peter y. zavalij“fundamentals of powder diffraction and structural characterization of materials....
TRANSCRIPT
DXC 2013DXC 2013
Peter Y. ZavalijPeter Y. Zavalij
X-ray Crystallographic CenterDepartment of Chemistry and Biochemistry
University of Maryland at College Park, Maryland, USA
HANDS-ON RIETVELD ANALYSISHANDS-ON RIETVELD ANALYSIS
Topics & Scope:Topics & Scope:o Recommended refinement strategieso Structure models and instrumental parameterso How to refine: lattice parameters, site occupancy factors,
thermal parameters, preferred orientationo How to properly consider instrumental parameterso Accuracy and precisiono Refinement indices and what they meano How to use the program to model a hypothetical patterno Quantitative analysis and amorphous contento What to do for an incomplete structure model
This is not attempt to give you all details how torefine crystal structure (this would require much moretime) and which buttons and in which sequences topress (this is rather impossible) but to give you guidanceabout what you need to know and consider whenworking on the structure analysis.
Where to go for help?Where to go for help?
1. V. Pecharsky & P. Zavalij “Fundamentals of Powder Diffraction and Structural Characterization of Materials. Second Edition” Springer, 2009, ISBN: 978-0-387-09578-3- Corrections, Color Figures, Examples,
Problems, Web link are available online*
2. Online materials:- links in the textbook, search- IUCr Teaching Pamphlets:
http://www.iucr.org/education/pamphlets
3. Online discussion groups: a) Rietveld mailing list - to subscribe e-mail to
[email protected] : SUB Rietveld_l “Your_Name “b) LinkedIn.com groups, e.g. Crystallography
* http://www2.chem.umd.edu/facility/xray/Zavalij/FPDSCM2
Unit Cell
Atomic Structure
Sample & Instrument
Powder Pattern
+
+
=
Powder Pattern = Unit Cell + Atomic Structure +Sample & Instrument
Powder Pattern = Unit Cell + Atomic Structure +Sample & Instrument
Inte
nsity
2θ
2θ
2θ
2θ
1)
2)
3)
Inte
nsity
Inte
nsity
h 1k 1
l 1
h 2k 2
l 2
h 3k 3
l 3
h 4k 4
l 4h 5
k 5l 5
h 6k 6
l 6h 7
k 7l 7
…
Understanding of Powder PatternUnderstanding of Powder Pattern
Patterncomponent
Structureparameters
Specimen property
Instrumental parameter
Peak position
Unit cell :(a,b,c,α,β,γ)
AbsorptionPorosity
Radiation (wavelength)Instrument/sample alignmentAxial divergence of the beam
Peak intensity
Atomic:(x, y, z, B, etc.)
Preferred orientationAbsorptionPorosity
Radiation Geometry and configuration(Lorentz, polarization)
Peak shapeDisorderDefects
Grain sizeStrainAbsorption
Radiation (spectral purity) Geometry, Beam conditioning (Slits)
Table: Powder diffraction pattern as a function of various crystal structure, specimen and instrumental parameters
Other Factors Affecting Peak PositionsOther Factors Affecting Peak Positions
θ2θ2θ2 Δ+= calcobs
654321 θcosθ2sinθtanθ2sinθ2tan
θ2 pppppp
+++++=Δ
22
2
221
2
1 3 ;
3 RKh
pRKh
