IEC Compliance Test Systems

MXCTS Systems

Complete test solution for Harmonics andFlicker testing of high power AC products.

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A growing number of electronic products manufacturedtoday have to meet international regulatory requirementsfor emissions and immunity. This is particularly true forproducts sold in the European community as well as agrowing list of countries in the Far East. The CaliforniaInstruments MXCTS System provides a cost-effective testsolution aimed at verifying higher power product compli-ance to a number of AC and DC related harmonized teststandards.

The MXCTS system offers many of the same featuresand capabilities of the California Instruments CTS Seriesproduct line already in use at many EMC labs around theworld.

Compliance Testing to:•• EN / IEC 61000-3-12 (-CTSH, -CTSHL)

Harmonics, < 75 Arms/phase

•• EN / IEC 61000-3-11 (-CTSH, -CTSHL)

Flicker Measurement, < 75 Arms/phase

•• EN / IEC 61000-3-2 (-CTSL, -CTSHL)

Harmonics - Including Am 14, < 16 Arms/Phase

•• EN / IEC 61000-3-3 (-CTSL, -CTSHL)

Flicker Measurement, < 16 Arms/phase

•• EN / IEC 61000-4-13 (option)Harmonics & Interharmonics Immunity (option)

•• EN / IEC 61000-4-14AC Voltage Fluctuations

•• EN / IEC 61000-4-17DC Ripple

•• EN / IEC 61000-4-28Frequency Variations

Pre-compliance Testing to:•• EN / IEC 61000-4-11 (option)

AC Voltage Dips and Variations (option)

•• EN / IEC 61000-4-27Three phase AC Voltage Unbalance

•• EN / IEC 61000-4-29DC Voltage Dips and Interruptions

MXCTS System - Flexible, Unique and Cost-Effective...

NPL Certified ComplianceThe MXCTS System is based on the same tech-nology deployed in the California Instruments CTSseries products. The CTS series has been certi-fied by the National Physics Laboratory (NPL) inthe United Kingdom for full compliance with theIEC Harmonics and Flicker standards. The NPLis an independent test laboratory and a recognizedauthority on AC calibration.

Unique Features and BenefitsThe MXCTS System provides the following uniquebenefits:

• Direct PC bus access data acquisition sys-tem provides the required sampling rate andresolution to meet IEC 61000-4-7 measure-ment requirements and supports high speeddata transfers, unlike competing IEC test sys-tems which provide only limited throughputusing IEEE-488.

• PC based Harmonic and Flicker test softwareprovides real-time full color data display up-dates and continuous PASS/FAIL monitoring.

• Automatic calculation of the maximum permis-sible system impedance Z

sys, using the Z

ref and

measured Flicker parameters, as required perEN/IEC 61000-3-11.

• Simple user operation under Windows pro-vides IEC test setup, data analysis, displayand MS Word test reports.

• High resolution, no gap acquisition data stor-age to ensure that all data can be streamedto disk (in ASCII format if needed) for laterreview and replay of actual test.

• Single Step and Fast Forward replay of re-corded test data.

Cost-Effective and UpgradableThe use of PC based acquisition and processingof data and test limits provides a cost effectiveplatform that can grow with your needs and en-sures that more processing power will be avail-able in the future without costly hardware up-grades.

The MX Series AC power source required for theMXCTS system provides a wealth of features andcapabilities for other AC and DC power applica-tions as well, further enhancing your return on in-vestment.

MX45-3Pi Power SourceThe MXCTS Sys-tem was de-signed to be usedin conjunctionwith the MX45-3Pi AC and DCpower source.The MX45-3Piprovides up to 65ARMS per phasefor high powerharmonics andFlicker testing.

All MX45-3Pi Se-ries AC sourcesoffer arbitrary

waveform generation, precision measurements,and waveform analysis capabilities. Refer to theMX Series data sheet for detailed information onthe MX Series’ capabilities and features.

The MX45-3Pi not only supports high power har-monics and flicker emissions test but can also beused for a range of IEC 61000-4 AC immunity stan-dards (certain options may be required, see or-dering information for details).

