metrology · 2017-10-16 · calibration • both metrology and calibration laboratories must...

Metrology

Kirk Arndt, Purdue University

Greg Derylo, Gordon Gillespie, Jorge Montes,

FNAL

EDIT 2012 - Fermilab 1

Metrology

• Metrology is the science of measurement.

• A core concept in metrology is metrological

traceability, usually obtained by calibration, to validate the data obtained from measuring equipment.equipment.

• Calibration is the process where metrology is applied to measurement equipment and procedures to ensure conformity with a known standard of measurement, usually traceable to a national standards board.


Calibration

• Both metrology and calibration laboratories

must isolate the work performed from

influences that might affect the work.

• Temperature, humidity, vibration, electrical • Temperature, humidity, vibration, electrical

power supply, radiated energy and other

influences are often controlled.

• Metrology and calibration work is always

accompanied by documentation.


Dimensional Metrology

• Modern measurement equipment includes hand tools (i.e. caliper and micrometer), CMMs (Coordinate-Measurement Machine), machine vision systems, laser trackers, and optical comparators.

• A CMM is based on CNC technology to automate • A CMM is based on CNC technology to automate measurement of Cartesian coordinates using a touch probe, contact scanning probe, or non-contact sensor.

• Data is collected and compared to a print, illustrating crucial features. Prints can be hand drawn or automatically generated by a CAD model.


CMM Usage

• CMMs can be used with different purposes:

– Measure the geometry of a completed detector

component or assembly. The data can then be

used to create a more accurate mathematical

model of positions within the detector.model of positions within the detector.

– Use the CMM to actively aid in component

construction, using its measurement accuracy to

place parts precisely during fabrication. Example

follows:


Actively Using CMMs During Fab.

• CDF Run2B Stave Example:

– Stave has 3 axial modules on one

face and 3 small-angle stereo

modules on the other

– STEREO modules are not in the

trigger. Their position must be

measured but since fast math is

not needed they do not need to

be accurately alignedbe accurately aligned

• Position set mechanically (edges

against pins, pins engage holes, etc.)

• Angular misalignment abt. +/- 500

microradians

– AXIAL modules are in the trigger

so they must be accurately

aligned in order to

accommodate fast math

decisions

• CMM used to guide module positions

during installation onto a stave

• Angular misalignment abt. +/- 40

microradians


Zeiss CMM with optical probe

• Demonstrate:

– Building part coordinate system, compare with machine coordinates

– Aligning “IC chip” to “silicon sensor” using manipulator




• Demonstrate:– Use of joystick to manually acquire locations of

fiducial targets

– Use of program control to move to desired locations

– Use of glass optical target centered on metal post to relate non-contact to touch probe measurements

OMIS II Vision Measurement

• Example of silicon sensor fiducials in a finished (D0 strips endcap) module

• Use of glass scale to check linear measuring accuracy



• Students perform hands-on measurement of precision gauge blocks using joystick control

• Compare measured length with certified length of gauge blocks (grade 2 tolerance = +/-1 micron on deviation of measured central length)


CMM Calibration Equipment

• Explain:

– use of large glass scale to periodically check accuracy of 2-D optical measurements on the CMMs

– use of ball bar for volumetric and traceable evaluation of CMM measurement errors using a touch probe

– use of master ball for calibration of probe stylus diameter


OGP measurement of CLEO III ladder

• Demonstrate:– Constructing part coordinate system using fiducial

markings at ends of sensor ladder

– Semi-automatic acquisition of X- and Y-axis measurement points using pattern recognition and Z-axis measurements using auto-focus


Pattern recognition

• Demonstrate programming to automatically acquire X-and Y-axis measurement points = intersection of fiducial edges found using pattern recognition


Auto focusing

• Demonstrate automatic Z-axis measurements using auto-focus function

• Program automatically acquires 60 X-Y-Z measurement points along ladder (6 points per sensor x 10 sensors), saved in a text file


