mida x, the next generation in optical inspection how ...effect. solution: local defects. in base...

CONFIDENTIAL Copyright © Dr. Schenk GmbH AIMCAL USA 2018 Page 1

How Today’s QC-Systems Can Be Made More Powerful

MIDA X, the Next Generation in Optical Inspection

Jochen KoenigSchenk Vision Inspection Systems


IntroducingDr. Schenk

Base Material Inspection

Properties Monitoring

Converted Material Inspection

Summary


Dr. Schenk – The Solution Provider

Local defect detection & overall properties monitoring

Design & manufacture Modular in-line and off-line inspection and measurement systems Quality & process control of flat surfaces for the following industries:

Glass Inspection

SolarInspection

Display & Touch Panel Inspection

NonwovenInspection

PlasticInspection

TextileInspection

MetalInspection

MaterialHandling

Paper Inspection

Customized Solutions


Ready for Your Project


Production Line with In-Line Inspection

Inspectionbase film Inspection

after coating

Extrusion, .

Coating

Inspectionafter drying

Drying


Production of Base Material

…B

low

Lin

e

Cas

tline

Extr

uder Delivery to customer

Grammage Reflectivity, gloss ...

Layer thickness Surface structures (haze) ...

Coating voids Pinholes Inclusions in coating layer Bubbles Coating streaks …

Converting of Material

Coa

ting

Inclusions Fish-eyes Gels, Knots ...

Quality & Process Control for Coated Materials

Defect Detection

Material Properties Monitoring


Material

MIDA CameraTechnology

IlluminationBRIGHT_LINE

IlluminationBRIGHT_LINE

System Configuration

Reflection Darkfield + BrightfieldTransmission Brightfield


MIDA: Single Camera – Multiple Illuminations

Example: combination reflection + transmission channels

Reflection

Illumination for reflection

Transmission

Material

Camera

Illumination for transmission

Reflection DF Reflection HF Transmission HF

High sensitivity for many different defects (e.g. inclusions, holes, contaminations, embossing defects, lines, cluster, wrinkles, …)

Comprehensive defect analysis for reliable defect classification

Only one camera -► saves footprint and investment costs


One System – Two Tasks

Shared Hardware

Local Defects Material Analysis

EasyInspect with EasyMeasure is a complete & unique solution






Summary

Base Film: Detection of Local Defects


Inspection & Measurement of Plastic Films

Problem Cause Effect Solution

Local defectsin base material

Gels, fisheyes: P-gel (polymerization) E-gel (extrusion)

Carbon specs (die pickoff) Air bubbles Striations (die-/weld-lines) Scratches Wrinkles Insects Roller marks ……..

Poor production process Poor material quality P-gels: bad incoming

resin E-gels: mostly unmelted /

degraded resins Poor crystallization

Inhomogeneous film, danger of tearing

Performance in end product (sealing capability of goods)

Cosmetic problems

Local Defect Detection

Local defectsafter coating

Coating voids Pinholes Inclusions Scratches MD-Streaks …….

Poor pre-treatment of base material

Particles on base material before coating

Defective coating die

Loss of coating function (e.g. sealing capability)

Problems with printing

Cosmetic problems


Film / coating inhomogeneity

Layer thickness Surface topology Clarity of the film Reflectivity

Poor material deposition Poor material quality Poor surface of rollers Inhomogeneous mixture

of granulate with master batch (M.B.) (i.e. because of heavier M.B.)

Performance of end product

Cosmetic problem in end product

Film Properties Monitoring


Inspection Results Base Film

Material: Flexible Packaging Base Film

Defect: Particle, Inclusion

Camera

RBF

RDF

TBF

Transmission Brightfield Reflection Brightfield Reflection Darkfield




Defect: Gels

Camera

TBF

Transmission Brightfield Transmission BrightfieldKnife Edge




Defect: Wrinkles

Camera

RBF

RDF

TBF

Transmission Brightfield Reflection Darkfield






Summary

Coated Film: Detection of Local Defects


Examples for Defects and Inhomogeneities

Examples for local defects in coated films

Coating layerPlastic film


Examples for layer inhomogeneities in coated films

Variation in layer thickness Variation in layer surface topology (haze)