Direct PC Data AcquisitionA high speed digital signal processor based dataacquisition system is used to implement the re-quired IEC compliance measurement system. Di-rect access to the PC bus ensures a much higherdata throughput capability than typically found insingle box IEC test systems that use the IEEE-488 instrumentation bus to communicate with thePC.

This architecture offers several advantages, notthe least of which is the ability to support futureversions of test standards by merely installing newPC software. This greatly reduces the risk of prod-uct obsolescence as test standards evolve. Fur-thermore, since the data is streamed to hard diskin real-time, a complete data record is created eachtime, which may be used for audit purposes, fur-ther analysis or to prove compliance to the teststandard.

A special signal conditioning and isolation unit(PACS-3-75) is used to provide quick and easyconnection between the AC source output and theEquipment Under Test. This unit provides the re-quired isolation, signal conditioning and anti-aliasfiltering for the measurement system. The equip-ment under test is wired to a rear panel mountedterminal block.

Harmonics AnalyzerA key part of the MXCTS system is the IEC compliant power ana-lyzer which provides detailed information on both voltage and cur-rent. Measurements of both harmonics and interharmonics are madein real-time with no measurement gaps to fully conform to the latestrevision of the IEC 61000-4-7 test standard. AC source voltage andEUT power are monitored continuously during the entire test. Volt-age distortion and current harmonic data is checked against IECclass limits for pass or fail detection. Comprehensive test reportscan be generated easily.

Test limits are retained in a password protected database and canbe updated if needed in the future without the need to change soft-ware. Other software changes as a result of changing IEC harmon-ics standards can be accomplished by simply installing new PC soft-ware. No harmonics testing software resides in system firmware whichwould require more costly field upgrades.

Flicker Reference ImpedancesAn IEC 868 compliant Flicker meter is an integral part of the -CTSMHsystem. The required reference impedance is implemented using alumped impedance capable of handling 75 A RMS per phase. Due tothe high amount of dissipation that occurs at these power levels, theOMNI-3-75 is housed in a 43” cabinet. This same cabinet is used tomount the PACS-3-75 unit. The lumped impedance is designed fortesting to the IEC 61000-3-11 Flicker standard.

For IEC 61000-3-3 low power Flicker testing (< 16 ARMS), the OMNI-3-37MX is used instead mounted in a similar 43” cabinet.(-CTSLsystem).

A combination of both is available onthe -CTSMXHL system. In this case,only one lumped impedance is in thecircuit at any one time and a quick con-nect scheme is used to allow switch-ing between the two lumped imped-ances (OMNI-3-37MX for -3-3 andOMNI-3-75 for -3-11).

MXCTS System - Modular System Components

MXCTS System - EN / IEC 61000-3-12 and -3-2 Harmonics Test

Test SelectionsAt the onset of a harmonics test, the operator is able to select from a num-ber of options using the setup screen shown here. Data is acquired in 10cycles per window for 50 Hz EUT’s and 12 cycles per window for 60 HzEUT’s. (200 msec time windows).

The operator can select nominal voltage and frequency for the EUT, allfrom the same setup screen. If needed, the Japanese evaluation methodmay be selected in lieu of the more common European standard. Settingscan be saved to disk for later recall and are also retained with the datarecords of any test run.

Simple User InterfaceAll IEC Harmonics tests can be accessed from a single control and datadisplay window on the PC. Simple on screen buttons control test setup andexecution. During the test run, voltage and current time domain waveformdisplays are updated in real time. The left part of the display shows allpower analyzer parameters for the EUT such as V

RMS, I

RMS, I

FUND I

PEAK, Real

Power, Apparent Power and Power Factor. The current harmonics windowdisplays instantaneous current harmonics and a line marking the appli-cable test limits. During the entire test run, a clear PASS or FAIL indicationis provided. Voltage distortion of the AC source is monitored during theentire test. Information about the operator and the unit under test can beentered. A general user comment field is provided to enter any relevantdata concerning the test.

The MXCTSH system offers fullcompliance harmonics testing perEN/IEC 61000-3-12 and can alsobe used to perform EN/IEC 61000-3-2 (additional CTSMXL softwarerequired or MXCTSHL system).

