementElectrical n n n
Visual n n
TemperatureCycling n
ConstantAcceleration n
VoltageConditioningAging n
VisualInspection n
FinalElectrical n n
Notes1.Non-QMLproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.2.P=Passivecomponents,ClassHandKelementevaluation.
DefinitionsElementEvaluation:Componenttesting/screeningperMIL-STD-883asdeterminedbyMIL-PRF-38534
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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.
Table 9: environmenTal Screening Space emi filTerS proToType, claSS H anD K, wiTH rHa H
Notes1.OurRedmondfacilityhasaDLAapprovedRHAplanforInterpointpowerproducts.
2.Non-QMLproducts,prototype(OO),maynotmeetalloftherequirementsofMIL-PRF-38534.
3.AllprocessesareQMLqualifiedandperformedbycertifiedoperators.4.ClassHorKQMLproductsthathavenoSMDnumberaremarked“CHH,CKH”perMIL-STD-38534,TableIIIinsteadof“QML”.
5.“O”intheRHAdesignatorpositioninInterpointmodelnumbersindicatesDLARHA“-”definedasnoRHA.
6.OurEMIfiltersaredesignedexclusivelywithpassivecomponentsprovidingmaximumtoleranceforspaceenvironmentrequirements.
7.NotrequiredbyDLAbutperformedtoassureproductquality.8.Burn-intemperaturedesignedtobringthecasetemperatureto+125°Cminimum.Burn-inisapoweredtest.
9.InterpointEMIfiltersaredesignedexclusivelywithpassivecomponentsprovidingmaximumtoleranceforspaceenvironmentrequirements.RHAlevelHisguaranteedto1000krad(Si).
EnvironmEntal ScrEEning SpacE Emi filtErS prototypE, claSS H anD K, rHa1 H
non-Qml 2 Qml 3, 4
prototypE 5 claSS H claSS KtESt pErformED /oo 6 /HH 6 /KH 6
pre-cap inspection, method 2017, 2032 n n n
temperature Cycle (10 times)
Method1010,Cond.C,-65°Cto+150°C,ambient n n n
Constant accelerationMethod2001,3000g n n n
pind, test method 2020, Cond. a n7 n
pre burn-in test, group a, Subgroups 1 and 4 n n n
burn-in method 1015, +125°C case, typical 8
96hours n
160hours n
2x160hours(includesmid-BItest) n
final electrical test, mil-prf-38534, group a, Subgroups1and4:+25°Ccase n
Subgroups1through6,-55°C,+25°C,+125°Ccase n n
hermeticity test, method 1014GrossLeak,Cond.B2,Kr85 n
GrossLeak,Cond.C1,fluorocarbon n n
FineLeak,Cond.B1,Kr85 n
FineLeak,Cond.A2,helium n n
radiography, method 2012 n
post radiography electrical test, +25°C case n7
final visual inspection, method 2009 n n n
radiation tolerance 1, 9
Passivecomponents,radiationtolerant n n
TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.
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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.
Table 10: elemenT evaluaTion HigH reliabiliTy Dc-Dc converTerS anD emi filTerS /883 (claSS H)
ElEmEnt Evaluation 1 HigH rEliaBility Dc-Dc convErtErS anD Emi filtErS /883 (claSS H)
Qml
claSS H /883
componEnt-lEvEl tESt pErformED m/S 2 p 3
ElementElectrical n n
Visual n n
InternalVisual n
FinalElectrical n n
WireBondEvaluation n n
Notes1.Elementevaluationdoesnotapplytostandardand/ESproduct.2.M/S=Activecomponents(microcircuitandsemiconductordie).3.P=Passivecomponents,ClassHelementevaluation.Notapplicabletostandardand/ESelementevaluation.
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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.