p −=−=
3
2
3αK
p −=
Rp
eff2μ1
4 =
Rsp 2
5 −=
Axial divergence of the incident beam(Soller slits decrease this effect)
In-plane divergence of the x-ray beam
Transparency shift (absorption effect)
Specimen displacement
Zero shift p6
POaxis
T⊥/T||= 2.5
φhkl
Thkl
T||= 1/τ
T ⊥=
1
d*hk
l
d*Thk
l
a)
T||= 1/τ3
T ⊥=
τ3/2
b)
T||=0.67
T ⊥=1
c)
Fig. 8.21. Ellipsoidal (a) and March-Dollase (b) functions with the magnitude T⊥/T|| = 2.5, and the two functions overlapped when T⊥/T|| = 1.5
[ ]2/1
1i
22 cos)1(11 −
= φ−+=
Nihklhkl N
T τ2/3
1i
222 sin1cos1 −
=
φ
τ+φτ=
Nihkl
ihklhkl N
T
Preferred orientationPreferred orientation
Z
X
Y
Fig. 8.22. Spherical harmonic preferred orientation function for the (100) reflection
= −=+
+=L
l
l
lm
ml
ml hkC
lT(h)
2
)(12
π41
= −=+
+=L
l
l
lm
mlC
lJ
2
2
1211
Preferred orientation correction:
Magnitude:
Preferred orientationPreferred orientation
x = 2θj - 2θk (deg.)-0.4 -0.2 0.0 0.2 0.4
G(x
); L(
x) (a
rb. u
nits
)
Lorentz Gauss ∞
∞−
∞
∞−= dxxLdxxG )()(
Normalized:
Gauss:
Lorenz:
( )22/1
expπ
)()( xCH
CxGxy G
G −==
( ) 122/1
1π
)()( −+′
== xCH
CxLxy L
L
Peak Shape Functions:Peak Shape Functions:
Pseudo-Voigt:
Pearson VII:( )
( ) ( ) β22/1
12/1β
β)(VII)( −+π−Γ
Γ== xCH
CxPxy PP
- Caglioti formula: ( ) 2/12 θtanθtan WVUH ++=θtanθcos/ YXH +=′
( ) ( ) ( ) 122/1
22/1
1π
η1expπ
η)()( −+−+−== xCH
CxCH
CxPVxy LL
GG
‘
Commonly Used Peak Shape Functions:Commonly Used Peak Shape Functions:
Bragg angle, 2θ (deg.)44.0 44.2 44.4 44.6 44.8 45.0
Rel
ativ
e in
tens
ity, Y
(arb
. uni
ts)
0
20
40
60
80
100 Kα1
Kα2
Kα1 +Kα2
BackgroundYobs-Ycalc
Fig. 8.13. Using Pearson-VII function to fit experimental data (open circles) representing a single Bragg peak containing Ka1 and Ka2 components.
Fundamental Parameters ApproachFundamental Parameters Approach
Peak shape function (PSF) = convolution* of 3 different functions:
- Ω - instrumental broadening,
- Λ - wavelength dispersion,
- Ψ - specimen function.
+ b – background function
∞
∞−
∞
∞−
−=−=⊗ τ)τ()τ(τ)τ()τ()()( dtfgdtgftgtf*
)θ()θ()θ()θ()θ( bPSF +Ψ⊗Λ⊗Ω=
∗ ∗ ∗Ω =
Slitwidth
X-rayfocus
In planedivergence
Axialdivergence
Fig. 8.15. Graphical representation of most common fundamental functions defining instrumental broadening.
)θ()θ()θ()θ()θ( bPSF +Ψ⊗Λ⊗Ω=
Fundamental Parameter Approach for Instrumental Broadening
Fundamental Parameter Approach for Instrumental Broadening
Specimen Peak Broadening (β):Specimen Peak Broadening (β):
cosθτλβ
⋅=
tanθεβ ⋅⋅= k
Average crystallite size (τ):
Microstrain (ε)
a*
b*
1/d = 2sinθ/nλ1/d(32)
(00)
0
The Indexing ProblemThe Indexing Problem
Fig. 14.1. The illustration of a two-dimensional reciprocal lattice (top) and its one-dimensional projection on the 1/d axis (bottom).
*** cbad lkhhkl ++=*
) , , , , , , , ,( γβα= cbalkhfdhkl
obshkl
obshkld
θλ=
sin2
Fig. 14.2. Three indistinguishable one- and two-dimensional projections obtained from three different three-dimensional objects.
