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1 CADENCE DESIGN SYSTEMS, INC. FDIP Workshop, EPEP 2006 Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs Zhen Mu Cadence Design Systems, Inc.

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Page 1: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

1 CADENCE DESIGN SYSTEMS, INC. FDIP Workshop, EPEP 2006

Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs

Zhen MuCadence Design Systems, Inc.

Page 2: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

2 FDIP Workshop, EPEP 2006

Note

• The content of this presentation is the collected effort of the entire SiP team in SPB division at Cadence.

Page 3: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

3 FDIP Workshop, EPEP 2006

Topics

• SiP Overview

– What is SiP?

– Why is SiP Important?

– SiP applications

• SiP Design Challenges

• Requirements of EDA tools for SiP design and analysi s

– Co-Design methodologies

– Design management

– SI and PI analysis

• Summary

Page 4: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

4 FDIP Workshop, EPEP 2006

Topics

• SiP Overview

– What is SiP?

– Why is SiP Important?

– SiP applications

• SiP Design Challenges

• Requirements of EDA tools for SiP design and analysi s

– Co-Design methodologies

– Design management

– SI and PI analysis

• Summary

Page 5: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

5 FDIP Workshop, EPEP 2006

What is SiP?

• SiP (System-in-Package)

– Single package that combines all of the electronic components (digital ICs, analog ICs, RF ICs, passive components or other elements) needed to provide a system or sub-system.

• Applications

– Cellular

– Bluetooth

– 802.11 WLAN

– CMOS Sensors

Courtesy of Philips

Page 6: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

6 FDIP Workshop, EPEP 2006

Why is SiP important?

• Increased functional density– Miniaturization due to fewer packages and

3D stacked die– Multiple technologies in a SiP

• Reduced time-to-new product concepts– Faster design cycles (over SoC)– Reduce system board complexity and layer

count

• Performance through interconnect elimination

– Low power– High speed

• Optimization of complexity, cost, and time to market

Courtesy of ASAT

Source: Renesas

37%

26%

13%

12%

12%

Miniaturization

EMI Noise Reduction

Low Power

Cost Reduction

High-Speed Bussimplification

Page 7: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

7 FDIP Workshop, EPEP 2006

SiP applications in wireless devices

SiP Functions

RF/IF(WLAN, Bluetooth, GPS)

Camera(A-FEP,DSP,VDr)

Baseband(DSP,memory)

Application(GPU,CPU,memory)

Camera

Voice

Video

Music

PersonalProductivity

Games

GPS

WLAN

Page 8: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

8 FDIP Workshop, EPEP 2006

SiP and Stacked-package designs increase 21% yearlyDesigns move from experts to majority of designers

(Source: Electronic Trend Publications )

Multi-Die package forecast

Courtesy of ASAT

Courtesy of Cannon

Page 9: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

9 FDIP Workshop, EPEP 2006

Topics

• SiP Overview

– What is SiP?

– Why is SiP Important?

– SiP applications

• SiP Design Challenges

• Requirements of EDA tools for SiP design and analysi s

– Co-Design methodologies

– Design management

– SI and PI analysis

• Summary

Page 10: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

10 FDIP Workshop, EPEP 2006

Multiple die connections

Die stackingPackage-on-package

3D IC RF module

Page 11: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

11 FDIP Workshop, EPEP 2006

Complex die stack design

3D StackDesign

3D StackViewer

Actual Stack Design

Page 12: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

12 FDIP Workshop, EPEP 2006

Complex die stack design

• Interposer

Page 13: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

13 FDIP Workshop, EPEP 2006

PCB to PCB

Pin on chip

package

Systems interconnect

Driving I/O

bufferon chip

C4 Bump

Receiving I/O bufferon chip

Page 14: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

14 FDIP Workshop, EPEP 2006

Topics

• SiP Overview

– What is SiP?

– Why is SiP Important?

