product change notification - mouser.com · ez-pdtm ccg4 (pd2) usb two-port type-c pd controller...
TRANSCRIPT
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Document No. 001-53357 Rev. *H Page 1 of 2
Cypress Semiconductor Corporation, 198 Champion Court, San Jose, CA 95134. Tel: (408) 943-2600
PRODUCT CHANGE NOTIFICATION
PCN: PCN182408 Date: June 17, 2018 Subject: Qualification of Fab 25 with the Copper (Cu) BEOL Process for the EZ-PDTM CCG4 (PD2) USB Type-C PD Controller Product Family To: PCN ALERTS MOUSER [email protected] Change Type: Major Description of Change: Cypress announces the qualification of Fab 25 in Austin, Texas with the Copper (Cu) Backend of Line (BEOL) process for the EZ-PDTM CCG4 (PD2) USB Type-C Power Delivery (PD) Controller product family. The Aluminum (Al) BEOL process uses Tungsten (W) plugs and Ti/TiN/Al metallization with subtractive patterning to create the metal interconnect layers. The Cu BEOL process converts the underlying metal interconnect layers from W plugs to Cu plugs and from Ti/TiN/Al metallization with subtractive patterning to Cu damascene with Ta/TaN barriers. This qualification is part of the flexible manufacturing initiative which allows Cypress to meet its delivery commitments in dynamic and changing market conditions. Benefit of Change: Qualification of alternate manufacturing sites is part of the ongoing flexible manufacturing initiative announced by Cypress. The goal of the flexible manufacturing initiative is to provide the means for Cypress to continue to meet delivery commitments through dynamic, changing market conditions. Part Numbers Affected: 6 See the attached Affected Parts List file for a list of all part numbers affected by this change. Note that any new parts that are introduced after the publication of this PCN will include all changes outlined in this PCN.
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Document No. 001-53357 Rev. *H Page 2 of 2
Qualification Status: This wafer fab site has been qualified through a series of tests documented in the Qualification Test Plan QTP#174802. This qualification report can be found as an attachment to this PCN or by visiting www.cypress.com and typing the QTP number in the keyword search window. Sample Status: Qualification samples may not be built ahead of time for all part numbers affected by this change. Please review the attached Affected Parts List file for a list of affected part numbers with their associated Fab 25 Cu BEOL sample ordering part numbers. Samples are available now unless there is an indication that the sample ordering part numbers are subject to lead times. If you require qualification samples, please contact your local Cypress sales representative as soon as possible, preferably within 30 days of the date of this PCN, to place any sample orders. Approximate Implementation Date: Effective 90 days from the date of this notification or upon customer approval, whichever comes first, all shipments of Commercial, Industrial and Automotive non-PPAP part numbers in the attached file will be supplied Fab 25 with Cu BEOL or Al BEOL process or other approved wafer fabrication sites. Anticipated Impact: Products fabricated at the new site are completely compatible with existing products from form, fit, functional, parametric and quality performance perspectives. Cypress also recommends that customers take this opportunity to review these changes against current application notes, system design considerations and customer environment conditions to assess impact (if any) to their application. Method of Identification: Cypress maintains traceability of product to wafer level, including wafer fabrication location, through the lot number marked on the package. Response Required: No response is required. For additional information regarding this change, contact your local sales representative or contact the PCN Administrator at [email protected]. Sincerely, Cypress PCN Administration
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Cypress Semiconductor Corporation EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller
FAB25 Cu Material Characterization Report
Design Engineering Director Murtuza Lilamwala [email protected]
Product Engineering Director
Jeffrey Kooiman [email protected]
Product Engineer Swanand Phadke [email protected]
Applications Engineer
Palaniappan (Palani) Subbiah [email protected]
Marketing Engineer
Ganesh Subramaniam [email protected]
www.cypress.com
198 Champion Ct
San Jose, CA 95134 USA
Tel: (408) 943 2600 Fax: (408) 943 4730
mailto:[email protected]:[email protected]:[email protected]:[email protected]:[email protected]://www.cypress.com/ -
EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report
Document No. 002-23442 Rev. **
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1.0 Table of Contents
1.0 Table of Contents .......................................................................................................................................................... 2
2.0 Introduction ................................................................................................................................................................... 3
3.0 Characterization Hardware and Setup ........................................................................................................................ 4
3.1 Characterization Hardware .......................................................................................................................................... 4
Temperature Forcing System .............................................................................................................................................. 4
Temptronic TPO4310A Precision Temperature Forcing System was used to force ambient/industrial operating temperatures of -40C, 25C and 105C .................................................................................................................................. 4
Power Supply......................................................................................................................................................................... 4
Agilent E3631A was used to source operating device power supply voltages. Keithley-2400 was used to force voltage and current. .............................................................................................................................................................. 4
Digital Multimeter .................................................................................................................................................................. 4
Agilent 34411A/3458 was used to measure voltages at 6.5/8.5 digit resolution ............................................................. 4
Clock Input ............................................................................................................................................................................. 4
Agilent 33250A Function Generator was used to provide clock signal .......................................................................... 4
Oscilloscope .......................................................................................................................................................................... 4
ATE Tester ............................................................................................................................................................................. 5
Nextest Magnum1 and Advantest 93K were used for all ATE tested parameters .......................................................... 5
4.0 Characterization Results .............................................................................................................................................. 6
4.1 Absolute Maximum Ratings: ........................................................................................................................................ 6
Document History : ............................................................................................................................................................. 18
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EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report
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2.0 Introduction
2.1 General Description
EZ-PD CCG4 is a dual USB Type-C controller that complies with Revision 2.0 of the Power Delivery specification and Revision 1.2 of the USB Type-C specification. . EZ-PD CCG4 provides a complete dual USB Type-C and USB-Power Delivery port control solution for notebooks, power adapters and docking stations. It can also be used in dual role and downstream facing port applications. EZ-PD CCG4 uses Cypresss proprietary M0S8 technology with a 32-bit, 48-MHz ARM Cortex-M0 processor with 128 KB flash and integrates two complete Type-C Transceivers including the Type-C termination resistors RP and RD.
Key Features:
Integrated dual Type-C+PD controller Integrated UFP (RD) and current sources for DFP (RP) on both Type-C ports Integrated dead battery termination for DRP (Power Source/Sink) applications Integrated VCONN FETs to power EMCA cables
Figure 1. CCG4 Logic Block Diagram
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EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report
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2.2 Datasheet
Datasheet is available here : http://www.cypress.com/documentation/datasheets/ez-pd-ccg4-datasheet-usb-type-c-port-controller
2.3 Application Notes
The following are the Application Notes related to CYPD4xxxx.
AN210403 - Hardware Design Guidelines for Dual Role Port Applications Using EZ-PD USB Type-C Controllers : http://www.cypress.com/file/234156/download
AN210771 - Getting Started with EZ-PD CCG4 : http://www.cypress.com/file/283881/download
2.4 White Papers
The CYPD4xxxx has no associated White Papers at this time.
2.5 Qualification Report
Not available at this time. Qualification is in progress.
3.0 Characterization Hardware and Setup
3.1 Characterization Hardware
Temperature Forcing System
Temptronic TPO4310A Precision Temperature Forcing System was used to force ambient/industrial operating temperatures of -40C, 25C and 105C
Power Supply
Agilent E3631A was used to source operating device power supply voltages. Keithley-2400 was used to force voltage and current.