The Indexing ProblemThe Indexing Problem
(CH3NH3)2Mo7O22
Bragg angle, 2θ (deg.)10 15 20 25 30 35 40 45 50
2θob
s - 2
θ cal
c (1
0-3 d
eg.)
-50
-40
-30
-20
-10
0
10
20
30
40
No correction
s/R = -0.00042(1)
Fig. 14.23. Differences between the obs. & calc. Bragg angles after LSQ refinement.
No correction:a = 23.0875(9) Å b = 5.5191(5) Åc = 19.5789(9) Å β = 122.924(3)º
Sample shift:a = 23.0641(8) Å b = 5.5131(2) Åc = 19.5601(6) Åβ = 122.930(1)º
Lattice Parameters RefinementLattice Parameters Refinement
14.4.1. The FN figure of merit
=
θ−θ=
θΔ×= N
i
calci
obsiposs
possN
N
NN
NF
1
2
____
222
1
==
____θ−θ=θΔ=θΔ
N
i
calci
obsi
N
ii NN 11
22121|2|
)|,2(| .possN NValueF_____
θΔ=
14.4.2. The M20 (MN) figure of merit
=
−=
Δ×= 20
1
20____20
2010
||2
1
i
calci
obsiposs
poss QQN
Q
Q
QN
M 22 1* ddQ ==
=
===
−=Δ=Δ20
111
20
1
____
201
201||
i
calci
obsi
ii QQQQ
=
−=
Δ×= N
i
calci
obsiposs
NN
possN
QQN
NQ
Q
QN
M
1
____
2||2
1
Indexing Figures of MeritIndexing Figures of Merit
Crystal Structure Determination FlowchartCrystal Structure Determination Flowchart
Preliminary processing:2θj, Ij
Indexing:hj, kj, lj; a, b, c, α, β, γ
Symmetry/diffraction class
(systematic absences)
Unit Cell Content(gravimetric density)
Full pattern decomposition:hj, kj, lj, Ijobs
Direct space approaches:
Reciprocal space approaches:
Model PhaseanglesOther: Fourier
ChooseSpace group symmetry
Suitablemodel
Rietveld
No
Yes
Solving Crystal Structure Crystal Structure Refinement
The Rietveld RefinementThe Rietveld Refinement
• Where to start & when to finish refinement?
• Problems in refinement from powder data
• Refinement of individual atoms
• Constraints, Restraints & Rigid-body
• Structure Data Representation & Publication
Hugo M. Rietveld (b. 1932).
The following two papers are considered seminal:
1. H.M. Rietveld, Line profiles of neutron powder-diffraction peaks for structure refinement, Acta Cryst. 22, 151 (1967);
2. H.M. Rietveld, A profile refinement method for nuclear and magnetic structures, J. Appl. Cryst. 2, 65 (1969).
Typical Rietveld refinement plot (shown small range)
Typical Rietveld refinement plot (shown small range)
Typical Rietveld refinement plot (shown full range)
Typical Rietveld refinement plot (shown full range)
obsn
calcn
obscalc
obscalc
kYY
kYY
kYY
=
=
=
...22
11
Non-linear least squares minimization of:
The minimized function, Φ
=
−=Φn
i
calci
obsii YYw
1
2)(
Fundamental Equations (I)Fundamental Equations (I)
= =
+−=Φn
ijj
m
jji
obsii xyIKbYw
1
2
1)])([(
Fundamental Equations (II)Fundamental Equations (II)
For single phase crystalline material
yj(xj) - the peak shape function
Ij - the integrated intensity of the jth Bragg reflection
xj = 2θjcalc – 2θi.
