measurement of transmission and reflectance of pv materials and cells

8/9/2019 Measurement of Transmission and Reflectance of PV Materials and Cells

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Measurement ofTransmissionand Ref lectance ofPV Mater ia ls and Cel ls

Shimadzu

UV-VIS-NIR Spectrophotometers

C101-E114


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Solar cell manufacturing plants are constantly seeking higher conversion efficiency. For this reason, the evaluation

of transmission and reflectance by a spectrophotometer at a specific wavelength region is required.

The SolidSpec-3700/UV-3600 are held in high regard by major solar cell manufacturers around the world for their

role in the development of solar cell materials, cells and modules, and also for ensuring of consistent quality in

mass production.

SolidSpec-3700/UV-3600 Play Important Roles

Thin-Fi lm Si Solar Cel l

a-Si/uc-Si spectral absorption coefficient

Transmission of glass substrates with TCO

Back electroden-type microcrystalline Si

i-type microcrystalline Si

p-type microcrystalline Si

n-type a-Si

i-type a-Si

p-type a-Si

TCO

Glass substrate

Crystal l ine Si Cel l Solar Cel ls

Verification of effectiveness of anti-reflective film

Dye-Sensit ized Solar Cel l

Transmission and Reflectance Measurement of Solar Cel l Materials

Spectral absorption coefficient of TiOz electrodes after dye adsorption

Transmission of glass or polymer substrates with transparentconducting film

• Glass or polymer substrate with TCO • Cover glass • EVA film

CIGS Solar Cel ls

Transmission of transparent conducting film (ZnO: Al or B doped)

Spectral absorption coefficient of photoelectric transfer layer

ZnO (Al or B doped)Buffer layer

CIGSSMo back electrodeGlass substrate

Glass or polymer filmTransparent conducting film

PlatinumElectrolyte

Titanium oxide electrodeTCO

Glass or polymer film

F

r o n t

e

l e c t r o d e

F

r o n t

e

l e c t r o d e Anti-reflective film

n-type Si

p-type Si substrate

p+ layerBack electrode


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olidSpec-3700 Reduces Measurement Workload and Achieves More Eff icient Analysis

olar Cell Manufacturing Processes

The large sample compartment enables non-destructive measurement of large samples up to

700 mm x 560 mm.

(1) Samples are easy to place.

The optional Automatic X-Y Stage enables samples to be moved to specified positions so that multiple points

can be measured automatically.

(2) Measurement workload at mult iple specif ied points can be reduced.

Attachment of the Variable Angle Absolute Specular Reflectance Measuring Device enables samples to be

measured at any angle of incidence without swapping accessories.

(3) Workload when changing measurement angle of incidence can be reduced.

560mm

700mm

Conventional

methods

SolidSpec

to


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Ideal for Evaluations of Solar Cell Manufacturing Processes and Materia

Large Sample Compartment Model SolidSpec-3700High Sensit ivi ty – World’s First* UV-VIS-NIRSpectrophotometer with Three Detectors

SolidSpec-3700Sample Compartment

Relationship Between Detectors and Measurable Range (Common to Both SolidSpec-3700 and UV-3600)

Detectors Optical System

Three Dimensional Optical Path

A photomultiplier tube (PMT) detector is used for the ultraviolet and visible

regions, while an InGaAs detector and a cooled PbS detector are used for the

near-infrared region. Use of the InGaAs and PbS detectors makes the sensitivity

in the near-infrared region significantly high.

The PMT detector can be switched to the InGaAs detector in the range of 700 nm to 1000 nm (the default switching wavelength is 870 nm).

The InGaAs detector can be switched to the PbS detector in the range of 1600 nm to 1800 nm (the default switching wavelength is 1650 nm).

Ultra-Large Sample Compartment –Wide Variety of Samples HandledA 3D optical system and ultra-large sample compartment allow extra large

samples up to 700 mm x 560 mm in size to be placed flat, making large sample

setting easier. And, the Automatic X-Y Stage enables automatic multi-point

measurement of samples up to 310 mm x 310 mm to be measured with nitrogen

gas purged.

* As of February 2005, in-house report

Integrating

sphereMonochrometer

WI lamp

D2 lamp

PbS detector

PMT

Integrating

sphere

InGaAs detector

Monochrometer

Direct Detection Unit

(DDU: optional)

PMT

InGaAs

PbS

UV

190nm 380nm 780nm 3300nm

Visible NIR

190 to 1000 nm

700 to 1800 nm

1600 to 3300 nm


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Accessories for Film Measurement

Optical System

Optical System Around Detectors

PbS detector

InGaAs detector

PMT detector

Desktop Model UV-3600High Sensit ivi tyThis instrument incorporates a PMT (photomultiplier tube) detector

for the ultraviolet and visible regions and an InGaAs detector, and

a cooled PbS detector for the near-infrared region. With

conventional instruments, there is a drop in sensitivity at the

crossover wavelength between the regions covered respectively by

the PMT and PbS detectors. Using an InGaAs detector to cover

this region, however, ensures high sensitivity across the entire

measurement wavelength range. The 1500-nm noise level does

not rise above 0.00003 Abs.

