lecture 8: circuit simulations · 4 logical effort: extract τ • recall τ is the coefficient of...

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1 Lecture 8: Circuit Simulations Circuit Characterization (Brief) Reading: Ch. 5 IV curves: Basic Shapes IDS vs VDS (two regions) Linear (Low V DS ) Saturated (High V DS ) IDS vs VGS Linear IDS (above threshold) Log (IDS) (below threshold)

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Page 1: Lecture 8: Circuit Simulations · 4 Logical Effort: Extract τ • Recall τ is the coefficient of h (i.e. slope) in a delay vs. fanout plot for an inverter • Logical effort for

1

Lecture 8: Circuit Simulations

•  Circuit Characterization (Brief)

•  Reading: Ch. 5

IV curves: Basic Shapes •  IDS vs VDS (two regions)

–  Linear (Low VDS) •  Effective Resistance

–  Saturated (High VDS) •  Current, gm, gds

•  IDS vs VGS –  Linear IDS (above threshold) –  Log (IDS) (below threshold)

Page 2: Lecture 8: Circuit Simulations · 4 Logical Effort: Extract τ • Recall τ is the coefficient of h (i.e. slope) in a delay vs. fanout plot for an inverter • Logical effort for

2

SPICE Level 1 Model •  Shichman-Hodges Model (Schichman68)

–  Similar to Shockley model, but with channel length modulation and body effect

( )

( )( )⎪⎪⎪

⎪⎪⎪

−>−⋅+

−<⎟⎠

⎞⎜⎝

⎛−−⋅+

<

=

saturationVVVVVVLAMBDALWKP

linearVVVVVVVVLAMBDALWKP

cutoffVV

I

tgsdstgsdseff

eff

tgsdsdsds

tgsdseff

eff

tgs

ds

212

21

0

SPICE Level 1 Model •  SPICE Level 1 Model

•  SPICE Level 2 and 3 –  Includes velocity saturation, mobility degradation, subthreshold

conduction, drain induced barrier lowering •  BSIM Models

–  Berkeley Short-Channel IGFET Model (BSIM) –  IGFET – Insulated Gate Field Effect Transistor (i.e. MOSFET) –  BSIM 3.v3 = SPICE level 49

•  More then 100 parameters and device equations!

( )PHIVPHIGAMMAVTOV sbt ++⋅+=MJSW

sbMJ

sbsb PHP

VCJSWPSPBVCJASC

−−

⎟⎠

⎞⎜⎝

⎛+⋅⋅+⎟

⎞⎜⎝

⎛+⋅⋅= 11

Page 3: Lecture 8: Circuit Simulations · 4 Logical Effort: Extract τ • Recall τ is the coefficient of h (i.e. slope) in a delay vs. fanout plot for an inverter • Logical effort for

3

Fanout-of-4 inverter delay

•  P/N ratio 2:1 –  1 means 1xWmin, 2

means 2xWmin,… –  L=2lamda (always)

•  X2 is upsized by 4x –  8 means 8xWmin…

•  Device under test placed in the middle –  Realistic input and

output slopes •  Find tpdr and tpdf

Copyright © 2005 Pearson Addison-Wesley. All rights reserved. 5-10

a b c d eX1 X2 X3 X41

2

4

8

16

32

64

128 fX5256

512

Shape input

DeviceUnderTest Load

Load onLoad

Optimization

•  Example: Best P/N ratio –  We’ve assumed 2:1 gives equal rise/fall delays –  But we see rise is actually slower than fall –  What P/N ratio gives equal delays?

•  P/N ratio for equal delay is 3.6:1 –  tpd = tpdr = tpdf = 84 ps (slower than 2:1 ratio) –  Big pMOS transistors waste power too –  Seldom design for exactly equal delays

•  What ratio gives lowest average delay? –  P/N ratio of 1.4:1 –  tpdr = 87 ps, tpdf = 59 ps, tpd = 73 ps

Page 4: Lecture 8: Circuit Simulations · 4 Logical Effort: Extract τ • Recall τ is the coefficient of h (i.e. slope) in a delay vs. fanout plot for an inverter • Logical effort for

4

Logical Effort: Extract τ •  Recall τ is the coefficient of h

(i.e. slope) in a delay vs. fanout plot for an inverter

•  Logical effort for INV g=1 a b c d e X1 X2 X3 X4

M=1

f X5

Shape input

Device Under Test Load

Load on Load

M=h M=h2 M=h3 M=h4

0 15 30 45 60

75 90

105 120

0 2 4 6 8 10 h

d abs

dabs=(gh+p) τ dabs=(h+p)τ

τ = 15 ps

Logical Effort Plots •  Logical effort can be measured

from simulation •  Plot tpd vs. h

–  Normalize by τ –  y-intercept is parasitic delay –  Slope is logical effort

•  Delay fits straight line very well in any process as long as input slope is consistent

0

20

40

60

80100

120

140

160

180

0 2 4 6 8 10

h

dabs

τ = 15 ps

dabs=16.7h + 28.9ps

gNAND=16.7/15=1.11 pNAND=28.9/15=1.93

X1 X2 X3 X4 X5

a b c d efM=1 M=h M=h2

M=h3M=h4

Shape input

DeviceUnderTest Load

Load onLoad

Page 5: Lecture 8: Circuit Simulations · 4 Logical Effort: Extract τ • Recall τ is the coefficient of h (i.e. slope) in a delay vs. fanout plot for an inverter • Logical effort for

5

Gate Capacitance (delay)

•  Gate capacitance extraction (delay) –  Effective gate capacitance for delay estimation –  Example: Estimate fanout of 4 input capacitance

•  Adjust capacitance Cdelay until c-to-d delay equals c-to-g delay

Gate Capacitance (power) •  Gate capacitance extraction (power)

–  Effective gate capacitance for power estimation is higher than effective gate capacitance for delay estimation

•  CGD is effectively doubled when wait long enough for drain to completely switch (Miller effect)

–  Example: circuit for determining the effective gate capacitance of X1 for power estimation

•  Apply voltage step and integrate the current into X1

Vdd

dttipowerC in

g∫=

)()(

Integrated over entire transition (delay is 50% point only)

Page 6: Lecture 8: Circuit Simulations · 4 Logical Effort: Extract τ • Recall τ is the coefficient of h (i.e. slope) in a delay vs. fanout plot for an inverter • Logical effort for

6

Parasitic Capacitance

•  Parasitic Capacitance Extraction –  Parasitic capacitance associated with drain or source includes

gate-to-diffusion overlap cap (Cgol) and area and perimeter cap Cjb and Cjbsw

Effective Resistance

•  According to RC delay model, Unit transistor has gate cap C, parasitic cap Cd, resistance Rn (for nMOS) and resistance Rp (for pMOS)

•  Find rising falling delays of fanout-of-h with 2:1 P/N ratio using Figure below

Page 7: Lecture 8: Circuit Simulations · 4 Logical Effort: Extract τ • Recall τ is the coefficient of h (i.e. slope) in a delay vs. fanout plot for an inverter • Logical effort for

7

Effective Resistance w/o Cd •  Remove dependence on parasitic capacitance Cd •  Calculate delay for h=3 and h=4, and subtract

( ) ( )

( ) ( ) CRCCRCCRt

CRCCR

CCR

t

ndndnpdf

pdp

dp

pdr

23333343

23333

2343

2

=+⋅⋅−+⋅⋅=Δ

=+⋅⋅−+⋅⋅=Δ

Summary

•  Simple simulations to extract R, Cg, Cd

•  More in Ch5