bj - the background coefficients
1][ −= obsii YwThe weighting scheme:
= =
Δ+++−=Φn
ijjjjj
m
jji
obsii xxyxyIKbYw
1
2
1)}])(5.0)({[(
Fundamental Equations (III)Fundamental Equations (III)
For single phase and dual wavelength (Kα1 + Kα2) data
Δxj - the difference in positions of Kα1 and Kα2
= = =
Δ+++−=Φn
i
p
ljljljljljl
m
jjlli
obsii xxyxyIKbYw
1
2
1,,,,,
1, ]))}(5.0)({[(
For a mixture of several (p) phases and dual wavelength (Kα1 + Kα2) data
Κl – individual scale factors for each phase(proportional to the content of the phase)
Refined Parameters (I)Refined Parameters (I)
• Background represented by 1 to 12 parameters (may be more)• Sample displacement, sample transparency or zero-shift corrections.• Peak shape function parameters, which usually include:
- full width at half maximum (FWHM parameters: U,V,W,P,X,Y), - asymmetry and other relevant variables.In a multiple phase diffraction pattern, these may be maintained identical or refined independently for each phase present (generally except for the asymmetry), if warranted both by the quality of the data and considerable differences due to the physical state of various phases in the specimen.
• Unit cell dimensions, usually from 1 to 6 independent parameters for each phase .• Preferred orientation, and if necessary, absorption, porosity, and extinction
parameters, which usually are independent for each phase.• Scale factors, one for each phase (Kl) ,
and in the case of multiple patterns, per pattern.• Positional parameters (x,y,z) of all independent atoms in the model of the crystal
structure of each crystalline phase, usually from 0 to 3 per atom.• Population parameters, if certain site positions are occupied partially or by
different types of atoms simultaneously, usually one per site.• Atomic displacement parameters, which may be treated as:
- an overall displacement parameter (one for each phase or a group of atoms) or - individual atomic displacement parameters, with 1-6 of independent variables
Parameter or group of parameters Linear Stable Sequence
Phase scale Yes Yes 1 Specimen displacement No Yes 1 Linear background Yes Yes 2 Lattice parameters No Yes 2 More background Generally no Yes 2 or 3 Peak Shape Parameter (W, or X, or Y) No Poorly 3 or 5 Coordinates of atoms No Fairly 3 Preferred orientation No Fairly 4 or not Population and isotropic displacements No Varies 5 Other profile parameters No No Last Anisotropic displacements No Varies Last Zero shift No Yes 1, 5 or not
Refined Parameters (II)Refined Parameters (II)
Non-linear least squares techniquemay fail in finding the best solution
x xx0 x0 xtruextrue
Min
imiz
ed fu
nctio
n, Φ
(x)
Min
imiz
ed fu
nctio
n, Φ
(x)
Wy)(A)WA(AΔx TT 1λ −+= DMarquardt dumping:
Correlation coefficients: 111 )()()( −−−=ρ jjiiijij WAAWAAWAA TTT
