p.g. wilcox et al- study of euv spectra from al x-pinch and wire array implosions produced on the 1...
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8/3/2019 P.G. Wilcox et al- Study of EUV Spectra from Al X-Pinch and Wire Array Implosions Produced on the 1 MA "Zebra" at UNR
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STUDY OF EUV SPECTRA FROM AL X- PINCH
AND WIRE ARRAY IMPLOSIONS
PRODUCED ON THE 1 MA ZEBRA AT UNR
P.G. Wilcox, A. S. Safronova, V. L. Kantsyrev, U. I.
Safronova, K. WilliamsonUniversity of Nevada, Reno, NV USAK. Struve, B. Jones, C. Deeney*, P.D. LePell**
Sandia National Laboratories, Albuquerque, NM USA
HEDP Summer School 2007 , 29 July-4 Aug. , UCSD San Diego ,CA
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ABSTRACT
It is well known that implosions of X-pinches and wire arrays producepowerful laboratory x-ray sources. X-ray spectroscopy is a very usefultool for diagnostics of X- and Z-pinch plasmas at stagnation while EUVspectroscopy seems to be an appropriate tool of diagnosing the plasmabefore and after the stagnation. Though x-ray spectra that characterizethe stagnating plasmas are intensively used for X- and Z-pinch plasmadiagnostics the EUV spectra are not yet studied in detail.
In the present work a collection of EUV spectra from implosions of verydifferent X- and Z-pinch loads on the 1MA Zebra generator at UNR ispresented for the first time. Specifically, the loads were Al X - pinches,cylindrical wire arrays (with a small portion of NaF coating), and planarwire arrays ( see [1-2] for the details of the experiments).
Non-LTE kinetic model of Al that was recently used to model X-ray K-
shell Al spectra from the planar wire arrays[3] was applied here tocalibrate and identify the EUV spectra. Preliminary plasmaparameters were computed. Similar and different features of the EUVspectra from the above-mentioned loads were identified and analyzed.Future work is discussed.
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The kinetics modeling of Al spectra depends on the plasmaconditions (parameters Te , Ne).
The atomic dataset was generated for the new Al model and used as aninput to SCRAM ( non-LTE collisional radiative kinetics code [4] )tomodel the Z-pinches spectra[3].
It includes the ground states of all ions from neutral to bare nucleus.
Energy level structures and complete radiative and collisionalcoupling data are calculated by the FAC atomic structure code [5].
The levels are fully coupled by radiative decay and radiativerecombination, collisional excitation and ionization, Auger decay andtheir reverse rates.
All collisional rates are calculated by integrating collision crosssections over a Maxwellian electron distribution function.
Kinetics Modeling
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Aluminum kinetics model
Collisional ionization,
three-body recombination, &
radiative recombination
Auger decay & dielectronic
recombination
Radiative decay,
collisional excitation &
de-excitation
B-like
(15 lev.)
Be-like
(98 levels)
Li-like
(153levels)
He-like
(178 levels)
H-like
(36 levels)
Bare
Atomic data is generated using the FAC atomic structure package developed by M.F. Gu[5]
C-like
(41lev.)
N-like
(70 lev.) O-like(85 lev.)
Al -like
(4lev.)
Mg-like
(35lev.)
Na-like
(5 lev.)
F-like
(60lev.)Ne-like
(37lev.)
