multi-signal, multi-format analysis · •explore interactions between multiple tx paths in the...

37
© 2012 Agilent Technologies April, 25 2012 Multi-Signal, Multi-Format Analysis With Agilent 89600 VSA Software Ken Voelker Agilent Technologies Inc. April 2012 1

Upload: others

Post on 24-Jul-2020

2 views

Category:

Documents


0 download

TRANSCRIPT

Page 1: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

April, 25 2012

Multi-Signal,

Multi-Format Analysis

With Agilent

89600 VSA Software

Ken Voelker

Agilent Technologies Inc.

April 2012

1

Page 2: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Agenda

• Introduction: New Measurement Challenges

• Multi-Measurements – an overview

• Practical Use Cases

2

Page 3: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

The basic workflow of signal verification hasn’t

changed much in 50+ years…

3

1. GSM Power

2. GSM Mod. Error

3. GSM PvT

4. GSM Mask

D.U.T.

Configure Execute Display

Test #1 Test #1 Test #1

One test at

a time…

Reconfigure

for next test.

Test List

Page 4: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Today’s complex devices make ‘one-at-a-time’

testing much less attractive….

4

Configure Execute Display

Test #1 Test #1 Test #1

Reconfigure

for next test.

• GSM Power

• GSM Mod. Error

• GSM PvT

• GSM Mask

• GSM OBW

• GSM Spurious

• Bluetooth Power

• Bluetooth EVM

• Bluetooth Flatness

• Bluetooth Mask

• Bluetooth OBW

• Bluetooth Spurious

• WCDMA Power

• WCDMA Mod Error

• WCDMA PvT

• WCDMA Mask

• WCDMA OBW

• WCDMA Spurious

• WLAN Power

• WLAN EVM

• WLAN Flatness

• WLAN Mask

• WLAN OBW

• WLAN Spurious

D.U.T.

Test List

One test at

a time…

Page 5: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Today’s complex devices make ‘one-at-a-time’

testing much less attractive….

5

Configure Execute Display

Test #1 Test #1 Test #1

Reconfigure

for next test.

• GSM Power

• GSM Mod. Error

• GSM PvT

• GSM Mask

• GSM OBW

• GSM Spurious

• Bluetooth Power

• Bluetooth EVM

• Bluetooth Flatness

• Bluetooth Mask

• Bluetooth OBW

• Bluetooth Spurious

• WCDMA Power

• WCDMA Mod Error

• WCDMA PvT

• WCDMA Mask

• WCDMA OBW

• WCDMA Spurious

• WLAN Power

• WLAN EVM

• WLAN Flatness

• WLAN Mask

• WLAN OBW

• WLAN Spurious

ISSUES:

• Tends to be slow – even when automated – due to time spent changing modes.

• Measurements are non-simultaneous; unable to show signal interactions.

• Results are not persistent; each new measurement replaces the previous one.

Page 6: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Introducing “Multi-Measurements”

6

1. GSM Power

2. GSM Mod. Error

3. GSM Mask

4. Bluetooth Power

5. Bluetooth Mod Err.

6. Bluetooth Mask

:

:

List of tasks

Configure Execute Display

all tests Test #1 all results

Test #2

Test #3

:

Done!

An architectural enhancement for the Agilent 89600 VSA software

that enables it to perform multiple measurements in parallel.

Page 7: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

Page 7

What is “Multi-Measurements” ?

Measurement:

LTE EVM

Multi-

Standard

Device

Display

Acquisition HW VSA Software on Windows PC

one signalat a time acquire displayprocess

DUT

It’s a departure from traditional, one-at-a-time measurements:

Page 8: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

Multi-Measurement concepts:

Users pre-define a collection of VSA measurements (not just one).

Measurements reside in memory, instantly ready to run.

Choice of execution styles, from true simultaneous to fast-sequencing.

Powerful display tools combine and/or correlate multiple results.

Page 8

What is “Multi-Measurements” ?

Measurement:

LTE EVM

Multi-

Standard

Device

Display

Acquisition HW VSA Software on Windows PC

one signalat a time acquire displayprocess

DUT

It’s a departure from traditional, one-at-a-time measurements:

Page 9: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

Page 9

What is “Multi-Measurements” ?

multiplesignals

wide-BWhardwareacquires

all signalsat once.

results shownon combined

display

measurementsprocessed

simultaneously

Measurement:

LTE EVM

Multi-

Standard

Device

Measurement:

GSM Mod. Quality

Measurement:

Composite Pk-Avg.

Acquisition HW

Display

VSA Software on Windows PCDUT

Page 10: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

Page 10

What is “Multi-Measurements” ?

Measurement:

LTE EVM

Multi-

Standard

Device

Measurement:

GSM Mod. Quality

Measurement:

Bluetooth EVM

Acquisition HW

multiplesignals

wide-BWhardwareacquires

all signalsat once.

results shownon combined

display

measurementsprocessed

simultaneously

Display

VSA Software on Windows PCDUT

When all signals won’t fit within a single bandwidth,

just add another instrument!