Table 11: environmenTal Screening HigH reliabiliTy Dc-Dc converTerS anD emi filTerS STanDarD, /eS anD /883 (claSS H)
EnvironmEntal ScrEEning HigH rEliaBility Dc-Dc convErtErS anD Emi filtErS StanDarD, /ES anD /883 (claSS H)
non-Qml 1 claSS H Qml 2
tESt pErformEDStanDarD /ES /883
SX 3/883cH 4
/883Qml 5
pre-cap inspection, method 2017, 2032 n n n n n
temperature Cycle (10 times)
Method1010,Cond.C,-65°Cto+150°C,ambient n n n
Method1010,Cond.B,-55°Cto+125°C,ambient n
Constant accelerationMethod2001,3000g n n n
Method2001,500g n
pind, test method 2020, Cond. a n n6 n6
burn-in method 1015, +125°C case, typical 7
96hours n
160hours n n n
final electrical test, mil-prf-38534, group a, Subgroups1through6,-55°C,+25°C,+125°Ccase n n n
Subgroups1and4,+25°Ccase n n
hermeticity testGrossLeak,Cond.C1,fluorocarbon n n n n
FineLeak,Cond.A2,helium n n n n
GrossLeak,Dip n
final visual inspection, method 2009 n n n n n
TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.
Notes1.Non-QMLproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.2.AllprocessesareQMLqualifiedandperformedbycertifiedoperators.3.SXscreeningisavailableonselectmodels.4.ClassHQMLproductswithnoSMDnumberaremarked“CH”perMIL-STD-38534RevJ,3.9.5.8.3,TableIII.5.ClassHQMLproductshaveanSMDnumber6.NotrequiredbyDLAbutperformedtoassureproductquality.7.Burn-intemperaturedesignedtobringthecasetemperatureto+125°Cminimum.Burn-inisapoweredtest.
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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.
EnvironmEntal ScrEEning Dc-Dc convErtErS anD Emi filtErS StanDarD anD /ES, non-Qml1
tESt pErformED StanDarD /ES
pre-cap inspectionMethod2017,2032 n n
temperature Cycle (10 times)Method1010,Cond.B,-55°Cto+125°C,ambient n
Constant accelerationMethod2001,500g n
burn-in method 1015 2
96hours n
final electrical test mil-prf-38534, group a Subgroups1and4:+25°Ccase n n
hermeticity testGrossLeak,Cond.C1,fluorocarbon n
FineLeak,Cond.A2,helium n
GrossLeak,Dip n
final visual inspectionMethod2009 n n
TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.
Notes1.Standardand/ES,non-QMLproducts,maynotmeetalloftherequirementsofMIL-PRF-38534.2.Burn-intemperaturedesignedtobringthecasetemperaturetothemaximumcasetemperatureoftheproduct.Refertothespecificproductinformationforthemaximumcasetemperature.Burn-inisapoweredtest.
Table 12: environmenTal Screening Dc-Dc converTerS anD emi filTerS STanDarD anD /eS, non-Qml
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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.
EnvironmEntal ScrEEning inDuStrial Dc-Dc convErtErS anD Emi filtErS StanDarD, non-Qml1
tESt pErformED inDuStrial StanDarD
pre-cap inspectionMethod2017,2032 n
final electrical test mil-prf-38534, group aSubgroups1and4:+25°Ccase n
hermeticity testGrossLeak,Dip n
final visual inspectionMethod2009 n
TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.
Notes1.Industrial,standard,non-QMLproducts,maynotmeetalloftherequirementsofMIL-PRF-38534.
Table 13: environmenTal Screening inDuSTrial Dc-Dc converTerS anD emi filTerS STanDarD, non-Qml
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QualityAssuranceandCertificationAPP-009RevAL-2018.12.07Allinformationisbelievedtobeaccurate,butnoresponsibilityisassumedforerrorsoromissions.CraneElectronics,Inc.reservestherighttomakechangesthatdonotaffectform,fitorfunctionofClassH,EorKproductsorspecificationswithoutnotice.InterpointisaregisteredtrademarkofCraneCo.TheproductseriesnamesaretrademarksofCraneElectronics,Inc.Copyright©1999-2018CraneElectronics,Inc.Allrightsreserved.http://www.craneae.com/interpoint
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