micron technology: i.mx 8 microprocessors driving
TRANSCRIPT
©2017 Micron Technology, Inc. All rights reserved. Information, products, and/or specifications are subject to
change without notice. All information is provided on an “AS IS” basis without warranties of any kind.
Statements regarding products, including regarding their features, availability, functionality, or compatibility,
are provided for informational purposes only and do not modify the warranty, if any, applicable to any
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property of Micron Technology, Inc. All other trademarks are the property of their respective owners.
Micron Technology: i.MX 8 Microprocessors
Driving Automotive Applications with
Micron Memory
Brian Zachrel, Micron FAE
August 16 2017
© 2017 Micron Technology, Inc.
Micron’s 25+ Year Commitment to Automotive
4
Quality First• Designed for automotive
• Automotive flow
Operational Excellence• 8D for non-conformities
• Continuous improvement
Automotive Compliance• ISO 26262 – ASIL
• TS 16949/AEC-Q100
• Long term product support
© 2017 Micron Technology, Inc.
$800
Micron
$250
Cypress
$183
Samsung
$155 ISSI
$134
Toshiba
$480 Other
Automotive Memory Providers
CY2016Source: Gartner 2017
Automotive Market Overview
Increasing memory footprint by application
Increasing memory consumption by OEM
5
Trends
2015
Infotainment & Connectivity
ADAS & Autonomous
Power Train & Other
2020 2025
1B$
2B$
3B$
4B$
5B$
6B$
Source: Micron Marketing
© 2017 Micron Technology, Inc.
ADAS/Autonomous Memory Bandwidth DriversL2 TO L5
*Source: IDC
Memory Bandwidth
50 to ~720GB/s
Memory Bandwidth
10 to ~300GB/s
Sense Perceive Act
© 2017 Micron Technology, Inc.
In Vehicle Experience (IVE) Cluster & Virtual Cockpit MEMORY BANDWIDTH DRIVERS
*Source: IDC
2025 Virtual Cockpit
9 - 11 X 4K Screens
~ 35 GB/s ~ 140 GB/s ~ 300 GB/s
2017 IVE3 x 1080p Screens
2020 IVE + Cluster3 X 4K Screens
2025 Virtual Cockpit9 - 11 X 4K Screens
Compatibility Guides
https://www.micron.com/solutions/micron-valued-partner-program/chipset-partner/nxp
© 2017 Micron Technology, Inc. | August 23, 20179
DRAM Market / Technical Details
© 2017 Micron Technology, Inc.
Automotive DRAM
DRAM Market Trends
– Increasing DRAM Usage
– Increasing DDR3 adoption at higher densities 2+Gb
DRAM Requirements
– Zero Defect Target Approach
Burn in required to lower DPM rate
Material selection for Auto grade devices
– Extended Operating Temperatures
From -40°C up to 125°C for next gen devices
– Formal Product Longevity Program (PLP)
11
© 2017 Micron Technology, Inc.
0%
10%
20%
30%
40%
50%
60%
70%
80%
90%
100%
CY15 CY16 CY17 CY18 CY19 CY20
0%
10%
20%
30%
40%
50%
60%
70%
80%
90%
100%
Auto DRAM Market Trends
12 | August 23, 2017
Source: Micron Marketing (March’17)
% i
n 1
Gb
eq
uiv
ale
nts
DDR4
DDR3
LPDDR5
GDDR
DDR2
LPDDR2
Legacy LPDRAM LPDDR4 8Gb
Legacy Std DRAM
Densities represent die (vs. package)
General Market
Automotive
General Market:
• DDR4 dominant interface for devices w/out batteries
• Increased LPDRAM adoption outside of mobile handsets
driven by Tablets & other Client apps
• LPDRAM shipments >50% of total market by the end of CY16
• DDR5/LPDDR5 adoption projected to start in late CY’19
Automotive:
• Continued need for legacy support
• DDR3 is the primary choice for current gen low cost
Infotainment and Cluster applications
• LPDDR4 will be the primary choice for next gen ADAS and
high-end Infotainment applications
% i
n 1
Gb
eq
uiv
ale
nts
Other
LPDDR4/xLPDDR3
DDR5
© 2017 Micron Technology, Inc.
