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LONGEVITY OF HIGH DENSITY MAGNETIC MEDIA
VIVEK NAVALENATIONAL ARCHIVES AND RECORDS ADMINISTRATION
8601 ADELPHI ROAD,COLLEGE PARK, MD, 20740Phone: 301-837-3404 FAX: 301-837-3681
E-mail: [email protected]
Presented at the THIC Meeting at the Raytheon ITS Auditorium, 1616 McCormick Dr
Upper Marlboro MD 20774-5301November 5-6, 2002
PRESENTATION OUTLINE
WHY THE STUDY WAS CONDUCTED?
WHAT WERE THE TECHNICAL AREAS STUDIED?
HOW THE MEASUREMENTS WERE MADE?
WHAT WERE THE FINDINGS OF THE WORK?
V. Navale, THIC, 2002
PURPOSE OF THE STUDY
EVALUATE HIGH DENSITY MAGNETIC TAPES AND DETERMINE RELIABLE ARCHIVAL MEDIA FOR USE BY NARA
COMPARE AND CONTRAST PHYSICAL AND CHEMICAL CHARACTERISITCS OF IBM 3590, DLT, SDLT TAPES
EFFECT OF TEMPERATURE AND HUMIDITY ON HIGHDENSITY MAGNETIC MEDIA
COMPUTE LIFE EXPECTANCIES FOR THE TAPE TYPES
EXAMINE ERROR CORRECTION CAPABILITIESFOR THE TAPE DRIVES
V. Navale, THIC, 2002
TECHNICAL STUDY AREAS
MICROSTRUCTURE ANALYSIS OF RECORDING MEDIA
INTRINSIC MAGNETIC PROPERTIES - MAGNETIC REMANENCE
BINDER HYDROLYSIS AND LUBRICANT STUDY
PHYSICAL PROPERTIES - RESISTIVITY AND FRICTION
RECORDING PROPERTY - RF AMPLITUDE CHANGES
TAPE ERROR CHANGES - ECC
V. Navale, THIC, 2002
METHODS OF INVESTIGATION
TRANSMISSION ELECTRON MICROSCOPY
VIBRATING SAMPLE MAGNETOMETER
GAS CHROMATOGRAPHY MASS SPECTROMETRY
RF-AMPLITUDE RESPONSE TESTING SYSTEM
SOFTWARE TESTING TOOL FOR DATA ERROR PROFILING
V. Navale, THIC, 2002
STUDY CONDITIONS
THREE DIFFERENT TEMPERATURE HUMIDITY CONDITIONS
40o C, 50% RH, 50o C, 75% RH, 50o C, 85% RH
TOTAL TIME DURATION OF SAMPLING - SIX MONTHS
SAMPLING FREQUENCY VARIED BY EXPERIMENT
MAGNETIC STABILITY PREDICTIVE MODELING(ARRHENIUS RELATIONSHIP)
V. Navale, THIC, 2002
Is vs Exposure Time 50C/ 85% RH
0.000
2.000
4.000
6.000
8.000
10.000
12.000
14.000
16.000
18.000
20.000
0 1000 2000 3000 4000
Time (hours)
Is (m
emu)
3590SDLTBaFeFuji DLTPoly. (3590)Poly. (SDLT)Poly. (Fuji DLT)Poly. (BaFe)
V. Navale, THIC, 2002
Percent Extractables vs Exposure Time 50 C & 54.5% RH
0.0
0.5
1.0
1.5
2.0
2.5
3.0
7 14 19 36
Time (days)
Perc
ent (
%)
Quantum SDLTFuji DLT IVMaxell DLT IVBaFeMP-DLT IIIIBM 3590-Imation
V. Navale, THIC, 2002
Percent Extractables vs Exposure Time (75C & 75%)
00.5
11.5
22.5
33.5
7 14 19 36 74 110 142
Time (days)
Perc
ent (
%)
IBM 3590-Emtec
Quantum SDLT
Fuji DLT IV
V. Navale, THIC, 2002
Comparative Friction Coefficient vs Time (50C/50% RH)
0.0
0.2
0.4
0.6
0.8
0 21 43 63 84 105
Time (Days)
Fric
tion
Coef
ficie
nt DLT Fuji3590 ImSDLTBaFeMP-DLTIII
V. Navale, THIC, 2002
LIFE EXPECTANCIES 80C & 100% RH
8.4 3.8 3
413
1.1 2.50
50100
150200
250300
350400
450
DLT IV-Fuji
DLT IV-Maxell
SDLT I BaFe-Arkival
DLT III-MP 3590
LIFE
TIM
ES (D
ays)
V. Navale, THIC, 2002
LIFE EXPECTANCIES 50C & 50% RH
1.510.21
1.65
25.3
1.25 1.220
5
10
15
20
25
30
DLT IV-Fuji
DLT IV-Maxell
SDLT I BaFe-Arkival
DLT III-MP 3590
LIFE
TIM
ES (Y
ears
)
V. Navale, THIC, 2002
LIFE EXPECTANCIES 50C vs. RH
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
0 10 20 30 40 50 60 70 80 90
% RH
Life
time
(yea
rs)
SDLT
DLT IV Fuji
DLT IV Maxell
3590
Linear (DLT IV Fuji)
Linear (3590)
Linear (SDLT)
Linear (DLT IVMaxell)
V. Navale, THIC, 2002
