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IntroductionOrientation Imaging Microscopy (OIM) is a techniqueused to obtain crystallographic orientation, grainboundary character, and phase distribution informationfrom single and polyphase crystalline materials throughthe collection of Scanning Electron Microscope (SEM)based Electron Backscatter Diffraction (EBSD) patterns.The OIM™6.0 system consists of the Data Collectionand Analysis software packages. OIM™ Data Collectionsoftware is used, in conjunction with an EBSD detectorand SEM, to automatically capture and analyze EBSDpatterns to compile OIM™ datasets. OIM™ Analysis is

the standalone application used for the creation ofmaps, plots, and charts detailing the sampledmicrostructure as well as highlighting and partitioning ofdata for advanced analysis. Delphi is the dedicatedPhase Identification application using combined EBSDand Energy Dispersive Spectroscopy (EDS).

OIM™6.0 software is the first microanalysis package tobe written for 64-bit processor and Microsoft® Windows7 compatibility. OIM™ Analysis software allows forvery large scan files to be handled on systems with a64-bit processor and operating system. Some recentexamples of analysis include datasets that are anorder of magnitude larger than current systems(>40 million data points).

Introduction of OIM™6.0 SoftwareTECHNICAL BULLETIN-EBSD

Results with Confidence

Figure 1. A combinedimage quality andorientation map from theGibeon meteorite.

OIM™Software is Easier to Use

• Expanded QuickGen and Template Functionality:Easier initial access to the most commonly usedfunctions in OIM™ Analysis software and “one-button”complete analysis using template files with a

comprehensive template library

• Full Image Area Mapping: Map full image area withscan resolution selected automatically by the numberof points desired in the map, resulting in quicker time-to-mapping

• Easier Data Rotations: Fast data rotation based onmanual selection using pole figures for easyalignment of data (see Fig. 3)

• Interactive page colors make quick measurementseasier to understand and utilize

• The system level

settings arepassword protected,though the improveduser interface allowsusers access tooptions needed fordata collectionwithout changingcritical systemsettings (see Fig. 4)

Figure 2. A combinedimage quality and

orientation map from apartially recrystallized

steel.

Figure 3. To center the cluster near the center ofthe pole figure, the user would have to estimate

the correct rotations in the manual entry partof the dialog and close the dialog to applythe rotations. Now, a click at the cluster

rotates the data so that the cluster is atthe center of the pole figure. This is

reflected in the pole figure in real timeand the rotations applied to the data

set after “Oking” the dialog.

Figure 4. Improved user interface.

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• Enhanced Batch Processor: More comprehensiveautomated analysis of multiple datasets using a rangeof template types. Useful for both routine analysis, 3D,or in-situ measurements for faster, repeatable, andconsistent data analysis

• Crystallographic Plane Matching: Identify and visualizespecified planes aligned across a boundary andaligned with 2D grain boundary trace. Useful forinvestigating phase transformations and orientationrelationships

• Fast Fourier Transform (FFT) Image Processing:Improved EBSD pattern quality with an FFT-basedimage processing routine that can be combined withother algorithms and saved as a recipe for later use(see Fig. 7)

• Non-Cubic Coincidence Site Lattice (CSL) BoundaryAnalysis: Extends CSL boundary analysis to

hexagonal, trigonal, and tetragonal unit cells formaterials such as magnesium, zirconium, and alumina

With the addition of these new features, theOIM™system continues to lead the way with the mostadvanced EBSD tools in the industry. OIM™software stillimplements its unique triplet indexing algorithms andpatented Confidence Index for superior EBSD patternanalysis and subsequent data quality.

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Improved Access to the InformationYou Need Most

• Improved advanced visualization tools to easilyunderstand the underlying crystallography such ascrystal planes and misorientation axes (see Fig. 5)

• Interactive status bar displays useful information ateach datapoint

• Data Processing Log automatically records postprocessing performed on datasets

The Enhanced Functionality Providesthe User with:

• Improved Chi-Scan technology, EDAXʼs patentedcombined EBSD-EDS tool for multiphase analysis:Component deviation mapping, EDS spatial shifting,and EDS kernel averaging have all been implementedto improve phase differentiation, especially fornanoscale measurements (see Fig. 6)

Figure 5. Improved access to information about crystal planes with

advanced visualization tools for understanding the underlyingcrystallography used by the OIM™system.

©EDAX Inc., 2010 1210   www.edax.com

Figure 6. Enhanced functionality with Chi-Scan PCA Component

Variation. 70% tolerance map is shown on left - notice the red phase.

When the component variation map is shown (middle), the red phasedivides into two shades of red. When the tolerance is increased to

75% (right), the initial red phase is divided into two unique phases.

Figure 7. Enhanced functionality with additional image processing

routine based on Fast Fourier Transform (FFT). Can be combined

with other processing routines and saved as a recipe for later use.