Standard DRAM & LPDRAM Trade Offs
Standard DRAM LPDRAM
Form Factor Center bond pads for highest performance and lowest costEdge bond pads allow for stacked die for MCP and PoP packaging,
enabling compact form factors
Performance x4, x8, x16 is lower cost and supports higher density
configurations
x32 allows system to support high bandwidth
in point-to-point applications
DRAM powerIDD specifications are geared towards moderate stand-by power,
providing the highest yields and lowest cost
Ultra low standby power enabled by on-die power management and
long refresh rates
System powerAdditional Delay Locked Loop (DLL) circuitry required for high
performance which inhibits system power savings
Lack of DLL circuitry allows for improved system power management;
System can enter/exit power-down modes
as well as throttle or stop the clock
Key Takeaway Optimized for cost and performance;
cost is primary feature
Optimized for battery life and portability;
low power & smallest possible footprint
are primary features
LPDDR4 is a higher bandwidth solution vs. DDR4
• LPDDR4: Peak BW 34GB/s (2 x32 package)
• DDR4: Peak BW 25.6GB/s (4 x16 packages)
LPD
DR
4 S
pe
cifi
c In
foG
en
era
l LP
vs.
DD
R C
om
par
iso
n
LPDRAM offers additional value over standard DRAM
13
© 2017 Micron Technology, Inc.
LPDDR1/2/3/4/5 and DDR3/4/5 Feature Comparison
14 | August 23, 2017CQ1'15
LPDDR1 LPDDR2 LPDDR3 LPDDR4/4X LPDDR5 DDR3/DDR3L DDR4 DDR5Die Density Up to 8Gb Up to 16Gb Up to 32Gb Up to 32Gb Up to 32Gb Up to 8Gb Up to 16Gb (128Gb 8H) 16Gb +
Prefetch Size 2n 2n, 4n 8n 16n 16n/32n 8n 8n 16n
Core Voltage (Vdd) 1.81.35V (S4A) 1.2V 1.1V 1.05V/0.9V
1.5V/1.35V1.2V 1.1V
1.2V (S4B) 1.8V WL supply req. 1.8V WL supply req. 1.8V VccP Separate WL supply 2.5V 1.8V Vpp
I/O Voltage 1.8V, 1.2V 1.2V 1.2V 1.1V/0.6V 0.3V - 0.5V Same as VDD Same as VDD 1.1V
Max Clock Freq. /Data rate 200Mhz 533MHz/DDR1066 800MHz/DDR1600 2133MHz/DDR4267 10 - 800MHz/20-6.4Gbps 1066MHz/DDR2100 1600MHz+/DDR3200+ 3.2Gb/s-6.4Gb/s
Burst Lengths 2, 4, 8, 16 4, 8, 16 8 16, 32 16, 32 BC4, 8 BC4, 8 BC8/B16
Package Configuration x16, x32 x16, x32, x64 x32, x64 2Ch x16, 4Ch x16 1Ch x16 x4, x8, x16 x4, x8, x16 x4, x8, x16
Address/ Command Signals 22 pins
14 pins 14 pins 10 pins per channel 7 Pins
27 pins
29 pins 14 Pins
(Mux’d command
address)(Mux’d command address) (Mux’d command address) (Mux’d command address) (partial mux’d)
(Mux’d command
address)
On Die Temperature SensorSDR (rising edge
of clock only)
Double (both rising
and falling edges of
clock)
Yes Yes Yes Optional/RS Yes Yes
PASRfull, half, quarter-
arrayfull, half, quarter-array
individual bank and segment
masking for partial-bank
modes
individual bank and segment
masking for partial-bank
modes
Yes
optional feature only -
full, ¾, half, ¼, 1/8 array,
if supported
Removed by JEDEC(Partial-array self refresh)
optional partial-
bank modes forwith individual bank
and segment masking
for partial-bank modes
Segment masking only No
eighth and
sixteenth-array
Drive Strength
25-ohm (full)
37-ohm (3/4)*
55-ohm (half)
80-ohm (quarter)*
*JEDEC optional
34-ohm
40-ohm
48-ohm
60-ohm
80-ohm
120-ohm
