managing heat for reliability
DESCRIPTION
Managing Heat for Reliability. Brian Piercy & David Chapman GSI Marketing & Apps Eng. Thermal Density Increasing. 25°C. 95°C. 1 BTU. 1 BTU. Equal thermal energy in a smaller volume results in higher temperature. Radiation Rate Decreasing. Older, larger parts had more surface area - PowerPoint PPT PresentationTRANSCRIPT
![Page 1: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/1.jpg)
Managing Heat for Reliability
Brian Piercy & David ChapmanGSI Marketing & Apps Eng.
![Page 2: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/2.jpg)
2
Thermal Density Increasing
1 BTU 1 BTU
25°C 95°C
Equal thermal energy in a smaller volumeresults in higher temperature.
![Page 3: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/3.jpg)
3
Radiation Rate DecreasingOlder, larger
parts had more surface areaand smaller
Theta JA
Newer, smallerparts have less
surface areaand largerTheta JA
![Page 4: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/4.jpg)
4
Thermal Path to the Board is Getting Much Better
SmallerTheta JB
LargeTheta JB
![Page 5: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/5.jpg)
5
Hot Hosts Cook RAMs
A nearby processor or FPGA makes thermal analysis based on Theta JA
alone impossible.
![Page 6: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/6.jpg)
6
Theta JA Theta JA
“The intent of θJA measurements is solely for a thermal performance comparison of one package to another in a standardized environment. This methodology is not meant to and will not predict the performance of a package in an application-specific environment.”
JEDEC Standard JESD51-2A:Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)www.jedec.org/sites/default/files/docs/JESD51-2A.pdf
![Page 7: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/7.jpg)
7
Thermal Power Circuit
Ambient Temperature
PCB Temperature
RAM Power
Case-to-AmbientThermal Resistance
Junction-to-CaseThermal Resistance
Junction-to-BoardThermal Resistance
PCB-to-AmbientThermal Resistance
PCB Thermal Resistance
![Page 8: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/8.jpg)
8
3D Analysis is Required
Thermal Design tools like Flowtherm™ account for all heat sources, thermal sinks and thermal resistances simultaneously.
http://www.mentor.com/products/mechanical/products/flotherm
![Page 9: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/9.jpg)
9
Predicting Die Temp
• Complex analysis is required to predict the actual temperatures at various places in and around the RAM.
• Approximate results can be obtained IF the RAM is physically connected to an object with high thermal mass via a path with low thermal resistance.
![Page 10: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/10.jpg)
10
LR-HM Thermal Estimates
Focus on a LOW RESISTANCE path to a HIGH MASS object.
![Page 11: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/11.jpg)
11
Assume PC Board as Thermal Constant30°C Air
1.5 W Die
2.5°C/W JC
10°C/W JB
Tj = (Theta JB * Pd) + TbTj = (10°C/W * 1.5 W) + 50°CTj = 65°C
So…
Tc = Tj - (Theta JC * Pd)Tc = 65°C – (2.5°C/W * 1.5W)Tc = 61.25°C
So…
Tj < 65°C.
RAM will heat air and air will cool the RAM…some…
65°CDie
61.25°CCase Top
50°CBoard
![Page 12: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/12.jpg)
12
Assume Cold Plate and PCB as Thermal Constant
1.5 W Die
2.5°C/W JC
10°C/W JB
Tj = Tc + (Theta JC * Pd)Tj = 20°C + (2.5°C/W * 1.5W)Tj = 23.75°C
And…
Tj = (Theta JB * Pd) + TbTj = (10°C/W * 1.5 W) + 50°CTj = 65°C
So…
65°C > RAM Tj > 23.75°C
20°CCase Top
50°CBoard
20°CCold Plate
50°CRAM Balls
![Page 13: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/13.jpg)
13
Design vs. Characterization
A single thermal resistance parameter cannot be used alone to predict die temperature.
However…
Theta JC (Junction to Case Temperature), Theta JB (Junction to Board Temperature), measured Case Temperature and measured Board Temperature can be used to estimate actual Junction temperature.