Page 11: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

Page 11

Multiple Simultaneous Insights

Meas. 01

(Full BW)

Composite Spectrum

+

Composite CCDF

Meas. 03

WCDMA

Spectrum &

Constellation

Meas. 04

LTE-DL

Spectrum &

Constellation

Meas. 02

GSM

Spectrum &

Constellation

• 1 acquisition

• 4 simultaneous

measurements, each

with user-selectable:

- freq/span settings

- meas./demod. setups

- trace type(s)

GSM mod. quality

LTE mod. quality

WCDMA mod. qual.

Page 12: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Multi-Measurements: How it works

12

User creates

measurement

configuration.

VSA “builds” the

measurement,

saves in memory.

Measurement

executes at

run-time.

Traditional

Single Meas.

• hardware choice & config

• input setup: freq, span, range, trigger

• meas. setup: time/freq/demod parameters

• display setup: traces, markers, layouts

Meas01 Core01

Core02 Core04

Core03

Page 13: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Multi-Measurements: How it works

13

User creates

multiple

measurement

configurations.

VSA “builds” all

measurements, keeps them all

in memory.

Measurements

executesimultaneously

on separate cores.

• hardware choice & config

• input setup: freq, span, range, trigger

• meas. setup: time/freq/demod parameters

• display setup: traces, markers, layouts

Fully independent

configurations for

each measurement

Multi-

Measurements

Meas01

Meas02 Meas04

Meas03 Core01

Core02 Core04

Core03

*GUI runs on separate core, not shown.

Page 14: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

Page 14

Who Needs Multi-Measurements?

Developers who need to:

• Simultaneously verify all carriers in a multi-carrier device (e.g. MCPA).

• Simultaneously verify all signals in a multi-standard device.

• Explore interactions between multiple TX paths in the same device.

• Analyze UL and DL signals within a single frame, for either TDD or FDD.

• Compare same signal at different test points within the same signal path.

• Perform several diverse measurements at once, such as measuring in-

channel modulation quality while testing for spurious or harmonic emissions.

Measurement:

LTE EVM

Multi-

Standard

Device

Measurement:

GSM Mod. Quality

Measurement:

Composite CCDF

Display

Page 15: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Use Case #1: Multi-Standard Device Testing

15

TX

Shared Acquisition

Benefits:

• faster than one-at-a-time.

• truly simultaneous; able to

observe interactions.

• side-by-side results.

GSM

WCDMA

LTE

S

GSM WCDMA LTE

Page 16: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Step 1: Create the Measurements

16

Measurement 1

• Center 1.8575 GHz

• Span 15.5 MHz

• Spectrum, CCDF

Measurement 2

• Center 1.8508 GHz

• Span 1.0 MHz

• GSM Mod. Quality

Measurement 3

• Center 1.855 GHz

• Span 5.0 MHz

• WCDMA Mod. Qual.

Measurement 4

• Center 1.8624 GHz

• Span 6.0 MHz

• LTE Mod. Quality

Page 17: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Step 2: Define the Acquisition Style

17

In “Shared Acquisition”, the analyzer acquires all signals at once,

with a single, wide-BW acquisition.

“Shared” Acquisition

Measurement

List

Page 18: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Step 2: Define the Acquisition Style

18

Overall GSM WCDMA LTE

1.850 GHz 1.855 GHz 1.862 GHz

Acquisition span:

15.5 MHz total

“Shared” Acquisition

Measurement

List

Page 19: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Step 3: Run Measurements, Observe Results

19

TX

GSM

WCDMA

LTE

S

GSM WCDMA LTE

Benefits:

• faster than one-at-a-time

• truly simultaneous; see

interactions.

• side-by-side results

Page 20: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Use Case #1: Multi-Format Device Testing

20

Shared Acquisition

Page 21: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Use Case #2: Simult. Wide/Narrow RBW Analysis

21

Challenge:

Mask test on

bursted WLAN

signal, 20 MHz

Wide.

Simultaneously

check level of

bursted spur, but

signal is below

the broadband

noise floor.

Solution:

Meas01 mask test

uses 140 MHz

span, 1 MHz RBW.

Spur at 2.46 GHz

is not visible.

Meas02 at 48 MHz

offset uses13 MHz

span and 3 kHz

RBW. Noise floor

is 25 dB lower.

Shared Acquisition

Page 22: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Summary – Use “Shared Acquisition” When:

• All signals to be measured are:

- within the IF bandwidth of your measurement hardware.

- accessible from the same physical test point / antenna / etc.

• You need truly simultaneous measurements in order to understand

interactions between the signals.

• You need to measure:

- multiple carriers in a single TX path or Power Amp.

- multiple formats in a single TX path or Power Amp.

- wide-BW modulation and narrow-band spurious together.

- UL and DL signals within the same frame (TDD or FDD).

22

Page 23: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

23

DUT

LTE

WLAN

LTE WLAN

~650 MHz

What if my signals are too far apart?

2.412 GHz

1.8624 GHz

Page 24: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

24

DUT

LTE

WLAN

LTE WLAN

~650 MHz

Trig.