Digital Multimeter
Agilent 34411A/3458 was used to measure voltages at 6.5/8.5 digit resolution
Clock Input
Agilent 33250A Function Generator was used to provide clock signal
Oscilloscope
Tektronix DPO 7254 Digital Phosphor Oscilloscope was used to verify IMO oscillator frequency on bench.
http://www.cypress.com/documentation/datasheets/ez-pd-ccg4-datasheet-usb-type-c-port-controllerhttp://www.cypress.com/documentation/datasheets/ez-pd-ccg4-datasheet-usb-type-c-port-controllerhttp://www.cypress.com/documentation/application-notes/an210403-hardware-design-guidelines-dual-role-port-applicationshttp://www.cypress.com/documentation/application-notes/an210403-hardware-design-guidelines-dual-role-port-applicationshttp://www.cypress.com/file/234156/downloadhttp://www.cypress.com/documentation/application-notes/an210771-getting-started-ez-pd-ccg4http://www.cypress.com/file/283881/download -
EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report
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ATE Tester
Nextest Magnum1 and Advantest 93K were used for all ATE tested parameters
3.2 Characterization Conditions and Parameters
Characterization was done on the following parts and conditions as listed in Table 1. Units were built using 40 QFN standard production package and chosen randomly unless specified.
Table 1. Characterization Conditions and Parameters
Device Package Supply Voltage (V) Temperature (C)
CYPD4125-40LQXIT 40 QFN VDDD=2.7-5.5V, VDDIO =1.71-5.5V, V5V=4.85-5.5V -40, 25, 105
CYPD4225-40LQXIT 40 QFN VDDD=2.7-5.5V, VDDIO =1.71-5.5V, V5V=4.85-5.5V -40, 25, 105
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EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report
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4.0 Characterization Results
4.1 Absolute Maximum Ratings:
Spec ID
Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
- VDDD_MAX Digital supply relative
to VSS Absolute max -0.5 - 6 V -0.5 - 6 -0.5 - 6
- V5V_P1 Max supply voltage
relative to VSS Absolute max - - 6 V - - 6 - - 6
- V5V_P2 Max supply voltage
relative to VSS Absolute max - - 6 V - - 6 - - 6
- VDDIO_MAX Max supply voltage
relative to VSS Absolute max - - 6 V - - 6 - - 6
- VGPIO_ABS GPIO voltage Absolute max -0.5 - VDDIO + 0.5 V -0.5 - VDDIO + 0.5 -0.5 - VDDIO + 0.5
- IGPIO_ABS Maximum current per
GPIO Absolute max -25 - 25 mA -25 - 25 -25 - 25
- IGPIO_injection GPIO injection current, Max for VIH> VDDD,
and Min for VIL < VSS
Absolute max, current injected per
pin -0.5 - 0.5 mA -0.5 - 0.5 -0.5 - 0.5
- LU Pin current for latch-up - -200 - 200 mA -200 - 200 -200 - 200
- ESD_IEC_CON Electrostatic discharge
IEC61000-4-2 Contact discharge on CC1, CC2 pins
8000 - - V - - 8000 - - 8000
- ESD_IEC_AIR Electrostatic discharge
IEC61000-4-2 Air discharge for pins CC1, CC2
15000 - - V - - 15000 - - 15000
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4.2 DC Specifications:
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID.PWR#1 VDDD Power supply input
voltage UFP applications 2.7 - 5.5 V 2.7 - 5.5 2.7 - 5.5
SID.PWR#1_A VDDD Power supply input
voltage DFP/DRP applications 3.15 - 5.5 V 3.15 - 5.5 3.15 - 5.5
SID.PWR#26 V5V_P1, V5V_P2
Power supply input voltage
- 4.85 - 5.5 V 4.85 - 5.5 4.85 - 5.5
PWR#13 VDDIO GPIO power supply - 1.71 - 5.5 V 1.71 - 5.5 1.71 - 5.5
SID.PWR#24 VCCD Output voltage (for core
logic) - - 1.8 - V 1.78 1.80 1.82 1.79 1.82 1.85
SID.PWR#15 CEFC External regulator voltage bypass on
VCCD X5R ceramic or better 80 100 120 nF 80 100 120 80 100 120
SID.PWR#16 CEXC Power supply
decoupling capacitor on VDDD
X5R ceramic or better 0.8 1 - F 0.8 1 - 0.8 1 -
SID.PWR#27 CEXV Power supply
decoupling capacitor on V5V_P1 and V5V_P2
X5R ceramic or better - 0.1 - F - 0.1 - - 0.1 -
Active Mode, VDDD = 2.7 to 5.5 V. Typical values measured at VDD = 3.3 V.
SID.PWR#4 IDD12 Supply current
V5V_P1 and V5V_P2 = 5 V, TA = 25 C, CC I/O IN Transmit or Receive, no I/O sourcing current, CPU at 24 MHz, two PD
ports active
-10 - 10 mA 5.53 5.65 5.92 5.45 5.71 6.22
Sleep Mode, VDDD = 2.7 to 5.5 V
SID25A IDD20A I2C wakeup WDT ON
IMO at 48 MHz
VDDD = 3.3 V, TA = 25 C, all blocks except CPU are ON, CC I/O ON, no I/O sourcing
current
- 2.5 4 mA 1.92 1.97 2.05 1.90 1.97 2.40
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Deep Sleep Mode, VDDD = 2.7 to 3.6 V (Regulator on)
SID34 IDD29 VDDD = 2.7 to 3.6 V I2C
wakeup and WDT ON VDDD = 3.3 V, TA = 25
C - 80 - A 48.75 55.23 111.06 56.38 74.21 177.81
SID_DS IDD_DS VDDD = 2.7 to 3.6 V CC
wakeup ON
Power source = VDDD, Type-C not attached,
CC enabled for wakeup, RP disabled
- 2.5 - A 0.85 1.88 34.90 1.43 6.24 28.73
SID_DS1 IDD_DS1 VDDD = 2.7 to 3.6 V
CC wakeup ON
Power source = VDDD, Type-C not attached,
CC enabled for wakeup, RP and RD connected at 70 ms intervals by CPU. RP,RD connection
should be enabled for both PD ports.