The MXCTS system supports sev-eral new capabilities that are re-quired to meet the first IEC 61000-3-12 harmonics standard revision.This includes measurement of bothharmonics and interharmonics andPartial Weighted Harmonics Distor-tion (PWHD) evaluation per the lat-est IEC 61000-4-7 standard (Gen-eral guide on harmonics andinterharmonics measurements andinstrumentation, for power supplysystems and equipment connectedthereto).

Despite these advanced capabili-ties, the MXCTS system is easy touse.

MXCTS System GUI Setup Window

Harmonics Test Report in MS Word

Available Data DisplaysThe following graphics displays are provided in Harmonicsmode:

• Voltage and Current time domain• Current Harmonics and IEC limits graph• Source voltage distortion and IEC limit• AC Source Voltage Harmonics and IEC

limits graph• Numeric display of F, V

RMS, I

RMS, I

FUND,

IPEAK

, PF, W, VA

Test Reports & Data RecordsA complete IEC harmonics test report, which includes alltest results for the EUT, can be printed at the end of the testin MS Word format. This report includes voltage and cur-rent waveform graphs, current harmonic tables and classlimits. A sample report is shown on the opposite page.

All graphs are included in the test report or can be copied tothe Windows® Clipboard for inclusion in custom reports. Inaddition to these harmonics test reports, the MXCTS sys-tem also delivers comprehensive test data records - includ-ing voltage and current timing waveform data - on disk for

Simple buttons startand stop automatedtest.

Key EUT electrical pa-rameters are updatedcontinuously.

User selectable testlimit margin.

Test start time and testprogress are clearly in-dicated.

Clearly marked Pass(Green) or Fail (Red) in-dication is active duringthe entire test run. ACSource distortion isalso monitored at alltimes.

Graphs and reportsprovide complete testdata documentation.

Both Voltage andCurrent waveformsare shown in real-time.

Bottom graphs showcurrent harmonicsagainst IEC classlimits. The user canalso view the sourcevoltage harmonicsin real-time.

Equipment UnderTest description andoperator ID areadded to all test re-ports.

IEC Harmonics Test Window

MXCTS System - EN / IEC 61000-3-12 and -3-2 Harmonics Test

Real-time Voltage Distortion against IEC limit

use in detailed reporting or further data analysis applica-tions. Data is stored in both compact binary and ASCII for-mat files. The latter format can be loaded directly in popularspreadsheet programs. A test file replay mode is supportedby the MXCTS system software that allows frame by frameplayback of test data files for detailed analysis of EUT be-havior. This replay capability also allows the MXCTS ownerto submit test data to California Instruments for review sohe can benefit from the experience of our technical staffwhen interpreting test results.

MXCTS System - EN / IEC 61000-3-11 and -3-3 Flicker Test

Test SelectionFlicker tests can be run at either 230 V, 115 V L-N or a user specifiednominal EUT voltage and at 50 or 60 Hz. While no official standard for60 Hz flicker exists to date, the CTS system applies an equivalent algo-rithm based on standards work presently underway for 60 Hz flicker evalu-ation.

With the release of the IEC 61000-3-11 flicker standard, the operator has anumber of options for different types of EUT’s. This is particularly true forthe evaluation of d

max. These new choices are fully supported by the MXCTS

system.

EN / IEC 61000-3-11 not only uses a different test impedance (see below)but also requires the calculation of Z

sys in the event that the unit under test

cannot meet the Flicker parameters limits with this lower test impedance.This Zsys must then be specified by the manufacturer, so that the userknows under which conditions the product can be used. The MXCTS cal-culates this Z

sys and thus automates this important requirement - providing

valuable time savings to the user.

Test times for flicker generally extend up to two hours depending on thetype of EUT. The MXCTS flicker mode can be run unattended. A largePASS or FAIL marquee can be set to appear on the PC screen at the endof the test which can be seen across the room. This means operator timecan be used elsewhere more productively while the flicker test is in progress.

Reference ImpedanceThe required flicker reference impedance is automatically engaged whena flicker test is executed. A lumped impedance (OMNI-3-75) is used toprovide the recommended reference impedance for IEC 61000-3-11 flickertesting. The OMNI-3-75 is contained in a 43” instrument cabinet and canbe located next to the MX45-3Pi AC source cabinet.