ZQ cal for +/-10%
accuracy
34-ohm
40-ohm
48-ohm
ZQ calibration for +/-10%
accuracy
Low-voltage swing
terminated logic (LVSTL)
VSSQ terminated
LVSTL, VSSQ-terminated
40-ohm
48-ohm
60-ohm
80-ohm
120-ohm
240-ohm
34-ohm
40-ohm
ZQ calibration for +/-10%
accuracy
34-ohm
40-ohm
TBD-ohm
ZQ calibration for
+/-10% accuracy
TBD
ZQ calibration for
Per Bank Refresh NoYes
YesYes, with directed per-bank
refreshYes No
Fine Granularity Refresh
(1x, 2x, 4x)
Fine Granularity Refresh
(1x, 2x, 4x)(8-bank devices only)
Output Driver LVCMOS_18 HSUL_12 HSUL_12 LVSTL_11/LVSTL_10 “SSTL_15” POD_12 POD_1.1
DPD (Deep power-down
mode)Yes Yes Yes No No No No No
DLL/ODT No/No No/No No/Yes No/Yes No/Yes Yes/Yes Yes/Yes Yes/Yes
Alert Pin No No No No No No No Yes
Package OptionsKGD, BGA, POP,
MCPKGD, BGA, POP, MCP KGD, BGA, POP, MCP KGD, BGA, POP, MCP KGD, BGA, POP, MCP BGA BGA BGA
Temperature Grades WT, IT, AT WT, IT, AT, UT WT, XT only WT, XT, IT, AT, UT WT, IT, AT, UT CT,IT,AT CT,IT,AT CT,IT,AT
Updated: March’17
© 2017 Micron Technology, Inc.
DRAM Performance Improvements Over Time (IO x16)
15
0
5
10
15
20
25
30
35
40
45
50
55
2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017
Gb/s
DDR2
DDR2-5338.5 Gb/s
DDR2-66710.6 Gb/s
DDR2-80012.8 Gb/s
DDR3-106617 Gb/s
DDR3-133321.3 Gb/s
DDR3-160025.6 Gb/s
DDR3-186630 Gb/s
DDR4-213334 Gb/s
DDR4-240038.4 Gb/s
DDR4-266642.7 Gb/s
DDR4-320051.2 Gb/s
DDR3
DDR4
© 2017 Micron Technology, Inc.16
0
20
40
60
80
100
120
140
160
2010 2011 2012 2013 2014 2015 2016 2017 2018
LPDDR2-80025.6 Gb/s
LPDDR2-106634.11 Gb/s
LPDDR2LPDDR3-1600
51.2 Gb/s
LPDDR3-1866 59.712 Gb/s
LPDDR3
LPDDR4-3733119.4 Gb/s
LPDDR4-4266136.51 Gb/s
LPDDR4
LPDDR4-3200102.4 Gb/s
Gb/s
LPDDR4-3200102.4 Gb/s
LPDDR4 is
supported
by i.MX8
LPDDR Performance Improvements Over Time (IO x32)
Non-Volatile Details
© 2017 Micron Technology, Inc.
Non-Volatile Flash Memory Solutions
18
Comprehensive selection of
Densities, Technologies, and Product
Integration
Non-volatile solutions for code, application
data storage, and data logging
A leading manufacturer of NAND/NOR/MCPSerial/Parallel NOR
Managed NAND
(e.MMC & Cards)Multi-Chip Package
(MCP & PoP)
SLC/MLC/TLC NAND
Micron quality, Technical support
and Product Longevity
© 2017 Micron Technology, Inc.
D
S
G
D
S
G
D
S
G
D
S
G
Direct to read circuitry
NOR and NAND Feature Comparison
Xccela NOR Flash/ Serial NOR/Parallel NOR SLC/MLC/TLC NAND / Managed NAND
Lower density, low pin count (serial)
Ease-of-use
Reliable code and data storage
Fast read and random access times
Higher endurance and data retention
Higher density, low pin count
Requires controller management (SLC, MLC)
Mostly data-focused
Fast writes and erases
Focused on reliability and performance (SLC),
cost/GB(MLC), and reduce time-to-market (managed
NAND)
NVM architectures
NOR
– Each memory cell can be accessed
independent of the others
– Physical "contact" to each memory
location
NAND
– Memory cells are grouped in stacks
called “strings”
– Physical “contacts” to the cells are
reduced resulting in better cell
efficiency
D
S
G
D
S
G
Direct to read circuitry
"bitline"
© 2017 Micron Technology, Inc.