- 100 - A 49.86 62.16 73.20 55.00 59.54 65.00
XRES Current
SID307 IDD_XR Supply current while
XRES asserted - - 1 10 A 0.23 0.34 0.82 0.22 1.04 1.77
4.3 AC Specifications:
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID.CLK#4 FCPU CPU frequency 3.0 V
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4.4 I/O DC Specifications:
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID.GIO#37 VIH Input voltage HIGH
threshold CMOS input 0.7 VDDIO - - V 0.46 0.53 0.63 0.44 0.55 0.67
SID.GIO#38 VIL Input voltage LOW
threshold CMOS input - - 0.3 VDDIO V 0.35 0.40 0.45 0.35 0.37 0.41
SID.GIO#39 VIH LVTTL input, VDDIO <
2.7 V - 0.7 VDDIO - - V 0.50 0.52 0.55 0.51 0.58 0.67
SID.GIO#40 VIL LVTTL input, VDDIO <
2.7 V - - - 0.3 VDDIO V 0.41 0.43 0.44 0.41 0.44 0.46
SID.GIO#41 VIH LVTTL input, VDDIO >=
2.7 V - 2 - - V 1.30 1.81 1.93 1.24 1.85 1.89
SID.GIO#42 VIL LVTTL input, VDDIO >=
2.7 V - - - 0.8 V 1.15 1.67 1.81 1.09 1.66 1.79
SID.GIO#33 VOH Output voltage HIGH
level IOH = 4 mA at 3-V
VDDIO VDDIO 0.6 - - V 3.07 3.11 3.14 3.04 3.11 3.23
SID.GIO#34 VOH Output voltage HIGH
level IOH = 1 mA at 1.8-V
VDDIO VDDIO 0.5 - - V 1.70 1.71 1.73 1.67 1.72 1.70
SID.GIO#35 VOL Output voltage LOW
level IOL = 4 mA at 1.8-V
VDDIO - - 0.6 V 0.08 0.09 0.12 0.08 0.11 0.15
SID.GIO#36 VOL Output voltage LOW
level IOL = 8 mA at 3 V
VDDIO - - 0.6 V 0.11 0.16 0.27 0.11 0.15 0.22
SID.GIO#5 RPULLUP Pull-up resistor - 3.5 5.6 8.5 k 3.62 5.01 5.55 4.59 4.88 5.63
SID.GIO#6 RPULLDOWN Pull-down resistor - 3.5 5.6 8.5 k 4.69 5.00 5.50 4.50 4.80 5.53
SID.GIO#16 IIL Input leakage current
(absolute value) 25 C, VDDIO = 3.0 V - - 2 nA
Guaranteed by Design
Guaranteed by Design
SID.GIO#17 CIN Input capacitance - - - 7 pF 1.82 2.13 3.45 2.12 2.36 3.63
SID.GIO#43 VHYSTTL Input hysteresis LVTTL VDDIO >= 2.7 V. Guaranteed by
characterization. 25 40 - mV 89.10 142.36 200.07 52.80 151.00 217.00
SID.GPIO#44 VHYSCMOS Input hysteresis CMOS Guaranteed by characterization
0.05 VDDD - - mV 0.11 0.14 0.21 0.10 0.15 0.23
SID69 IDIODE Current through
protection diode to VDDIO/Vss
Guaranteed by Design
- - 100 A
Guaranteed by Design
Guaranteed by Design
SID.GIO#45 ITOT_GPIO Maximum total source or
sink chip current Guaranteed by
Design - - 85 mA
Guaranteed by Design
Guaranteed by Design
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EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report
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4.5 I/O AC Specifications
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID70 TRISEF Rise time in Fast Strong
mode 3.3-V VDDIO, Cload=25
pF 2 - 12 ns 4.74 5.00 5.13 2.39 3.36 4.72
SID71 TFALLF Fall time in Fast Strong
mode 3.3-V VDDIO, Cload=25
pF 2 - 12 ns 2.94 4.20 4.24 2.89 3.37 3.94
4.6 XRES DC Specifications
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID.XRES#1 VIH Input voltage
HIGH threshold CMOS input 0.7 VDDIO - - V 0.54 0.55 0.61 0.53 0.57 0.62
SID.XRES#2 VIL Input voltage
LOW threshold CMOS input - - 0.3 VDDIO V 0.41 0.48 0.50 0.42 0.48 0.50
SID.XRES#3 CIN Input capacitance - - - 7 pF 1.28 1.31 1.33 1.32 1.33 1.34
SID.XRES#4 VHYSXRES Input voltage
hysteresis Guaranteed by characterization
- - 0.05 VDDIO mV 0.07 0.07 0.19 0.07 0.13 0.20
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4.7 Digital Peripherals:
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID.TCPWM.3 TCPWMFREQ Operating frequency Fc max = CLK_SYS. Maximum = 48 MHz.
- Fc - MHz - Fc - - Fc -
SID.TCPWM.4 TPWMENEXT Input trigger pulse
width For all trigger events - 2/Fc - ns - 2/Fc - - 2/Fc -
SID.TCPWM.5 TPWMEXT Output trigger pulse
width
Minimum possible width of Overflow, Underflow, and CC
(Counter equals Compare value)
outputs
- 2/Fc - ns - 2/Fc - - 2/Fc -
SID.TCPWM.5A TCRES Resolution of counter Minimum time between
successive counts - 1/Fc - ns - 1/Fc - - 1/Fc -
SID.TCPWM.5B PWMRES PWM resolution Minimum pulse width
of PWM output - 1/Fc - ns - 1/Fc - - 1/Fc -
SID.TCPWM.5C QRES Quadrature inputs
resolution
Minimum pulse width between quadrature-
phase inputs - 1/Fc - ns - 1/Fc - - 1/Fc -
4.8 Fixed I2C AC Specifications:
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID153 FI2C1 Bit rate - - - 1 Mbps 1.51 1.91 1.98 1.45 1.87 1.97
4.9 Fixed UART AC Specifications:
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID162 FUART Bit rate - - - 1 Mbps 1.46 1.89 2.42 1.46 1.85 2.40
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4.10 Fixed SPI AC Specifications:
Spec ID Parameter Description Details/Conditions
Datasheet
Units
SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID166 FSPI SPI operating frequency
(Master; 6X oversampling) - - - 8 MHz 10.34 12.25 12.70 10.85 12.09 13.06
4.11 Fixed SPI Master Mode AC Specifications:
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID167 TDMO MOSI valid after Sclock
driving edge - - - 15 ns 4.65 6.04 7.16 4.25 6.18 7.94
SID168 TDSI MISO valid before
Sclock capturing edge - 20 - - ns -52.73 -47.54 -22.02 -51.76 -40.40 -23.89
SID169 THMO Previous MOSI data
hold time - 0 - - ns 52.39 55.05 57.01 50.44 54.38 58.95
4.12 Fixed SPI Slave Mode AC Specifications:
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID170 TDMI MOSI valid before Sclock
capturing edge - 40 - - ns -0.96 0.24 0.65 -1.09 0.19 1.06
SID171 TDSO MISO valid after Sclock
driving edge TSCB = TCPU =
1/24 MHz - - 48 + 3 * TSCB ns 77.01 81.46 102.88 77.81 86.41 101.08
SID171A TDSO_EXT MISO valid after Sclock
driving edge in Ext Clk mode - - - 48 ns 11.23 20.93 34.85 10.84 22.06 39.78
SID172 THSO Previous MISO data hold
time - 0 - - ns 11.26 20.93 34.88 10.86 22.06 39.83
SID172A TSSELSCK SSEL valid to first SCK valid
edge - 100 - - ns 0.17 1.32 2.46 0.11 1.29 2.41
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4.13 Flash AC Specifications:
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID.MEM#4 TROWWRITE Row (block) write time (erase and
program) - - - 20 ms Guaranteed by Design Guaranteed by Design
SID.MEM#3 TROWERASE Row erase time - - - 13 ms Guaranteed by Design Guaranteed by Design
SID.MEM#8 TROWPROGRAM Row program time
after erase - - - 7 ms Guaranteed by Design Guaranteed by Design
SID178 TBULKERASE Bulk erase time (128
KB) - - - 35 ms Guaranteed by Design Guaranteed by Design
SID180 TDEVPROG Total device program
time Guaranteed by Design - - 25 seconds Guaranteed by Design Guaranteed by Design
SID.MEM#6 FEND Flash endurance Guaranteed by characterization
100K - - cycles Qual Qual
SID182 FRET1 Flash retention. TA
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4.15 Precise Power On Reset (POR):
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID190 VFALLPPOR BOD trip voltage in active
and sleep modes Guaranteed by characterization
1.48 - 1.62 V 1.54 1.58 1.59 1.55 1.56 1.57
SID192 VFALLDPSLP BOD trip voltage in Deep
Sleep Guaranteed by characterization
1.1 - 1.5 V 1.26 1.27 1.32 1.26 1.27 1.30
4.16 SWD Interface Specifications:
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID.SWD#1 F_SWDCLK1 3.3V
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4.17 IMO AC Specifications:
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID.CLK#13 FIMOTOL Frequency variation
at 24, 36, and 48 MHz (trimmed)
- - 2 % -0.16 -0.07 0.003 -0.16 -0.06 0.04
SID226 TSTARTIMO IMO start-up time - - 7 s 1.72 2.26 2.66 2.92 3.15 3.40
SID229 TJITRMSIMO RMS jitter at 48 MHz - 145 - ps 50.42 68.77 100.43 96.90 232.00 363.00
FIMO - IMO frequency 24 - 48 MHz Verified at 48 MHz
Verified at 48 MHz
4.18 ILO AC Specifications:
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID234 TSTARTILO1 ILO startup time Guaranteed by
characterization. - - 2 ms 0.01 0.015 0.02 0.001 0.01 0.02
SID236 TILODUTY ILO duty cycle Guaranteed by
characterization. 40 50 60 %
Guaranteed by Design
Guaranteed by Design
SID.CLK#5 FILO ILO frequency - 20 40 80 kHz 35.84 47.36 56.18 34.56 45.79 61.44
4.19 PD DC Specifications:
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID.PD.1 Rp_std DFP CC termination for default
USB Power 64 80 96 A 73.94 83.19 94.73 76.59 82.89 91.36
SID.PD.2 Rp_1.5A DFP CC termination for 1.5A
power 166 180 194 A 167.02 177.18 183.41 169.10 176.23 191.78
SID.PD.3 Rp_3.0A DFP CC termination for 3.0A
power 304 330 356 A 328.13 329.26 330.25 311.75 320.67 345.75
SID.PD.4 Rd UFP CC termination 4.59 5.1 5.61 k 4.64 5.01 5.29 4.70 4.98 5.43
SID.PD.5 Rd_DB UFP Dead Battery CC
Termination on CC1 and CC2 All supplies forced to 0V and 1.32 V applied at CC1 or CC2
4.08 5.1 6.12 k 4.93 5.12 5.42 4.45 4.75 5.18
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EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report
Document No. 002-23442 Rev. **
Company Confidential A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 16 of 18
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID.PD.15 Vdrop_V5V_CC1
Voltage drop from V5V_P1 and V5V_P2 pins to CC1 pin while sourcing
215 mA. CC1 and CC2 pins of Port1 and Port2 are not short circuit
protected. Max sourcing current allowed is 500 mA.