– SiP applications

• SiP Design Challenges

• Requirements of EDA tools for SiP design and analysi s

– Co-Design environment

– Design management

– SI and PI analysis

• Summary

Page 15: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

15 FDIP Workshop, EPEP 2006

Modeling and analysis challenges

• Optimization requires design automation

• Recongnicing the differences between SiP design and classic single package and PCB designs

• Issues

– Multiple stacked dies are placed vertically or horizontally

– Connection between multiple dies are realized by wirebonding, interposer, interconnect, or flip-chip technology

– IC design needs to consider package design, while package designneeds to consider IC requirements

– How to make die information available to package designers, and how to pass package models back to IO designers to simulate entire signal path

– Data passing and property mapping

Page 16: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

16 FDIP Workshop, EPEP 2006

Modeling and analysis challenges

• Fundamental requirements for SiP tools

– An environment with IC/package/board co-design and co-simulationcapabilities

– To provide engineers with Signal Integrity (SI) and Power Integrity (PI) solutions

– Concurrent pre-route analysis and post-route verification

Page 17: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

17 FDIP Workshop, EPEP 2006

Current methodologies must change

• Isolated IC, Package, and PCB design tools increases costs and design cycle times

– Many problems not discovered until integration (costly iterations)

• New methodology requires full system interconnect planning

– IC package interconnect and its influence must be fully understood and modeled

– Must arbitrate connection scheme across chip, package and board

• Timing, signal integrity and power delivery intertwined

– Full analysis of system interconnect from buffer to buffer required

• Constraints have to be established based on accurate pre-route analysis

ICIC PackagePackage PCBPCB

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18 FDIP Workshop, EPEP 2006

Opening Up the Solution Space

IC

Design Space

Board

Design Space

I/O Pad to Package Pin Physical Design

and Modeling

I/O Pad � Bump Array Placement and Optimization

RDL Routing

I/O Pad to Bump Delays

System Level I/O Buffer Characterization

Package Footprint Creation

Schematic Symbol Creation

I/O Pad to Package Pin Delays

Package Pin Optimization

Package

Design Space

Page 19: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

19 FDIP Workshop, EPEP 2006

Topics

• SiP Overview

– What is SiP?

– Why is SiP Important?

– SiP applications

• SiP Design Challenges

• Requirements of EDA tools for SiP design and analysi s

– Co-Design methodologies

– Design management

– SI and PI analysis

• Summary

Page 20: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

20 FDIP Workshop, EPEP 2006

SiP digital design flow

• Concurrent designs & independent teams

• Unique IC processes

• Design chain geographically diverse

System

Sub

U1U2

M1,2

System Design Hierarchy

U3U1 U2 U3

M1

M23DIC

SiP

Resulting SiP Complex 3D Structures & Technologies

– U1: flip chip, 90nm digital

– 3DIC:– U2: wire bond 130nm

– M1 & M2: wire bond 90nm memory

– U3: fixed die, flip chip 130nm digital

Sub-assembly is the SiP

PCB

Page 21: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

21 FDIP Workshop, EPEP 2006

Architect

Layout

SI/PI

SiP digital design methodology

*

Page 22: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

22 FDIP Workshop, EPEP 2006

Digital SiP connectivity hierarchy

Board

FA,B,C FD

SiP (SoC, FB)

Balls Int

SiP (FD)

Balls Int

SoCBlock

FunctionB

Block

SiP (SoC, FB) Logical Interface

SoC Function B

BumpsBumps IntInt

FunctionD

Block

SiP Logical Interface

Function D

Bumps Int

Page 23: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

23 FDIP Workshop, EPEP 2006

Co-design dies

• IC tool based die abstract editor

• Co-design die are hierarchical design elements on substrate

• Die abstracts management

• Data Import/Export

Page 24: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

24 FDIP Workshop, EPEP 2006

Concurrent design to enable optimizationof DIE abstracts

Flip chip with drivers, RDL and

Bumps

Flip chip (standard)

Wire bond chip (standard)