Profile residual, Rp
Weighted profile residual, Rwp
Bragg residual, RB,
Figures of merit and quality of refinement (I)Figures of merit and quality of refinement (I)
%100R
1
1p ×
−=
=
=n
i
obsi
n
i
calci
obsi
Y
YY
( )%100
)(R
21
2
1
1
2
wp ×
−=
=
=n
i
obsii
n
i
calci
obsii
Yw
YYw
%100R
1
1B ×
−=
=
=m
j
obsj
m
j
calcj
obsj
I
II
Expected residual Rexp
Goodness of fit, χ2
The Durbin-Watson d-statistic
Figures of merit and quality of refinement (II)Figures of merit and quality of refinement (II)
%100)(
R
21
2
1
exp ×
−=
=
n
i
obsii Yw
pn
=
= −
−
σΔ
σΔ−σ
Δ
=n
i i
i
n
i i
i
i
i
Y
YY
d
1
22
2
1
1
( ) 2
exp
wp1
2
2
RR
χ
=
−
−=
=
pn
YYwn
i
calci
obsii
Good fit
Inte
nsity
, Y(1
03co
unts
)
Bragg angle, 2θ (deg.)67.6 67.8 68.0 68.2 68.4
-4
-2
0
2
4
6
8
10
12
I calc too high
Bragg angle, 2θ (deg.)67.6 67.8 68.0 68.2 68.4
-4
-2
0
2
4
6
8
10
12
Inte
nsity
, Y(1
03co
unts
)
I calc too low
Bragg angle, 2θ (deg.)67.6 67.8 68.0 68.2 68.4
-4
-2
0
2
4
6
8
10
12
Inte
nsity
, Y(1
03co
unts
)
Quality of profile fitting: IntensityQuality of profile fitting: Intensity
Good fit
Bragg angle, 2θ (deg.)67.6 67.8 68.0 68.2 68.4
-4
-2
0
2
4
6
8
10
12
Inte
nsity
, Y(1
03co
unts
)
2θcalc too high
Bragg angle, 2θ (deg.)67.6 67.8 68.0 68.2 68.4
-4
-2
0
2
4
6
8
10
12
Inte
nsity
, Y(1
03co
unts
)
2θcalc too low
Bragg angle, 2θ (deg.)67.6 67.8 68.0 68.2 68.4
-4
-2
0
2
4
6
8
10
12
Inte
nsity
, Y(1
03co
unts
)
Quality of profile fitting: 2ΘQuality of profile fitting: 2Θ
Good fit
Bragg angle, 2θ (deg.)67.6 67.8 68.0 68.2 68.4
-4
-2
0
2
4
6
8
10
12
Inte
nsity
, Y(1
03co
unts
)
FWHM too large
Bragg angle, 2θ (deg.)67.6 67.8 68.0 68.2 68.4
-4
-2
0
2
4
6
8
10
12
Inte
nsity
, Y(1
03co
unts
)
FWHM too low
Bragg angle, 2θ (deg.)67.6 67.8 68.0 68.2 68.4
-4
-2
0
2
4
6
8
10
12
Inte
nsity
, Y(1
03co
unts
)
Quality of profile fitting: FWHMQuality of profile fitting: FWHM
Asymmetry underestimated
Bragg angle, 2θ (deg.)67.6 67.8 68.0 68.2 68.4
-4
-2
0
2
4
6
8
10
12
Inte
nsity
, Y(1
03co
unts
)
Good fit
Bragg angle, 2θ (deg.)67.6 67.8 68.0 68.2 68.4
-4
-2
0
2
4
6
8
10
12
Inte
nsity
, Y(1
03co
unts
)
Bragg angle, 2θ (deg.)67.6 67.8 68.0 68.2 68.4
-4
-2
0
2
4
6
8
10
12
Inte
nsity
, Y(1
03co
unts
)
Asymmetry overestimated
Quality of profile fitting: AssymetryQuality of profile fitting: Assymetry
I calc and FWHM too large
Bragg angle, 2θ (deg.)21.0 21.2 21.4 21.6
Inte
nsity
, Y(1
03co
unts
)
-2
-1
0
1
2
3
4
5
Good fit
Bragg angle, 2θ (deg.)21.0 21.2 21.4 21.6
-2
-1
0
1
2
3
4
5
Inte
nsity
, Y(1
03co
unts
)
I calc and assym. too small
Inte
nsity
, Y(1
03co
unts
)
Bragg angle, 2θ (deg.)21.0 21.2 21.4 21.6
-2
-1
0
1
2
3
4
5
Quality of profile fitting: CombinationQuality of profile fitting: Combination
HANDS-ON EXAMPLE NiMoO2(OH)
Example in Chapter 20 includes:• Ab initio indexing of the powder pattern• Solving the crystal structure