- - - 100 mV 38.22 49.65 58.36 25.50 28.31 31.50
SID.PD.16 Vdrop_V5V_CC2
Voltage drop from V5V_P1 and V5V_P2 pins to CC2 pin while sourcing
215 mA. CC1 and CC2 pins of Port1 and Port2 are not short circuit
protected. Max sourcing current allowed is 500 mA.
- - - 100 mV 38.69 47.87 57.89 26.00 29.07 50.00
4.20 ADC DC Specifications:
Spec ID Parameter Description Details/Conditions Datasheet
Units SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID.ADC.1 Resolution ADC resolution - - 8 - bits Verified for 8Bits Verified for 8Bits
SID.ADC.2 INL Integral nonlinearity - -1.5 - 1.5 LSB -0.28 0.02 0.37 -0.30 0.01 0.48
SID.ADC.3 DNL Differential nonlinearity
- -2.5 - 2.5 LSB -0.37 0.04 0.82 -0.37 0.04 0.78
SID.ADC.4 Gain Error Gain error - -1 - 1 LSB -0.12 0.01 0.08 -0.11 0.001 0.09
4.21 ADC AC Specifications:
Spec ID Parameter Description Details/Conditions Datasheet
Units
SKYWATER Al FAB25 Cu
Min Typ Max Min Typ Max Min Typ Max
SID.ADC.7 SLEW_Max Rate of change of
sampled voltage signal - - - 3 V/ms Guaranteed by Design Guaranteed by Design
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EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report
Document No. 002-23442 Rev. **
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Page 17 of 18
5.0 Eye Diagram Measurements for USB-PD BMC Compliance:
Note: USBPD-CCG4 EYE DIAGRAM for Typical unit at 25c, Voltage 3.3V, Internal Rp Trim and External Rd - 5.1K
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EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report
Document No. 002-23442 Rev. **
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturers representatives, and distributors. To find the office closest to you, visit us at cypress.com/sales.
Products
PSoC psoc.cypress.com Clocks & Buffers clocks.cypress.com Wireless wireless.cypress.com Memories memory.cypress.com Image Sensors image.cypress.com
PSoC Solutions
General psoc.cypress.com/solutions Low Power/Low Voltage psoc.cypress.com/low-power Precision Analog psoc.cypress.com/precision-analog LCD Drive psoc.cypress.com/lcd-drive CAN 2.0b psoc.cypress.com/can USB psoc.cypress.com/usb
Cypress Semiconductor Corporation, 2018. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign), United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without the express written permission of Cypress. Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress product in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Use may be limited by and subject to the applicable Cypress software license agreement. All products and company names mentioned in this document may be the trademarks of their respective holders.
Company Confidential A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 18 of 18
Document History :
Rev. ECN No. Orig. of
Change Description of Change
** 6107989 RADK EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller
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Document No. 002-24165 Rev. **ECN #: 6199884
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Page 1 of 31
Cypress SemiconductorProduct Qualification Report
QTP# 174802 VERSION**June 2018
EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller Device Family
S8SPR1 Technology, Fab 25 (Cu BEOL Interconnect)
CYPD4125**
EZ-PD CCG4 (PD2) Dual USB Type-C Controller
CYPD4225**
FOR ANY QUESTIONS ON THIS REPORT, PLEASE [email protected] or via a CYLINK CRM CASE
Prepared By:Josephine Pineda (JYF)
Reviewed By:Sandhya Chandrashekhar (SANC)
Staff Reliability Engineer Principal Reliability Engineer
Approved By:David Hoffman (DHH)
Reliability Director
mailto:[email protected] -
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PRODUCT QUALIFICATION HISTORY
QTPNumber
Description of Qualification Purpose Date
151008Qualification of S8* Technology in Fab 25 Using TrueTouch Gen6MTouchscreen Controller Device
Dec. 2015
151303 Qualification of CapSense MBR3 Device, S8PF-10R Technology in Fab 25 Dec. 2015
160401 Qualification of TrueTouch Fingerprint Device, S8PFHD-10R Technology in Fab 25 May 2016
160301Qualification of TrueTouch Gen6XL Touchscreen Controller Device,S8SPF-10P Technology in Fab 25
June 2016
160803 Qualification of PSoC 4000S Device, S8PFHD-10R Technology in Fab 25 June 2016
160207 Qualification of PSoC 3 Device, S8P12-10P Technology in Fab 25 July 2016
161003Qualification of EZ-PDTM CCG1 USB Type-C PD Controller Device,S8PF-10R Technology in Fab 25
March 2016
160809Qualification of EZ-PDTM CCG2 USB Type-C PD Controller Device,S8PR2-10R Technology in Fab 25
Aug. 2016
164802Qualification of EZ-PDTM CCG2 USB Type-C PD Controller Device,S8PR1-10/S8PHR-10R Technology in Fab 25
Sept. 2017
163301Qualification of EZ-PDTM CCG3 USB Type-C PD Controller Device,S8SPF-20/S8SPF20-NP Technology in Fab 25 (Al BEOL Interconnect)
June 2017
164302Qualification of EZ-PDTM CCG3 USB Type-C PD Controller Device,S8SPF-20/S8SPF20-NP Technology in Fab 25 (Cu BEOL Interconnect)
Nov.2017