n = 2- 4
n = 2- 3n = 2- 6 n = 2- 7
n = 2- 3n = 2- 3
n = 2- 3n =2- 3
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The X- and Z-pinch loads used
in experiments on 1 MA Zebraat UNR
Al X-pinches with 2 and 4 wiresfrom Al 5056 (95% Al and 5% Mg)and Al 1100 (99% Al) alloys
Cylindrical wire arrays with NaFcoating
Planar wire arrays
X-Pinch and Planar Array
Shot # Load Mater ial
432 X pinch,2w Al(1100)
468 X pinch,4w Al(5056)
785Cylindrical Array,8 w
Al(5056)+ 5 %NaF
796 Planar Array, 10w Al(5056)
787 Cyl.Arr.,8w Al(5056)+ 5 %NaF
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0 50 100 150 200 250 300
0.0
0.2
0.4
0.6
0.8
1.0
Intensity
Lambda
Al-IX , 200 ev , d20
Al-VI
Al-VII
AL-X
Modelingof EUVspectra from different
Aluminum IonizationStages
(Te = 200ev , Ne = 10cm-3)
0 50 100 150 200 250 300
0.0
0.2
0.4
0.6
0.8
1.0
I
Wavelength,A0
Al-V,200ev,d20
Al-VI
Al-VIII
0 10 20 30 40 50 60 70 80
0.0
0.2
0.4
0.6
0.8
1.0
I
Wavelength,A0
Al,X,0-70A,200ev,20
0 10 20 30 40 50 60 70 80
0.0
0.2
0.4
0.6
0.8
1.0
Wavelength,A0
I,au
Al-XI ,200ev,0-70A,d20
0 10 20 30 40 50 60 70 80
0.0
0.2
0.4
0.6
0.8
1.0
I,
au
Wavelength,A0
Al-IX,200ev,d20,0-70A
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0 20 40 60 80 100
0.0
0.2
0.4
0.6
0.8
1.0
Intensity,
au
Wavelength,A0
Al,VI,50ev,d20,0-100AAl,VII,50ev,d20,0-100AAl,VIII,50ev,d20,0-100A
0 20 40 60 80 100
0.0
0.2
0.4
0.6
0.8
1.0
Intensity,
au
lenght,Ao
Al,IX,50ev,d20,0-100A
Al,X, 50ev,d20,0-100A
Al,XI,50ev,d20,0-100A
Modelingof EUVspectra from Aluminum VI-XI
(Te = 50ev ,100ev ; Ne=10 cm-3)
0 20 40 60 80 100
0.0
0.2
0.4
0.6
0.8
1.0
Intens
ity,
au
Wavelength,A0
Al,VI,100ev,d20 ,0-100A
Al,VII,100ev,d20 ,0-100A Al,VIII,100ev,d20 ,0-100A
0 20 40 60 80 100
0.0
0.2
0.4
0.6
0.8
1.0
Intensity,
au
Wavelength,A0
Al,IX,100ev,d20 ,0-100AAl,X,100ev,d20 ,0-100AAl,XI,100ev,d20 ,0-100A
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0 50 100 150 200 250 300
0.0
0.2
0.4
0.6
0.8
1.0
I
Wavelength,A0
Al,VI,150ev,d20.0-300Al,VII,150ev,d20.0-300Al,VIII,150ev,d20.0-300
0 50 100 150 200 250 300
0.0
0.2
0.4
0.6
0.8
1.0
I
Wavelength,A0
Al,IX,150ev,d20.0-300Al,X,150ev,d20.0-300Al,XI,150ev,d20.0-300
Modelingof IonizationStagesinAluminum (Te= 150ev ,200ev ; Ne = 10 cm-3 )
0 20 40 60 80 100
0.0
0.2
0.4
0.6
0.8
1.0
Intensity,
au
Wavelength,A0
Al,VI,200ev,d20,0-100AAl,VII,200ev,d20,0-100AAl,VIII,200ev,d20,0-100A
0 20 40 60 80 100
0.0
0.2
0.4
0.6
0.8
1.0
Intensity,
au
Wavelength,A0
Al,IX,200ev,d20,0-100AAl,X,200ev,d20,0-100AAl,XI,200ev,d20,0-100A
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References for the Indentification
6. R. Kelly,Atomic and Ionic Spectrum Lines below 2000 ,Vol. 16 (1987)
7. NIST -- http://physics.nist.gov/asd3.
8. Non-LTE Al modeling
9. A.Shevelko,L.Shmaenok et al, Physica Scripta,vol. 57, pp 276 282 (1998).
10. S.Hoory,U.Feldman at al,Journal of the Optical Society of America, vol.60, #11(1970)
11. R. Stuik , PhD Thesis , Tech. University, Eindhoven, The Netherlands
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Al EUV spectrum from Sparky *
0 50 100 150 200 250 300
0
20
40
60
80
100
120
140
160
180
200
Intensity,au
Wavelength,A0
Sparky
39.6 AAl X
104 AAl VI
* For details about UNR table-top Z-pinch & laser plasma facility see [12]
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0 50 100 150 200 250 300
0
20
40
60
80
100
120
140
160
180
200
Intens
ity,au
Wavelength,A0
Sparky
39.6 A
Al X
78 AAl VIII
107AAl VI
88 AAl VI 104 A
Al VI
126 AAl V
Al EUV (S parky) line identification
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___________________________________________________________
Al IX,X I I I I
_____________________________________________________
Al VIII II I
______________________________________________________
Al V , VI I I I I I
0 50 100 150 200 250 300
0
20
40
60
80
100
120
140
160
180
200
Intensity,au
Wavelength,A0
Sparky
Al EUV (S parky) line identification
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List of the Identified Lines
AL X Ref.