Data and analysisEdit_School_Ladder.RTN02:13:1213:45:11

S1-1 X -0.002 Y -13.128

S1-2 X 0.002 Y 13.128

S1-3 X 49.313 Y -13.131

S1-4 X 49.315 Y 13.124

S2-1 X 53.288 Y -13.132

S2-2 X 53.288 Y 13.123

S2-3 X 102.604 Y -13.131

S2-4 X 102.603 Y 13.122

S3-1 X 106.597 Y -13.126

S3-2 X 106.599 Y 13.129

S3-3 X 155.911 Y -13.131

S3-4 X 155.912 Y 13.124

S4-1 X 159.896 Y -13.138

S4-2 X 159.893 Y 13.118

S4-3 X 209.212 Y -13.133

S4-4 X 209.208 Y 13.122

S6-1 X 266.485 Y -13.134

S6-2 X 266.484 Y 13.123

S6-3 X 315.802 Y -13.133

S6-4 X 315.8 Y 13.122

S7-1 X 319.783 Y -13.132

S7-2 X 319.782 Y 13.124

-15

-10

-5

0

5

10

15

0 100 200 300 400 500 600

Y-a

xis

(m

m)

X-axis (mm)

fiducial locations


• Discuss analysis of measurement data to describe the shape of and interrelationship between parts (i.e. ladder sensors)

• Show Excel plots of X, Y measurement points in the ladder X-Y plane, and Z-axis measurement points and linear fit along ladder near edge, centerline, and far edges, and OGP software reported flatness and straightness (see next slide)

S7-2 X 319.782 Y 13.124

S7-3 X 369.098 Y -13.133

S7-4 X 369.096 Y 13.123

S9-1 X 426.386 Y -13.13

S9-2 X 426.383 Y 13.125

S9-3 X 475.7 Y -13.125

S9-4 X 475.697 Y 13.13

S10-1 X 479.677 Y -13.132

S10-2 X 479.677 Y 13.124

S10-3 X 528.987 Y -13.128

S10-4 X 528.987 Y 13.128

Flatness Grid Points

X -0.023 Y -13.138 Z -0.027

X 49.309 Y -13.14 Z -0.012

X 53.288 Y -13.127 Z -0.009

X 102.6 Y -13.142 Z -0.002

X 106.598 Y -13.121 Z -0.002

X 155.908 Y -13.137 Z -0.017

X 159.892 Y -13.133 Z -0.019

X 209.209 Y -13.137 Z -0.012

X 213.201 Y -13.118 Z -0.013

X 262.488 Y -13.128 Z -0.02

X 266.482 Y -13.123 Z -0.001

X 315.804 Y -13.125 Z 0.011

X 319.776 Y -13.144 Z 0.015

X 369.103 Y -13.123 Z 0.021

X 373.092 Y -13.132 Z 0.022

X 422.393 Y -13.136 Z 0.02

X 426.389 Y -13.124 Z 0.022

X 475.707 Y -13.117 Z 0.025

X 479.674 Y -13.139 Z 0.028

X 528.992 Y -13.144 Z 0.03

X 0.01 Y 0.005 Z 0.012

X 49.313 Y -0.008 Z 0.014

X 53.291 Y 0.009 Z 0.017

X 102.605 Y -0.01 Z 0.02

X 106.601 Y 0.009 Z 0.018

X 155.912 Y -0.009 Z 0.007

X 159.897 Y 0.011 Z 0.007

X 209.211 Y -0.011 Z 0.004

X 213.201 Y -0.009 Z 0.003

X 262.497 Y -0.007 Z -0.007

X 266.444 Y -0.007 Z 0.003

X 315.807 Y 0.006 Z 0.017

-0.03

-0.02

-0.01

0

0.01

0.02

0.03

0.04

0 100 200 300 400 500

Ax

is T

itle

Axis Title

focus points (near edge) Linear (focus points (near edge))

0

0.01

0.02

0.03

0.04

Ax

is T

itle

focus points (centerline) Linear (focus points (centerline))


