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Confidential - All Rights Reserved - ADVANTEST Europe GmbH
Komplexe
Produktkonfigurationen in der
High Tech Industrie
10/15/2014 1
Georg Herzog, Advantest Europe GmbH
Oliver Herrmann, PROMATIS software GmbH

Confidential - All Rights Reserved - ADVANTEST Europe GmbH 10/15/2014 2
Agenda
Firmenprofile
Advantest
Promatis
Ausgangslage
Machbarkeitsstudie
Anforderungen
Umsetzung
Lessons learned

Advantest

Advantest at a Glance
10/15/2014 4
Founded: 1954, Tokyo, Japan
U.S. Head Office: San Jose, CA
Europe Head Office: Munich, Germany
Other Major Subsidiaries: Singapore, Korea, Taiwan, China
Business: Semiconductor ATE
Mechatronics Systems
Services, Support & Others
Publicly Traded: Tokyo Stock Exchange (6857)
New York Stock Exchange (ATE)
Capital: 32.4 Billion
Revenue (FY2012): 111.9 Billion
No. of Employees: Approximately 4,600 Worldwide
R&D Sites: 11 Facilities on 6 Continents
(Japan, U.S., Germany, China, Singapore,
India)
R&D Spending (FY2012):
32.7 Billion

Expand Global Coverage
10/15/2014 5
Europe3 R&D Sites (Germany),
6 Sales/Support Sites
Total 700 employees
Asia Pacific 3 R&D Sites (China, Singapore, India),
18 Sales/Support Sites, 3 Production Sites
Total 900 employees
North America 2 R&D Sites (USA), 14 Sales/Support Sites,
1 Production Site
Total 500 employees
JapanAdvantest Headquarters (Tokyo)
4 R&D Sites, 6 Sales/Support Sites,
4 Production Sites
Total 2,500 employees
*All number is preliminary, as of March 2014

A Heritage of Technical Excellence
10/15/2014 6
2009 2008
ASIA Electronics
2013
1985 2000 2003 2008
1999
2006
1939
1954
1994
2011

Advantest Products

Semiconductor and Component Test Systems
10/15/2014 8
Advantests diverse product lineup offers solutions optimized for various
semiconductor devices.
Semiconductor and Component Test Systems
SoC Test System Memory Test System
T5503
for NAND Flash Memory
Test
T2000
for SoC / Chipsets V93000
for SoC / High-Speed Memory
Devices

Mechatronic Systems
10/15/2014 9
Test peripheral products support
semiconductor test operations
Nanotechnology powers these
systems for front-end semiconductor
processes
Mechatronics Systems
Device Interfaces Test Handlers MVM-SEM EB Lithography
Wafer MVM-SEM
E3310
F7000 EB Lithography
System
Hifix M6242 Test Handler

Mechatronic Systems
10/15/2014 10
Test Handlers
Test handlers transfer packaged semiconductors
in large batches to a test system, then sort them
based on the results of test. They enable
massively parallel test and lower semiconductor
test cost.
Device Interfaces
These precision mechanical and
electrical components connect
semiconductor devices with test systems.
M4871
Probe card
Change kit

Mechatronic Systems
10/15/2014 11
MVM-SEM
Advantests scanning electron microscopes
perform measurement in real time and in 3D of the
width, height, and side wall angles of nanoscale
patterns on semiconductor wafers and
photomasks.
EB Lithography
Systems such as our F7000 use electron
beams to etch advanced nanoscale patterns
as fine as 1Xnm. EB lithography is ideal for
high-mix low-volume production and prototype
manufacturing.
1
7000

Service, Support, Others & New Businesses
10/15/2014 12
Advantests new businesses utilize measurement technologies amassed over decades to
provide innovative solutions in arenas outside semiconductor processing.
Service, Support, Others & New Businesses
Support & Service Electric Measuring
Instruments Lease & Rental
Terahertz
Spectroscopic/
Imaging System
CloudTesting Service
MEMS
Components AirTap W2Bi
Cross Domain Analyzer
U3851
Terahertz Spectroscopic
Imaging System
TAS7500 Series
CloudTesting Station
CX1000P

New Businesses
10/15/2014 13
Terahertz Spectroscopic / Imaging Systems
Utilizing terahertz waves, these groundbreaking
systems perform non-invasive analysis of
pharmaceuticals, chemical samples, materials for
advanced communications, and other substances.
TAS7500 Series
Cross-Sectional Imaging
Imaging Analysis of a Drug Tablet

New Businesses
10/15/2014 14
CloudTestingTM Service*
An industry first. Advantests e-commerce platform* offers
on-demand test solutions. Optimal for educational
institutions and semiconductor R&D.
* Offered through Advantests Cloud Testing Service subsidiary.
CloudTesting Station
W2BI Wireless Test Automation
Smart Device Automated Test & Measurement Software

Applications
10/15/2014 15
Flash Memory
Consumer Mixed Signal
LCD Driver IC
Automotive/
Power
MCU
CMOS Image Sensor
DRAM
MPU/GPU
Wireless:
RF and
Processors
High Speed
Interface IC

PROMATIS

Ausgangslage

Mehrere Konfiguratoren in Eigenentwicklung
Unterschiedliche Komplexitt und
Konfigurationsmglichkeiten
zwischen 10 und 4500 Konfigurationsregeln per Produkt
Offline Betrieb. Nicht in ERP Infrastruktur eingebunden
Erstellung von Bauanleitungen fr externe Produktion
Anforderungen kommen von R&D und Produkt Marketing
nderungen werden von IT und Fachabteilung (Konfigurator
Team) eingepflegt
Ausgangslage

Ausgangslage
10/15/2014 23
Beauftragung einer Machbarkeitsstudie
Oracle R12 Konfigurator basierend
Nur Standardfunktionalitt soll genutzt werden
Abbildung aller exisitierender Funktionen muss
mglich sein
Prototype ber 30Tage Aufwand erstellt
Getestet und fr machbar empfunden Sign Off
Basis fr weitere Vorgehensweise

Ausgangslage
10/15/2014 24
Ergebnis der Machbarkeitsstudie
Umsetzung ohne zu programmierenden Code
machbar, allerdings mit viel Pflegeaufwand
Nutzung von Java Komponenten empfohlen
Geht grundstzlich aber nur mit Java Extensions
sinnvoll

Anforderungen
10/15/2014 25
Integration in Oracle R12 von der Stckliste bis zur
Produktionsanleitung
Konfigurator aufrufbar aus Oracle Angebotserstellung
und Auftrageseingabe
Ersetzen aller Konfigurationstools die im betrieblichen
Einsatz sind
Pflege der Regeln muss durch Fachabteilung mglich
sein
Anpassungen an das Standard Benutzer Interface muss
durch Fachabteilung mglich sein
Erstellen von Bauanleitungen, abgeleitet aus der
konfigurierten Stckliste (PMF PogoMapping file).

Umsetzung (durch Promatis)
10/15/2014 26
Template Technology genutzt
Unterteilung in verschiedene Kategorien von
Konfiguratoren
A : UI automatisch ber Stckliste generiert
B : UI automatisch generiert und manuell angepas

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