SIP IO PlannerCo-design DIE

SiP Substrate Editor

Page 25: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

25 FDIP Workshop, EPEP 2006

• Flip Chip or Wirebond Attachment

– Automatic optimization strategies via node swapping

• Based on Package Pin Assignment

• Flip Chip Escape Patterns

• Feasibility Routing for RDL

– IOP mask ready RDL routing

– I/O Buffer to Bump/Die Pad in IOP

• IC-Pkg routability analysis

– All angle, Orthogonal, Diagonal

– Support for Differential Signaling

– Materials and Standard Package trade-offs

– Full mask ready substrate routing

Route feasibility analysis: IC-RDL and SiP substrate

Page 26: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

26 FDIP Workshop, EPEP 2006

Package Physical Layout

• Automatic Bond Shell Creation

• Net assignment based on Routability of Package

• All angle auto-routing

• Unique routers for wire-bond and flip-chip routing styles

– DRC correct

– Electrical constraints and Physical rules

Page 27: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

27 FDIP Workshop, EPEP 2006

3D Visualization

• Support for Die Stacks

• Bond Wire Clearance Checking

– Reverse Bonding

• Micro-Via Checking

Page 28: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

28 FDIP Workshop, EPEP 2006

Topics

• SiP Overview

– What is SiP?

– Why is SiP Important?

– SiP applications

• SiP Design Challenges

• Requirements of EDA tools for SiP design and analysi s

– Co-Design methodologies

– Design management

– SI and PI analysis

• Summary

Page 29: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

29 FDIP Workshop, EPEP 2006

Co-design methodologies in high-speed design

• Problem1: Signal path from silicon to board through package

– Reflections, xtalk, timing

The interconnect from Package to Board and IO buffersare modeled

The interconnect from Package to Board and IO buffersare modeled

SiliconSilicon

PackagePackage

Board(s)Board(s)

Page 30: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

30 FDIP Workshop, EPEP 2006

Co-design methodologies in high-speed design (cont’)

• Problem 2: Power delivery path from board to silicon through package

Power is delivered from PCB to Siliconthrough Package

Power is delivered from PCB to Siliconthrough Package

SiliconSilicon

PackagePackage

Board(s)Board(s)

Page 31: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

31 FDIP Workshop, EPEP 2006

Co-design methodologies in high-speed design (cont’)

• Problem 3: Effects between signal and power supply

Silicon Package Board

Problem 1: signal

Problem 2: power

Problem 3: Interference of signal and power

Page 32: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

32 FDIP Workshop, EPEP 2006

Signal analysis: Establishing constraints

• Early exploration on multi-die connection

Page 33: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

33 FDIP Workshop, EPEP 2006

Signal analysis: Establishing constraints

• Early exploration on multi-die connection

Page 34: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

34 FDIP Workshop, EPEP 2006

Signal analysis: Establishing constraints

• Extracted circuit for space simulation

Three dies

Page 35: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

35 FDIP Workshop, EPEP 2006

Signal analysis: interconnect modeling

• Detailed interconnect modeling

Page 36: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

36 FDIP Workshop, EPEP 2006

Signal analysis: assistant to analysis

• 3D view

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37 FDIP Workshop, EPEP 2006

Signal analysis: wirebond constraints

• Perform what/if analysis by changing wirebond profiles

– Work with existing design and/or start new design

– Edit the parameters

– Update (or extract) constraints

Page 38: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

38 FDIP Workshop, EPEP 2006

Signal analysis: stackup design

• Crossection details

Page 39: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

39 FDIP Workshop, EPEP 2006

Signal analysis: wirebond modeling

• Interested wirebonds

Page 40: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

40 FDIP Workshop, EPEP 2006

Signal analysis: wirebond model re-use

• Extracting models from existing design

Page 41: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

41 FDIP Workshop, EPEP 2006

Signal analysis: wirebond model re-use

• The corresponding design with only wirebonds

Page 42: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

42 FDIP Workshop, EPEP 2006

Signal analysis: wirebond model re-use

• 3D view of the multi-die design

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43 FDIP Workshop, EPEP 2006

Signal analysis: wirebond model reuse

• View geometry mesh

– Original net (in full)

