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MSA-100-3D Micro System Analyzer MSA-100-3D Micro System Analyzer 3D Vibration Measurement for MEMS & Microsystems Product Brochure

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Page 1: MSA-100-3D Micro System Analyzer Micro System Analyzer ... MEMS Sensors and Actuators ... tables and can also be installed on table top vibration isolation breadboards or on …

MSA-100-3D Micro System Analyzer

MSA-100-3D Micro System Analyzer3D Vibration Measurementfor MEMS & MicrosystemsProduct Brochure

Page 2: MSA-100-3D Micro System Analyzer Micro System Analyzer ... MEMS Sensors and Actuators ... tables and can also be installed on table top vibration isolation breadboards or on …

Because real life happens in 3D

3D deflection shape measurement of microstructues with pm resolution for both out-of-plane and in-plane motion mark the state-of-the art microscope based vibration measurement.

Technology

This novel measurement instrument is based on heterodyne Mach-Zehnder interferometry with 3 linearly independent interferometer paths. The laser beam directed on-axis through the main interferometer is frequency-shifted acousto-optically with respect to the 3 reference beams by a Bragg-cell. The scattered light is then collected on-axis and in two off-axis directions. The 3 detector signals contain the complete broad-bandwidth 3D vibration spectra at the measurement spot. A coordinate transformation is employed to derive the vibration data in Cartesian coordinates. Operating deflection shapes of all resonances are measured by scanning the laser beam over the surface of the sample.

3D Vibration Measurements for Microsystems

The MSA-100-3D Micro System Analyzer is designed for 3D vibration analysis with high lateral resolution. It is especially suited for microsystems, precision mecha-nics parts and for studies on the dynamics of HGAs and secondary actuators in the data storage industry.

The instrument is based on a novel 3D vibrometer setup enabling pm-resolution for both out-of-plane and in-plane motion. It has a frequency bandwidth of 25 MHz. An integrated XY-traverse stage with full software support for high-precision sample movement enables scanned measurements for obtaining 3D deflection shapes.

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Highlights

The MSA-100-3D Micro System Analyzer solves many challenging development tasks. It is based on the directionally resolved analysis of the Doppler frequency shift of light backscattered from just a single laser beam impinging on a vibrating or moving object. Subpicometer amplitude resolution is achieved for both Out-Of-Plane (OOP) and In-Plane (IP) motion with a small laser spot resulting in high spatial resolution data. This combined with up to 25 MHz bandwidth real time data will open a realm of entirely new applications for the characterization of MEMS and other micro mechanical structures.

Real-time measurement with high bandwidth

Sub-pm displacement resolution for both Out-of-Plane and In-Plane motion

Single-Point and Full-Field scanning measurements

Frequency range up to 25 MHz

Small spot size of <4 μm for high lateral resolution

Large stand-off distance of 38 mm

Probe station compatible

BEAMSPLITTER

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Enabling deflection shape analysis for MEMS and microstructures with excellent resolution for both out-of-plane and in-plane motion components, here a Piezo transducer.

MEMS Sensors and Actuators

The primary direction of motion for many MEMS devices is defined by the principal plane of the device (in-plane, IP). Typical examples include inertial sensors such as accelerometers or gyroscopes. In another class of devices the principal direction of motion is perpendicular to the plane of the device (out-of-plane, OOP), typical examples are micro mirrors and mirror arrays, inkjet printing heads, microphones and pressure sensor membranes.

However, in most cases the real performance cannot be characterized as either pure OOP or IP vibration. Instead, it is a superposition of both motion components. Therefore high-resolution measurement data from all motion directions are needed for a complete description. In addition, the vibration measurement has to be very sensitive, in the picometer range, to catch the smallest parasitic contributions.

Application Areas

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Data Storage

A sophisticated non-contact 3D measurement technology like LDV helps to accomplish the engineering task to increase R/W head-positioning accuracy in hard disk drive (HDD) development to achieve higher storage density and better reliability. Precise time-domain data and various operational deflection shape measurements help to quickly verify new designs thus accelerating the development process.

Bio-Medical Applications

Biological systems like insect hearing organs which display complex 3D vibrations on the nm-scale when exposed to sound can be studied in real-time with the MSA-100-3D Micro system analyzer.