Automotive NOR Flash Applications
– Instant on/fast boot
– Execute-in-place (XiP)
SNOR Benefits
– x8 DDR serial protocol
Non-proprietary interface
Low 11 pin-count
– Industry leading: 400MB/s (200Mhz DDR)
– Automotive grade (-40 to 125C operation)
PNOR Benefits
– Performance
– High Density up to 2Gb
– Reliability
100PE cycles, Auto quality and support.
Automotive grade (-40 to 105C operation)
© 2017 Micron Technology, Inc.
Serial NOR Flash
Ideal for code storage and execution
– Fast XiP performance, fast random access times, and ultra-fast sequential byte access times
– An entire 1-Gbit of memory can be read in a mere 0.3 seconds!
– Program/Erase Suspend and Resume to aid in concurrent read-while-write operations
Ideal for data storage
– Byte/page program and 4KB Block Erase architecture for flexible data manipulation
Advanced sector protection
– Protect critical boot/program code from erroneous or malicious writes
– Protect critical configuration data and user data
Low pin-count solution to reduce SoC pin-counts, simplify PCB routing, and save board
space
21
© 2017 Micron Technology, Inc.
Xccela™ Flash: Best of Parallel and Serial NOR Flash
22
512Mb
Quad-SPI
MT25Q
512Mb
Twin-Quad
MT25T
512Mb
Xccela Flash
MT35X
Bandwidth90MB/s
(90MHz, DDR mode)
180MB/s
(90MHz, DDR mode)
400MB/s
(200MHz, DDR mode)
Initial Word
Access Time
139ns (1.8V, 4-bit)
157ns (1.8V, 16-bits)
139ns (1.8V, 8-bit)
145ns (1.8V, 16-bit)
85ns (1.8V, 8-bit)
87.5ns (1.8V, 16-bit)
Subsequent
Word Access
6ns (4-bits)
24ns (16-bits)
6ns (8-bits)
12ns (16-bits)
2.5ns (8-bits)
5ns (16-bits)
Package and Pins24-BGA (6x8mm)
6 Active Pins
24-BGA (6x8mm)
11 Active Pins
24-BGA (6x8mm)
11 Active Pins
Energy Per Bit 41 pJ/bit 41 pJ/bit 28 pJ/bit
Xccela™ Flash(MT35X)
Parallel NOR FlashHigh performance
Fast bootReliability
Serial NOR FlashReduced pin countsSimple PCB design
ReliabilityNeed more
performance with same package
Want reduced pin count/package size
Xccela is
supported
by i.MX8
© 2017 Micron Technology, Inc.
Micron Embedded NOR Solutions RECOMMENDED FOR NEW DESIGNS
(INCLUDING FUTURE PRODUCTS THROUGH 2018)
23 | | August 23, 2017
* Some densities are DDP and QDP configurations.
128Mb 256Mb 512Mb 1Gb 2Gb
Xccela™ Flash
Xccela™ Flash
Octal 3V
Xccela™ Flash
Octal 1.8V
Serial (SPI)
Twin-Quad Serial
3V
Twin-Quad Serial
1.8V
Quad-Serial
3V
Quad-Serial
1.8V
ParallelParallel
3V
MT25Q
MT28EW
MT25Q
MT35X
MT35X
MT25T
MT25T
© 2017 Micron Technology, Inc.
Faster than any other Flash solution for direct XiP code execution
MT35X leaves other Flash behind the more you sequentially read from it
Micron’s MT35X Has the Ultimate Performance
24
XiP
Bytes Per Fetch
MT35X
Tra
nsf
er
Rate
(M
B/s
ec)
Random Read Performance vs. Data Access Size
© 2017 Micron Technology, Inc.
Simplify System Design and Save Valuable Board SpaceSMALL FOOT PRINT 4X FEWER PINS & 2X SMALLER PACKAGE THAN OTHER FLASH MEMORY
25 | August 23, 2017
(50 active pins) (25 to 50 active pins) (11 active pins)
FBGA-64 (13x11mm)
TSOP-56 (14x20mm)
TBGA-64 (8x10mm)
TBGA-24 (6x8mm, 5x5 array)
MT28EW MT28G (G18) Xccela™ Flash (MT35X)
© 2017 Micron Technology, Inc.