162113Qualification of EZ-PDTM CCG4 USB Two-Port Type-C PD Controller Device,S8SPR1P Technology in Fab 25 (Al BEOL Interconnect)
March 2017
174801Qualification of EZ-PD TM CCG4 (PD3) USB Two-Port Type-C PD Controller Device,S8SPR1 Technology in Fab 25 (Cu BEOL Interconnect)
Feb. 2018
174802Qualification of EZ-PD TM CCG4 (PD2) USB Two-Port Type-C PD Controller Device,S8SPR1 Technology in Fab 25 (Cu BEOL Interconnect)
June 2018
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Page 3 of 31
PRODUCT DESCRIPTION (for qualification)
Qualification Purpose: To qualify EZ-PD TM CCG4 (PD2) USB Two-Port Type-C PD Controller Device,
S8SPR1 Technology in Fab 25 (Cu BEOL Interconnect)
Marketing Part #: CYPD4125**/ CYPD4225**
Device Description: EZ-PD CCG4 (PD2) Dual USB Type-C Controller
Cypress Division: Cypress Semiconductor MCU and Connectivity Division (MCD)
TECHNOLOGY/FAB PROCESS DESCRIPTION
Number of Metal Layers: Proprietary Metal Composition: Proprietary
Passivation Type and Thickness: Proprietary
Generic Process Technology/Design Rule (-drawn): Proprietary
Gate Oxide Material/Thickness (MOS): Proprietary
Name/Location of Die Fab (prime) Facility: Fab 25
Die Fab Line ID/Wafer Process ID: S8SPR1
ALTERNATIVE FAB FACILITY SITE
FAB SITE LOCATION QTP NUMBER
SkyWater Bloomington, Minnesota154601
(Al BEOL Interconnect)
Fab 25 Austin, Texas162113
(Al BEOL Interconnect)
Fab 25 Austin, Texas174801 (CCG4 PD3)
(Cu BEOL Interconnect)
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Page 4 of 31
MAJOR PACKAGE INFORMATION USED IN THIS QUALIFICATION
Package Designation: LQ40
Package Outline, Type, or Name: Quad Flat No Lead (QFN), 6x6x0.6mm
Mold Compound Name/Manufacturer: GE7470L-A/Nitto
Mold Compound Flammability Rating: V-0 UL94
Oxygen Rating Index: >28% 54%
Lead Frame Designation: FMP
Lead Frame Material: Copper
Lead Finish, Composition / Thickness: NiPdAu
Die Backside Preparation Method/Metallization: Backgrind
Die Separation Method: Saw Process
Die Attach Supplier: Henkel
Die Attach Material: QMI 519
Bond Diagram Designation 001-99438
Wire Bond Method: Thermosonic
Wire Material/Size: CuPd/0.8 mil (20um)
Thermal Resistance Theta JA C/W: 31 C /W
Package Cross Section Yes/No: Yes
Assembly Process Flow: 11-21099
Name/Location of Assembly (prime) facility: CML-RA
MSL Level 3
Reflow Profile 260C
ELECTRICAL TEST / FINISH DESCRIPTION
Test Location: CML-RA
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RELIABILITY TESTS PERFORMED PER SPECIFICATION REQUIREMENTS
Stress/Test Test Condition (Temp/Bias) ResultP/F
Acoustic Microscopy
J-STD-020Precondition: JESD22 Moisture Sensitivity Level
(192 Hrs., 30 C, 60% RH, 260C Reflow)P
Data Retention150C/175C, No BiasJESD22-A117 and JESD22-A103
P
Electrostatic DischargeCharge Device Model (ESD-CDM)
500V/750V/1,000V/1,250V/1,500V/1,750V/2,000VJESD22-C101
P
Electrostatic DischargeHuman Body Model (ESD-HBM)
1,100V/2,200V /3,300V/4,000V/5,000V/6,000V/7,000V/8,000VJESD22, Method A114
P
Endurance Test Per Datasheet (100K Cycles), JESD22-A117 P
High Accelerated Saturation Test(HAST)
JEDEC STD 22-A110: 130C, 85% RH, 5.5V/6.6VPrecondition: JESD22 Moisture Sensitivity Level
(192 Hrs., 30 C, 60% RH, 260C Reflow)P
High Temperature Operating LifeEarly Failure Rate
Dynamic Operating Condition, Vcc Max=2.07V/2.16V/2.27V/6.6V,150CJESD22-A-108
P
High Temperature Operating LifeLatent Failure Rate
Dynamic Operating Condition, Vcc Max=2.07V/2.27V,150CJESD22-A-108
P
Low Temperature Operating LifeDynamic Operating Condition, -40CJESD22-A108
P
Pressure Cooker
JESD22-A102:121C /100%RH, 15 PSIGPrecondition: JESD22 Moisture Sensitivity Level
(192 Hrs., 30 C, 60% RH, 260C Reflow)P
SEM Analysis MIL-STD-883, Method 2018 P
Static Latch-up85C, +/- 140mA, +/- 200mA, +/-300mA125C, +/-100mA, +/-140mAJESD 78
P
Temperature Cycle
MIL-STD-883, Method 1010, Condition C, -65C to 150CPrecondition: JESD22 Moisture Sensitivity Level
(192 Hrs., 30 C, 60% RH, 260C Reflow)P
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Page 6 of 31
RELIABILITY FAILURE RATE SUMMARY
Stress/Test Device Tested/Device Hours
#Fails
ActivationEnergy
Thermal
AF3Failure Rate
High Temperature Operating LifeEarly Failure Rate
1, 591 Devices 0 N/A N/A 0 PPM (1)
High Temperature Operating LifeLong Term Failure Rate
553,740 DHRs 0 0.7 170 10 FIT (2)
1. Early Failure Rate was computed from QTP# 174802.2. Long Term Failure Rate was computed from QTP#151008, QTP#151303, QTP#160301, QTP#160207, QTP# 161003,
QTP# 164802, QTP# 163301, QTP# 164302 data.
1 Assuming an ambient temperature of 55C and a junction temperature rise of 15C.2 Chi-squared 60% estimations used to calculate the failure rate.3 Thermal Acceleration Factor is calculated from the Arrhenius equation
AF =E
k
1
T-
1
T
A
2 1
exp
where:
EA =The Activation Energy of the defect mechanism.K = Boltzmanns constant = 8.62x10-5 eV/Kelvin.T1 is the junction temperature of the device under stress and T2 is the junction temperature of thedevice at use conditions.