For IEC 61000-3-3 flicker testing of low power EUT’s, the OMNI-3-37MXcan be added. This also requires the optional CTSMXL software.

The MXCTSH system offers fullcompliance Flicker testing in accor-dance with the new EN/IEC 61000-3-11 Flicker standard. TheMXCTSL system includes softwareand an OMNI-3-37MX for EN/IEC61000-3-3 Flicker testing. For both,the MXCTSHL system combinesboth capabilities into one system.

Included in the CTSMX softwaresupplied with the MXCTS systemis measurement of EUT inrush cur-rent, semi-automatic data acquisi-tion and average calculation for 24each d

max tests and the new limit of

3.3 % for dt and d

c parameters.

The MXCTS system is one of thefew Flicker test systems that pro-vides real-time Flicker results whilethe Flicker test is in progress, elimi-nating the need to wait for the endof a two hour test run only to findout an EUT failed.

MXCTS System GUI Setup Window

Flicker Test Report in MS Word

Simple User InterfaceThe Flicker and harmonics test modes use similar , easy touse interfaces. Setup is minimal and test runs can be startedquickly. During the test run, graphical displays of V

RMS, d

c

and dt as a function of time are updated continuously. The

bottom part of the display shows Flicker test related pa-rameters for the EUT such as V

RMS, d

max, d

c and d

t. At the

end of the test sequence, short term (Pst) and long term

Flicker (Plt) are calculated and a clear PASS or FAIL indi-

cation is provided.

Available Data DisplaysThe following graphics displays are provided in the IEC61000-3-11 test program:

• Chart of dc and d

t versus time

• Chart of VRMS

versus time

• Color PASS/FAIL indicator

• Numeric display of VRMS

, dmax

, dc, P

st, and P

lt

• Numeric display of maximum dc, d

max, d

t, P

st and P

lt

Start and Stop Flickertests with the click ofa button.

Start time, currenttime and stop timemonitoring.

Highest values foundduring test are con-tinuously shown andupdated.

Clear Pass (Green) orFail (Red) indicationleaves no doubt aboutthe test result.

User selectable testtime.

Select test parametersand data display op-tions.

IEC Test limits can bechanged for pre-compli-ance applications.

Real time display of dt,dc and Vrms.

Continuous readouts ofVrms, dmax, dc, Plt and Pstprovide test progressfeedback.

Equipment Under Testdescription and operatorID are added to all testreports.

Real-time display of instantaneous Pst

IEC Flicker Test Window

MXCTS System - EN / IEC 61000-3-11 and -3-3 Flicker Test

Test Reports and Data LoggingA Flicker test report can be printed at the end of the test inMS Word format. This report includes all flicker test resultsfor the EUT. Inrush current and d

max measurement results if

selected are included in the report. A sample report is shownon the opposite page.

The MXCTS system also records comprehensive test datarecords on disk for use in detailed reporting or further dataanalysis applications. Flicker data is stored in both com-pact binary and ASCII format files. The latter format can beloaded directly in popular spreadsheet programs. A test filereplay mode is supported by the MXCTS system softwarethat allows frame by frame playback of test data files fordetailed analysis of EUT behavior. This replay capabilityalso allows the MXCTS owner to submit test data to Califor-nia Instruments for review so he can benefit from the expe-rience of our technical staff when interpreting test results.

The MXCTS system extends itsusefulness by offering a widerange of Immunity tests in addi-tion to Harmonics and Flickeremission tests. These AC andDC immunity tests are controlledfrom the PC using the includedMXGUI source control software.

Pass or Fail results are deter-mined by the operator based onan evaluation of the condition ofthe equipment under test at theend of the test run. Operator ob-servations made during the testand settings used are includedin the MS Word format test re-port.

Test parameters for most EN/IEC 61000-4 tests are set byproduct committees for variousproduct categories. The MXGUIsoftware allows test parametersfor any number of EUT’s to besaved to disk. This makes it easyto create a library of commonlyused IEC test setups for quickrecall.

In addition to the IEC immunitytests, avionics power test stan-dards Mil-Std-704 and RTCADO-160 are available as op-tions.