Automotive SLC NAND Flash
Trends
– Infotainment/cluster fusion
– Smart car systems—Advanced Driver Assistance Systems
(ADAS)
NAND Flash Requirements
– Cost-effective for higher-density code storage
– Simplified architecture reduces controller cost and pin count
– 105C support, 100K P/E @85C, 60K P/E @105C
– 10Yr DR @85C (uncycled)
– Security features, On-Die ECC
– Streamlined PCB design with low pin-count and BGA packages
16-Pin SOP
24-Ball BGA
| August 23, 201726
| Micron Confidential
© 2017 Micron Technology, Inc.
25nm M78A/M79A SLC NAND Flash
Wide Applications: Consumer, DTV, Wearables, Set-top-
box, Automotive Infotainment
Complete Portfolio: SPI, Parallel, 1.8V, 3.3V, IT and Auto
grade
Reliability : 100K PE and 10 year uncycled data retention
High Performance: Faster Read with 133Mhz (3V, 1-1-4
mode) Faster Write Performance
Ease of use: SPI enables simpler system design with less
overhead
27
Features Micron SLC
NAND Flash
On-die ECC
Parallel & SPI interface
1.8V & 3.3V support
Wide temperature
offerings
Security features
High Performance
Ease of Use
Low/mid density offerings
August 23, 2017
© 2017 Micron Technology, Inc.
SPI NAND Flash BenefitsSIMPLE AND SMALL FOR MID-DENSITY NEEDS
SPI
NOR
Parallel
NAND
Flash
SPI
NAND
Flash
e.MMC
Unit Price
Pin count 8 23 8 15
Package
size
48mm2 240mm2 48mm2 149.5m
m2
DFN 6x8mm
(8 active pins)
48mm2240mm2
|| August 23, 201728
• Competitive SPI NAND pricing
•Ease of use due to simple design
•Small form factor and serial packages
© 2017 Micron Technology, Inc.
Automotive e.MMC
Market Trends
– Managed NAND for code and data storage
– Simplified management: No need for complicated
external NAND controller
– High speed
– Boot option for code execution
e.MMC Requirements
– Quality Approach
Automotive methodology flow
AEC-Q Grade 2 and AEC-Q Grade 3
– Extended Operating Temperatures
© 2017 Micron Technology, Inc.
• Eliminates company
specific NAND
customization
• Boot functionality
managed within e.MMC
Linux/Android support
• Utilizes industry
standard MMC bus
• Compatible with
previous e.MMC
versions
• Standard packages
• ECC, Wear leveling,
Block management
• Performance optimized
within e.MMC
controller
Internal
NAND Management
Simplified
Hardware
Design
Simplified
Software
Design
Standardized
Interface
Decreased
Time to
Market
e.MMC Advantage
Designers of next-generation embedded processors must meet the increasingly complex
ECC & data management requirements of future MLC NAND Flash devices
MANAGED NAND DEVICES OVERCOME THESE CHALLENGES
30
© 2017 Micron Technology, Inc.
Raw NAND for application “expert” with NAND data
management and ready to support ECC needs.
eMMC interface for application that want to offload by any
NAND data management with a standard interface.
Serial NAND for application requiring high density with
Serial protocol.
ECC NAND for application that do not want to change the
ECC with the NAND litho shrink.
NAND system solutions for Industry
Raw NAND
Host Controller I
NAND Interface
LLDECCFTLNAND BUS
ECC NANDHost Controller II
NAND Interface
LLDFTLNAND BUS ECC
eMMC
NANDECC
FTL
Host Controller IV
eMMC Interface
LLD
MMC BUS
SPI
ECC
Host Controller III
SPI Interface
LLD
SPI BUS
FTL
eUSB interface for application that want to offload by any
NAND data management with a standard interface.
eUSB NAND
ECC
FTL
Host Controller V
eUSB Interface
LLD
USB BUS
LLD = Low Level Driver ECC = Error Correction Code FTL = NAND Scheduling Logical Mapping, Bad Block Management, Wear Leveling
© 2017 Micron Technology, Inc.