Film Holder (P/N 204-58909) Standard Type

Applicable sample size: Minimum 16 (W) x 32 (H) mm

Maximum 80 (W) x 40 (H) x 20 (t) mm

Film Holder (Special Order)

This accessory is mounted in the instrument's sample

compartment, and enables rotation of the sample and attachment

of a polarizer.

It is particularly suited to the measurement of transmission

characteristics of polarized film. There are many other accessories

available for the UV-3600.

High Resolution, Ultra-Low Stray Light and Wide Measurement Wavelength Range

Using a high-performance double monochromator makes it possible to attain an ultra-low stray light level (0.00005% max. at 340 nm) with a

high resolution (max. 0.1 nm). The wide wavelength range of 185 nm to 3300 nm enables measurements over the ultraviolet, visible and near-

infrared regions, allowing spectrophotometry to be performed in a variety of different fields.

InGaAs

PbS

PMT


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SolidSpec-3700 Accessories

The Automatic X-Y Stage enables automatic in-plane mapping measurement of crystalline Si solar cells as they

are, and even thin-film Si or CIGS solar cells of a maximum size of 310 mm x 310 mm. The results of measuring a

glass substrate with TCO (SnO) for thin-film solar cells shown above indicate that an in-plane transmittance error

Automatic X-Y Stage

This stage enables automatic multi-point measurement of samples

of a maximum size of 310 mm x 310 mm.

Mounted on Instrument

Wavelength (nm)

300

700

1000

1500

6.68

77.8

69.96

31.38

6.3

77.77

71.99

35.61

6.52

76.25

70.88

34.02

7.1

75.44

69.62

30.95

6.52

76.78

70.34

31.68

Measurement Point 1 Measurement Point 2 Measurement Point 3 Measurement Point 4 Measurement Point 5

In-Plane Mapping Measurement of Transmittance at 5 Points in a Glass Substrate Surface with TCO at Specific Wavelengths

Wavelength (nm)


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Solar Cel l Material , Cel l and Module Analysis and Evaluation Instruments

The angle of incidence of the light irradiating the sample can be

changed with ease thanks to a goniometer system that allowsrotation of the sample and detector (integrating sphere) on the

same axis. The integrating sphere can also be installed on the

transmitting side to enable measurement of transmission at a

variable angle of incidence and measurement of the distribution of

the scattered angle of transmission.

Applicable sample size

Measurement wavelength range

Absolute specular incidence angle, Variable in range

Transmittance detection angle, Variable in range

50 (W) x 50 (H) x 2 (t) mm

300 to 2600 nm

5 ϒ to 70 ϒ

0 ϒ to 90 ϒ

Variable Angle Absolute Specular Reflectance Measuring

Device (Special Order)

Structure of Variable Angle Absolute Specular Reflectance

Measuring Device

Mounted in Sample Compartment

Specifications

Reference light

Reference sideintegrating sphere

Sample

Mask

Sample sideintegrating sphere

Sample lightSample lightReference sideintegrating sphere

Sample sideintegrating sphere

Each of the sampleholder and sample typedetector angles can beset independently.

Moving parts

Energy Dispersive X-RayFluorescence Spectrometer

EDX Series

[Applications]Non-destructive composition analysis and filmthickness measurement of CIGSS/CIGS, buffer layers, TCO thin films, and electrodes

XPS Imaging Spectrometer

ESCA-3400(Kratos Amicus)

[Applications]Chemical bonding analysis of CIGSS/CIGS thinfilms and buffer layers in depth direction

Single Nano Particle Size Analyzer

IG-1000

[Applications]Particle size and particle-size-distributionmeasurements of nano-size metal particlesin range 0.5 nm to 200 nm

Universal Testing Machine

AG-X

[Applications]Module compression and tensile testing, end-sealingmaterial and back sheet peeling testing, evaluation ofbonding strength of interconnections

FTIR Spectrophotometer

IRPrestige-21

[Applications]Analysis of ultraviolet light and thermaldegradation of EVA and other transparentbonding film, evaluation of Si-H bonding strength

UV/PY (UV Irradiation/Pyrolysis)

GCMS-QP2010 Plus

[Applications]Analysis of chemical changes and deterioration of EVAin the optical, thermal and oxidation degradationphases by combining UV irradiation and pyrolysis


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The contents of this brochure are subject to change without notice.

SHIMADZU CORPORATION. International Marketing Division

3. Kanda-Nishikicho 1-chome, Chiyoda-ku, Tokyo 101-8448, JapanPhone: 81(3)3219-5641 Fax. 81(3)3219-5710

URL http://www.shimadzu.com

JQA-0376

Founded in 1875, Shimadzu Corporation, a leader in the

development of advanced technologies, has a distinguished

history of innovation built on the foundation of contributing tosociety through science and technology. We maintain a global

network of sales, service, technical support and applications

centers on six continents, and have established long-term

relationships with a host of highly trained distributors located

in over 100 countries. For information about Shimadzu, and to

contact your local office, please visit our Web site at

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