EN / IEC 61000-4-11p1

The Voltage Dips and Interruptionstests are included in the AC sourcecontrol program supplied with theMXCTS system. The operator is pre-sented with a simple screen that showsthe type of test that will be run and thetest duration. The operator can enterthe desired nominal test voltage andfrequency.

Clearly labeled buttons are provided forTest Run and Test Abort. Test param-eters can be changed by the user ifneeded to accommodate different testlevels called out by product standardcommittees. Due to voltage rise and falltime limitations of the MX AC source,this test is offered for pre-compliancetesting only.

EN / IEC 61000-4-132

The MX Series AC/DC Source can beequipped with the -413 option to pro-vide full support for EN/IEC 61000-4-13 harmonics and Interharmonics test-ing. An independent, digitally controlledsweep generator is used to superim-pose interharmonics on the AC output.The AC source’s data acquisition sys-tem is used to determine EUT reso-nance points during the frequencysweep test. Flat top curve andoverswing curve waveforms are gen-erated using the arbitrary waveformgeneration capability of the MX SeriesAC/DC source.

At the end of the test run, a detailedtest report can be printed for completedocumentation of test setup and re-sults.

1) IEC 61000-4-11 tests are pre-compliance. Requires -411 option.2) IEC 61000-4-13 test requires -413 option.3) IEC 61000-4-27 and -29 tests are pre-compliance.

EN/IEC 61000-4-11 Test Window

EN/IEC 61000-4-13 Test Window

MXCTS System - EN / IEC 61000-4 Immunity Test

EN / IEC 61000-4-14This test applies a series of preciselytimed voltage fluctuations to the equip-ment under test. The nominal voltageand frequency of the EUT can be setby the operator.

Test levels are pre-programmed forlevel 1 and level 2 class EUT’s or canbe modified and saved to disk easily ifneeded. Changes can be made onscreen using a spreadsheet style dataentry grid and saved to disk. These testsetups can be quickly recalled for ap-plication to different EUT’s.

EN/IEC 61000-4-14 Test Window

MXCTS System - EN / IEC 61000-4 Immunity Test

EN / IEC 61000-4-17This test applies a DC ripple level inpercent of DC nominal to the EUT. Thetest is done at nominal, high and lowDC voltage levels. The ripple frequencycan be programmed as a multiple ofthe AC line frequency. Test parametersare pre-programmed or can be modi-fied easily if needed.

The DC voltage applied to the EUT isacquired by the power source and dis-played graphically for reference.

EN / IEC 61000-4-28This test applies a series of slowlychanging frequency variations to theEUT. The level and duration of the fre-quency shift can be set by the opera-tor or recalled from a file. Test levels 2,3 and 4, as specified by the IEC stan-dard, are provided with the program.The user is capable of specifying a li-brary of test sequences and test levelsfor different product categories. Thesetest setups can be quickly recalled forapplication to the EUT.

EN / IEC 61000-4-27p3

This test applies a series of three phasevoltage and phase angle unbalanceconditions to the EUT. Test levels forEUT classes 2 and 3 as well as X (userdefined) are provided. Additional testlevels may be entered and saved forlater recall as needed. Output voltagewaveforms for all phases are acquiredand displayed graphically during thetest.

The AC source meets most of the testgenerator requirements and supportspre-compliance testing to this standard.

EN / IEC 61000-4-29p3

This test is similar to the IEC 61000-4-11 test but applies to DC powered prod-ucts. A series of DC voltage dips, in-terruptions and variations is applied.Test levels and durations are generallydefined by product category and canbe entered using a spreadsheet dataentry grid and subsequently saved todisk for later recall. The MX sourcemeets most of the test generator re-quirements and supports pre-compli-ance testing to this standard.

EN/IEC 61000-4-28 Test Window

EN/IEC 61000-4-17 Test Window

MIL-STD-704 and DO-160In addition to the European immunitytest standards, the MXCTS system canbe configured with Mil-Std-704E andRTCA/DO-160D Avionics power immu-nity test options. (-704 and -160 respec-tively). The -160 option includes thenew EUROCAE ED-14D standard(115 V). These firmware options imple-ment testing to these standards to fur-ther enhance the usefulness of theMXCTS test system.