Raw NANDECC NAND
(On-Die ECC)
Fully Managed
(eMMC)
Complexity of Customer
Development (NAND Management by Host)
High Med Low
New Product
Qualification (Complexity & Effort)
High Med Low
Relative Cost Low Med Med +
Level of Management by NAND Solution
Level of Management by NAND solutionsTRADE OFFS BETWEEN COMPLEXITY, QUALIFICATION EFFORT & COST
© 2017 Micron Technology, Inc.
e.MMC Fully Managed NANDPROVIDES REDUCED DESIGN EFFORT FOR MINIMAL COST
33
NAND
Wear leveling
ECC
Driver
NAND Controller
Raw NAND
ONFI NAND
bus
Command/Block
Management
Low-level Driver
NAND Controller
Fully Managed NAND (e.MMC)
MMC , SATA
or USB bus
NAND
Wear leveling,
CMD/Block
Mgmt, NAND
Error Mgmt
Controller
e.MMC, e.USB
SATA, & CF
Cost
& Price
Ease of design
& Validation
© 2017 Micron Technology, Inc.
Performance consideration for system solutionsRAW NAND, ECC NAND AND EMMC REQUIRE DIFFERENT MANAGEMENT SOFTWARE
THE CORRECT PERFORMANCE EVALUATION IS AT SYSTEM
LLD = Low Level Driver ECC = Error Correction Code FTL = NAND Scheduling Logical Mapping, Bad Block Management, Wear Leveling
Device Throughput
Raw NAND
eMMC
ECC
FTL
On-Die ECC
NAND
ECC
Host Controller I
NAND Interface
FTL ECC LLD
Host Controller II
NAND Interface
FTL LLD
Host Controller III
eMMC Interface
LLD
NAND BUS
NAND BUS
eMMC BUS
© 2017 Micron Technology, Inc.
Performance consideration for system solutionsRAW NAND, THE EVOLUTION OF EMMC 5.0 (400MT/S PHY) IMPROVES PERFORMANCE
CAPABILITIES
LLD = Low Level Driver ECC = Error Correction Code FTL = NAND Scheduling Logical Mapping, Bad Block Management, Wear Leveling
Device Throughput
Raw NAND
eMMC
ECC
FTL
On-Die ECC
NAND
ECC
Host Controller I
NAND Interface
FTL ECC LLD
Host Controller II
NAND Interface
FTL LLD
Host Controller III
eMMC Interface
LLD
NAND BUS
NAND BUS
eMMC BUS
© 2017 Micron Technology, Inc.
Automotive SSD Market Trends
Applications
– Infotainment systems
– Self Driving Cars
– Data recording
SSDs are ideal for local storage
of important software and data
in self-driving cars
Differentiating performance
Scalable to larger capacities
Low power consumption
Higher reliability and robustness across
automotive temperature range
© 2017 Micron Technology, Inc.
Transition from HDD to SSD is Economically Justifiable
$0
$50
$100
$150
$200
$250
$300
$350
$400
$450
$500
1 2 3 4 5 6 7
Enterprise Client Industrial Total cache SSD Average
AVERAGE HDD ASPS ARE ESTIMATED TO INCREASE AT A 5.7% CAGR OVER 2016-2021
37 || August 23, 2017
SSD ASP ($) by Application
$0.00
$20.00
$40.00
$60.00
$80.00
$100.00
$120.00
$140.00
$160.00
1 2 3 4 5 6 7
Enterprise Client Nontraditional/CE Total
HDD ASP ($) by Application
Source: IHS Q1 2017 SSD and HDD Storage Market Tracker
© 2017 Micron Technology, Inc.
SSD Form Factors
Parameter 2.5” mSATA M.2 (PCIe) µSSD (PCIe)
Capacities (GB) 60/120/240 60/120/240 256/512/1024 128/256/512
Specification EIA-720 MO-300B,
variation A
PCIe M.2 Spec.
Rev. 1.1
PCIe M.2 Spec.