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44 FDIP Workshop, EPEP 2006

Signal analysis: reflections, crosstalks, timing

• Building simulation circuits

– 3D modeling

Page 45: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

45 FDIP Workshop, EPEP 2006

Signal analysis: reflections, crosstalks, timing

• Simulation circuit

Two dies

Page 46: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

46 FDIP Workshop, EPEP 2006

Power analysis: power delivery

• Power delivery to multiple dies

Page 47: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

47 FDIP Workshop, EPEP 2006

Power analysis: power delivery

• Power delivery to multiple dies

Page 48: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

48 FDIP Workshop, EPEP 2006

Power analysis: power delivery

• Power delivery to multiple dies

– Decoupling capacitor selection and placement

Page 49: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

49 FDIP Workshop, EPEP 2006

Power analysis: IR-Drop analysis at IC level with package effects included (cont’)

• Voltagestorm output using multi-port DC net model of package

With N-port DC net model in package

Worst IR-drop : 253mV

Without package effects

Worst IR-drop : 155mV

Page 50: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

50 FDIP Workshop, EPEP 2006

Power analysis: stability study

• Estimate SSO/SSN impacts at early design stage

– This methodology helps decide the ratio of signal I/O pads to power & ground pads before starting chip design

Data preparation

I/O Pad Ratio Setting

SSO Simulation

Pass?

Adding capacitors

No

Yes

Start to design chip’s floor-plan and export design spec. to package house

Page 51: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

51 FDIP Workshop, EPEP 2006

Co-simulation in SiP: final verification

• Final verification for solutions 1-3

– Consider entire signal path

– Silicon to board through package

– Examine signal quality and timing budget

– Consider power stability

– Key is SSN analysis

Silicon Package Board

Problem 1: signal

Problem 2: power

Problem 3: Interference of signal and power

Page 52: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

52 FDIP Workshop, EPEP 2006

Co-simulation in SiP: final verification

• Design example: finished package design

– Many diff. pairs

– Multi-GHz signaling

Page 53: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

53 FDIP Workshop, EPEP 2006

Co-simulation in SiP: final verification

• Design example

– Finished package design

– Wideband model extraction

Page 54: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

54 FDIP Workshop, EPEP 2006

Co-simulation in SiP: final verification

• Design example

– Mesh view of a pair of critical differential signals

Page 55: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

55 FDIP Workshop, EPEP 2006

Co-simulation in SiP: final verification

• Design example– Driver/receiver

model

– Transistor level model wrapped in Spectre format

– Macromodel

– Long trace representing board

– Run Spectre directly in SiPenvironment

Page 56: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

56 FDIP Workshop, EPEP 2006

Co-simulation in SiP: final verification

• Large package model

Page 57: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

57 FDIP Workshop, EPEP 2006

Co-simulation in SiP: final verification

• Assign package model and power/ground buses

Page 58: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

58 FDIP Workshop, EPEP 2006

Co-simulation in SiP: final verification

• Results of detailed Spectresimulation

– 8 Lane SSO analysis results

Page 59: Modeling and Analysis Challenges for Complex Digital ... · Modeling and Analysis Challenges for Complex Digital Systems-in-Package Designs ... RF ICs, passive components ... Layout

59 FDIP Workshop, EPEP 2006

Summary

• System-in-Package is the right integration solution for wireless and consumer products– It posts great challenges to designs and analyses (differences between

single package and PCB designs)

• Design tools are evolving to meet the needs of designers– IC-Package-Board co-design and co-simulation enable designs to be

optimized to meet design requirements

• SiP Digital tool– Providing a co-design environment for SiP interconnect including embedded

ICs and the target printed circuit board

– Including integrated signal integrity, parasitic extraction/modeling and substrate interconnect editing, power delivery, and signal/powerinterference analyses

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60 FDIP Workshop, EPEP 2006

Thank you