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Page 7 of 31
Reliability Test Data
QTP #: 151008
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: ACOUSTIC, MSL3
CYTT214032 (8CP206101) 4539372 611534008 CML-RA COMP 15 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA COMP 15 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA COMP 15 0
STRESS: DATA RETENTION, PLASTIC, 150C
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 500 80 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 1000 80 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 500 80 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 1000 80 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 500 80 0
STRESS: DATA RETENTION, PLASTIC, 175C
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 76 80 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 152 79 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 76 80 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 152 80 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 76 80 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 152 80 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150, 2.07V, Vcc Max)
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 48 1490 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 48 1510 0
CYTT214032 (8CP206101) 4545249 611537364 CML-RA 48 1547 0
STRESS: ENDURANCE
CYTT214032 (8CP206101) 4539372 611534008 CML-RA CYCLING 78 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 168 78 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 500 78 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA CYCLING 80 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 168 80 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 500 80 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA CYCLING 80 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 168 80 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 500 80 0
STRESS: ESD-CHARGE DEVICE MODEL
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 500 9 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 750 3 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 1000 3 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 1250 3 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 1500 3 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 1750 3 0
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Document No. 002-24165 Rev. **ECN #: 6199884
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Page 8 of 31
Reliability Test Data
QTP #: 151008
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: ESD-CHARGE DEVICE MODEL
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 500 9 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 750 3 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 1000 3 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 1250 3 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 1500 3 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 1750 3 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 500 9 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 750 3 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 1000 3 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 1250 3 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 1500 3 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 1750 3 0
STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 1100 3 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 2200 8 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 3300 3 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 4000 3 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 5000 3 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 1100 3 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 2200 8 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 3300 3 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 4000 3 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 1100 3 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 2200 8 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 3300 3 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 4000 3 0
STRESS: HI-ACCEL SATURATION TEST (130C, 85%RH, 5.5V), PRE COND 192 HR 30C/60%RH (MSL3)
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 96 30 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 96 30 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.07V, Vcc Max)
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 80 116 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 500 116 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 80 120 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 500 120 0
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Page 9 of 31
Reliability Test Data
QTP #: 151008
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: LOW TEMPERATURE OPERATING LIFE, -40C
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 160 40 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 380 40 0
STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 Psig, PRE COND 192 HR 30C/60%RH (MSL3)
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 168 75 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 168 78 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 168 80 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 288 80 0
STRESS: PRE/POST LFR PARAMETER ASSESSMENT
CYTT214032 (8CP206101) 4539372 611534008 CML-RA COMP 10+2 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA COMP 10+2 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA COMP 10+2 0
STRESS: STATIC LATCH-UP (85C, 140mA)
CYTT214032 (8CP206101) 4539372 611534008 CML-RA COMP 6 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA COMP 6 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA COMP 6 0
STRESS: STATIC LATCH-UP (85C, 200mA)
CYTT214032 (8CP206101) 4539372 611534008 CML-RA COMP 3 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA COMP 3 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (85C, 300mA)
CYTT214032 (8CP206101) 4539372 611534008 CML-RA COMP 3 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA COMP 3 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA COMP 3 0
STRESS: SEM CROSS SECTION
CYTT214032 (8CP206101) 4539372 611534008 CML-RA COMP 1 0
STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 500 80 0
CYTT214032 (8CP206101) 4539372 611534008 CML-RA 1000 80 0
CYTT214032 (8CP206101) 4540145 611534709 CML-RA 500 80 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 500 79 0
CY8C42452 (8CP44200) 4537464 611531543 CML-RA 1000 79 0
STRESS: THERMAL JUNCTION MEASUREMENT
CYTT214032 (8CP206101) 4539372 611534008 CML-RA COMP 1 0
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Page 10 of 31
Reliability Test Data
QTP #: 151303
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: ACOUSTIC, MSL3
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA COMP 15 0
STRESS: DATA RETENTION, PLASTIC, 150C
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 500 80 0
STRESS: DATA RETENTION, PLASTIC, 175C
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 76 80 0
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 152 80 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.07V, Vcc Max)
CY8CMBR31552 (8CP44303CB) 4542914 611534693 ASE-G 48 1469 0
STRESS: ENDURANCE
CY8CMBR31552 (8CP44303CB) 4542914 611534693 ASE-G CYCLING 80 0
CY8CMBR31552 (8CP44303CB) 4542914 611534693 ASE-G 168 80 0
CY8CMBR31552 (8CP44303CB) 4542914 611534693 ASE-G 500 80 0
STRESS: ESD-CHARGE DEVICE MODEL
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 500 9 0
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 750 3 0
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 1000 3 0
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 1250 3 0
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 1500 3 0
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 1750 3 0
STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 1100 3 0
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 2200 8 0
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 3300 3 0
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 4000 3 0
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 5000 3 0
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 6000 3 0
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 7000 3 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.07V, Vcc Max)
CY8CMBR31552(8CP44303CB) 4542914 611534693 ASE-G 80 120 0
CY8CMBR31552(8CP44303CB) 4542914 611534693 ASE-G 500 120 0
STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 Psig, PRE COND 192 HR 30C/60%RH (MSL3)
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 168 80 0
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 288 79 0
STRESS: PRE/POST LFR PARAMETER ASSESSMENT
CY8CMBR31552(8CP44303CB) 4542914 611534693 ASE-G COMP 10+2 0
-
Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 11 of 31
Reliability Test Data
QTP #: 151303
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: STATIC LATCH-UP (85C, 140mA)
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA COMP 6 0
STRESS: STATIC LATCH-UP (85C, 200mA)
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (125C, 140mA)
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (85C, 300mA)
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA COMP 3 0
STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 500 80 0
CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 1000 80 0
-
Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 12 of 31
Reliability Test Data
QTP #: 160401
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: ACOUSTIC, MSL3
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R COMP 15 0
STRESS: DATA RETENTION, PLASTIC, 150C
CY8C42452(8CP44200DB) 4537464 611531543 CML-RA 500 80 0
CY8C42452(8CP44200DB) 4537464 611531543 CML-RA 1000 80 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.07V, Vcc Max)
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 48 1550 0
STRESS: ENDURANCE
CY8C42452(8CP44200DB) 4537464 611531543 CML-RA CYCLING 80 0
CY8C42452(8CP44200DB) 4537464 611531543 CML-RA 168 80 0
CY8C42452(8CP44200DB) 4537464 611531543 CML-RA 1000 80 0
STRESS: ESD-CHARGE DEVICE MODEL
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 500 9 0
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 750 3 0
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 1000 3 0
STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 1100 3 0
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 2200 3 0
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 3300 3 0
STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 Psig, PRE COND 192 HR 30C/60%RH (MSL3)
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 168 80 0
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 168 76 0
STRESS: STATIC LATCH-UP (125C, 100mA)
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R COMP 3 0
STRESS: STATIC LATCH-UP (125C, 140mA)
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R COMP 3 0
STRESS: STATIC LATCH-UP (85C, 200mA)
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R COMP 3 0
STRESS: STATIC LATCH-UP (85C, 300mA)
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R COMP 3 0
STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 500 78 0
CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 1000 76 0
-
Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 13 of 31
Reliability Test Data
QTP #: 160301
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: DATA RETENTION, PLASTIC, 150C
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 500 80 0
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 1000 80 0
STRESS: DATA RETENTION, PLASTIC, 175C
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 76 80 0
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 152 80 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.07V, Vcc Max)
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 48 2609 1 No Visual Defect found