Rev. 1.1*
Dimensions (L) 100.45 mm
(W) 69.85 mm
(H) 7 mm
(L) 50.80 mm
(W) 29.85 mm
(H) 3.75 mm
(L) 30 mm
(W) 22 mm
(H) 1.5 mm
(L) 20 mm
(W) 16 mm
(H) 1.5 mm
Weight < 70g < 10g < 10 g < 10 g
EXISTING AND FUTURE DIRECTIONS
38 || August 23, 2017
Form Factors
– 2.5”, mSATA, M.2, µSSD (BGA)
Interfaces
– SATA III
– PCIe
Product Longevity
Yearly firmware updates
*Type 1620 ball-out
© 2017 Micron Technology, Inc.
Why Micron?TRUSTED PARTNER OF THE WHOLE AUTOMOTIVE ECOSYSTEM
Automotive Mindset• 25+ years of auto
commitment
• Global Customer Labs
• Dedicated technical
team
• No competition with
our customers
High Quality Solution• Optimized for
automotive quality
• One stop shop - full
suite of volatile and
non volatile memories
• Continuous
improvement
Leading Edge Products• High-bandwidth DRAM
solutions
• Comprehensive storage
solutions
• Fast boot FLASH
memory
Long Term Support• Formal product
longevity program
• Extended product
change transition
phases
© 2017 Micron Technology, Inc.
DRAM Products
RLDRAM – Ultra low latency for high-speed networking
• RLDRAM3 in production
• RLDRAM2 long term support in place (no planned
EOL)
HMC – Massive Parallelism and Bandwidth enables high-
speed packet buffering
• Customer designs underway for 2015 launch
DDR3/DDR4 – Cost effective high volume solutions
• Highest speed DDR3s – NOW
• DDR4 sampling NOW
DDR2/DDR/SDR – Long-term support assured to match
customer’s long product life cycle (no planned EOLs)
RLDRAM
HMC
DDR3/4
DDR2/DDR/SDR
41
© 2017 Micron Technology, Inc.
DRAM Modules
42
(ECC) SODIMM
VLP RDIMM
FBDIMM/LRDIMM
(ECC) UDIMM
RDIMM
Mini-DIMM
Long-term product support & supply consistency with modules
direct from leading DRAM manufacturer
(>60% of Micron DRAM shipped in the last 3 years was on
modules)
Industry’s most comprehensive module portfolio (including DDR2
and DDR3) with focus on Networking preferred form factors
Original, superior-grade DRAM components with extensive
qualification testing
(including IT grade components)
Micron quality and technical support including dedicated resources
for module design and system compatibility testing
Global manufacturing and operations to maximize flexibility and
responsiveness
© 2017 Micron Technology, Inc. | August 23, 201743
| Micron Confidential
-IT -AIT/-AAT
QU
ALIT
Y &
RELIA
BIL
ITY
Temperature Range -40 to +85°C
AIT: -40 to +85°C
AAT: -40 to +105°C
Qualification Spec Reference JESD47 AECQ100
Zero Defect Approach No
Yes, according to AEC-
Q100
(SYA, PAT,CHAR …)
Material Selection for Eligibility to Automotive No Yes
PPM Quality Agreement No Can be negotiated
ISO/TS-Certified Fab and Assembly Location Not guaranteed Yes
SER
VIC
E &
SU
PP
OR
T
8D for Failure analysis (including 5Whys)
response
Not guaranteed
standard report
Yes, according to 1-2-10
rule
PPAP Submission No Yes
Supply Prioritization No Yes
Buffer Stock/CMI/VMI No Can be negotiated
Documentation Support (Questionnaire)
Submission of Micron‘s Internal
Qualification and Reliability Report
under NDA
Full Questionnaire
Support
Fab and Assembly Audit Support ISO 9001 (limited) ISO/TS-16949 (full)
Xccela™ Flash Satisfies Auto Reliability and TemperatureOpen Standard
Ultra Fast NVM
Small Pin Count/ SPI
Compatible
Lowest Energy Per BitRich Security Features
Auto Quality
© 2017 Micron Technology, Inc.
Single Level Cell vs. Multi-Level Cell
SLC
– 1 physical bit = 1 data bit
– Cell either programmed or erased
– Higher performance
– SLC NAND more reliable than MLC NAND
MLC
– 1 physical bit = 2 data bits
– 3 bit per cell technology for some NAND
– Cells partially programmed
– Lower performance
– Higher density and lower cost per MB
© 2017 Micron Technology, Inc.