1. Rietveld refinement using lab X-ray data 2. Simultaneous refinement of X-ray & neutron data3. Chemical composition & H atom determination
Examples including original experimental data, intermediate and final results can be downloaded as following:
1) http:\www.chem.umd.edu\crystallography2) Click the book icon on the right and then WebPage3) Save zip file with Examples
Example Files:Example Files:
NiMnO2(OH), Chapter 20:− Unit Cell Indexing (TREOR)− Structure Solution using SHELXS (Ch20Ex01.ins and .hkl)o Initial Refinement (Ch20Ex01a.exp and .cif)o X-ray Data Fitting (Ch20Ex01b)wo Combined X-ray and Neutron Data Fitting (Ch20Ex01c)o Chemical Composition and H atom Determination
Experimental Data Files:− X-ray: Ch20Ex01_CuKa.raw− Neutron: Ch20Ex01_Neut.raw
Instrumental Parameters:− X-ray: Ch20Ex01_CuKa.prm− Neutron: Ch20Ex01_Neut.prm
Refinement Sequence for NiMnO2(OH)Refinement Sequence for NiMnO2(OH)
Refined parameters Rp Rwp RB χ2
Initial 36.9 50.8 99.7 350Scale factor only 18.2 25.9 36.0 90.9Scale, background, unit cell dimensions, grain size (X) 14.9 22.4 34.0 68.1All of the above plus preferred orientation (PO) for [010] axis and then adding another PO for [100] axis
9.6 13.5 12.2 24.8
All of the above plus strain (Y) instead of X, PO1/PO2 ratio, asymmetry (α), coordinates of all atoms, Uover
7.4 10.6 8.9 15.3
All of the above plus Mn2 was changed to Ni1 (5 cycles), then individual Uiso for Mn1 and Ni1
7.3 10.5 9.6 15.0
All of the above plus Ss, profile parameters, grain size, strain together with their anisotropy (Xa and Ya)
5.9 8.0 6.8 8.75
Only scale, background, unit cell dimensions and absorption, a1 and a2, in the Suortti approximation
6.0 8.1 6.3 8.79
All of the above plus coordinates, Uiso for Mn1 and Ni1, Uover for O, PO[010], PO[100], X, Xa α.
6.0 8.0 6.7 8.77
All of the above plus U, V, W, Y, Ya. Final (x-ray only), 5.1 6.6 6.7 5.99Combined final: x-ray 5.1 6.7 6.7 n/aCombined final: neutrons 4.0 5.0 24.4 n/aCombined final: total 5.0 6.5 n/a 5.85
NiMnO2(OH), Cu Kα
Bragg angle, 2θ (deg.)10 20 30 40 50 60 70 80 90 100 110
Inte
nsity
, Y (1
03 cou
nts)
0
10
20
30
40
1 µm 2 µm1 µm1 µm 2 µm2 µm
Fig. 20.1. Powder diffraction pattern collected from the NiMnO2(OH) powder using CuKα radiation
Polyrystalline NiMnO2(OH)Polyrystalline NiMnO2(OH)
NiMnO2(OH), Cu Kα
Bragg angle, 2θ (deg.)10 20 30 40 50 60 70 80 90
FWH
M (d
eg.)
0.0
0.1
0.2
0.3
0.4
Fig. 20.2. Full width at half maximum as a function of Bragg angle for the powder diffraction pattern of NiMnO2(OH)
TREOR indexing using 23 peaks gave an orthorhombic C-centered lattice with figure of merit, F20 = 135 (0.003, 27), and unit cell a = 2.8609 Å, b = 14.6482 Å, c = 5.2703 Å.
Solved using SHELXS direct method and intensities of 30 peaks in space group Cmc21.