CYAT816882 (8C206802BB) 3617006 611617664 CML-R 48 1013 0
STRESS: ENDURANCE
CYAT816882 (8C206802BB) 3613017 611611087 CML-R CYCLING 80 0
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 500 80 0
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 1000 80 0
STRESS: ESD-CHARGE DEVICE MODEL
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 500 9 0
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 750 3 0
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 1000 3 0
STRESS: ESD-CHARGE DEVICE MODEL
CYTT417012 (8CP206801BB) 3613017 611614958 CML-R 500 9 0
CYTT417012 (8CP206801BB) 3613017 611614958 CML-R 1000 3 0
CYTT417012 (8CP206801BB) 3613017 611614958 CML-R 1250 3 0
CYTT417012 (8CP206801BB) 3613017 611614958 CML-R 1500 3 0
CYTT417012 (8CP206801BB) 3613017 611614958 CML-R 1750 3 0
CYTT417012 (8CP206801BB) 3613017 611614958 CML-R 2000 3 0
STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 1100 3 0
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 2200 8 0
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 3300 3 0
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 4000 3 0
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 5000 3 0
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 6000 3 0
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 7000 3 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.07V, Vcc Max)
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 500 99 0
STRESS: PRE/POST LFR PARAMETER ASSESSMENT
CYAT816882 (8C206802BB) 3613017 611611087 CML-R COMP 10 0
STRESS: STATIC LATCH-UP (125C, 140mA)
CYAT816882 (8C206802BB) 3613017 611611087 CML-R COMP 3 0
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Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 14 of 31
Reliability Test Data
QTP #: 160301
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: STATIC LATCH-UP (85C, 140mA)
CYAT816882 (8C206802BB) 3613017 611611087 CML-R COMP 3 0
STRESS: STATIC LATCH-UP (85C, 200mA)
CYAT816882 (8C206802BB) 3613017 611611087 CML-R COMP 3 0
STRESS: STATIC LATCH-UP (85C, 300mA)
CYAT816882 (8C206802BB) 3613017 611611087 CML-R COMP 3 0
STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 500 80 0
CYAT816882 (8C206802BB) 3613017 611611087 CML-R 1000 80 0
-
Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 15 of 31
Reliability Test Data
QTP #: 160803
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.07V, Vcc Max)
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 48 1596 0
STRESS: ESD-CHARGE DEVICE MODEL
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 500 9 0
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 750 3 0
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 1000 3 0
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 1250 3 0
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 1500 3 0
STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 1100 3 0
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 2200 8 0
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 3300 3 0
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 4000 3 0
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 5000 3 0
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 6000 3 0
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 7000 3 0
STRESS: STATIC LATCH-UP (125C, 100mA)
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T COMP 3 0
STRESS: STATIC LATCH-UP (125C, 140mA)
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T COMP 3 0
STRESS: STATIC LATCH-UP (85C, 140mA)
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T COMP 3 0
STRESS: STATIC LATCH-UP (85C, 200mA)
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T COMP 3 0
STRESS: STATIC LATCH-UP (85C, 300mA)
CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T COMP 3 0
-
Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 16 of 31
Reliability Test Data
QTP #: 160207
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: ACOUSTIC, MSL3
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R COMP 15 0
STRESS: DATA RETENTION, PLASTIC, 150C
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 500 90 0
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 1000 90 0
STRESS: DATA RETENTION, PLASTIC, 175C
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 76 90 0
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 152 90 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.07V, Vcc Max)
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 48 2303 0
STRESS: ENDURANCE
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R CYCLING 90 0
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 168 90 0
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 500 90 0
STRESS: ESD-CHARGE DEVICE MODEL
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 500 9 0
STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 1100 3 0
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 2200 8 0
STRESS: HI-ACCEL SATURATION TEST (130C, 85%RH, 5.5V), PRE COND 192 HR 30C/60%RH (MSL3)
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 96 30 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.07V, Vcc Max)
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 500 125 0
STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 Psig, PRE COND 192 HR 30C/60%RH (MSL3)
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 168 78 0
STRESS: STATIC LATCH-UP (125C, 100mA)
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R COMP 3 0
STRESS: STATIC LATCH-UP (125C, 140mA)
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R COMP 3 0
STRESS: STATIC LATCH-UP (85C, 140mA)
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R COMP 3 0
STRESS: STATIC LATCH-UP (85C, 200mA)
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R COMP 3 0
STRESS: STATIC LATCH-UP (85C, 300mA)
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R COMP 3 0
STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)
CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 500 80 0
-
Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 17 of 31
Reliability Test Data
QTP #: 161003
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: ACOUSTIC, MSL3
CYPD1103 (8F44100) 4537464 611531543 CML-R COMP 15 0
STRESS: DATA RETENTION, PLASTIC, 150C
CYPD1103 (8F44100) 4537464 611531543 CML-R 500 80 0
STRESS: DATA RETENTION, PLASTIC, 175C
CYPD1103 (8F44100) 4537464 611531543 CML-R 76 80 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 152 80 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.07V, Vcc Max)
CYPD1103 (8F44100) 4537464 611531543 CML-R 48 1510 0
STRESS: ENDURANCE
CYPD1103 (8F44100) 4537464 611531543 CML-R CYCLING 80 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 168 80 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 500 80 0
STRESS: ESD-CHARGE DEVICE MODEL
CYPD1103 (8F44100) 4537464 611531543 CML-R 500 9 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 750 3 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 1000 3 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 1250 3 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 1500 3 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 1750 3 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 2000 3 0
STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114
CYPD1103 (8F44100) 4537464 611531543 CML-R 1100 3 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 2200 8 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 3300 3 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 4000 3 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.07V, Vcc Max)
CYPD1103 (8F44100) 4537464 611531543 CML-R 80 120 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 500 120 0
STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 Psig, PRE COND 192 HR 30C/60%RH (MSL3)
CYPD1103 (8F44100) 4537464 611531543 CML-R 168 80 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 288 80 0
STRESS: PRE/POST LFR PARAMETER ASSESSMENT
CYPD1103 (8F44100) 4537464 611531543 CML-R COMP 10+2 0
STRESS: STATIC LATCH-UP (85C, 140mA)
CYPD1103 (8F44100) 4537464 611531543 CML-R COMP 6 0
STRESS: STATIC LATCH-UP (85C, 200mA)
CYPD1103 (8F44100) 4537464 611531543 CML-R COMP 3 0
STRESS: STATIC LATCH-UP (125C, 140mA)
CYPD1103 (8F44100) 4537464 611531543 CML-R COMP 3 0
-
Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 18 of 31
Reliability Test Data
QTP #: 161003
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: STATIC LATCH-UP (85C, 300mA)
CYPD1103 (8F44100) 4537464 611531543 CML-R COMP 3 0
STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)
CYPD1103 (8F44100) 4537464 611531543 CML-R 500 79 0
CYPD1103 (8F44100) 4537464 611531543 CML-R 1000 79 0
-
Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 19 of 31
Reliability Test Data
QTP #: 160809
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: ESD-CHARGE DEVICE MODEL
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 500 9 0
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 750 3 0
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 1000 3 0
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 1250 3 0
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 1500 3 0
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 1750 3 0
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 2000 3 0
STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 1100 3 0
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 2200 8 0
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 3300 3 0
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 4000 3 0
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 5000 3 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150, 2.07V, Vcc Max)
CYPD21342 (7CP64111C) 3612012 611612816 CML-RA 48 1032 0
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 48 537 0
STRESS: STATIC LATCH-UP (85C, 140mA)
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (85C, 200mA)
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (85C, 300mA)
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (125C, 100mA)
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (125C, 140mA)
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA COMP 3 0
YIELD: BACKEND
CYPD21342 (7CP64111C) 3612012 611612816 CML-RA COMP EQUIVALENT
CYPD21342 (7CP64111C) 3612012 611612814 CML-RA COMP EQUIVALENT
YIELD: E-TEST
CYPD21342 (7CP64111C) 3612012 611612816 CML-RA COMP EQUIVALENT
YIELD: SORT
CYPD21342 (7CP64111C) 3612012 611612816 CML-RA COMP EQUIVALENT
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Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 20 of 31
Reliability Test Data
QTP #: 164802
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: ACOUSTIC, MSL3
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA COMP 15 0
STRESS: ESD-CHARGE DEVICE MODEL
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 500 9 0
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 750 3 0
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 1000 3 0
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 1250 3 0
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 1500 3 0
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 1750 3 0
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 2000 3 0
STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 500 3 0
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 1100 3 0
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 2200 8 0
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 3300 3 0
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 4000 3 0
STRESS: HI-ACCEL SATURATION TEST (130C, 85%RH, 6.6V), PRE COND 192 HR 30C/60%RH (MSL3)
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 96 28 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.27V, Vcc Max)
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 48 1550 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.27V, Vcc Max)
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 80 84 0