X 315.807 Y 0.006 Z 0.017

X 319.783 Y -0.006 Z 0.017

X 369.1 Y 0.01 Z 0.021

X 373.098 Y -0.011 Z 0.02

X 422.397 Y -0.009 Z 0.019

X 426.392 Y -0.01 Z 0.017

X 475.705 Y 0.007 Z 0.016

X 479.676 Y -0.008 Z 0.015

X 528.993 Y -0.011 Z 0.023

X -0.004 Y 13.123 Z 0.026

X 49.321 Y 13.116 Z 0.029

X 53.281 Y 13.119 Z 0.029

X 102.61 Y 13.118 Z 0.027

X 106.567 Y 13.155 Z 0.024

X 155.917 Y 13.118 Z 0.016

X 159.882 Y 13.121 Z 0.016

X 209.213 Y 13.115 Z 0.002

X 213.2 Y 13.118 Z 0.001

X 262.497 Y 13.117 Z -0.022

X 266.481 Y 13.119 Z -0.009

X 315.794 Y 13.124 Z 0.002

X 319.779 Y 13.117 Z 0.002

X 369.093 Y 13.121 Z 0.002

X 373.1 Y 13.118 Z -0.001

X 422.402 Y 13.117 Z 0

X 426.383 Y 13.113 Z -0.006

X 475.701 Y 13.127 Z -0.015

X 479.673 Y 13.116 Z -0.016

X 528.987 Y 13.121 Z -0.025

60 Point Best Fit Plane FLT +0000.064

Sensor Straightness Near Edge STR +0000.013

Sensor Straightness Far Edge STR +0000.012

-0.03

-0.02

-0.01

0

0 100 200 300 400 500

Ax

is T

itle

Axis Title

-0.03

-0.02

-0.01

0

0.01

0.02

0.03

0.04

0 100 200 300 400 500

Ax

is T

itle

Axis Title

focus points (far edge) Linear (focus points (far edge))

Contour plots

• Show contour plots made from all X-Y-Z measurement points

• 3-D plot shows ladder is twisted, but not bowed

• Discuss how measurement results (both electrical and dimensional) used for Quality Control, and to grade parts to determine which are best for installation in the experiment


Backup slides


CLEO III Silicon Vertex

Detector (Si3)

Purdue responsibilities:

• Mechanical design and engineering

• Assembly of silicon strip ladders using CVD diamond for support, wire bonding, module testing

• Kinematic mounting of ladders on end cones

• Cooling system

• Transportation to Cornell, SVX installation into CLEO

CLEO III SVX ladders – alignment precision

Location of individual sensors in all ladders <15

20

-0.04 -0.20 0 0.02 0.04

distance (mm)

25

20

15

10

5

0

# o

f m

easu

rem

en

tsLocation of individual sensors in all ladders <15

microns deviation from ideal

CLSO Si3 Mechanical Challenges

• Silicon Ladders

– Outer layer 53.3 cm long – one of the longest ladders constructed for a collider geometry

– Precision assembly of wafers over length <15 micron

– Natural frequency >100HZ and self deflection <25 micron

– CTE match between support beam and silicon

21

– CTE match between support beam and silicon

– Electrical compatibility between support beam and silicon

• Conical end supports

– Precision location of ladders to <75 microns

– Mounting locations for hybrid electronics and cables

– Thermal management of hybrids (500 watts)

• Kinematic mounting

– Isolate ladders from end supports to mitigate forces due to external loads (i.e. transport) or thermal changes

Silicon Ladder Assembly• Pick-and-place machine with 6-axis adjustment

used to align arrays of wafers on 10 micron flatness fixtures. Epoxy applied to the joints between wafers after alignment

• Ladders aligned and mounted on end cones with custom placement tools

• Optical probe mounted on CMM with 3 micron accuracy over 1m x 0.7m x 0.5m volume used to locate wafers and ladders.

22

Silicon Ladder Support• Beam geometry

– Several considered (side rails, vertical strip, tubes, V-beam)

– A closed geometry was chosen to provide torsional stiffness. The V-beam geometry is easily constructed from sheet materials and makes use of the stiffness of the silicon which closes the triangular beam section.

• Beam material– Many materials (Be, SiC, carbon fiber & Kevlar

composites) evaluated for stiffness, radiation

23

composites) evaluated for stiffness, radiation length and CTE match to silicon

– CVD diamond was a clear winner for CTE and stiffness, as well as being an electrical insulator and excellent thermal conductor.

Kinematic mountsCustom wave spring loaded “clips”

for kinematic mounting ladders to conic end supports

Ball-in-socket joint

and crossed pins at

one end of ladder

24

one end of ladder

Pin on two balls at

other end of

ladder

metrology · 2017-10-16 · calibration • both metrology and calibration laboratories must...

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