Use Case #3: Multi-Format Devices – Wide DFIndependent Acquisition

Page 25: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Scenario: Intermittent Error Spikes on LTE Signal

25

Meas01: LTE Demod

(EVM vs. Time)

DUT

WLAN

LTE

X

Page 26: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

DUT

LTE + WLAN Demod: Time Relationships Visible

26

WLAN

LTE

Meas01: LTE Demod

(EVM vs. Time)

Meas02: WLAN Demod

(Power vs. Time)

LTE Error spikes are aligned with WLAN Bursts

Trig.

Page 27: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Combined Display Proves Time-Correlated Error

27

Page 28: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Use Case #3: Multi-Format Devices – Wide DF

28

TX

Benefits:

• not limited by analyzer BW.

• faster than one-at-a-time

• view interactions

• side-by-side results

LTE

WLAN

LTE WLAN

~650 MHz

Independent Acquisition

Trig.

Page 29: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Summary: Shared vs. Independent Acquisition

29

• Single instrument + VSA SW.

• Single acquisition.

• Measurements are inherently

time-aligned.

• Frequency separation limited

to hardware’s IF bandwidth.

• 2 (or more) instruments + VSA SW.

• Multiple coordinated acquisitions.

• Measurements may be time-aligned

using external triggering.

• Unlimited frequency separation.

Page 30: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Use Case #4: Check Signal at Multiple Test Points

30

Logic An.

X RFIFDAC

ScopeSignal

Analyzer

Independent Acquisition

Signal AnalyzerTrig.

• Check EVM at each test point -or-

• Use math functions to compute:

- BB to RF transfer function

- Digital BB to RF transfer function

- IF Gain/Flatness/Group Delay

VSA Software

Page 31: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Simultaneous Baseband, RF Measurement Setup

31

X RFIFDAC

Scope

BB RF

• Meas01: Baseband

Hardware: 2-ch. scope (I + Q)

Center Freq: 0 Hz

Span: 2 MHz

Meas Type: Spectrum, Time

• Meas02: RF Output

Hardware: RF signal analyzer

Center Freq = 1.001 GHz

Span = 2 MHz

Meas Type: Spectrum, Time

• Freq Resp = Meas02 / Meas01

Trig.

Signal

Analyzer

Page 32: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Importance of Synchronization

32

Spectra must be

perfectly sync’ed

to obtain a

smooth result.

(gain)RF

BB

(group delay)RF

BB

X RFIFDAC

Scope

BB RF

Trig ?

Signal

Analyzer

Page 33: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Importance of Synchronization

33

Post-demod

spectra are

accurately

sync’ed.

(gain)RF

BB

(group delay)RF

BB

X RFIFDAC

Scope

BB RF

Trig.

Signal

Analyzer

Page 34: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Use Case #4: Compare Signals at Diff. Test Points

34

Independent Acquisition

Benefits:

• quickly compare signal quality at

key points along signal path.

• compute frequency response

via user-defined math functions.

Logic An.

X RFIFDAC

ScopeSignal

AnalyzerSignal

AnalyzerTrig.

VSA Software

Page 35: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

One More Acquisition Style…

35

Independent (Single Instrument)

• Fast-switched, single-instrument

measurements.

• Rapidly switch among members of

a measurement collection.

• Can be sequenced with a built-in

macro (supplied with VSA SW.)

• Simultaneous or time-coordinated

measurements, using single or multiple

instruments.

Shared

(1 instr.)

Independent

(multi-instr.)

Page 36: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

• GSM Power

• GSM Mod. Error

• GSM PvT

• GSM Mask

• GSM OBW

• GSM Spurious

• Bluetooth Power

• Bluetooth EVM

• Bluetooth Flatness

• Bluetooth Mask

• Bluetooth OBW

• Bluetooth Spurious

• WCDMA Power

• WCDMA Mod Error

• WCDMA PvT

• WCDMA Mask

• WCDMA OBW

• WCDMA Spurious

• WLAN Power

• WLAN EVM

• WLAN Flatness

• WLAN Mask

• WLAN OBW

• WLAN Spurious

Use Cases for Fast-Switched Measurements

36

Configure Execute Display

Test #1 Test #1 Test #1

Reconfigure

for next test.

D.U.T.

Test List

• Step quickly through a series of diverse tests.

• Step quickly through the same test repeated at several frequencies.

• Any use case for “shared” acquisition where true simultaneity is not required.

Page 37: Multi-Signal, Multi-Format Analysis · •Explore interactions between multiple TX paths in the same device. •Analyze UL and DL signals within a single frame, for either TDD or

© 2012 Agilent Technologies

Summary:

Multi-Measurements with the 89600 VSA Software

37

Independent, multi-box: “loosely”

synchronized measurements at

same/different freqs, spans, formats,

etc. using multiple HW front ends.

Independent, same-box: non-

simultaneous measurements at

various freq’s, spans, formats, etc.

using a single HW front end.

Fast switching

F1

F3

F4

F2

Unlimited BW

Shared: acquire once, then perform

multiple, truly simultaneous meas.

within the max span width. F1 F2 F3 F4

Simultaneous