NAND technology challenges
How to manage the ECC requirements?
– NAND controllers with high ECC capability
– ECC NAND managed solutions
on-die ECC
– Fully managed solutions
eMMC, eUSB, others
How to manage lower Endurance?
Understand the application and usage model
– How does the file system work?
– How often are you programming?
– How big is the data file/s?
– What is the PLC of your system?
INTERSECTING YOUR PROJECT AND THE MEMORY TECHNOLOGY IS KEY TO SUCCESS!
Determines PE Cycles and Density Required
© 2017 Micron Technology, Inc.
Broad Market e.MMCINTERFACE SIGNALS
August 23, 2017
CLK
CMD
DAT[7:0]
VCC
VSS
VCCQ
VSSQ
RST_n
NAND (ONFI)
ALE
CLE
CE#
RE#
WE#
WP#
I/O[7:0]
R/B#
VCC
VSS
15 signals
+
2 power lines
10 signals
+
4 power lines
+
HW reset
e.MMC
© 2017 Micron Technology, Inc.
CPU or Chipset
NAND
Flash
DQ
7:0
Co
ntro
l Pin
s
R/B
#
DQ
15
:8
x1
6
x8
& x
16
AD
V
CPU or Chipset
eMMC 5.0
DQ
15
:0
A M
ax
:0
Co
ntro
l Pin
s
WA
IT
W#
/Vp
p
CPU or Chipset
Serial
NOR x1
Ho
ld#
DO DI
DQ
2
CPU or Chipset
Serial
NOR x4
DQ
3
DQ
1
DQ
0
X8 X16
14 22
Interface X1
# of pins 6
X4
6
Interface Speeds (Max)
250MB/s 50-100MB/s 13MB/s 66MB/s
X8
15
Flash Architectures – Component LevelALL ARCHITECTURES HAVE THEIR ADVANTAGES
TREND IN THE INDUSTRY MOVING TOWARD THE LOWER PIN COUNT ARCHITECTURES
© 2017 Micron Technology, Inc.
Density Needs for Boot Memory
© 2017 Micron Technology, Inc.
©2014 Micron Technology, Inc. | 49
DRAM product attributes
• Many different types
• Fast read performance
• Fast writes
• Leading edge requires many conversions
Discrete
• Common standards
• Common packages
• Many levels in a single system
Module
• Higher density reach
• Easier conversions/migrations
• Standards and custom options
• ECC management enabled
© 2017 Micron Technology, Inc.
Freq. Range
(MHz)
Bus Width (per
device)
Max.
Bandwidth
(burst rate)
Transfer rate per pin Density Row Cycle
Time (tRC)
Max Power
SDRAM 100-200 x4, x8, x16, x32 400 MB/s 100-200Mb/s 64Mb - 512Mb 66ns 1W
DDR1 100-200 x4, x8, x16 800 MB/s 200-400Mb/s 128Mb-1Gb 60ns 1W
DDR2 200-400 x4, x8, x16 1.6 GB/s 400-800Mb/s 256Mb-2Gb 55ns 700mW
DDR3 400-1066 x4, x8, x16 3.2 GB/s 800-1600Mb/s 1Gb, 2Gb 48ns 500mW
DDR3L 400-800 x4, x8, x16 3.2 GB/s 800-1600Mb/s 1Gb, 2Gb 48ns 440mW
DDR4 667-1600 x4, x8, x16, x32 12.8 GB/s 1333-3200Mb/s 4-8Gb TBD<45ns TBD-330mW
LPDDR 100-167 X16, x32 667 MB/s 200-333Mb/s 128-512Mb 45-50ns 150-230mW
LPDDR2 333-400 X16, x32 2.1 GB/s 667-1066Mb/s 2-8Gb 55ns 200mW
• Technology migration (SDRDDRDDR2DDR3DDR4) has improved on power/Bandwidth/density
• LPDRAM can offer better system standby power, but requires a price trade-off consideration
DRAM Active Power
August 23, 2017
Compatibility Guides
https://www.micron.com/solutions/micron-valued-partner-program/chipset-partner/nxp
© 2017 Micron Technology, Inc. | August 23, 201752
Automotive
© 2017 Micron Technology, Inc.53
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