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Lossless Ion Trapping in Structures for Lossless Ion Manipulation (SLIM)
Xinyu Zhang, Sandilya V.B. Garimella, Spencer A. Prost, Ian K. Webb, Randolph V. Norheim, Brian L. LaMarche, Tsung-Chi Chen, Aleksey V. Tolmachev,
Gordon A. Anderson, Yehia M. Ibrahim and Richard D. Smith
Pacific Northwest National Laboratory
Basic Gas Phase Ion Manipulations
Ion transport
Ion trapping
Ion-ion/ion-molecule reactions
Ion mobility separations (IMS)
Ion Trapping in SLIM Explored at ~Torr Pressures
Ion accumulation and charge capacity in a SLIM trap
Ion release from a SLIM trap
Ion storage for extended times to e.g. enable more efficient use of MS
Structures for Lossless Ion Manipulation
See Poster WP714 by Ian Webb et al., Jun 17
5 mm
Slim Electrode Designs Used in This Study
5.6 mm
0.76 mm
0.76 mm
0.76 mm
Rung electrodes
Guard electrodes
Guard electrodes
DC Rung gradient
Guard gradient
+ - + - + - + - + - + -
Comparable DC Voltages Used on Rung and Guard Electrodes to Facilitate Ion Confinement
Guard gradient
DC for ion confinement and manipulation used in conjunction with RF confinement potentials applied to rung electrodes
10.00 40.00 70.00
0 25 50 75
Potential (V)0
25
50
Pot
entia
l (V)
Pseudo Potential Well (Ion Confinement)
X
Y
Charge: 1+Mass: 1000RF: 200 Vp-p at 800 kHzGuard Bias: +5 V
See Poster WP716 by Sandilya Garimella et al., Jun 17
7.000 53.50 100.0
0 20 40 60
Potential (V)
Pot
entia
l (V)
01020
Z
Y
Pseudo Potential Well (Ion Transport)
See Poster WP716 by Sandilya Garimella et al., Jun 17
DC: 12 V/cm
6
10.00 55.00 100.0
0 50
Potential (V)
Pot
entia
l (V)
15
20
Z
Y
Pseudo Potential Well (Ion Trapping)
See Poster WP716 by Sandilya Garimella et al., Jun 17
DC: 12 V/cm
Instrumental Arrangement Used
Pressure: 4.3 torr (Nitrogen)RF: 165 Vp-p, 1.7 MHz
Continuous Mode (DC Gradient Arrangement)
40 V
Fill
30 cm
Sample Tetraoctylammonium Bromide1μM in CH3CN/H2O/CH3COOH (75/24/1)
m/z: 466.3
Continuous Mode (Current Measurements)
0 100 200 300 4000
10
20
30
continuous mode
Cur
rent
(pA
)
Arrival Time (ms)
SLIM Used for the Charge Capacity Study
Entrance Gate Exit GateTrapping Region
Charge Capacity (DC Gradient Arrangement)
40 V
15 V
Fill(Time varies)
Release
7.5 cm 7.5 cm15 cm
Charge Capacity (Current Measurements)
0 100 200 300 4000
10
20
30
continuous mode
320 ms (filling time)
Cur
rent
(pA
)
Arrival Time (ms)
0 100 200 300 4000
10
20
30
continuous mode
320 ms (filling time)
Cur
rent
(pA
)
Arrival Time (ms)
Charge Capacity Measurements
0 100 200 300 4000
10
20
30
continuous mode
320 ms (filling time)
Cur
rent
(pA
)
Arrival Time (ms)
Charge Capacity Measurements
SLIM Charge Capacity
0 500 1000 1500 2000 2500
0
10M
20M
30M
40M
50M
60M
70M Number of Charges
Num
ber o
f Cha
rges
Filling Time (ms)
0.0
0.2
0.4
0.6
0.8
1.0
Trapping Effeciency Trapping Effeciency
Exit GateEntrance Gate
Trapping Region
SLIM Used for the Release Time Study
30 V/cm
7 cm0.46 cm
Accumulate
0.7 V/cm
14.5 V/cm
10 V/cm
Fill(80 ms)
Release(Released Ion # v.s. Release Time) 5 M charges
Release Time (DC Gradient Arrangement)
m/z: 466.3
SLIM Release Time
0.0 0.5 1.0 1.50
50
100
150
200
250Io
n C
ount
(A.U
.)
Release Time (ms)
1 ms
37 38 39 40 41 42 430
20
40
60
Ion
Cou
nt (A
.U.)
Mobility Time (ms)
SLIM Used for the Storage Time Study
Entrance Gate Exit GateTrapping Region
40 V
15 V
15 V
Fill(5 ms)
Trap(Time varies)
Release
7.5 cm 7.5 cm15 cm
Storage Time (DC Gradient Arrangement)
m/z: 466.3 and 690.5
0.0
0.2
0.4
0.6
0.8
1.0
1.2
m/z 466.3, (C8H17)4N+
m/z 690.5, (C12H25)4N+Nor
mal
ized
Inte
nsity
Trapping Time0 10 s 20 s 30 s 5 hr
SLIM Storage Time
0.0
0.2
0.4
0.6
0.8
1.0
1.2
m/z 466.3, (C8H17)4N+
m/z 690.5, (C12H25)4N+Nor
mal
ized
Inte
nsity
Trapping Time0 10 s 20 s 30 s 5 hr
SLIM Storage Time
0.0
0.2
0.4
0.6
0.8
1.0
1.2
m/z 466.3, (C8H17)4N+
m/z 690.5, (C12H25)4N+Nor
mal
ized
Inte
nsity
Trapping Time0 10 s 20 s 30 s 5 hr
SLIM Storage Time
0.0
0.2
0.4
0.6
0.8
1.0
1.2
m/z 466.3, (C8H17)4N+
m/z 690.5, (C12H25)4N+Nor
mal
ized
Inte
nsity
Trapping Time0 10 s 20 s 30 s 5 hr
SLIM Storage Time
400 500 600 700 8000
1000
2000
3000
4000
Abu
ndan
ce (A
.U.)
m/Z400 500 600 700 800
0
1000
2000
3000
4000
Abu
ndan
ce (A
.U.)
m/Z
Trapping for 1 s Trapping for 5 hours
SLIM Storage Time
Conclusions
Effective pseudo potential wells in SLIM
The construction and application of a number of SLIM arrangements
Defined charge capacity of a SLIM trap
Ion release from a SLIM trap
Lossless ion trapping at Torr for hours in SLIM
Initial research has demonstrated:
Acknowledgements
NIH National Institute of General Medical Sciences Biomedical Technology Research Resource
DOE Office of Biological and Environmental Research
PNNL Laboratory Directed R&D