RTCA / DO-160D Test Window

EN/IEC 61000-4-29 Test Window

EN/IEC 61000-4-27 Test Window

MXCTS System - Report Generation

MS Word Test ReportsTest reports for harmonics, flicker andimmunity tests are generated using MSWord format. This widely used reportformat can be integrated into moreelaborate user specific reports cover-ing all aspects of compliance testing ifneeded.

Test reports contain data on the EUT,the test lab and operator, all measure-ment results and a clear pass or failindication. Harmonics test reports in-clude current harmonics and voltageharmonics data in both bar charts andtabular formats.

Detailed measurement data is alsoavailable on disk and can be exportedto a tab delimited ASCII text format foruse in other application programs suchas MS Excel. This allows further analy-sis of the acquired data for engineer-ing troubleshooting purposes of EUT’sthat did not pass.

Note: A copy of MS Word must be in-stalled on the PC to generate test re-ports.

The Power Analyzer and Conditioning System unit provides the required interface between the MX AC source, theEquipment Under Test and the PC.

Parameters PACS-3-75

Number of phases 3Channels Voltage and Current 6Connector Style Rear panel Compression terminal blockMaximum voltage L-N 480 VacMaximum current per phase 75 Arms/phInput Power Voltage 115 / 230 V ± 10 %

Current < 0.75 AFrequency 50 / 60 Hz

Dimensions HxWxD 5.25” x 16.8” x 22”HxWxD 134 x 427 x 560 mm

MXCTS Series - PACS-3-75 Specifications

The following specifications arevalid for the power analyzer por-tion of the MXCTS system.

PC Based A/D ConversionThe Harmonics Analyzer is imple-mented using a high performance Digi-tal Signal Processor based PC plug-inA/D card. This digitizer connects di-rectly to the Power Analyzer and Con-ditioning System (PACS) unit througha shielded cable. No other connectionsbetween the PACS-3-75 unit and thePC are required.

The use of a fast multi-channel A/Dcard that transfers data to PC memoryusing Direct Memory Access (DMA)enables the MXCTS system to performcontinuous measurements without anygaps in measured data, an importantrequirement for compliance with IEC61000-4-7 as well as IEC 868.

Signal ConditioningThe Power Analyzer and ConditioningSystem (PACS) unit is used to provideisolation between the PC based acqui-sition system and the Equipment Un-der Test (EUT). Precision currenttransformers provide accurate currentsensing over three different currentranges for maximum resolution. ThePC based acquisition system capturesdata on all current ranges and auto-matically selects the appropriate rangeto use for further processing. This elimi-nates the need for range switching asis commonly done in conventionalpower analyzers.

Anti-aliasing filters are provided for allvoltage and current channels to pre-vent unwanted frequency componentsfrom affecting the measurement re-sults.

The PACS-3-75 unit provides a con-venient way for the user to connect theunit under test. A single signal cableconnects between the PC and thePACS-3-75 unit and provides all theanalog and digital signals needed toand from the A/D card.

Measurement Specification UnitBandwidth

Anti Aliasing > 60 dB at 5 kHzBandpass ripple < 2 % up to 2.5 kHz %

VoltsRange (L-N) 0.001 - 312.00 Vrms

Max. input 1000 Vpeak

Max. crest factor 5:1Accuracy ± 0.1 % ± 0.05 % FS ± 3 mVResolution 10 mVVoltage CMRR 80 dB

RMS CurrentCurrent ranges (Auto ranging) 16, 40, 75 Arms

Highest range 75 Arms

Max. input [permanent,no damage if < 225 Apeak] 75 Arms

Max. CF [75 A Range] 3:1 @ max IrmsMax. CF [16 A Range] 12:1 @ max IrmsAccuracy ± 0.1 % ± 0.05 % FS ± 5 mA mAResolution 1 mA

PowerRange 0.1 - 24,000 WAccuracy ± 0.25 % ± 0.25% FS ± 20 mW mWResolution 0.1 W

Apparent PowerRange 0.1 - 24,000 VAAccuracy ± 0.15% ± 0.15% FS±20mVA mVAResolution 0.1 VA