Precision Micro Mechanics

High precision micro mechanic components, assemblies and tools are essential elements in many industries ranging from semiconductor, medical, dental, watch-making to aerospace and other high technology industries. An easy, non-contact precision measurement leads to a significant characterization of the 3D dynamic properties of micro mechanic parts and assemblies thus helping to develop better products in a shorter time.

Zoom-in with very high resolution allow a close look on fine-mechanics like gears in watches. Detecting unwanted vibrations and displacements in pm-range is crucial to comply with the highest quality standards in this sector.

3D deflection shape of watch components.Microscopic 3D analysis ensure highest quality and accuracy in product development processes.

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Models and Accessories

Configuration with portal stand, automated z-axis, xy-positioning table and actively-controlled vibration isolated workstation.

Intelligent Software

Simple Operation: The proven Polytec PSV scanning vibro- meter software is the base and has been extended with powerful features for fast and highly productive 3D vibration measurement on micro structures. The automated video stitching function allows an easy extension of the scan area on larger structures. The support for the motorized z-axis allows the easy assignment of optimum focus values to individual measurement points or a group of points.

Intuitive Data Analysis and Evaluation: Frequency data over the instrument’s whole bandwidth is available, without the need to know discrete frequencies in advan-ce. The intuitive software package has a fully featured analyzer for time domain, FFT, Zoom FFT, averaging and peak hold measurements using a wide range of excitati-on wave forms. Data visualization includes full frequency response function (FRF) and operational deflection shape (ODS) capabilities with impressive 3D animations. Post processing and further data evaluation is enhanced by an open programming interface, versatile data export to modal analysis packages (UFF, ASCII, binary) and a powerful built-in signal processor.

Either as single point or as full-field 3D scanning, the MSA-100-3D stands for flexibility with different bandwidth configurations for vibration measurement:

H-Version up to 100 kHz M-Version up to 2.5 MHz V-Version up to 25 MHz

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Stands and Sample Positioning

A flexible mounting concept allows to install the MSA-100 Sensor Head specifically to the application require-ments, with either standard or portal stand mounting or installed on probe stations. Polytec stands are available on air-damped or actively-controlled vibration isolated tables and can also be installed on table top vibration isolation breadboards or on user supplied optical tables. XY-stages with tip-tilt compensation allow precise sample positioning and full field scanning. For more information, please see the accessory data sheet.

Probe Station Compatibility

The MSA-100-3D can easily be adapted to probe sta-tions for automated or semi-automated measurements on wafer-level, even under vacuum conditions. Moun-ting holes equivalent to a Mitutoyo FS70-L-S (short base) back plate enable an easy integration on commercially available probe stations. Its long working distance and sensor head form allows also the installation at vacuum, pressure or temperature chambers.

The XY-positioning table with tip-tilt compensation,

vibration isolated workstation and more extras enable

comfortable work.

Intuitive visualization of 3D deflection shapes in

PSV software.

MSA-100-3D integrated in a vacuum probe station.

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Polytec GmbH (Germany)Polytec-Platz 1-7 76337 Waldbronn Tel. +49 7243 604-0 [email protected]

Polytec GmbH (Germany)Vertriebs- undBeratungsbüroSchwarzschildstraße 1 12489 Berlin Tel. +49 30 6392-5140

Polytec, Inc. (USA)North American Headquarters16400 Bake ParkwaySuites 150 & 200Irvine, CA 92618Tel. +1 949 [email protected]

Central Office1046 Baker RoadDexter, MI 48130Tel. +1 734 253-9428

East Coast Office1 Cabot Road Suites 101 & 102Hudson, MA 01749Tel. +1 508 417-1040

Polytec Ltd. (Great Britain)Lambda HouseBatford MillHarpenden, Herts AL5 5BZTel. +44 1582 [email protected]

Polytec France S.A.S.Technosud IIBâtiment A99, Rue Pierre Semard92320 ChâtillonTel. +33 1 [email protected]

Polytec JapanArena Tower, 13th floor3-1-9, ShinyokohamaKohoku-ku, Yokohama-shiKanagawa 222-0033Tel. +81 45 [email protected]

Polytec South-East Asia Pte LtdBlk 4010 Ang Mo Kio Ave 10#06-06 TechPlace 1Singapore 569626Tel. +65 [email protected]

Polytec China Ltd.Room 402, Tower B Minmetals Plaza No. 5 Chaoyang North AveDongcheng District 100010 BeijingTel. +86 10 [email protected]

www.polytec.com

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