2s2p 2p4p 6,7,8,9,10
2s2p 2s3d 6,7,8,9,10
AL IX
2s2p - 2s2p3d 6,7,8,9
AL VI R
2s2p4 - 2s2p3d 6,7,8,9,11
2s2p4 - 2s2p3s 6,7,8,9,11
Al V
2s2p5 - 2s2p4(D)3s 6,7,112s2p5 - 2s2p4(3P)3s 6,7,11AL VIII
2s2p 2s 2p3d 6,7,8,92s2p 2s2p3s 6,7,8,9
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Comparison and
Identification
of the Al EUV Zebra
Shots
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Sparky
Zebra
796
_Wavelength, A_ 50 ________100_A_____150________200_________>Al V,VI ,VIII I I I I II II
(Pl.Ar.,10w)
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Zebra787
Sparky
_Wavelength, A____50_________100_A__________150________________>
Al V,VI ,VIII I I I I II II
(Cyl.Arr.,8w)
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Zebra
432
Zebra
796
_Wavelength, A___ __50_______100_A______150 ____________>Al V,VI ,VIII I I I I I I II
(Pl.Ar.,10w)
(X,2w)
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Zebra
796
Zebra
785
_Wavelength, A________50________100_A______150_______>Al V,VI ,VIII I I I I II II
(Pl.Ar.,10w)
(Cyl.Arr.,8w)
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Zebra
796
Zebra
787
Wavelength, A_50_______100_A______150____________>Al V,VI ,VIII I I I I I I II
(Pl.Ar.,10w)
(Cyl.Arr.,8w)
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Conclusions
Non - LTE kinetic model of Al is used to model EUV Al spectra.
Preliminary plasma parameters (Te =200ev, Ne=10 cm-3) arecomputed.
The different spectral features of EUV spectra from the Aluminumloads in experiments on Zebra are identified and analyzed .
Predominantly low ionization stages that we found in Zebra shotsindicate relatively lower Te than on Sparky.
Higher ionization stages lines are widely broadened due to theincreased number of collisions in denser Zebra plasma ( in
comparison with Sparky).
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Future Work
1.Modification of the model to include high Rydberg
states for Li~, B~, and C~ Aluminum.
2.Modeling of EUV spectra from Zebra and analysis of
plasma parameters with connection to the type of load.
3. Analysis of EUV spectra from wire Z- and X- pinch
loads.
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References and Acknowledgments
1. V.L. Kantsyrev, A. S. Safronova et al, IEEE transactions on plasma science , vol. 34,No.2 (Apr. 2006).
2. B. Jones, C. Deeny, V.Kantsyrev et al, ICOPS 2006, CP808.3. A.S.Safronova, V.L. Kantsyrev et al , HEDP 3(2007) pp.237-24154. S.B. Hansen. PhD Dissertation, University of Nevada,Reno (2003).5. M.F. Gu. , AIP conference proceedings; 730: 127 (2004).6. R. Kelly,Atomic and Ionic Spectrum Lines below 2000 ,Vol. 16 (1987)
7. NIST -- http://physics.nist.gov/asd3.8. Non-LTE Al modeling9. A.Shevelko,L.Shmaenok et al, Physica Scripta,vol. 57, pp 276 282 (1998).10.S.Hoory,U.Feldman at al,Journal of the Optical Society of America,vol.60, #11 (1970)
11. R. Stuik , PhD Thesis , Tech. University, Eindhoven, The Netherlands12. V.L. Kantsyrev, D. A. Fedin et al,Proc. of SPIE, vol. 59180W, pp. 1-7 ( 2005).
* This work was supported by NNSA under DOE Cooperative Agreements DE-FC52-06NA27588, DE-FC52-06NA27586,and DE-FC52-06NA27616.Sandia is a multi-program laboratory operated by Sandia Corporation, a Lockheed Martin Company, for theUnited States Department of Energy under Contract DE-AC04- 94AL85000 .