LE 30% RH vs TEMPERATUREbasis: Is-Saturation Magnetization
0.001
0.01
0.1
1
10
100
1000
10000
0 50 100
Temperature (C)
Life
time
(yea
rs)
SDLT
DLT IV Fuji
DLT IV Maxell
3590
V. Navale, THIC, 2002
COMPARING MEDIA TYPES 50C/ 85% RH
0
50
100
150
200
250
1 2 3 4TIME-MONTHS
B*E
R x
10^9 DLT (Y)
SDLT (G)
3590 (R)
V. Navale, THIC, 2002
LE PROJECTIONS 40C/ 50% RH
0
200
400
0 5
TIME- Months
B*ER
x10^
9DLT/SDLT
3590
Linear (3590)
Linear(DLT/SDLT)
V. Navale, THIC, 2002
Two examples showing the LE projections using the Is projection and with ECC applied projection-note: all LE values decrease with higher temp and RH; The power of the ECC is obvious in all cases; the ECC efficiency is indicated by the difference in LE between products (best SDLT then DLT then
3590)
LE 40C/50% RH basis: Is vs. ECC
9.3
237.5
1083.3
6.3
17.3
62.1
0 500 1000
3590
DLT
SDLT
Stor
age
Prod
uct
Lifetime (years)
Is SaturationMagnetizationECC Applied
LE 50C/75% RH basis: Is vs. ECC
2.0
90.0
216.7
0.8
1.1
1.4
0 50 100 150 200
3590
DLT
SDLT
Stor
age
Prod
uct
Lifetime (years)
Is SaturationMagnetizationECC Applied
V. Navale, THIC, 2002
SUMMARY
MAGNETIC REMANENCE CHANGES FOR HIGH DENSITY MEDIA DEPENDS ON IMPOSED ENVIRONMENTAL STRESS
MINIMUM BINDER HYDROLYSIS PRODUCTS OBSERVED FOR DLT(IV), SDLT, IBM 3590 TAPES
RESISTIVITY AND FRICTION COEFFECIENT CHANGES WERE WITHINTHE ISO/ECMA SPECIFICATIONS FOR THESE PRODUCTS
THREE ORDERS OF MAGNITUDE DECREASE IN LIFE EXPECTANCY (LE) FOR ALL TAPES WHEN TEMPERATURE INCREASED FROM 20 TO 40 CELSIUSEVEN AT 30% RH
THREE ORDERS OF MAGNITUDE DECREASE IN LEWERE OSERVED HUMIDITY INCREASED FROM 30 TO 75%AT CONSTANT TEMPERATURE OF 20 CELSIUS
V. Navale, THIC, 2002
SUMMARY
LOWER READ AND WRITE ERROR RATES FOR DLT THAN IBM 3590 MEDIA DURING FIRST WRITE AND READ TESTING
CORRECTABLE ERRORS AND ERROR RATE INCREASED WITH INCREASING TEMPERATURE AND HUMIDITY
AT 50 C/75% RH, LE COMPUTED AFTER USING ECC, DLT(IV) - 16 YEARS, IBM 3590 - 10 YEARS
TAPE FAILURES AND DATA LOSSES OBSERVED IN ALLTHREE STORAGE PRODUCT STUDIED
DLT(IV) AND SDLT TAPES SHOWED THE MOST STABLEPERFORMANCE UNDER THE CONDITIONS EXAMINED,MOST FAVORABLE ARCHIVAL STORAGE MEDIA
V. Navale, THIC, 2002
REFERENCES
Ron Weiss et.al., “Environmental Stability Study and Life Expectanciesof Magnetic Media for Use with IBM 3590 and Quantum Digital Linear TapeSystems”. Final Report to the National Archives and Records Administration, Delivered by Arkival Technology Corporation, under contract requirement,NAMA-01-F-0061, 2002, PP 1-94,
John W.C. Van Bogart, “Media Stability Studies”. Final Report preparedby National Media Laboratory, PP 1-86, 1994.
V. Navale, THIC, 2002
Acknowledgement
National Archives and Records Administration
Contract - NAMA-01-F0061
And
ArKival Technology Corporation
Ron Weiss, John Judge, and the Arkival team
Professor Glen Miller, University of New Hampshire
V. Navale, THIC, 2002
RESOURCES
Copies of the complete Report and Appendix for the study entitled,
“Environmental Stability Study and Life Expectanciesof Magnetic Media for Use with IBM 3590 and Quantum Digital Linear TapeSystems” are available in either a printed bound volume or CD.
Requests can be made to Arkival Technology [email protected]