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Origin of Emission and Susceptibilit y in ICs

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Origin of Emission and Susceptibility in ICs

2 March 2008

Emission of EM wavesSusceptibility to EM waves

EMC Introduction

Two main concepts:

Personnal entrainments

Safety systems

interferences

Hardware faultSoftware failureFunction Loss

Components

Printed circuit boards

Equipments

System

Noise

3 March 2008

Natural disturbances (cosmic rays, thunder)

Radio communications, wireless, radars,…

Electrical Overstress

Inductive loads, motors

IC

Source of Electromagnetic Interferences

IC

4 March 2008

VDD

VSS

Output capa

Vin

Origin of Parasitic Emission

Basic mechanisms for core current: CMOS inverter exemple

IDD (0.1mA)

ISS (0.1mA)

IDD (0.1mA)

ISS (0.1mA)

VOUT

Switching current

Voltage Time

Time

5 March 2008

Origin of Parasitic Emission

The increasing speed and the high level of integration generate a stronger noise:

Vss

Vdd

50ps

i(t)

Time

Switching gatesInternal

switching noise

Vdd

Vss

i(t)

Main noise sources comes from AC current sources: Clock-driven blocks, synchronized logic Memory read/write/refresh I/O switching

Simultaneous Switching Noise

t

iLV

t

iLV

6 March 2008

Stronger di/dt Stronger di/dt

Increase parasitic noise

Increase parasitic noise

Time

New process

VoltOld process

Why technology scale down makes things worse ?

• Current level keeps almost constant but:

• Faster current switching

• Current level keeps almost constant but:

• Faster current switching

Time

Current

di/dt

New processOld process

Origin of Parasitic Emission

7 March 2008

Origin of Parasitic Emission

Example: evaluation of switching current in an IC

• 0.1 mA / Gate in 100ps• 1 Billion gates (32 Bit Micro) => 100A• 10% switching activity => 10A• 10% spreading of current peak (non synchronous switching) => 1A in 1ns

0.1 mA

Ampere

0.1 nstime

Vdd

Vss

i(t)Current / gate

Ampere

1 nstime

Current / Ic

1 A

8 March 2008

Origin of Parasitic Emission

Example: evaluation of SSN

L=0.6nH/mm

L=1nH/mm

Lead = 10 mm

1 A en 1 ns

Evaluate SSN amplitude

VDD

VSS

Lead = 10 mm

mm/nHL 1

t

iLV

Vns

AnHV 20

1

120

Puce

9 March 2008

5.0

3.3

2.51.8

0.5µm 0.35µm 0.18µm 90nm 65nm Technology

0.8

Supply (V)

1.2

45nm

I/O

Core

Power supply decrease & Noise margin reduction :

=> Increase of ICs sensibility to parasitic noise

Susceptibility issues

10 March 2008

EMC of ICs issues

1-10GHz : Packages act as very good antennas

Susceptibility Issues

Antenna optimal size:4

L

11 March 2008

Hobby

Hobby

TV UHF

Radars

Satellites

MWave

Badge

DECT

Stat. de base

1W

Frequency

1MW

1KW

1GW Radar Météo

3 MHz 30 MHz 300 MHz 3 GHz 30 GHz 300 GHz

Power

1mW

HF VHF UHF SHF xHF THF

Radar UMTS

TV VHF

Multiple parasitic electromagnetic sources

GSM

Susceptibility Issues

Components issues

12 March 2008

Barber, Herke, IEE Electromagnetic Hazard, 1994

Immunity increases with Freq

Immunity increases with Freq

Immunity suddenly decreases?

Immunity suddenly decreases?

Susceptibility trends vs frequency

Susceptibility Issues

13 March 2008

Susceptibility Issues

Desynchronization issues

Jitter is becoming increasingly important in design of logic circuit due to rising operating frequencies.

The increase of operating frequencies of digital circuits reduces their dynamic margin

EMI induced jitter

EMI induced jitter

Bit error

Dynamic failure

EMI on supply

14 March 2008

Emission / Susceptibility Issues

Block type Emission SusceptibilityFast digital I/O ++ -

Power switch output ++ --

Oscillator / PLL / Clock circuitry ++ ++

Charge pump ++ --

Digital block supply + -

Analog input -- ++

DC/DC converter + ++

15 March 2008

High frequency measurementHigh frequency modelling2D, 3D modellingElectrical modellingIC designIC floorplan

High frequency measurementHigh frequency modelling2D, 3D modellingElectrical modellingIC designIC floorplan

EMC for Integrated Circuits requires various expertise

EMC environment

EMC Measurement methods

17 March 2008

EMC measurement methods

Why EMC standard measurement methods

Check EMC compliance of ICs, equipments and systems Comparison of EMC performances between different products, different

technologies, designs, PCB routings

Improve interaction between customers and providers (same protocols,

same set-up)

18 March 2008

Emission measurement methods

Device under testCoupling device

Coupling network

Antennas

Wave guide

Acquisition system

Spectrum analyzer

EMI receiver

Oscilloscope

Emission – General measurement set-up

Radiated or conducted coupling

50Ω adapted path

Control - Acquisition

Emission requirements verified ?

19 March 2008

IEC 61967-2

(TEM : 1GHz)

IEC 61967-3/6

(Near field scan, 5GHz)

IEC 61967-4

(1/150 ohm, 1 GHz)

IEC 61967-5

(WBFC, 1 GHz)

IEC 61967-7

(Mode Stirred Chamber: 18 GHz)

IEC 61967-2

(GTEM 18 GHz)

International standards for IC emission measurement methods

Emission measurement methods

20 March 2008

Emission measurement methods

Example of emission measurement set-up – TEM cell measurement

Spectrum Analyzer

Pre-amplifierGTEM cell

Shielding

Septum

Far end (to absorbers50 termination)

aperture 1

aperture 2 Near end (to receiver)

Chip under test

Emission spectrum

21 March 2008

Immunity measurement methods

Immunity – General measurement set-up

Device under test

Coupling deviceCoupling network

Antennas

Wave guide

Radiated or conducted coupling

Disturbance generation

Harmonic signal

Transients

Burst

50Ω adapted path

Failure detectionInjected level Extraction

Immunity requirements verified ?

22 March 2008

IEC 62132-2

(Bulk Current Injection : 1 GHz)

IEC 62132-3

(Direct Power Inj 1GHz)

IEC 62132-4

(TEM/GTEM)

IEC 62132-5

(WBFC 1 GHz)

New proposal:

(LIHA : 10 GHz)

Still research:

(NFS 10 GHz)

International standards for IC susceptibility measurement methods

Immunity measurement methods

23 March 2008

Immunity measurement methods

Example of immunity measurement set-up

DPI Capacitor

Decoupling network Chip under test

Pforw Prefl

Directional coupler

Signal Synthesizer

Amplifier

Failure detection

• Oscilloscope• Acquisition card

Susceptibility threshold

24 March 2008

Impedance extraction

Frequency domain Time domain

Vector Network Analyzer Time Domain Reflectometry

Equipment to extract impedance profile of board, package, chip

25 March 2008

EMC equipments

Vector Network Analyzer 10 GHz (100 K€)

Signal Synthesizer 6 GHz (20 K€) GTEM cell 18 GHz

(15 K€)

Spectrum analyzer 40 GHz (40 K€)

Amplifier 3 GHz 100W (60 K€)

Main equipments for EMC – typical prices

Expensive …. Complete EMC laboratory : 500 K€