![Page 14: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/14.jpg)
14
Thermal Characterization
Measured Total DiePower = 2.0 W
Board to JunctionTj = (Theta JB * Pd) + TbTj = (12.3°C/W * 2.0W) + 30°CTj = 54.6°C
Case to JunctionTj = (Theta JC * Pd) + TcTj = (2.6°C/W * 2.0W) + 50°CTj = 55.2°C
So…
Junction Temp 55°C*
* Do not expect to get exactly the same answer for each method!
Data SheetThermal
CharacteristicsJB = 12.3°C/WJC = 2.6°C/W
Measured BoardTemp = 30°C
MeasuredCase Temp = 50°C
![Page 15: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/15.jpg)
15
Data Sheet Specifications• Absolute Maximum Ratings
• Define the worst environment the device can tolerate for a short time.
• Exposing a device to Absolute Maximum conditions reduces device lifetime.
• Recommended Operating Conditions• The device is guaranteed to meet all
specifications• A group will demonstrate a Failure Rate of no
greater than 50 FITs for 10 years.
![Page 16: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/16.jpg)
16
Example Abs Max SectionAbsolute Maximum Ratings(All voltages reference to VSS)Symbol Description Value Unit
VDD Voltage on VDD Pins –0.5 to 2.4 VVDDQ Voltage in VDDQ Pins –0.5 to VDD VVREF Voltage in VREF Pins –0.5 to VDDQ VVI/O Voltage on I/O Pins –0.5 to VDDQ +0.5 (≤ 2.4 V max.) VVIN Voltage on Other Input Pins –0.5 to VDDQ +0.5 (≤ 2.4 V max.) V
VTIN Input Voltage (TCK, TMS, TDI) –0.5 to VDDQ +0.5 (≤ 2.4 V max.) VIIN Input Current on Any Pin +/–100 mA dc
IOUT Output Current on Any I/O Pin +/–100 mA dcTJ Maximum Junction Temperature 125 °C
TSTG Storage Temperature –55 to 125 °C
Note: Permanent damage to the device may occur if the Absolute Maximum Ratings are exceeded. Operation should be restricted to Recommended Operating Conditions. Exposure to conditions exceeding the Recommended Operating Conditions, for an extended period of time, may affect reliability of this component.
![Page 17: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/17.jpg)
17
Under Recommended Operating Conditions…
• Consume IDD Max or Less• Meet or exceed all DC Parametric Specifications
• Input and Output Levels• Input and Output Impedances
• Meet or exceed all Timing Specifications• Cycle as fast or faster than specified• Capture signals within tS – tH windows• Produce Output Data Valid at specified time
• AND the population of devices will not exceed the forecast failure rate.
![Page 18: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/18.jpg)
18
• Burn-in forces “Infant Failures”
• Qualification Testing verifies Random Failure Rate over “Useful Life” (normally 10 years)
• Wear-out failures at “End of Useful Life” are normal.
Reliability
Drawing: http://en.wikipedia.org/wiki/File:Bathtub_curve.svg
10 Days 10 Years
50 FITSOr
Less
Useful Life
![Page 19: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/19.jpg)
19
Accelerating Failures
• Typical Burn-In Example• Abs Max Voltage & Abs Max Temp applied for 128
hours.
• HTOL* Reliability Test Example• Abs Max Voltage & Abs Max Temp applied to 315
devices for 1000 hours• 1 failure derates to 50 FITs over 10 Year Useful
Life* High Temperature Operating Life Test
![Page 20: Managing Heat for Reliability](https://reader036.vdocuments.us/reader036/viewer/2022081515/56815cba550346895dcab76d/html5/thumbnails/20.jpg)
20
Summary
A population of devices used within Thermal
Recommended Operating Conditions and
Electrical Recommended Operating Conditions
will meet or exceed all specifications for 10
years while demonstrating a failure rate of no
more than 50 Failures per 1 Billion Device Hours
of operation (i.e. 50 FITs).