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 500 81 0
STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 Psig, PRE COND 192 HR 30C/60%RH (MSL3)
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 96 80 0
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 168 79 0
STRESS: PRE/POST LFR PARAMETER ASSESSMENT
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 0 10+2 0
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 500 10+2 0
-
Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 21 of 31
Reliability Test Data
QTP #: 164802
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: STATIC LATCH-UP (125C, 100mA)
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA COMP 6 0
STRESS: STATIC LATCH-UP (125C, 140mA)
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (85C, 140mA)
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (85C, 200mA)
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (85C, 300mA)
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA COMP 3 0
STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 500 80 0
CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 1000 80 0
-
Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 22 of 31
Reliability Test Data
QTP #: 163301
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: DATA RETENTION, PLASTIC, 175C
CY8C4248AZI2 (8CP42003CB) 3621015 611619413 G-Taiwan 76 80 0
CY8C4248AZI2 (8CP42003CB) 3621015 611619413 G-Taiwan 152 80 0
STRESS: ENDURANCE
CY8C4248AZI2 (8CP42003CB) 3621015 611619413 G-Taiwan 168 80 0
STRESS: ESD-CHARGE DEVICE MODEL
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 500 9 0
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 1000 3 0
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 1250 3 0
STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 1000 3 0
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 2200 8 0
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 3300 3 0
STRESS: HI-ACCEL SATURATION TEST (130C, 85%RH, 5.5V), PRE COND 192 HR 30C/60%RH (MSL3)
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 96 25 0
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 192 25 0
CYPD3135 (7CP64301DB) 3652003 611700857 CML-RA 96 26 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.27V, Vcc Max)
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 48 1103 0
CYPD3135 (7CP64301DB) 3641022 611637237 CML-RA 48 413 0
CYPD3135 (7CP64301DB) 3643014 611639672 CML-RA 48 1570 0
STRESS:HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.27V, Vcc Max)
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 500 117 0
CYPD3135 (7CP64301DB) 3643014 611639672 CML-RA 80 130 0
CYPD3135 (7CP64301DB) 3643014 611639672 CML-RA 500 130 0
STRESS: HIGH TEMPERATURE STORAGE, PLASTIC, 150C
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 500 45 0
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 1000 45 0
CYPD3135 (7CP64301DB) 3643014 611639672 CML-RA 500 45 0
CYPD3135 (7CP64301DB) 3643014 611639672 CML-RA 1000 45 0
STRESS: PRE/POST LFR PARAMETER ASSESSMENT
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 0 10+2 0
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 500 10+2 0
CYPD3135 (7CP64301DB) 3643014 611639672 CML-RA 0 10+2 0
CYPD3135 (7CP64301DB) 3643014 611639672 CML-RA 500 10+2 0
STRESS: STATIC LATCH-UP (85C, 140mA)
CYPD3135 (7CP64301DB) 3652003 611700857 CML-RA COMP 3 0
CYPD3135 (7CP64301DB) 3652003 611700858 CML-RA COMP 3 0
CYPD3135 (7CP64301DB) 3706023 611706634 CML-RA COMP 2 0
-
Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 23 of 31
Reliability Test Data
QTP #: 163301
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: STATIC LATCH-UP (85C, 200mA)
CYPD3135 (7CP64301DB) 3652003 611700857 CML-RA COMP 3 0
CYPD3135 (7CP64301DB) 3652003 611700858 CML-RA COMP 3 0
CYPD3135 (7CP64301DB) 3706023 611706634 CML-RA COMP 2 0
STRESS: STATIC LATCH-UP (85C, 300mA)
CYPD3135 (7CP64301DB) 3652003 611700857 CML-RA COMP 3 0
CYPD3135 (7CP64301DB) 3652003 611700858 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (125C, 100mA)
CYPD3135 (7CP64301DB) 3652003 611700857 CML-RA COMP 6 0
CYPD3135 (7CP64301DB) 3652003 611700858 CML-RA COMP 6 0
CYPD3135 (7CP64301DB) 3706023 611706634 CML-RA COMP 6 0
STRESS: STATIC LATCH-UP (125C, 140mA)
CYPD3135 (7CP64301DB) 3652003 611700857 CML-RA COMP 3 0
CYPD3135 (7CP64301DB) 3652003 611700858 CML-RA COMP 3 0
CYPD3135 (7CP64301DB) 3706023 611706634 CML-RA COMP 2 0
STRESS: THERMAL JUNCTION MEASUREMENT
CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA COMP 1 0
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Document No. 002-24165 Rev. **ECN #: 6199884
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Page 24 of 31
Reliability Test Data
QTP #: 164302
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: ACOUSTIC, MSL3
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 22 0
STRESS: ESD-CHARGE DEVICE MODEL
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 500 9 0
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 750 3 0
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 1000 3 0
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 1250 3 0
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 1500 3 0
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 1750 3 0
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 2000 3 0
STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 1100 9 0
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 2200 3 0
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 3300 3 0
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 4000 3 0
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 5000 3 0
STRESS: HI-ACCEL SATURATION TEST (130C, 85%RH, 5.5V), PRE COND 192 HR 30C/60%RH (MSL3)
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 96 30 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.27V, Vcc Max)
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 48 1040 1 Functional (NGDO_Vbus)
CYPD31357 (7CP64301JB) 3715132 611716236 CML-RA 48 1043 0
CYPD31357 (7CP64301JB) 3719028 611719500 CML-RA 48 985 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.27V, Vcc Max)
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 500 79 0
STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 Psig, PRE COND 192 HR 30C/60%RH (MSL3)
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 168 79 0
STRESS: PRE/POST LFR PARAMETER ASSESSMENT
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 0 10+2 0
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 500 10+2 0
STRESS: STATIC LATCH-UP (125C, 100mA)
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (125C, 140mA)
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (85C, 140mA)
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (85C, 200mA)
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (85C, 300mA)
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 3 0
-
Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 25 of 31
Reliability Test Data
QTP #: 164302
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 500 0
CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 1000 0
-
Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 26 of 31
Reliability Test Data
QTP #: 162113
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.16V, Vcc Max)
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 48 156 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 48 1515 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 48 744 0
CYPD4226 (7CP64210A) 3650047 611647007 CML-RA 48 784 0
STRESS: ESD-CHARGE DEVICE MODEL
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 500 9 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 500 9 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 500 9 0
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 750 3 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 750 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 750 3 0
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 1000 3 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 1000 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 1000 3 0
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 1250 3 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 1250 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 1250 3 0
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 1500 3 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 1500 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 1500 3 0
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 1750 3 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 1750 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 1750 3 0
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 2000 3 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 2000 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 2000 3 0
STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 1100 3 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 1100 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 1100 3 0
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 2200 8 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 2200 8 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 2200 8 0
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 3300 3 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 3300 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 3300 3 0
-
Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 27 of 31
Reliability Test Data
QTP #: 162113
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 4000 3 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 4000 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 4000 3 0
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 5000 3 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 5000 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 5000 3 0
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 6000 3 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 6000 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 6000 3 0
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 7000 3 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 7000 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 7000 3 0
CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 8000 3 0
STRESS: STATIC LATCH-UP (125C, 100mA)
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA COMP 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (125C, 140mA)
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA COMP 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (85C, 140mA)
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA COMP 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (85C, 200mA)
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA COMP 3 0
CYPD4226 (7CP64210A) 3649027 611645295 CML-RA COMP 3 0
STRESS: STATIC LATCH-UP (85C, 300mA)
CYPD4226 (7CP64210A) 4628102 611623286 CML-RA COMP 3 0
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Document No. 002-24165 Rev. **ECN #: 6199884
Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 28 of 31
Reliability Test Data
QTP #: 174801
Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism
STRESS: ACOUSTIC, MSL3
CYPD42267 (7CP64230A) 3745143 611746079 CML-RA COMP 22 0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 6.6V, Vcc Max)
CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 48 1548 0
STRESS: ESD-CHARGE DEVICE MODEL
CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 500 9 0
CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 750 3 0
CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 1000 3 0
CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 1250 3 0
CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 1500 3 0
CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 1750 3 0
CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 2000 3 0
CYPD4126 (7CP64234A) 3745143 611801313 CML-RA 500 9 0
CYPD4126 (7CP64234A) 3745143 611801313 CML-RA 750 3 0
CYPD4126 (7CP64234A) 3