Power FactorRange 0.000 - ± 1.000Accuracy ± 0.005Resolution 0.001

Crest FactorRange 20:1Accuracy ± 0.005Resolution 0.001

FrequencyRange 45.0 - 65.0 HzAccuracy 0.01 % of reading HzResolution 0.1 Hz

Harmonic AnalysisRange Fundamental to 40th

Accuracy Fundamental ± 0.05% ± 0.05% FSAccuracy Harmonics ± 0.1 %±0.1%/kHzInterharmonics resolution 5 HzMeasurement window 10, 12 and 16 periodsSmoothing filter 1.5 sec

FlickerPst Range 0.1 - 10 Pst

Accuracy2

3 %Resolution 0.01Integration time 10 min

Plt Range 0.1 - 10Integration time 120 min

dmax Range 0 - 100 %dc Range 0.1 - 100 %dt Range 0.1 - 100 %dt over 3.3% Range 0 - 1000 ms

Note 1: All specifications are for L-N. Phase angle specifications are valid under balanced load conditions only.Note 2: Excludes Reference Impedance Error.

CI400PCI - PCI A/D Card

MXCTS System - Measurement Specifications1

Ordering Information PC RequirementsThe MXCTS requires the use of a PCcapable of running Windows 98™ orWin 2000. Recommended PC hard-ware specifications are as follows:

CPU Pentium 4, 1.2 GHz clockor faster.

RAM 256 Mbytes or more.Hard Disk 20 Gbytes or more.

20 Mbytes required forprogram storage.

Display Color SVGA MonitorSlots Available PCI slot for A/D

card.Software MS Word, WindowsIEEE-488 For control of the power

source, a National Instru-ments IEEE bus controllerand available PC slot orRS232 port are required.

California Instruments will quote a PCas part of the system on request. Con-tact factory for details.

Relevant MX45 Options:-411 EN/IEC 61000-4-11

Voltage Dips and Interrup-tions test option. (includedwith -EOS options)

-413 EN/IEC 61000-4-13Harmonics and Inter-Harmonics test option.

-160 RTCA/DO-160 testfirmware.

-704 MIL-STD704 test firmware.

For specifications on the MX Series AC/DC power sources, refer to the MXSeries data sheet. The MXCTS system requires an MX45-3Pi to function. TheMXCTS system is an option for the MX45-3Pi power source.

Specify MX45 model and one of three system configuration suffixes:.

-CTSH High Power Test Standards System includes:

PACS-3-75 Measurement system. Mounted in OMNI-3-75 cabinet.

OMNI-3-75 Three phase Lumped impedance cabinet for IEC 61000-3-11 Flicker

CIC651 CTSMXH Software for IEC 61000-3-12 (Harmonics andIEC 61000-3-11 (Flicker) testing. (P/N CIC651)

CI400PCI A/D Card PCI Bus.

CI68C Cable from CI400PCI to PACS-3-75.

-CTSL Low Power Test Standards System includes:

PACS-3-75 Measurement system. Mounted in OMNI-3-75 cabinet.

OMNI-3-37MX Three phase Lumped impedance for IEC 61000-3-3Flicker

CIC652 CTSMXL Software for IEC 61000-3-2 (Harmonics andIEC 61000-3-3 (Flicker) testing. (P/N CIC652)

CI400PCI A/D Card PCI Bus.

CI68C Cable from CI400PCI to PACS-3-75.

Cabinet 42” cabinet with PACS-3-75 and OMNI-3-37MX installed.

-CTSHL High and Low Power Test Standards System:

Combines CTSH and CTSL components.

Dimension drawing PACS-3-75 unit

Contact California Instruments:TEL: 858 677-9040FAX: 858 677-0940

Email: sales@calinst.comWeb URL: http://www.calinst.com

9689 Towne Centre Drive, San Diego, CA 92121-1964 (858) 677-9040 FAX : (858) 677-0940© Copyright 2001, California Instruments Corp. Specifications subject to change without notice Printed in the USA. MXCTS 03/03

PC Options:CIC-PC Suitable Pentium class PC

with preinstalled CTS andMXGUI software. IncludesCase, keyboard, mouse,Windows and MS Word.

CIC-PCX Adds 15 inch monitor andprinter to CIC-PC.

Accessories:CI400PCI Spare PCI A/D CardCI68C Spare 37 pin signal

interface cable for PCI.