Cosmetic problems









Cosmetic problems










Brightfield Transmission Brightfield Reflection

Inspection Results Coated Film

Material: Packaging film, coated

Defect: Spot / coating void

Camera

RBF

TBF


Brightfield Reflection Darkfield Reflection



Camera

RBF

RDF

Defect: Coating void / particles


Transmission Brightfield Reflection Brightfield



Camera

RBF

TBF

Defect: Oil contamination


Transmission Brightfield Transmission Brightfield/Knife Edge



Defect: Orange peel, gels

Camera

TBF



Material: Plastic film, waterbased coating

Camera

RBF

RDF

Defect: Dewetting

Reflection Brightfield Reflection Darkfield



Material: Plastic film, extrusion coating

AWD17314-0

Reflection Brightfield Reflection BrightfieldStreak detection

CameraRBF

Defect: Coating streak



Material: Plastic film

AWD17314-0

Defect: Bubbles in extrusion coating

Transmission Brightfield Reflection Brightfield Reflection Darkfield

Camera

RBF

RDF

TBF


Inspection Results Metallized Film

Material: Packaging Film / Metallized

Transmission Brightfield Reflection BrightfieldKnife Edge

Camera

RBF

TBF

Defect: Metal void, pinholes


MIDA → MIDA X: Closing the Intelligence Gap

MIDA

The 1st revolution in optical inspection

SoftwareMulti-threading capability

Architecture EXPLOITS hardware optimally

HardwareMulti-CPU / GPU Architecture

Multi-Processor Technology

The 2nd revolution in optical inspection


MIDA X: Visual Intelligence

The way to higher yield

Gray image with reduced noise MIDA X: real defect size

Enhancedevaluation


MIDA X: Visual Intelligence

MIDA X: Precise defect differentiation

Gray Image MIDA XStandardInspection

Inse

ctC

onta

min

atio

n


Dr. Schenk MCI Technology

Filter Mat / Nonwoven

Conventional: white light + color line camera

MCI Technology: 3x more light !Multi-Color-Illumination + monochrome line camera

dr. schenk



Filter Mat / Nonwoven

ConventionalColor Camera



One System – Two Tasks

Shared Hardware

Local Defects Material Analysis

EasyInspect with EasyMeasure is a complete & unique solution






Summary

Coated Film: Monitoring of Film Properties












Cosmetic problems









Cosmetic problems










Examples for Defects and Inhomogeneities

Examples for local defects in coated films



Examples for layer inhomogeneities in coated films

Variation in layer thickness Variation in layer surface topology (haze)


Variation in coating layer thickness

Samples:V0

V1V2V3V4

Monitoring Coating Thickness

Material: PET with coating


In-Line Coating after MDO / Monitoring after TDO

MDO-stretching TDO -Extrusion Coating stretching

dr. schenk

dr. schenk

1000 nm ~1.200 Graylevels (GL) => 1 GL~ 0,8 nm

Thickness after TDO: • Base film: 30 µm• Coating: 1000 nm

Coating after MDO, thickness 5 µm

dr. schenk


Homogeneity Map

Material: Plastic film, extrusion coating

AWD17314-0

Defect: Flow lines

Camera

RBF

RDF

Reflection Brightfield Reflection DarkfieldGray Image Homogeneity Map


Monitoring Adhesive Coating / Tapes

Material: Coated paper

Reflection Brightfield

Defect: Gloss variation

Camera

RBF


Film / Coating Properties Monitoring

Material: Battery electrode film

calandered area

not calandered area

Camera

RDF

Gra

yval

ue c

ount

Gra

yval

ue c

ount

Monitoring of calandering



Material: Plastic film

AWD17314-0Reflection Brightfield Reflection Darkfield

Defect: Missing adhesive

Camera

RBF

RDF


Adv

anta

ges

of A

OI

Cost reduction in converting

In-line quality check prior to subsequent process steps

Increased YieldContinuous monitoring of material/coating layer⇒ Process remains within process window

ConsistentPerformance 24 h/day + 7 days/week

ROI < 2 years Based on customer experience depending on various factors

Summary and Conclusion


Summary and Conclusion

Delivery to customer

RejectsProduction process

Quality data

Reports and statistics

Inlinequalitycontrol

Process parmameters

adaption

Process optimization

Inspection system

MES (ManagementExecution System)

PIs (Performance Indicators)


Thank you for your attention

Jochen KoenigManaging Director

Schenk VisionInspection Systems www.schenkvision.com

MIDA X, the Next Generation in Optical InspectionSlide Number 2Dr. Schenk – The Solution ProviderReady for Your ProjectProduction Line with In-Line Inspection Quality & Process Control for Coated MaterialsSystem ConfigurationMIDA: Single Camera – Multiple IlluminationsOne System – Two TasksSlide Number 10Inspection & Measurement of Plastic Films Inspection Results Base FilmInspection Results Base FilmInspection Results Base FilmSlide Number 15Examples for Defects and InhomogeneitiesInspection & Measurement of Plastic Films Inspection Results Coated FilmInspection Results Coated FilmInspection Results Coated FilmInspection Results Coated FilmInspection Results Coated FilmInspection Results Coated FilmInspection Results Coated FilmInspection Results Metallized Film MIDA → MIDA X: Closing the Intelligence GapMIDA X: Visual IntelligenceMIDA X: Visual IntelligenceDr. Schenk MCI TechnologyDr. Schenk MCI TechnologyOne System – Two TasksSlide Number 32Inspection & Measurement of Plastic Films Examples for Defects and InhomogeneitiesMonitoring Coating ThicknessIn-Line Coating after MDO / Monitoring after TDOHomogeneity MapMonitoring Adhesive Coating / TapesFilm / Coating Properties MonitoringInspection Results Coated FilmSummary and ConclusionSummary and ConclusionSlide Number 43Slide Number 44

mida x, the next generation in optical inspection how ...effect. solution: local defects. in base...

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