Peaks used for unit cell indexing and solving the structure
Peaks used for unit cell indexing and solving the structure
NiMnO2(OH), Cu Kα
Bragg angle, 2θ (deg.)10 20 30 40 50 60 70 80 90 100 110
Inte
nsity
, Y (1
03 cou
nts)
-5
0
5
10
15
20
25
30
35
40
Bragg angle, 2θ (deg.)70 75 80 85 90
Inte
nsity
, Y (1
03 cou
nts)
0
5
Rp = 18.16 %Rwp = 25.91 %RB = 36.02 %χ2 = 90.9
Fig. 20.3. The observed and calculated powder diffraction patterns of NiMnO2(OH) after the initial Rietveld refinement with only the scale factor determined
NiMnO2(OH) – scale factor onlyNiMnO2(OH) – scale factor only
NiMnO2(OH), Cu Kα
Bragg angle, 2θ (deg.)10 20 30 40 50 60 70 80 90 100 110
Inte
nsity
, Y (1
03 cou
nts)
-5
0
5
10
15
20
25
30
35
40
Bragg angle, 2θ (deg.)70 75 80 85 90
Inte
nsity
, Y (1
03 cou
nts)
0
3
Rp = 7.37 %Rwp = 10.60 %RB = 8.86 %χ2 = 15.3
Fig. 20.4. The observed and calculated powder diffraction patterns of NiMnO2(OH) after preferred orientation, coordinates of all atoms and the overall displacement parameter were refined in addition to the scale factor, unit cell dimensions, background, grain size and strain effects, and peak asymmetry
NiMnO2(OH) – most parametersNiMnO2(OH) – most parameters
NiMnO2(OH), Cu Kα
Bragg angle, 2θ (deg.)10 20 30 40 50 60 70 80 90 100 110
Inte
nsity
, Y (1
03 cou
nts)
-5
0
5
10
15
20
25
30
35
40
Bragg angle, 2θ (deg.)70 75 80 85 90
Inte
nsity
, Y (1
03 cou
nts)
0
3
Rp = 5.08 %Rwp = 6.63 %RB = 6.68 %χ2 = 5.99
Fig. 20.5. The observed and calculated powder diffraction patterns of NiMnO2(OH) after the completion of Rietveld refinement using only x-ray powder diffraction data (the hydrogen atom is still missing from the model).
NiMnO2(OH) – all possible parameters:switched Mn & Ni, PSF aniso, 2PO, etc.
NiMnO2(OH) – all possible parameters:switched Mn & Ni, PSF aniso, 2PO, etc.
Fig. 20.6. Distributions of the nuclear density in the unit cell of NiMnO2(OH) at x = 0, calculated without H atom.
The nuclear density in NiMnO2(OH) at x = 0:The nuclear density in NiMnO2(OH) at x = 0:
Difference Fourier map using:|ΔF| = |Fobs-Fcalc| and αcalc;
Conventional Fourier map using: |Fobs| and αcalc
NiMnO2(OH), neutrons
10 20 30 40 50 60 70 80 90 100 110
Inte
nsity
, Y (1
02 cou
nts)
10
20
30 λ = 1.392
Rp = 3.99 %Rwp = 5.02 %RB = 24.4 %χ2 = 5.85
Å
a)
NiMnO2(OH), Cu Kα
Bragg angle, 2θ (deg.)10 20 30 40 50 60 70 80 90 100 110
Inte
nsity
, Y (1
03 cou
nts)
0
10
20
30
40
Rp = 5.12 %Rwp = 6.73 %RB = 6.67 %χ2 = 5.85
b)
Fig. 20.7. The observed and calculated powder diffraction patterns of NiMnO2(OH) after the completion of combined Rietveld refinement using neutron (top) and x-ray (bottom) powder diffraction data
NiMnO2(OH): Neutrons & X-ray simultaneouslyNiMnO2(OH): Neutrons & X-ray simultaneously
YX
Z
Mn
Ni O H
Fig. 20.8. The model of the crystal structure of NiMnO3-x(OH)x, x=0.62(5). The covalent O1-H bonds are shown as cylinders, and the H…O3 hydrogen bonds are shown using thin lines
Validation of the Crystal Structure NiMnO2(OH)Validation of the Crystal Structure NiMnO2(OH)
Instead of Conclusions
Thank You!
“The Metamorphosis of Narcissus” where Narcissus (polycrystalline sample) falls in love with his own reflection (diffraction pattern), transforms into an egg (lattice), and then into a flower (crystal structure), which bears his name.